Three-dimensional simulation of scanning tunneling microscopy for semiconductor carrier and impurity profiling

Gespeichert in:

Autor*in:	Fukuda, K. [verfasserIn] Nishizawa, M. Tada, T. Bolotov, L. Suzuki, K. Satoh, S. Arimoto, H. Kanayama, T.

Format:	Artikel

Erschienen:	2014

Übergeordnetes Werk:	Enthalten in: Journal of applied physics - Melville, NY : AIP, 1937, 116(2014), 2 vom: 14. Juli, Seite 23701-23700
Übergeordnetes Werk:	volume:116 ; year:2014 ; number:2 ; day:14 ; month:07 ; pages:23701-23700

Katalog-ID:	OLC1946899283

Internformat


LEADER	01000caa a22002652 4500
001	OLC1946899283
003	DE-627
005	20230714121932.0
007	tu
008	140714s2014 xx \|\|\|\|\| 00\| \|\|und c
028	5	2	\|a sw140709_1
035			\|a (DE-627)OLC1946899283
035			\|a (DE-599)GBVOLC1946899283
035			\|a (KEY)0076740920140700116000223701threedimensionalsimulationofscanningtunnelingmicro
040			\|a DE-627 \|b ger \|c DE-627 \|e rakwb
082	0	4	\|a 530
100	1		\|a Fukuda, K. \|e verfasserin \|4 aut
245	1	0	\|a Three-dimensional simulation of scanning tunneling microscopy for semiconductor carrier and impurity profiling
264		1	\|c 2014
336			\|a Text \|b txt \|2 rdacontent
337			\|a ohne Hilfsmittel zu benutzen \|b n \|2 rdamedia
338			\|a Band \|b nc \|2 rdacarrier
700	1		\|a Nishizawa, M. \|4 oth
700	1		\|a Tada, T. \|4 oth
700	1		\|a Bolotov, L. \|4 oth
700	1		\|a Suzuki, K. \|4 oth
700	1		\|a Satoh, S. \|4 oth
700	1		\|a Arimoto, H. \|4 oth
700	1		\|a Kanayama, T. \|4 oth
773	0	8	\|i Enthalten in \|t Journal of applied physics \|d Melville, NY : AIP, 1937 \|g 116(2014), 2 vom: 14. Juli, Seite 23701-23700 \|w (DE-627)129079030 \|w (DE-600)3112-4 \|w (DE-576)014411652 \|x 0021-8979 \|7 nnns
773	1	8	\|g volume:116 \|g year:2014 \|g number:2 \|g day:14 \|g month:07 \|g pages:23701-23700
912			\|a GBV_USEFLAG_A
912			\|a SYSFLAG_A
912			\|a GBV_OLC
912			\|a SSG-OLC-PHY
912			\|a GBV_ILN_21
912			\|a GBV_ILN_22
912			\|a GBV_ILN_59
912			\|a GBV_ILN_70
912			\|a GBV_ILN_170
912			\|a GBV_ILN_2004
912			\|a GBV_ILN_2185
912			\|a GBV_ILN_2279
912			\|a GBV_ILN_4266
912			\|a GBV_ILN_4319
951			\|a AR
952			\|d 116 \|j 2014 \|e 2 \|b 14 \|c 7 \|h 23701-23700

