XEBIC at the Dual Beam

Gespeichert in:

Autor*in:	Vanzi, M. [verfasserIn] Podda, S. Musu, E. Cao, R.

Format:	Artikel

Erschienen:	2013

Umfang:	4

Übergeordnetes Werk:	Enthalten in: Microelectronics reliability - Amsterdam [u.a.] : Elsevier, 1964, 53(2013), 9 vom: Sept., Seite 1399-1402
Übergeordnetes Werk:	volume:53 ; year:2013 ; number:9 ; month:09 ; pages:1399-1402 ; extent:4

Katalog-ID:	OLC1929929390

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