Trap characterization of silicon nitride thin films by a modified trap spectroscopy technique

Gespeichert in:

Autor*in:	Midya, Kousik [verfasserIn] Dhar, Subhabrata Kottantharayil, Anil

Format:	Artikel

Erschienen:	2013

Umfang:	1

Übergeordnetes Werk:	Enthalten in: Journal of applied physics - Melville, NY : AIP, 1937, 114(2013), 15 vom: 21. Okt., Seite 154101-154101
Übergeordnetes Werk:	volume:114 ; year:2013 ; number:15 ; day:21 ; month:10 ; pages:154101-154101 ; extent:1

Katalog-ID:	OLC1930077203

Internformat


LEADER	01000caa a22002652 4500
001	OLC1930077203
003	DE-627
005	20230713232626.0
007	tu
008	131119s2013 xx \|\|\|\|\| 00\| \|\|und c
028	5	2	\|a sw131022_1
035			\|a (DE-627)OLC1930077203
035			\|a (DE-599)GBVOLC1930077203
040			\|a DE-627 \|b ger \|c DE-627 \|e rakwb
082	0	4	\|a 530
100	1		\|a Midya, Kousik \|e verfasserin \|4 aut
245	1	0	\|a Trap characterization of silicon nitride thin films by a modified trap spectroscopy technique
264		1	\|c 2013
300			\|a 1
336			\|a Text \|b txt \|2 rdacontent
337			\|a ohne Hilfsmittel zu benutzen \|b n \|2 rdamedia
338			\|a Band \|b nc \|2 rdacarrier
700	1		\|a Dhar, Subhabrata \|4 oth
700	1		\|a Kottantharayil, Anil \|4 oth
773	0	8	\|i Enthalten in \|t Journal of applied physics \|d Melville, NY : AIP, 1937 \|g 114(2013), 15 vom: 21. Okt., Seite 154101-154101 \|w (DE-627)129079030 \|w (DE-600)3112-4 \|w (DE-576)014411652 \|x 0021-8979 \|7 nnns
773	1	8	\|g volume:114 \|g year:2013 \|g number:15 \|g day:21 \|g month:10 \|g pages:154101-154101 \|g extent:1
912			\|a GBV_USEFLAG_A
912			\|a SYSFLAG_A
912			\|a GBV_OLC
912			\|a SSG-OLC-PHY
912			\|a GBV_ILN_22
912			\|a GBV_ILN_59
912			\|a GBV_ILN_70
912			\|a GBV_ILN_170
912			\|a GBV_ILN_2004
912			\|a GBV_ILN_2185
912			\|a GBV_ILN_2279
912			\|a GBV_ILN_4319
951			\|a AR
952			\|d 114 \|j 2013 \|e 15 \|b 21 \|c 10 \|h 154101-154101 \|g 1

