Trace phase detection and strain characterization from serial X-ray free-electron laser crystallography of a Pr0.5Ca0.5MnO3 powder
We report on the analysis of virtual powder-diffraction patterns from serial femtosecond crystallography (SFX) data collected at an X-ray free-electron laser. Different approaches to binning and normalizing these patterns are discussed with respect to the microstructural characteristics which each h...
Ausführliche Beschreibung
Autor*in: |
Kenneth R Beyerlein [verfasserIn] |
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Artikel |
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Sprache: |
Englisch |
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2015 |
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Übergeordnetes Werk: |
Enthalten in: Powder diffraction - Swarthmore, Pa. : JCPDS, 1986, 30(2015), S1, Seite S25-S30 |
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Übergeordnetes Werk: |
volume:30 ; year:2015 ; number:S1 ; pages:S25-S30 |
Links: |
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DOI / URN: |
10.1017/S0885715614001171 |
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Katalog-ID: |
OLC1957494778 |
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520 | |a We report on the analysis of virtual powder-diffraction patterns from serial femtosecond crystallography (SFX) data collected at an X-ray free-electron laser. Different approaches to binning and normalizing these patterns are discussed with respect to the microstructural characteristics which each highlights. Analysis of SFX data from a powder of Pr0.5Ca0.5MnO3 in this way finds evidence of other trace phases in its microstructure which was not detectable in a standard powder-diffraction measurement. Furthermore, a comparison between two virtual powder pattern integration strategies is shown to yield different diffraction peak broadening, indicating sensitivity to different types of microstrain. This paper is a first step in developing new data analysis methods for microstructure characterization from serial crystallography data. | ||
650 | 4 | |a X-ray free-electron lasers | |
650 | 4 | |a strain characterization | |
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Enthalten in Powder diffraction 30(2015), S1, Seite S25-S30 volume:30 year:2015 number:S1 pages:S25-S30 |
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Enthalten in Powder diffraction 30(2015), S1, Seite S25-S30 volume:30 year:2015 number:S1 pages:S25-S30 |
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Kenneth R Beyerlein @@aut@@ Christian Jooss @@oth@@ Anton Barty @@oth@@ Richard Bean @@oth@@ Sébastien Boutet @@oth@@ Sarnjeet S Dhesi @@oth@@ R Bruce Doak @@oth@@ Michael Först @@oth@@ Lorenzo Galli @@oth@@ Richard A Kirian @@oth@@ Joseph Kozak @@oth@@ Michael Lang @@oth@@ Roman Mankowsky @@oth@@ Marc Messerschmidt @@oth@@ John C H Spence @@oth@@ Dingjie Wang @@oth@@ Uwe Weierstall @@oth@@ Thomas A White @@oth@@ Garth J Williams @@oth@@ Oleksandr Yefanov @@oth@@ Nadia A Zatsepin @@oth@@ Andrea Cavalleri @@oth@@ Henry N Chapman @@oth@@ |
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Kenneth R Beyerlein ddc 540 misc X-ray free-electron lasers misc strain characterization misc serial crystallography misc nanocrystalline materials misc trace phase detection misc quantitative phase analysis misc manganite Trace phase detection and strain characterization from serial X-ray free-electron laser crystallography of a Pr0.5Ca0.5MnO3 powder |
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540 530 DNB Trace phase detection and strain characterization from serial X-ray free-electron laser crystallography of a Pr0.5Ca0.5MnO3 powder X-ray free-electron lasers strain characterization serial crystallography nanocrystalline materials trace phase detection quantitative phase analysis manganite |
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Trace phase detection and strain characterization from serial X-ray free-electron laser crystallography of a Pr0.5Ca0.5MnO3 powder |
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Trace phase detection and strain characterization from serial X-ray free-electron laser crystallography of a Pr0.5Ca0.5MnO3 powder |
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trace phase detection and strain characterization from serial x-ray free-electron laser crystallography of a pr0.5ca0.5mno3 powder |
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Trace phase detection and strain characterization from serial X-ray free-electron laser crystallography of a Pr0.5Ca0.5MnO3 powder |
abstract |
We report on the analysis of virtual powder-diffraction patterns from serial femtosecond crystallography (SFX) data collected at an X-ray free-electron laser. Different approaches to binning and normalizing these patterns are discussed with respect to the microstructural characteristics which each highlights. Analysis of SFX data from a powder of Pr0.5Ca0.5MnO3 in this way finds evidence of other trace phases in its microstructure which was not detectable in a standard powder-diffraction measurement. Furthermore, a comparison between two virtual powder pattern integration strategies is shown to yield different diffraction peak broadening, indicating sensitivity to different types of microstrain. This paper is a first step in developing new data analysis methods for microstructure characterization from serial crystallography data. |
abstractGer |
We report on the analysis of virtual powder-diffraction patterns from serial femtosecond crystallography (SFX) data collected at an X-ray free-electron laser. Different approaches to binning and normalizing these patterns are discussed with respect to the microstructural characteristics which each highlights. Analysis of SFX data from a powder of Pr0.5Ca0.5MnO3 in this way finds evidence of other trace phases in its microstructure which was not detectable in a standard powder-diffraction measurement. Furthermore, a comparison between two virtual powder pattern integration strategies is shown to yield different diffraction peak broadening, indicating sensitivity to different types of microstrain. This paper is a first step in developing new data analysis methods for microstructure characterization from serial crystallography data. |
abstract_unstemmed |
We report on the analysis of virtual powder-diffraction patterns from serial femtosecond crystallography (SFX) data collected at an X-ray free-electron laser. Different approaches to binning and normalizing these patterns are discussed with respect to the microstructural characteristics which each highlights. Analysis of SFX data from a powder of Pr0.5Ca0.5MnO3 in this way finds evidence of other trace phases in its microstructure which was not detectable in a standard powder-diffraction measurement. Furthermore, a comparison between two virtual powder pattern integration strategies is shown to yield different diffraction peak broadening, indicating sensitivity to different types of microstrain. This paper is a first step in developing new data analysis methods for microstructure characterization from serial crystallography data. |
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S1 |
title_short |
Trace phase detection and strain characterization from serial X-ray free-electron laser crystallography of a Pr0.5Ca0.5MnO3 powder |
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http://dx.doi.org/10.1017/S0885715614001171 http://search.proquest.com/docview/1682356822 |
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Christian Jooss Anton Barty Richard Bean Sébastien Boutet Sarnjeet S Dhesi R Bruce Doak Michael Först Lorenzo Galli Richard A Kirian Joseph Kozak Michael Lang Roman Mankowsky Marc Messerschmidt John C H Spence Dingjie Wang Uwe Weierstall Thomas A White Garth J Williams Oleksandr Yefanov Nadia A Zatsepin Andrea Cavalleri Henry N Chapman |
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