Indexfelder

author_variant	k f kf
matchkey_str	article:00218979:2014----::hedmninliuainfcnigunlnmcocpfreiodcoc
hierarchy_sort_str	2014
publishDate	2014
allfields	sw140709_1 (DE-627)OLC1946899283 (DE-599)GBVOLC1946899283 (KEY)0076740920140700116000223701threedimensionalsimulationofscanningtunnelingmicro DE-627 ger DE-627 rakwb 530 Fukuda, K. verfasserin aut Three-dimensional simulation of scanning tunneling microscopy for semiconductor carrier and impurity profiling 2014 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Nishizawa, M. oth Tada, T. oth Bolotov, L. oth Suzuki, K. oth Satoh, S. oth Arimoto, H. oth Kanayama, T. oth Enthalten in Journal of applied physics Melville, NY : AIP, 1937 116(2014), 2 vom: 14. Juli, Seite 23701-23700 (DE-627)129079030 (DE-600)3112-4 (DE-576)014411652 0021-8979 nnns volume:116 year:2014 number:2 day:14 month:07 pages:23701-23700 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_21 GBV_ILN_22 GBV_ILN_59 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2185 GBV_ILN_2279 GBV_ILN_4266 GBV_ILN_4319 AR 116 2014 2 14 7 23701-23700
spelling	sw140709_1 (DE-627)OLC1946899283 (DE-599)GBVOLC1946899283 (KEY)0076740920140700116000223701threedimensionalsimulationofscanningtunnelingmicro DE-627 ger DE-627 rakwb 530 Fukuda, K. verfasserin aut Three-dimensional simulation of scanning tunneling microscopy for semiconductor carrier and impurity profiling 2014 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Nishizawa, M. oth Tada, T. oth Bolotov, L. oth Suzuki, K. oth Satoh, S. oth Arimoto, H. oth Kanayama, T. oth Enthalten in Journal of applied physics Melville, NY : AIP, 1937 116(2014), 2 vom: 14. Juli, Seite 23701-23700 (DE-627)129079030 (DE-600)3112-4 (DE-576)014411652 0021-8979 nnns volume:116 year:2014 number:2 day:14 month:07 pages:23701-23700 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_21 GBV_ILN_22 GBV_ILN_59 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2185 GBV_ILN_2279 GBV_ILN_4266 GBV_ILN_4319 AR 116 2014 2 14 7 23701-23700
allfields_unstemmed	sw140709_1 (DE-627)OLC1946899283 (DE-599)GBVOLC1946899283 (KEY)0076740920140700116000223701threedimensionalsimulationofscanningtunnelingmicro DE-627 ger DE-627 rakwb 530 Fukuda, K. verfasserin aut Three-dimensional simulation of scanning tunneling microscopy for semiconductor carrier and impurity profiling 2014 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Nishizawa, M. oth Tada, T. oth Bolotov, L. oth Suzuki, K. oth Satoh, S. oth Arimoto, H. oth Kanayama, T. oth Enthalten in Journal of applied physics Melville, NY : AIP, 1937 116(2014), 2 vom: 14. Juli, Seite 23701-23700 (DE-627)129079030 (DE-600)3112-4 (DE-576)014411652 0021-8979 nnns volume:116 year:2014 number:2 day:14 month:07 pages:23701-23700 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_21 GBV_ILN_22 GBV_ILN_59 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2185 GBV_ILN_2279 GBV_ILN_4266 GBV_ILN_4319 AR 116 2014 2 14 7 23701-23700
allfieldsGer	sw140709_1 (DE-627)OLC1946899283 (DE-599)GBVOLC1946899283 (KEY)0076740920140700116000223701threedimensionalsimulationofscanningtunnelingmicro DE-627 ger DE-627 rakwb 530 Fukuda, K. verfasserin aut Three-dimensional simulation of scanning tunneling microscopy for semiconductor carrier and impurity profiling 2014 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Nishizawa, M. oth Tada, T. oth Bolotov, L. oth Suzuki, K. oth Satoh, S. oth Arimoto, H. oth Kanayama, T. oth Enthalten in Journal of applied physics Melville, NY : AIP, 1937 116(2014), 2 vom: 14. Juli, Seite 23701-23700 (DE-627)129079030 (DE-600)3112-4 (DE-576)014411652 0021-8979 nnns volume:116 year:2014 number:2 day:14 month:07 pages:23701-23700 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_21 GBV_ILN_22 GBV_ILN_59 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2185 GBV_ILN_2279 GBV_ILN_4266 GBV_ILN_4319 AR 116 2014 2 14 7 23701-23700
allfieldsSound	sw140709_1 (DE-627)OLC1946899283 (DE-599)GBVOLC1946899283 (KEY)0076740920140700116000223701threedimensionalsimulationofscanningtunnelingmicro DE-627 ger DE-627 rakwb 530 Fukuda, K. verfasserin aut Three-dimensional simulation of scanning tunneling microscopy for semiconductor carrier and impurity profiling 2014 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Nishizawa, M. oth Tada, T. oth Bolotov, L. oth Suzuki, K. oth Satoh, S. oth Arimoto, H. oth Kanayama, T. oth Enthalten in Journal of applied physics Melville, NY : AIP, 1937 116(2014), 2 vom: 14. Juli, Seite 23701-23700 (DE-627)129079030 (DE-600)3112-4 (DE-576)014411652 0021-8979 nnns volume:116 year:2014 number:2 day:14 month:07 pages:23701-23700 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_21 GBV_ILN_22 GBV_ILN_59 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2185 GBV_ILN_2279 GBV_ILN_4266 GBV_ILN_4319 AR 116 2014 2 14 7 23701-23700
