Trace phase detection and strain characterization from serial X-ray free-electron laser crystallography of a Pr0.5Ca0.5MnO3 powder

We report on the analysis of virtual powder-diffraction patterns from serial femtosecond crystallography (SFX) data collected at an X-ray free-electron laser. Different approaches to binning and normalizing these patterns are discussed with respect to the microstructural characteristics which each h...
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Autor*in:	Kenneth R Beyerlein [verfasserIn] Christian Jooss Anton Barty Richard Bean Sébastien Boutet Sarnjeet S Dhesi R Bruce Doak Michael Först Lorenzo Galli Richard A Kirian Joseph Kozak Michael Lang Roman Mankowsky Marc Messerschmidt John C H Spence Dingjie Wang Uwe Weierstall Thomas A White Garth J Williams Oleksandr Yefanov Nadia A Zatsepin Andrea Cavalleri Henry N Chapman

Format:	Artikel
Sprache:	Englisch

Erschienen:	2015

Schlagwörter:	X-ray free-electron lasers strain characterization serial crystallography nanocrystalline materials trace phase detection quantitative phase analysis manganite

Übergeordnetes Werk:	Enthalten in: Powder diffraction - Swarthmore, Pa. : JCPDS, 1986, 30(2015), S1, Seite S25-S30
Übergeordnetes Werk:	volume:30 ; year:2015 ; number:S1 ; pages:S25-S30

