Practical Aspects of EIK Technology

Gespeichert in:

Autor*in:	Berry, D [verfasserIn] Deng, H Dobbs, R Horoyski, P Hyttinen, M Kingsmill, A MacHattie, R Roitman, A Sokol, E Steer, B

Format:	Artikel

Erschienen:	2014

Umfang:	6

Übergeordnetes Werk:	Enthalten in: IEEE transactions on electron devices - New York, NY : IEEE, 1963, 61(2014), 6, Seite 1830-1835
Übergeordnetes Werk:	volume:61 ; year:2014 ; number:6 ; pages:1830-1835 ; extent:6

Katalog-ID:	OLC1945681349

Internformat


LEADER	01000caa a22002652 4500
001	OLC1945681349
003	DE-627
005	20210715151901.0
007	tu
008	140618s2014 xx \|\|\|\|\| 00\| \|\|und c
028	5	2	\|a sw140617_1
035			\|a (DE-627)OLC1945681349
035			\|a (DE-599)GBVOLC1945681349
035			\|a (KEY)0079428720140000061000601830practicalaspectsofeiktechnology
040			\|a DE-627 \|b ger \|c DE-627 \|e rakwb
082	0	4	\|a 620
100	1		\|a Berry, D \|e verfasserin \|4 aut
245	1	0	\|a Practical Aspects of EIK Technology
264		1	\|c 2014
300			\|a 6
336			\|a Text \|b txt \|2 rdacontent
337			\|a ohne Hilfsmittel zu benutzen \|b n \|2 rdamedia
338			\|a Band \|b nc \|2 rdacarrier
700	1		\|a Deng, H \|4 oth
700	1		\|a Dobbs, R \|4 oth
700	1		\|a Horoyski, P \|4 oth
700	1		\|a Hyttinen, M \|4 oth
700	1		\|a Kingsmill, A \|4 oth
700	1		\|a MacHattie, R \|4 oth
700	1		\|a Roitman, A \|4 oth
700	1		\|a Sokol, E \|4 oth
700	1		\|a Steer, B \|4 oth
773	0	8	\|i Enthalten in \|t IEEE transactions on electron devices \|d New York, NY : IEEE, 1963 \|g 61(2014), 6, Seite 1830-1835 \|w (DE-627)129602922 \|w (DE-600)241634-7 \|w (DE-576)015096734 \|x 0018-9383 \|7 nnns
773	1	8	\|g volume:61 \|g year:2014 \|g number:6 \|g pages:1830-1835 \|g extent:6
912			\|a GBV_USEFLAG_A
912			\|a SYSFLAG_A
912			\|a GBV_OLC
912			\|a SSG-OLC-TEC
912			\|a SSG-OLC-MAT
912			\|a GBV_ILN_70
912			\|a GBV_ILN_170
912			\|a GBV_ILN_2004
912			\|a GBV_ILN_4313
912			\|a GBV_ILN_4314
951			\|a AR
952			\|d 61 \|j 2014 \|e 6 \|h 1830-1835 \|g 6

