Investigation of in-depth and surface properties of polyethyleneterephthalate thin films after SHI and gamma radiation treatment by means of PALS and AFM studies

Gespeichert in:

Autor*in:	Singh, Paramjit [verfasserIn] Kumar, Rajesh Nambissan, P.M.G

Format:	Artikel
Sprache:	Englisch

Erschienen:	2015

Übergeordnetes Werk:	Enthalten in: Vacuum - Kidlington : Elsevier Science, 1951, 115(2015), Seite 31-38
Übergeordnetes Werk:	volume:115 ; year:2015 ; pages:31-38

Links:	Volltext

DOI / URN:	10.1016/j.vacuum.2015.01.021

Katalog-ID:	OLC1962863948

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title	Investigation of in-depth and surface properties of polyethyleneterephthalate thin films after SHI and gamma radiation treatment by means of PALS and AFM studies
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title_sort	investigation of in-depth and surface properties of polyethyleneterephthalate thin films after shi and gamma radiation treatment by means of pals and afm studies
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title_short	Investigation of in-depth and surface properties of polyethyleneterephthalate thin films after SHI and gamma radiation treatment by means of PALS and AFM studies
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