AFM applications to study the morphology of HfO2 multilayer thin films

Gespeichert in:

Autor*in:	Ramzan, M [verfasserIn] Ahmed, E Niaz, N.A Rana, A.M Bhatti, A.S Khalid, N.R Nadeem, M.Y

Format:	Artikel
Sprache:	Englisch

Erschienen:	2015

Übergeordnetes Werk:	Enthalten in: Superlattices and microstructures - Oxford [u.a.] : Elsevier Science, Academic Press, 1985, 82(2015), Seite 399-405
Übergeordnetes Werk:	volume:82 ; year:2015 ; pages:399-405

Links:	Volltext

DOI / URN:	10.1016/j.spmi.2015.02.030

Katalog-ID:	OLC1957165626

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