Indexfelder

author_variant	k m km
matchkey_str	article:00218979:2013----::rphrceiainfiiontiehnimbaoiidrp
hierarchy_sort_str	2013
publishDate	2013
allfields	sw131022_1 (DE-627)OLC1930077203 (DE-599)GBVOLC1930077203 DE-627 ger DE-627 rakwb 530 Midya, Kousik verfasserin aut Trap characterization of silicon nitride thin films by a modified trap spectroscopy technique 2013 1 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Dhar, Subhabrata oth Kottantharayil, Anil oth Enthalten in Journal of applied physics Melville, NY : AIP, 1937 114(2013), 15 vom: 21. Okt., Seite 154101-154101 (DE-627)129079030 (DE-600)3112-4 (DE-576)014411652 0021-8979 nnns volume:114 year:2013 number:15 day:21 month:10 pages:154101-154101 extent:1 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_22 GBV_ILN_59 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2185 GBV_ILN_2279 GBV_ILN_4319 AR 114 2013 15 21 10 154101-154101 1
spelling	sw131022_1 (DE-627)OLC1930077203 (DE-599)GBVOLC1930077203 DE-627 ger DE-627 rakwb 530 Midya, Kousik verfasserin aut Trap characterization of silicon nitride thin films by a modified trap spectroscopy technique 2013 1 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Dhar, Subhabrata oth Kottantharayil, Anil oth Enthalten in Journal of applied physics Melville, NY : AIP, 1937 114(2013), 15 vom: 21. Okt., Seite 154101-154101 (DE-627)129079030 (DE-600)3112-4 (DE-576)014411652 0021-8979 nnns volume:114 year:2013 number:15 day:21 month:10 pages:154101-154101 extent:1 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_22 GBV_ILN_59 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2185 GBV_ILN_2279 GBV_ILN_4319 AR 114 2013 15 21 10 154101-154101 1
allfields_unstemmed	sw131022_1 (DE-627)OLC1930077203 (DE-599)GBVOLC1930077203 DE-627 ger DE-627 rakwb 530 Midya, Kousik verfasserin aut Trap characterization of silicon nitride thin films by a modified trap spectroscopy technique 2013 1 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Dhar, Subhabrata oth Kottantharayil, Anil oth Enthalten in Journal of applied physics Melville, NY : AIP, 1937 114(2013), 15 vom: 21. Okt., Seite 154101-154101 (DE-627)129079030 (DE-600)3112-4 (DE-576)014411652 0021-8979 nnns volume:114 year:2013 number:15 day:21 month:10 pages:154101-154101 extent:1 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_22 GBV_ILN_59 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2185 GBV_ILN_2279 GBV_ILN_4319 AR 114 2013 15 21 10 154101-154101 1
allfieldsGer	sw131022_1 (DE-627)OLC1930077203 (DE-599)GBVOLC1930077203 DE-627 ger DE-627 rakwb 530 Midya, Kousik verfasserin aut Trap characterization of silicon nitride thin films by a modified trap spectroscopy technique 2013 1 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Dhar, Subhabrata oth Kottantharayil, Anil oth Enthalten in Journal of applied physics Melville, NY : AIP, 1937 114(2013), 15 vom: 21. Okt., Seite 154101-154101 (DE-627)129079030 (DE-600)3112-4 (DE-576)014411652 0021-8979 nnns volume:114 year:2013 number:15 day:21 month:10 pages:154101-154101 extent:1 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_22 GBV_ILN_59 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2185 GBV_ILN_2279 GBV_ILN_4319 AR 114 2013 15 21 10 154101-154101 1
allfieldsSound	sw131022_1 (DE-627)OLC1930077203 (DE-599)GBVOLC1930077203 DE-627 ger DE-627 rakwb 530 Midya, Kousik verfasserin aut Trap characterization of silicon nitride thin films by a modified trap spectroscopy technique 2013 1 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Dhar, Subhabrata oth Kottantharayil, Anil oth Enthalten in Journal of applied physics Melville, NY : AIP, 1937 114(2013), 15 vom: 21. Okt., Seite 154101-154101 (DE-627)129079030 (DE-600)3112-4 (DE-576)014411652 0021-8979 nnns volume:114 year:2013 number:15 day:21 month:10 pages:154101-154101 extent:1 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_22 GBV_ILN_59 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2185 GBV_ILN_2279 GBV_ILN_4319 AR 114 2013 15 21 10 154101-154101 1
source	Enthalten in Journal of applied physics 114(2013), 15 vom: 21. Okt., Seite 154101-154101 volume:114 year:2013 number:15 day:21 month:10 pages:154101-154101 extent:1
sourceStr	Enthalten in Journal of applied physics 114(2013), 15 vom: 21. Okt., Seite 154101-154101 volume:114 year:2013 number:15 day:21 month:10 pages:154101-154101 extent:1
format_phy_str_mv	Article
institution	findex.gbv.de
dewey-raw	530
isfreeaccess_bool	false
container_title	Journal of applied physics
authorswithroles_txt_mv	Midya, Kousik @@aut@@ Dhar, Subhabrata @@oth@@ Kottantharayil, Anil @@oth@@
publishDateDaySort_date	2013-10-21T00:00:00Z
hierarchy_top_id	129079030
dewey-sort	3530
id	OLC1930077203
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC1930077203</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230713232626.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">131119s2013 xx \|\|\|\|\| 00\| \|\|und c</controlfield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">sw131022_1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1930077203</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1930077203</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">530</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Midya, Kousik</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Trap characterization of silicon nitride thin films by a modified trap spectroscopy technique</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2013</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Dhar, Subhabrata</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kottantharayil, Anil</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Journal of applied physics</subfield><subfield code="d">Melville, NY : AIP, 1937</subfield><subfield code="g">114(2013), 15 vom: 21. Okt., Seite 