Measurements of Deflection and Residual Stress in Thin Films Utilizing Coherent Light Reflection/Projection Moiré Interferometry

Gespeichert in:

Autor*in:	Sciammarella, C A [verfasserIn] Boccaccio, A Lamberti, L Pappalettere, C Rizzo, A Signore, M A Valerini, D

Format:	Artikel

Erschienen:	2013

Umfang:	12

Übergeordnetes Werk:	Enthalten in: Proceedings of the Society for Experimental Mechanics - Bethel, Conn. : Soc., 1984, 70(2013), 2, Seite 977-988
Übergeordnetes Werk:	volume:70 ; year:2013 ; supplement:2 ; pages:977-988 ; extent:12

Katalog-ID:	OLC1944651675

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