Electrical Property of DNA Field-Effect Transistor: Charge Retention Property

Gespeichert in:

Autor*in:	Matsuo, Naoto [verfasserIn] Takagi, Shyogo Yamana, Kazushige Heya, Akira Takada, Tadao Yokoyama, Shin

Format:	Artikel

Erschienen:	2012

Systematik:	UA 4210.

Umfang:	1

Übergeordnetes Werk:	Enthalten in: Japanese journal of applied physics. Part 1, Regular papers, brief communications & review papers - Tokyo : Ōyō Butsuri Gakkai, 1982, 51(2012), 4, S vom: 1. Apr., Seite 4DD13
Übergeordnetes Werk:	volume:51 ; year:2012 ; number:4 ; day:1 ; month:04 ; supplement:S ; pages:4DD13 ; extent:1

Katalog-ID:	OLC1935438352

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