154101-154101</subfield><subfield code="w">(DE-627)129079030</subfield><subfield code="w">(DE-600)3112-4</subfield><subfield code="w">(DE-576)014411652</subfield><subfield code="x">0021-8979</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:114</subfield><subfield code="g">year:2013</subfield><subfield code="g">number:15</subfield><subfield code="g">day:21</subfield><subfield code="g">month:10</subfield><subfield code="g">pages:154101-154101</subfield><subfield code="g">extent:1</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_59</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_170</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2004</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2185</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2279</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4319</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">114</subfield><subfield code="j">2013</subfield><subfield code="e">15</subfield><subfield code="b">21</subfield><subfield code="c">10</subfield><subfield code="h">154101-154101</subfield><subfield code="g">1</subfield></datafield></record></collection>
author	Midya, Kousik
spellingShingle	Midya, Kousik ddc 530 Trap characterization of silicon nitride thin films by a modified trap spectroscopy technique
authorStr	Midya, Kousik
ppnlink_with_tag_str_mv	@@773@@(DE-627)129079030
format	Article
dewey-ones	530 - Physics
delete_txt_mv	keep
author_role	aut
collection	OLC
remote_str	false
illustrated	Not Illustrated
issn	0021-8979
topic_title	530 Trap characterization of silicon nitride thin films by a modified trap spectroscopy technique
topic	ddc 530
topic_unstemmed	ddc 530
topic_browse	ddc 530
format_facet	Aufsätze Gedruckte Aufsätze
format_main_str_mv	Text Zeitschrift/Artikel
carriertype_str_mv	nc
author2_variant	s d sd a k ak
hierarchy_parent_title	Journal of applied physics
hierarchy_parent_id	129079030
dewey-tens	530 - Physics
hierarchy_top_title	Journal of applied physics
isfreeaccess_txt	false
familylinks_str_mv	(DE-627)129079030 (DE-600)3112-4 (DE-576)014411652
title	Trap characterization of silicon nitride thin films by a modified trap spectroscopy technique
ctrlnum	(DE-627)OLC1930077203 (DE-599)GBVOLC1930077203
title_full	Trap characterization of silicon nitride thin films by a modified trap spectroscopy technique
author_sort	Midya, Kousik
journal	Journal of applied physics
journalStr	Journal of applied physics
isOA_bool	false
dewey-hundreds	500 - Science
recordtype	marc
publishDateSort	2013
contenttype_str_mv	txt
container_start_page	154101
author_browse	Midya, Kousik
container_volume	114
physical	1
class	530
format_se	Aufsätze
author-letter	Midya, Kousik
dewey-full	530
title_sort	trap characterization of silicon nitride thin films by a modified trap spectroscopy technique
title_auth	Trap characterization of silicon nitride thin films by a modified trap spectroscopy technique
collection_details	GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_22 GBV_ILN_59 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2185 GBV_ILN_2279 GBV_ILN_4319
container_issue	15
title_short	Trap characterization of silicon nitride thin films by a modified trap spectroscopy technique
remote_bool	false
author2	Dhar, Subhabrata Kottantharayil, Anil
author2Str	Dhar, Subhabrata Kottantharayil, Anil
ppnlink	129079030
mediatype_str_mv	n
isOA_txt	false
hochschulschrift_bool	false
author2_role	oth oth
up_date	2024-07-04T01:27:59.877Z
_version_	1803609943444553728
fullrecord_marcxml	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC1930077203</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230713232626.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">131119s2013 xx \|\|\|\|\| 00\| \|\|und c</controlfield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">sw131022_1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1930077203</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1930077203</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">530</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Midya, Kousik</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Trap characterization of silicon nitride thin films by a modified trap spectroscopy technique</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2013</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Dhar, Subhabrata</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kottantharayil, Anil</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Journal of applied physics</subfield><subfield code="d">Melville, NY : AIP, 1937</subfield><subfield code="g">114(2013), 15 vom: 21. Okt., Seite 154101-154101</subfield><subfield code="w">(DE-627)129079030</subfield><subfield code="w">(DE-600)3112-4</subfield><subfield code="w">(DE-576)014411652</subfield><subfield code="x">0021-8979</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:114</subfield><subfield code="g">year:2013</subfield><subfield code="g">number:15</subfield><subfield code="g">day:21</subfield><subfield code="g">month:10</subfield><subfield code="g">pages:154101-154101</subfield><subfield code="g">extent:1</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_59</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_170</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2004</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2185</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2279</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4319</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">114</subfield><subfield code="j">2013</subfield><subfield code="e">15</subfield><subfield code="b">21</subfield><subfield code="c">10</subfield><subfield code="h">154101-154101</subfield><subfield code="g">1</subfield></datafield></record></collection>
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