Effect of field cooling process and ion-beam bombardment on the exchange bias of NiCo/(Ni, Co)O bilayers
Gespeichert in:
| Autor*in: |
Li, X. [verfasserIn] |
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| Format: |
Artikel |
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| Erschienen: |
2014 |
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| Umfang: |
7 |
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| Übergeordnetes Werk: |
Enthalten in: Thin solid films - Amsterdam [u.a.] Elsevier, 1967, 570(2014) vom: 3. Nov., Seite 383-389 |
|---|---|
| Übergeordnetes Werk: |
volume:570 ; year:2014 ; day:3 ; month:11 ; pages:383-389 ; extent:7 |
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