Indexfelder

author_variant	d b db
matchkey_str	article:00189383:2014----::rciaapcsfi
hierarchy_sort_str	2014
publishDate	2014
allfields	sw140617_1 (DE-627)OLC1945681349 (DE-599)GBVOLC1945681349 (KEY)0079428720140000061000601830practicalaspectsofeiktechnology DE-627 ger DE-627 rakwb 620 Berry, D verfasserin aut Practical Aspects of EIK Technology 2014 6 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Deng, H oth Dobbs, R oth Horoyski, P oth Hyttinen, M oth Kingsmill, A oth MacHattie, R oth Roitman, A oth Sokol, E oth Steer, B oth Enthalten in IEEE transactions on electron devices New York, NY : IEEE, 1963 61(2014), 6, Seite 1830-1835 (DE-627)129602922 (DE-600)241634-7 (DE-576)015096734 0018-9383 nnns volume:61 year:2014 number:6 pages:1830-1835 extent:6 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_4313 GBV_ILN_4314 AR 61 2014 6 1830-1835 6
spelling	sw140617_1 (DE-627)OLC1945681349 (DE-599)GBVOLC1945681349 (KEY)0079428720140000061000601830practicalaspectsofeiktechnology DE-627 ger DE-627 rakwb 620 Berry, D verfasserin aut Practical Aspects of EIK Technology 2014 6 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Deng, H oth Dobbs, R oth Horoyski, P oth Hyttinen, M oth Kingsmill, A oth MacHattie, R oth Roitman, A oth Sokol, E oth Steer, B oth Enthalten in IEEE transactions on electron devices New York, NY : IEEE, 1963 61(2014), 6, Seite 1830-1835 (DE-627)129602922 (DE-600)241634-7 (DE-576)015096734 0018-9383 nnns volume:61 year:2014 number:6 pages:1830-1835 extent:6 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_4313 GBV_ILN_4314 AR 61 2014 6 1830-1835 6
allfields_unstemmed	sw140617_1 (DE-627)OLC1945681349 (DE-599)GBVOLC1945681349 (KEY)0079428720140000061000601830practicalaspectsofeiktechnology DE-627 ger DE-627 rakwb 620 Berry, D verfasserin aut Practical Aspects of EIK Technology 2014 6 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Deng, H oth Dobbs, R oth Horoyski, P oth Hyttinen, M oth Kingsmill, A oth MacHattie, R oth Roitman, A oth Sokol, E oth Steer, B oth Enthalten in IEEE transactions on electron devices New York, NY : IEEE, 1963 61(2014), 6, Seite 1830-1835 (DE-627)129602922 (DE-600)241634-7 (DE-576)015096734 0018-9383 nnns volume:61 year:2014 number:6 pages:1830-1835 extent:6 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_4313 GBV_ILN_4314 AR 61 2014 6 1830-1835 6
allfieldsGer	sw140617_1 (DE-627)OLC1945681349 (DE-599)GBVOLC1945681349 (KEY)0079428720140000061000601830practicalaspectsofeiktechnology DE-627 ger DE-627 rakwb 620 Berry, D verfasserin aut Practical Aspects of EIK Technology 2014 6 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Deng, H oth Dobbs, R oth Horoyski, P oth Hyttinen, M oth Kingsmill, A oth MacHattie, R oth Roitman, A oth Sokol, E oth Steer, B oth Enthalten in IEEE transactions on electron devices New York, NY : IEEE, 1963 61(2014), 6, Seite 1830-1835 (DE-627)129602922 (DE-600)241634-7 (DE-576)015096734 0018-9383 nnns volume:61 year:2014 number:6 pages:1830-1835 extent:6 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_4313 GBV_ILN_4314 AR 61 2014 6 1830-1835 6
allfieldsSound	sw140617_1 (DE-627)OLC1945681349 (DE-599)GBVOLC1945681349 (KEY)0079428720140000061000601830practicalaspectsofeiktechnology DE-627 ger DE-627 rakwb 620 Berry, D verfasserin aut Practical Aspects of EIK Technology 2014 6 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Deng, H oth Dobbs, R oth Horoyski, P oth Hyttinen, M oth Kingsmill, A oth MacHattie, R oth Roitman, A oth Sokol, E oth Steer, B oth Enthalten in IEEE transactions on electron devices New York, NY : IEEE, 1963 61(2014), 6, Seite 1830-1835 (DE-627)129602922 (DE-600)241634-7 (DE-576)015096734 0018-9383 nnns volume:61 year:2014 number:6 pages:1830-1835 extent:6 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_4313 GBV_ILN_4314 AR 61 2014 6 1830-1835 6
source	Enthalten in IEEE transactions on electron devices 61(2014), 6, Seite 1830-1835 volume:61 year:2014 number:6 pages:1830-1835 extent:6
sourceStr	Enthalten in IEEE transactions on electron devices 61(2014), 6, Seite 1830-1835 volume:61 year:2014 number:6 pages:1830-1835 extent:6
format_phy_str_mv	Article
institution	findex.gbv.de
dewey-raw	620
isfreeaccess_bool	false
container_title	IEEE transactions on electron devices
authorswithroles_txt_mv	Berry, D @@aut@@ Deng, H @@oth@@ Dobbs, R @@oth@@ Horoyski, P @@oth@@ Hyttinen, M @@oth@@ Kingsmill, A @@oth@@ MacHattie, R @@oth@@ Roitman, A @@oth@@ Sokol, E @@oth@@ Steer, B @@oth@@
publishDateDaySort_date	2014-01-01T00:00:00Z
hierarchy_top_id	129602922
dewey-sort	3620
id	OLC1945681349
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC1945681349</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20210715151901.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">140618s2014 xx \|\|\|\|\| 00\| \|\|und c</controlfield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">sw140617_1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1945681349</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1945681349</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(KEY)0079428720140000061000601830practicalaspectsofeiktechnology</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Berry, D</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Practical Aspects of EIK Technology</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2014</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">6</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Deng, H</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Dobbs, R</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Horoyski, P</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hyttinen, M</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kingsmill, A</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">MacHattie, R</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Roitman, A</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Sokol, E</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Steer, B</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">IEEE