Links:	Volltext Link aufrufen

DOI / URN:	10.1017/S0885715614001171

Katalog-ID:	OLC1957494778

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520			\|a We report on the analysis of virtual powder-diffraction patterns from serial femtosecond crystallography (SFX) data collected at an X-ray free-electron laser. Different approaches to binning and normalizing these patterns are discussed with respect to the microstructural characteristics which each highlights. Analysis of SFX data from a powder of Pr0.5Ca0.5MnO3 in this way finds evidence of other trace phases in its microstructure which was not detectable in a standard powder-diffraction measurement. Furthermore, a comparison between two virtual powder pattern integration strategies is shown to yield different diffraction peak broadening, indicating sensitivity to different types of microstrain. This paper is a first step in developing new data analysis methods for microstructure characterization from serial crystallography data.
650		4	\|a X-ray free-electron lasers
650		4	\|a strain characterization
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language	English
source	Enthalten in Powder diffraction 30(2015), S1, Seite S25-S30 volume:30 year:2015 number:S1 pages:S25-S30
sourceStr	Enthalten in Powder diffraction 30(2015), S1, Seite S25-S30 volume:30 year:2015 number:S1 pages:S25-S30
format_phy_str_mv	Article
institution	findex.gbv.de
topic_facet	X-ray free-electron lasers strain characterization serial crystallography nanocrystalline materials trace phase detection quantitative phase analysis manganite
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container_title	Powder diffraction
authorswithroles_txt_mv	Kenneth R Beyerlein @@aut@@ Christian Jooss @@oth@@ Anton Barty @@oth@@ Richard Bean @@oth@@ Sébastien Boutet @@oth@@ Sarnjeet S Dhesi @@oth@@ R Bruce Doak @@oth@@ Michael Först @@oth@@ Lorenzo Galli @@oth@@ Richard A Kirian @@oth@@ Joseph Kozak @@oth@@ Michael Lang @@oth@@ Roman Mankowsky @@oth@@ Marc Messerschmidt @@oth@@ John C H Spence @@oth@@ Dingjie Wang @@oth@@ Uwe Weierstall @@oth@@ Thomas A White @@oth@@ Garth J Williams @@oth@@ Oleksandr Yefanov @@oth@@ Nadia A Zatsepin @@oth@@ Andrea Cavalleri @@oth@@ Henry N Chapman @@oth@@
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author	Kenneth R Beyerlein
spellingShingle	Kenneth R Beyerlein ddc 540 misc X-ray free-electron lasers misc strain characterization misc serial crystallography misc nanocrystalline materials misc trace phase detection misc quantitative phase analysis misc manganite Trace phase detection and strain characterization from serial X-ray free-electron laser crystallography of a Pr0.5Ca0.5MnO3 powder
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topic_title	540 530 DNB Trace phase detection and strain characterization from serial X-ray free-electron laser crystallography of a Pr0.5Ca0.5MnO3 powder X-ray free-electron lasers strain characterization serial crystallography nanocrystalline materials trace phase detection quantitative phase analysis manganite
topic	ddc 540 misc X-ray free-electron lasers misc strain characterization misc serial crystallography misc nanocrystalline materials misc trace phase detection misc quantitative phase analysis misc manganite
topic_unstemmed	ddc 540 misc X-ray free-electron lasers misc strain characterization misc serial crystallography misc nanocrystalline materials misc trace phase detection misc quantitative phase analysis misc manganite
topic_browse	ddc 540 misc X-ray free-electron lasers misc strain characterization misc serial crystallography misc nanocrystalline materials misc trace phase detection misc quantitative phase analysis misc manganite
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title	Trace phase detection and strain characterization from serial X-ray free-electron laser crystallography of a Pr0.5Ca0.5MnO3 powder
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title_full	Trace phase detection and strain characterization from serial X-ray free-electron laser crystallography of a Pr0.5Ca0.5MnO3 powder
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title_sort	trace phase detection and strain characterization from serial x-ray free-electron laser crystallography of a pr0.5ca0.5mno3 powder
title_auth	Trace phase detection and strain characterization from serial X-ray free-electron laser crystallography of a Pr0.5Ca0.5MnO3 powder
abstract	We report on the analysis of virtual powder-diffraction patterns from serial femtosecond crystallography (SFX) data collected at an X-ray free-electron laser. Different approaches to binning and normalizing these patterns are discussed with respect to the microstructural characteristics which each highlights. Analysis of SFX data from a powder of Pr0.5Ca0.5MnO3 in this way finds evidence of other trace phases in its microstructure which was not detectable in a standard powder-diffraction measurement. Furthermore, a comparison between two virtual powder pattern integration strategies is shown to yield different diffraction peak broadening, indicating sensitivity to different types of microstrain. This paper is a first step in developing new data analysis methods for microstructure characterization from serial crystallography data.
abstractGer	We report on the analysis of virtual powder-diffraction patterns from serial femtosecond crystallography (SFX) data collected at an X-ray free-electron laser. Different approaches to binning and normalizing these patterns are discussed with respect to the microstructural characteristics which each highlights. Analysis of SFX data from a powder of Pr0.5Ca0.5MnO3 in this way finds evidence of other trace phases in its microstructure which was not detectable in a standard powder-diffraction measurement. Furthermore, a comparison between two virtual powder pattern integration strategies is shown to yield different diffraction peak broadening, indicating sensitivity to different types of microstrain. This paper is a first step in developing new data analysis methods for microstructure characterization from serial crystallography data.
abstract_unstemmed	We report on the analysis of virtual powder-diffraction patterns from serial femtosecond crystallography (SFX) data collected at an X-ray free-electron laser. Different approaches to binning and normalizing these patterns are discussed with respect to the microstructural characteristics which each highlights. Analysis of SFX data from a powder of Pr0.5Ca0.5MnO3 in this way finds evidence of other trace phases in its microstructure which was not detectable in a standard powder-diffraction measurement. Furthermore, a comparison between two virtual powder pattern integration strategies is shown to yield different diffraction peak broadening, indicating sensitivity to different types of microstrain. This paper is a first step in developing new data analysis methods for microstructure characterization from serial crystallography data.
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container_issue	S1
title_short	Trace phase detection and strain characterization from serial X-ray free-electron laser crystallography of a Pr0.5Ca0.5MnO3 powder
url	http://dx.doi.org/10.1017/S0885715614001171 http://search.proquest.com/docview/1682356822
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author2	Christian Jooss Anton Barty Richard Bean Sébastien Boutet Sarnjeet S Dhesi R Bruce Doak Michael Först Lorenzo Galli Richard A Kirian Joseph Kozak Michael Lang Roman Mankowsky Marc Messerschmidt John C H Spence Dingjie Wang Uwe Weierstall Thomas A White Garth J Williams Oleksandr Yefanov Nadia A Zatsepin Andrea Cavalleri Henry N Chapman
author2Str	Christian Jooss Anton Barty Richard Bean Sébastien Boutet Sarnjeet S Dhesi R Bruce Doak Michael Först Lorenzo Galli Richard A Kirian Joseph Kozak Michael Lang Roman Mankowsky Marc Messerschmidt John C H Spence Dingjie Wang Uwe Weierstall Thomas A White Garth J Williams Oleksandr Yefanov Nadia A Zatsepin Andrea Cavalleri Henry N Chapman
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doi_str	10.1017/S0885715614001171
up_date	2024-07-04T00:26:51.215Z
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