Time-Dependent Detection of the Refractive Index Distribution of Nonlinear Optical Materials

The refractive index distribution (RID) measurement reveals detailed RI information and flaws on the sample. The time-dependent detection of the light- and thermal-induced RI change process of nonlinear optical materials was quantitatively studied by the scanning focused refractive index microscopy...
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Autor*in:	Sun, Tengqian [verfasserIn] Ye, Qing Wang, Xiaowan Wang, Jin Deng, Zhichao Liu, Shike Yang, Qilin Mei, Jianchun Zhou, Wenyuan Zhang, Chunping Tian, Jianguo

Format:	Artikel
Sprache:	Englisch

Erschienen:	2016

Schlagwörter:	Optical variables control Optical microscopy Optical materials photothermal effects Microscopy Nonlinear optics Optical refraction Refractive index Optical variables measurement

Übergeordnetes Werk:	Enthalten in: IEEE photonics technology letters - New York, NY : IEEE, 1989, 28(2016), 3, Seite 260-263
Übergeordnetes Werk:	volume:28 ; year:2016 ; number:3 ; pages:260-263

Links:	Volltext Link aufrufen Link aufrufen

DOI / URN:	10.1109/LPT.2015.2494591

Katalog-ID:	OLC1958220167

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520			\|a The refractive index distribution (RID) measurement reveals detailed RI information and flaws on the sample. The time-dependent detection of the light- and thermal-induced RI change process of nonlinear optical materials was quantitatively studied by the scanning focused refractive index microscopy (SFRIM). The light- and thermal-induced RI change can be distinguished by means of curve fitting. Our method is compared with the traditional Z-scan technique, which can only measure the mean RI change across the sample. The experimental results show that the time-dependent detection of RID by SFRIM can provide a new point of view toward the investigation of nonlinear optical materials.
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700	1		\|a Liu, Shike \|4 oth
700	1		\|a Yang, Qilin \|4 oth
700	1		\|a Mei, Jianchun \|4 oth
700	1		\|a Zhou, Wenyuan \|4 oth
700	1		\|a Zhang, Chunping \|4 oth
700	1		\|a Tian, Jianguo \|4 oth
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allfields	10.1109/LPT.2015.2494591 doi PQ20160430 (DE-627)OLC1958220167 (DE-599)GBVOLC1958220167 (PRQ)c1272-46609f0ed36b153d87ef8a36e32a91edcca946fc9102e485ad389164be53a8320 (KEY)0175401720160000028000300260timedependentdetectionoftherefractiveindexdistribu DE-627 ger DE-627 rakwb eng 620 DNB 33.38 bkl 53.54 bkl Sun, Tengqian verfasserin aut Time-Dependent Detection of the Refractive Index Distribution of Nonlinear Optical Materials 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The refractive index distribution (RID) measurement reveals detailed RI information and flaws on the sample. The time-dependent detection of the light- and thermal-induced RI change process of nonlinear optical materials was quantitatively studied by the scanning focused refractive index microscopy (SFRIM). The light- and thermal-induced RI change can be distinguished by means of curve fitting. Our method is compared with the traditional Z-scan technique, which can only measure the mean RI change across the sample. The experimental results show that the time-dependent detection of RID by SFRIM can provide a new point of view toward the investigation of nonlinear optical materials. Optical variables control Optical microscopy Optical materials photothermal effects Microscopy Nonlinear optics Optical refraction Refractive index Optical variables measurement Ye, Qing oth Wang, Xiaowan oth Wang, Jin oth Deng, Zhichao oth Liu, Shike oth Yang, Qilin oth Mei, Jianchun oth Zhou, Wenyuan oth Zhang, Chunping oth Tian, Jianguo oth Enthalten in IEEE photonics technology letters New York, NY : IEEE, 1989 28(2016), 3, Seite 260-263 (DE-627)129622567 (DE-600)246805-0 (DE-576)018141765 1041-1135 nnns volume:28 year:2016 number:3 pages:260-263 http://dx.doi.org/10.1109/LPT.2015.2494591 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7307116 http://search.proquest.com/docview/1751302822 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_21 GBV_ILN_70 GBV_ILN_231 33.38 AVZ 53.54 AVZ AR 28 2016 3 260-263
spelling	10.1109/LPT.2015.2494591 doi PQ20160430 (DE-627)OLC1958220167 (DE-599)GBVOLC1958220167 (PRQ)c1272-46609f0ed36b153d87ef8a36e32a91edcca946fc9102e485ad389164be53a8320 (KEY)0175401720160000028000300260timedependentdetectionoftherefractiveindexdistribu DE-627 ger DE-627 rakwb eng 620 DNB 33.38 bkl 53.54 bkl Sun, Tengqian verfasserin aut Time-Dependent Detection of the Refractive Index Distribution of Nonlinear Optical Materials 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The refractive index distribution (RID) measurement reveals detailed RI information and flaws on the sample. The time-dependent detection of the light- and thermal-induced RI change process of nonlinear optical materials was quantitatively studied by the scanning focused refractive index microscopy (SFRIM). The light- and thermal-induced