Determination of thicknesses and refractive indices of polymer thin films by multiple incident media ellipsometry

Gespeichert in:

Autor*in:	Karabiyik, Ufuk [verfasserIn] Mao, Min Satija, Sushil K. Esker, Alan R.

Format:	Artikel

Erschienen:	2014

Umfang:	7

Übergeordnetes Werk:	Enthalten in: Thin solid films - Amsterdam [u.a.] Elsevier, 1967, 565(2014) vom: 28. Aug., Seite 72-78
Übergeordnetes Werk:	volume:565 ; year:2014 ; day:28 ; month:08 ; pages:72-78 ; extent:7

Katalog-ID:	OLC194872166X

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