transactions on electron devices</subfield><subfield code="d">New York, NY : IEEE, 1963</subfield><subfield code="g">61(2014), 6, Seite 1830-1835</subfield><subfield code="w">(DE-627)129602922</subfield><subfield code="w">(DE-600)241634-7</subfield><subfield code="w">(DE-576)015096734</subfield><subfield code="x">0018-9383</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:61</subfield><subfield code="g">year:2014</subfield><subfield code="g">number:6</subfield><subfield code="g">pages:1830-1835</subfield><subfield code="g">extent:6</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-MAT</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_170</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2004</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4313</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4314</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">61</subfield><subfield code="j">2014</subfield><subfield code="e">6</subfield><subfield code="h">1830-1835</subfield><subfield code="g">6</subfield></datafield></record></collection>
author	Berry, D
spellingShingle	Berry, D ddc 620 Practical Aspects of EIK Technology
authorStr	Berry, D
ppnlink_with_tag_str_mv	@@773@@(DE-627)129602922
format	Article
dewey-ones	620 - Engineering & allied operations
delete_txt_mv	keep
author_role	aut
collection	OLC
remote_str	false
illustrated	Not Illustrated
issn	0018-9383
topic_title	620 Practical Aspects of EIK Technology
topic	ddc 620
topic_unstemmed	ddc 620
topic_browse	ddc 620
format_facet	Aufsätze Gedruckte Aufsätze
format_main_str_mv	Text Zeitschrift/Artikel
carriertype_str_mv	nc
author2_variant	h d hd r d rd p h ph m h mh a k ak r m rm a r ar e s es b s bs
hierarchy_parent_title	IEEE transactions on electron devices
hierarchy_parent_id	129602922
dewey-tens	620 - Engineering
hierarchy_top_title	IEEE transactions on electron devices
isfreeaccess_txt	false
familylinks_str_mv	(DE-627)129602922 (DE-600)241634-7 (DE-576)015096734
title	Practical Aspects of EIK Technology
ctrlnum	(DE-627)OLC1945681349 (DE-599)GBVOLC1945681349 (KEY)0079428720140000061000601830practicalaspectsofeiktechnology
title_full	Practical Aspects of EIK Technology
author_sort	Berry, D
journal	IEEE transactions on electron devices
journalStr	IEEE transactions on electron devices
isOA_bool	false
dewey-hundreds	600 - Technology
recordtype	marc
publishDateSort	2014
contenttype_str_mv	txt
container_start_page	1830
author_browse	Berry, D
container_volume	61
physical	6
class	620
format_se	Aufsätze
author-letter	Berry, D
dewey-full	620
title_sort	practical aspects of eik technology
title_auth	Practical Aspects of EIK Technology
collection_details	GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_4313 GBV_ILN_4314
container_issue	6
title_short	Practical Aspects of EIK Technology
remote_bool	false
author2	Deng, H Dobbs, R Horoyski, P Hyttinen, M Kingsmill, A MacHattie, R Roitman, A Sokol, E Steer, B
author2Str	Deng, H Dobbs, R Horoyski, P Hyttinen, M Kingsmill, A MacHattie, R Roitman, A Sokol, E Steer, B
ppnlink	129602922
mediatype_str_mv	n
isOA_txt	false
hochschulschrift_bool	false
author2_role	oth oth oth oth oth oth oth oth oth
up_date	2024-07-03T23:00:10.408Z
_version_	1803600643134324736
fullrecord_marcxml	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC1945681349</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20210715151901.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">140618s2014 xx \|\|\|\|\| 00\| \|\|und c</controlfield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">sw140617_1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1945681349</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1945681349</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(KEY)0079428720140000061000601830practicalaspectsofeiktechnology</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Berry, D</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Practical Aspects of EIK Technology</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2014</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">6</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Deng, H</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Dobbs, R</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Horoyski, P</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hyttinen, M</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kingsmill, A</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">MacHattie, R</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Roitman, A</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Sokol, E</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Steer, B</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">IEEE transactions on electron devices</subfield><subfield code="d">New York, NY : IEEE, 1963</subfield><subfield code="g">61(2014), 6, Seite 1830-1835</subfield><subfield code="w">(DE-627)129602922</subfield><subfield code="w">(DE-600)241634-7</subfield><subfield code="w">(DE-576)015096734</subfield><subfield code="x">0018-9383</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:61</subfield><subfield code="g">year:2014</subfield><subfield code="g">number:6</subfield><subfield code="g">pages:1830-1835</subfield><subfield code="g">extent:6</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-MAT</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_170</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2004</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4313</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4314</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">61</subfield><subfield code="j">2014</subfield><subfield code="e">6</subfield><subfield code="h">1830-1835</subfield><subfield code="g">6</subfield></datafield></record></collection>
score	7.399331

Nicht das Richtige dabei?

Schreiben Sie uns!

Practical Aspects of EIK Technology

Nicht das Richtige dabei?

Zugang & Verfügbarkeit

Vorhandene Bände

Nicht das Richtige dabei?