Contributed review: Review of integrated correlative light and electron microscopy
New developments in the field of microscopy enable to acquire increasing amounts of information from large sample areas and at an increased resolution. Depending on the nature of the technique, the information may reveal morphological, structural, chemical, and still other sample characteristics. In...
Ausführliche Beschreibung
Autor*in: |
Timmermans, F J [verfasserIn] |
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Format: |
Artikel |
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Sprache: |
Englisch |
Erschienen: |
2015 |
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Schlagwörter: |
Imaging, Three-Dimensional - methods Electron Microscope Tomography - instrumentation Spectrum Analysis, Raman - instrumentation Imaging, Three-Dimensional - instrumentation |
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Übergeordnetes Werk: |
Enthalten in: Review of scientific instruments - Melville, NY : AIP, 1930, 86(2015), 1 |
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Übergeordnetes Werk: |
volume:86 ; year:2015 ; number:1 |
Links: |
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DOI / URN: |
10.1063/1.4905434 |
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Katalog-ID: |
OLC1963354621 |
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530 620 DNB Contributed review: Review of integrated correlative light and electron microscopy Microscopy - instrumentation Microscopy - methods Imaging, Three-Dimensional - methods Electron Microscope Tomography - instrumentation Spectrum Analysis, Raman - instrumentation Imaging, Three-Dimensional - instrumentation Spectrum Analysis, Raman - methods Electron Microscope Tomography - methods |
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ddc 530 misc Microscopy - instrumentation misc Microscopy - methods misc Imaging, Three-Dimensional - methods misc Electron Microscope Tomography - instrumentation misc Spectrum Analysis, Raman - instrumentation misc Imaging, Three-Dimensional - instrumentation misc Spectrum Analysis, Raman - methods misc Electron Microscope Tomography - methods |
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ddc 530 misc Microscopy - instrumentation misc Microscopy - methods misc Imaging, Three-Dimensional - methods misc Electron Microscope Tomography - instrumentation misc Spectrum Analysis, Raman - instrumentation misc Imaging, Three-Dimensional - instrumentation misc Spectrum Analysis, Raman - methods misc Electron Microscope Tomography - methods |
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ddc 530 misc Microscopy - instrumentation misc Microscopy - methods misc Imaging, Three-Dimensional - methods misc Electron Microscope Tomography - instrumentation misc Spectrum Analysis, Raman - instrumentation misc Imaging, Three-Dimensional - instrumentation misc Spectrum Analysis, Raman - methods misc Electron Microscope Tomography - methods |
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Contributed review: Review of integrated correlative light and electron microscopy |
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contributed review: review of integrated correlative light and electron microscopy |
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Contributed review: Review of integrated correlative light and electron microscopy |
abstract |
New developments in the field of microscopy enable to acquire increasing amounts of information from large sample areas and at an increased resolution. Depending on the nature of the technique, the information may reveal morphological, structural, chemical, and still other sample characteristics. In research fields, such as cell biology and materials science, there is an increasing demand to correlate these individual levels of information and in this way to obtain a better understanding of sample preparation and specific sample properties. To address this need, integrated systems were developed that combine nanometer resolution electron microscopes with optical microscopes, which produce chemically or label specific information through spectroscopy. The complementary information from electron microscopy and light microscopy presents an opportunity to investigate a broad range of sample properties in a correlated fashion. An important part of correlating the differences in information lies in bridging the different resolution and image contrast features. The trend to analyse samples using multiple correlated microscopes has resulted in a new research field. Current research is focused, for instance, on (a) the investigation of samples with nanometer scale distribution of inorganic and organic materials, (b) live cell analysis combined with electron microscopy, and (c) in situ spectroscopic and electron microscopy analysis of catalytic materials, but more areas will benefit from integrated correlative microscopy. |
abstractGer |
New developments in the field of microscopy enable to acquire increasing amounts of information from large sample areas and at an increased resolution. Depending on the nature of the technique, the information may reveal morphological, structural, chemical, and still other sample characteristics. In research fields, such as cell biology and materials science, there is an increasing demand to correlate these individual levels of information and in this way to obtain a better understanding of sample preparation and specific sample properties. To address this need, integrated systems were developed that combine nanometer resolution electron microscopes with optical microscopes, which produce chemically or label specific information through spectroscopy. The complementary information from electron microscopy and light microscopy presents an opportunity to investigate a broad range of sample properties in a correlated fashion. An important part of correlating the differences in information lies in bridging the different resolution and image contrast features. The trend to analyse samples using multiple correlated microscopes has resulted in a new research field. Current research is focused, for instance, on (a) the investigation of samples with nanometer scale distribution of inorganic and organic materials, (b) live cell analysis combined with electron microscopy, and (c) in situ spectroscopic and electron microscopy analysis of catalytic materials, but more areas will benefit from integrated correlative microscopy. |
abstract_unstemmed |
New developments in the field of microscopy enable to acquire increasing amounts of information from large sample areas and at an increased resolution. Depending on the nature of the technique, the information may reveal morphological, structural, chemical, and still other sample characteristics. In research fields, such as cell biology and materials science, there is an increasing demand to correlate these individual levels of information and in this way to obtain a better understanding of sample preparation and specific sample properties. To address this need, integrated systems were developed that combine nanometer resolution electron microscopes with optical microscopes, which produce chemically or label specific information through spectroscopy. The complementary information from electron microscopy and light microscopy presents an opportunity to investigate a broad range of sample properties in a correlated fashion. An important part of correlating the differences in information lies in bridging the different resolution and image contrast features. The trend to analyse samples using multiple correlated microscopes has resulted in a new research field. Current research is focused, for instance, on (a) the investigation of samples with nanometer scale distribution of inorganic and organic materials, (b) live cell analysis combined with electron microscopy, and (c) in situ spectroscopic and electron microscopy analysis of catalytic materials, but more areas will benefit from integrated correlative microscopy. |
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Contributed review: Review of integrated correlative light and electron microscopy |
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