RI change can be distinguished by means of curve fitting. Our method is compared with the traditional Z-scan technique, which can only measure the mean RI change across the sample. The experimental results show that the time-dependent detection of RID by SFRIM can provide a new point of view toward the investigation of nonlinear optical materials. Optical variables control Optical microscopy Optical materials photothermal effects Microscopy Nonlinear optics Optical refraction Refractive index Optical variables measurement Ye, Qing oth Wang, Xiaowan oth Wang, Jin oth Deng, Zhichao oth Liu, Shike oth Yang, Qilin oth Mei, Jianchun oth Zhou, Wenyuan oth Zhang, Chunping oth Tian, Jianguo oth Enthalten in IEEE photonics technology letters New York, NY : IEEE, 1989 28(2016), 3, Seite 260-263 (DE-627)129622567 (DE-600)246805-0 (DE-576)018141765 1041-1135 nnns volume:28 year:2016 number:3 pages:260-263 http://dx.doi.org/10.1109/LPT.2015.2494591 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7307116 http://search.proquest.com/docview/1751302822 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_21 GBV_ILN_70 GBV_ILN_231 33.38 AVZ 53.54 AVZ AR 28 2016 3 260-263
allfields_unstemmed	10.1109/LPT.2015.2494591 doi PQ20160430 (DE-627)OLC1958220167 (DE-599)GBVOLC1958220167 (PRQ)c1272-46609f0ed36b153d87ef8a36e32a91edcca946fc9102e485ad389164be53a8320 (KEY)0175401720160000028000300260timedependentdetectionoftherefractiveindexdistribu DE-627 ger DE-627 rakwb eng 620 DNB 33.38 bkl 53.54 bkl Sun, Tengqian verfasserin aut Time-Dependent Detection of the Refractive Index Distribution of Nonlinear Optical Materials 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The refractive index distribution (RID) measurement reveals detailed RI information and flaws on the sample. The time-dependent detection of the light- and thermal-induced RI change process of nonlinear optical materials was quantitatively studied by the scanning focused refractive index microscopy (SFRIM). The light- and thermal-induced RI change can be distinguished by means of curve fitting. Our method is compared with the traditional Z-scan technique, which can only measure the mean RI change across the sample. The experimental results show that the time-dependent detection of RID by SFRIM can provide a new point of view toward the investigation of nonlinear optical materials. Optical variables control Optical microscopy Optical materials photothermal effects Microscopy Nonlinear optics Optical refraction Refractive index Optical variables measurement Ye, Qing oth Wang, Xiaowan oth Wang, Jin oth Deng, Zhichao oth Liu, Shike oth Yang, Qilin oth Mei, Jianchun oth Zhou, Wenyuan oth Zhang, Chunping oth Tian, Jianguo oth Enthalten in IEEE photonics technology letters New York, NY : IEEE, 1989 28(2016), 3, Seite 260-263 (DE-627)129622567 (DE-600)246805-0 (DE-576)018141765 1041-1135 nnns volume:28 year:2016 number:3 pages:260-263 http://dx.doi.org/10.1109/LPT.2015.2494591 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7307116 http://search.proquest.com/docview/1751302822 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_21 GBV_ILN_70 GBV_ILN_231 33.38 AVZ 53.54 AVZ AR 28 2016 3 260-263
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allfieldsSound	10.1109/LPT.2015.2494591 doi PQ20160430 (DE-627)OLC1958220167 (DE-599)GBVOLC1958220167 (PRQ)c1272-46609f0ed36b153d87ef8a36e32a91edcca946fc9102e485ad389164be53a8320 (KEY)0175401720160000028000300260timedependentdetectionoftherefractiveindexdistribu DE-627 ger DE-627 rakwb eng 620 DNB 33.38 bkl 53.54 bkl Sun, Tengqian verfasserin aut Time-Dependent Detection of the Refractive Index Distribution of Nonlinear Optical Materials 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The refractive index distribution (RID) measurement reveals detailed RI information and flaws on the sample. The time-dependent detection of the light- and thermal-induced RI change process of nonlinear optical materials was quantitatively studied by the scanning focused refractive index microscopy (SFRIM). The light- and thermal-induced RI change can be distinguished by means of curve fitting. Our method is compared with the traditional Z-scan technique, which can only measure the mean RI change across the sample. The experimental results show that the time-dependent detection of RID by SFRIM can provide a new point of view toward the investigation of nonlinear optical materials. Optical variables control Optical microscopy Optical materials photothermal effects Microscopy Nonlinear optics Optical refraction Refractive index Optical variables measurement Ye, Qing oth Wang, Xiaowan oth Wang, Jin oth Deng, Zhichao oth Liu, Shike oth Yang, Qilin oth Mei, Jianchun oth Zhou, Wenyuan oth Zhang, Chunping oth Tian, Jianguo oth Enthalten in IEEE photonics technology letters New York, NY : IEEE, 1989 28(2016), 3, Seite 260-263 (DE-627)129622567 (DE-600)246805-0 (DE-576)018141765 1041-1135 nnns volume:28 year:2016 number:3 pages:260-263 http://dx.doi.org/10.1109/LPT.2015.2494591 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7307116 http://search.proquest.com/docview/1751302822 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_21 GBV_ILN_70 GBV_ILN_231 33.38 AVZ 53.54 AVZ AR 28 2016 3 260-263