source	Enthalten in Journal of applied physics 116(2014), 2 vom: 14. Juli, Seite 23701-23700 volume:116 year:2014 number:2 day:14 month:07 pages:23701-23700
sourceStr	Enthalten in Journal of applied physics 116(2014), 2 vom: 14. Juli, Seite 23701-23700 volume:116 year:2014 number:2 day:14 month:07 pages:23701-23700
format_phy_str_mv	Article
institution	findex.gbv.de
dewey-raw	530
isfreeaccess_bool	false
container_title	Journal of applied physics
authorswithroles_txt_mv	Fukuda, K. @@aut@@ Nishizawa, M. @@oth@@ Tada, T. @@oth@@ Bolotov, L. @@oth@@ Suzuki, K. @@oth@@ Satoh, S. @@oth@@ Arimoto, H. @@oth@@ Kanayama, T. @@oth@@
publishDateDaySort_date	2014-07-14T00:00:00Z
hierarchy_top_id	129079030
dewey-sort	3530
id	OLC1946899283
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC1946899283</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230714121932.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">140714s2014 xx \|\|\|\|\| 00\| \|\|und c</controlfield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">sw140709_1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1946899283</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1946899283</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(KEY)0076740920140700116000223701threedimensionalsimulationofscanningtunnelingmicro</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">530</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Fukuda, K.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Three-dimensional simulation of scanning tunneling microscopy for semiconductor carrier and impurity profiling</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2014</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Nishizawa, M.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Tada, T.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Bolotov, L.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Suzuki, K.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Satoh, S.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Arimoto, H.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kanayama, T.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Journal of applied physics</subfield><subfield code="d">Melville, NY : AIP, 1937</subfield><subfield code="g">116(2014), 2 vom: 14. Juli, Seite 23701-23700</subfield><subfield code="w">(DE-627)129079030</subfield><subfield code="w">(DE-600)3112-4</subfield><subfield code="w">(DE-576)014411652</subfield><subfield code="x">0021-8979</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:116</subfield><subfield code="g">year:2014</subfield><subfield code="g">number:2</subfield><subfield code="g">day:14</subfield><subfield code="g">month:07</subfield><subfield code="g">pages:23701-23700</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_21</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_59</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_170</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2004</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2185</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2279</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4266</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4319</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">116</subfield><subfield code="j">2014</subfield><subfield code="e">2</subfield><subfield code="b">14</subfield><subfield code="c">7</subfield><subfield code="h">23701-23700</subfield></datafield></record></collection>
author	Fukuda, K.
spellingShingle	Fukuda, K. ddc 530 Three-dimensional simulation of scanning tunneling microscopy for semiconductor carrier and impurity profiling
authorStr	Fukuda, K.
ppnlink_with_tag_str_mv	@@773@@(DE-627)129079030
format	Article
dewey-ones	530 - Physics
delete_txt_mv	keep
author_role	aut
collection	OLC
remote_str	false
illustrated	Not Illustrated
issn	0021-8979
topic_title	530 Three-dimensional simulation of scanning tunneling microscopy for semiconductor carrier and impurity profiling
topic	ddc 530
topic_unstemmed	ddc 530
topic_browse	ddc 530
format_facet	Aufsätze Gedruckte Aufsätze
format_main_str_mv	Text Zeitschrift/Artikel
carriertype_str_mv	nc
author2_variant	m n mn t t tt l b lb k s ks s s ss h a ha t k tk
hierarchy_parent_title	Journal of applied physics
hierarchy_parent_id	129079030
dewey-tens	530 - Physics
hierarchy_top_title	Journal of applied physics
isfreeaccess_txt	false
familylinks_str_mv	(DE-627)129079030 (DE-600)3112-4 (DE-576)014411652
title	Three-dimensional simulation of scanning tunneling microscopy for semiconductor carrier and impurity profiling
ctrlnum	(DE-627)OLC1946899283 (DE-599)GBVOLC1946899283 (KEY)0076740920140700116000223701threedimensionalsimulationofscanningtunnelingmicro
title_full	Three-dimensional simulation of scanning tunneling microscopy for semiconductor carrier and impurity profiling
author_sort	Fukuda, K.
journal	Journal of applied physics
journalStr	Journal of applied physics
isOA_bool	false
dewey-hundreds	500 - Science
recordtype	marc
publishDateSort	2014
contenttype_str_mv	txt
container_start_page	23701
author_browse	Fukuda, K.
container_volume	116
class	530
format_se	Aufsätze
author-letter	Fukuda, K.
dewey-full	530
title_sort	three-dimensional simulation of scanning tunneling microscopy for semiconductor carrier and impurity profiling
title_auth	Three-dimensional simulation of scanning tunneling microscopy for semiconductor carrier and impurity profiling
collection_details	GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_21 GBV_ILN_22 GBV_ILN_59 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2185 GBV_ILN_2279 GBV_ILN_4266 GBV_ILN_4319
container_issue	2
title_short	Three-dimensional simulation of scanning tunneling microscopy for semiconductor carrier and impurity profiling
remote_bool	false
author2	Nishizawa, M. Tada, T. Bolotov, L. Suzuki, K. Satoh, S. Arimoto, H. Kanayama, T.
author2Str	Nishizawa, M. Tada, T. Bolotov, L. Suzuki, K. Satoh, S. Arimoto, H. Kanayama, T.
ppnlink	129079030
mediatype_str_mv	n
isOA_txt	false
hochschulschrift_bool	false
author2_role	oth oth oth oth oth oth oth
up_date	2024-07-04T01:45:48.106Z
_version_	1803611063561748480
fullrecord_marcxml	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC1946899283</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230714121932.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">140714s2014 xx \|\|\|\|\| 00\| \|\|und c</controlfield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">sw140709_1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1946899283</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1946899283</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(KEY)0076740920140700116000223701threedimensionalsimulationofscanningtunnelingmicro</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">530</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Fukuda, K.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Three-dimensional simulation of scanning tunneling microscopy for semiconductor carrier and impurity profiling</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2014</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Nishizawa, M.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Tada, T.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Bolotov, L.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Suzuki, K.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Satoh, S.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Arimoto, H.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kanayama, T.</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Journal of applied physics</subfield><subfield code="d">Melville, NY : AIP, 1937</subfield><subfield code="g">116(2014), 2 vom: 14. Juli, Seite 23701-23700</subfield><subfield code="w">(DE-627)129079030</subfield><subfield code="w">(DE-600)3112-4</subfield><subfield code="w">(DE-576)014411652</subfield><subfield code="x">0021-8979</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:116</subfield><subfield code="g">year:2014</subfield><subfield code="g">number:2</subfield><subfield code="g">day:14</subfield><subfield code="g">month:07</subfield><subfield code="g">pages:23701-23700</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_21</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_59</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_170</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2004</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2185</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2279</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4266</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4319</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">116</subfield><subfield code="j">2014</subfield><subfield code="e">2</subfield><subfield code="b">14</subfield><subfield code="c">7</subfield><subfield code="h">23701-23700</subfield></datafield></record></collection>
score	7.397993

Nicht das Richtige dabei?

Schreiben Sie uns!

Three-dimensional simulation of scanning tunneling microscopy for semiconductor carrier and impurity profiling

Nicht das Richtige dabei?

Zugang & Verfügbarkeit

Vorhandene Bände

Nicht das Richtige dabei?