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author	Sun, Tengqian
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topic_title	620 DNB 33.38 bkl 53.54 bkl Time-Dependent Detection of the Refractive Index Distribution of Nonlinear Optical Materials Optical variables control Optical microscopy Optical materials photothermal effects Microscopy Nonlinear optics Optical refraction Refractive index Optical variables measurement
topic	ddc 620 bkl 33.38 bkl 53.54 misc Optical variables control misc Optical microscopy misc Optical materials misc photothermal effects misc Microscopy misc Nonlinear optics misc Optical refraction misc Refractive index misc Optical variables measurement
topic_unstemmed	ddc 620 bkl 33.38 bkl 53.54 misc Optical variables control misc Optical microscopy misc Optical materials misc photothermal effects misc Microscopy misc Nonlinear optics misc Optical refraction misc Refractive index misc Optical variables measurement
topic_browse	ddc 620 bkl 33.38 bkl 53.54 misc Optical variables control misc Optical microscopy misc Optical materials misc photothermal effects misc Microscopy misc Nonlinear optics misc Optical refraction misc Refractive index misc Optical variables measurement
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title	Time-Dependent Detection of the Refractive Index Distribution of Nonlinear Optical Materials
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title_full	Time-Dependent Detection of the Refractive Index Distribution of Nonlinear Optical Materials
author_sort	Sun, Tengqian
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doi_str_mv	10.1109/LPT.2015.2494591
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title_sort	time-dependent detection of the refractive index distribution of nonlinear optical materials
title_auth	Time-Dependent Detection of the Refractive Index Distribution of Nonlinear Optical Materials
abstract	The refractive index distribution (RID) measurement reveals detailed RI information and flaws on the sample. The time-dependent detection of the light- and thermal-induced RI change process of nonlinear optical materials was quantitatively studied by the scanning focused refractive index microscopy (SFRIM). The light- and thermal-induced RI change can be distinguished by means of curve fitting. Our method is compared with the traditional Z-scan technique, which can only measure the mean RI change across the sample. The experimental results show that the time-dependent detection of RID by SFRIM can provide a new point of view toward the investigation of nonlinear optical materials.
abstractGer	The refractive index distribution (RID) measurement reveals detailed RI information and flaws on the sample. The time-dependent detection of the light- and thermal-induced RI change process of nonlinear optical materials was quantitatively studied by the scanning focused refractive index microscopy (SFRIM). The light- and thermal-induced RI change can be distinguished by means of curve fitting. Our method is compared with the traditional Z-scan technique, which can only measure the mean RI change across the sample. The experimental results show that the time-dependent detection of RID by SFRIM can provide a new point of view toward the investigation of nonlinear optical materials.
abstract_unstemmed	The refractive index distribution (RID) measurement reveals detailed RI information and flaws on the sample. The time-dependent detection of the light- and thermal-induced RI change process of nonlinear optical materials was quantitatively studied by the scanning focused refractive index microscopy (SFRIM). The light- and thermal-induced RI change can be distinguished by means of curve fitting. Our method is compared with the traditional Z-scan technique, which can only measure the mean RI change across the sample. The experimental results show that the time-dependent detection of RID by SFRIM can provide a new point of view toward the investigation of nonlinear optical materials.
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title_short	Time-Dependent Detection of the Refractive Index Distribution of Nonlinear Optical Materials
url	http://dx.doi.org/10.1109/LPT.2015.2494591 http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7307116 http://search.proquest.com/docview/1751302822
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author2	Ye, Qing Wang, Xiaowan Wang, Jin Deng, Zhichao Liu, Shike Yang, Qilin Mei, Jianchun Zhou, Wenyuan Zhang, Chunping Tian, Jianguo
author2Str	Ye, Qing Wang, Xiaowan Wang, Jin Deng, Zhichao Liu, Shike Yang, Qilin Mei, Jianchun Zhou, Wenyuan Zhang, Chunping Tian, Jianguo
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doi_str	10.1109/LPT.2015.2494591
up_date	2024-07-04T02:23:20.074Z
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