Alternative configuration scheme for signal amplification with scanning ion conductance microscopy
Scanning Ion Conductance Microscopy (SICM) is an emerging nanotechnology tool to investigate the morphology and charge transport properties of nanomaterials, including soft matter. SICM uses an electrolyte filled nanopipette as a scanning probe and detects current changes based on the distance betwe...
Ausführliche Beschreibung
Autor*in: |
Kim, Joonhui [verfasserIn] |
---|
Format: |
Artikel |
---|---|
Sprache: |
Englisch |
Erschienen: |
2015 |
---|
Schlagwörter: |
---|
Übergeordnetes Werk: |
Enthalten in: Review of scientific instruments - Melville, NY : AIP, 1930, 86(2015), 2 |
---|---|
Übergeordnetes Werk: |
volume:86 ; year:2015 ; number:2 |
Links: |
---|
DOI / URN: |
10.1063/1.4907360 |
---|
Katalog-ID: |
OLC1963355032 |
---|
LEADER | 01000caa a2200265 4500 | ||
---|---|---|---|
001 | OLC1963355032 | ||
003 | DE-627 | ||
005 | 20230714160910.0 | ||
007 | tu | ||
008 | 160206s2015 xx ||||| 00| ||eng c | ||
024 | 7 | |a 10.1063/1.4907360 |2 doi | |
028 | 5 | 2 | |a PQ20160617 |
035 | |a (DE-627)OLC1963355032 | ||
035 | |a (DE-599)GBVOLC1963355032 | ||
035 | |a (PRQ)c1175-8262f7ed578f5de6aaf21b4fd08b4d78a86a290afa5c6b0f347e17ec3632832b0 | ||
035 | |a (KEY)0016010520150000086000200000alternativeconfigurationschemeforsignalamplificati | ||
040 | |a DE-627 |b ger |c DE-627 |e rakwb | ||
041 | |a eng | ||
082 | 0 | 4 | |a 530 |a 620 |q DNB |
100 | 1 | |a Kim, Joonhui |e verfasserin |4 aut | |
245 | 1 | 0 | |a Alternative configuration scheme for signal amplification with scanning ion conductance microscopy |
264 | 1 | |c 2015 | |
336 | |a Text |b txt |2 rdacontent | ||
337 | |a ohne Hilfsmittel zu benutzen |b n |2 rdamedia | ||
338 | |a Band |b nc |2 rdacarrier | ||
520 | |a Scanning Ion Conductance Microscopy (SICM) is an emerging nanotechnology tool to investigate the morphology and charge transport properties of nanomaterials, including soft matter. SICM uses an electrolyte filled nanopipette as a scanning probe and detects current changes based on the distance between the nanopipette apex and the target sample in an electrolyte solution. In conventional SICM, the pipette sensor is excited by applying voltage as it raster scans near the surface. There have been attempts to improve upon raster scanning because it can induce collisions between the pipette sidewalls and target sample, especially for soft, dynamic materials (e.g., biological cells). Recently, Novak et al. demonstrated that hopping probe ion conductance microscopy (HPICM) with an adaptive scan method can improve the image quality obtained by SICM for such materials. However, HPICM is inherently slower than conventional raster scanning. In order to optimize both image quality and scanning speed, we report the development of an alternative configuration scheme for SICM signal amplification that is based on applying current to the nanopipette. This scheme overcomes traditional challenges associated with low bandwidth requirements of conventional SICM. Using our alternative scheme, we demonstrate successful imaging of L929 fibroblast cells and discuss the capabilities of this instrument configuration for future applications. | ||
650 | 4 | |a Microscopy - instrumentation | |
650 | 4 | |a Nanotechnology - instrumentation | |
700 | 1 | |a Kim, Seong-Oh |4 oth | |
700 | 1 | |a Cho, Nam-Joon |4 oth | |
773 | 0 | 8 | |i Enthalten in |t Review of scientific instruments |d Melville, NY : AIP, 1930 |g 86(2015), 2 |w (DE-627)129509175 |w (DE-600)209865-9 |w (DE-576)014915782 |x 0034-6748 |7 nnns |
773 | 1 | 8 | |g volume:86 |g year:2015 |g number:2 |
856 | 4 | 1 | |u http://dx.doi.org/10.1063/1.4907360 |3 Volltext |
856 | 4 | 2 | |u http://www.ncbi.nlm.nih.gov/pubmed/25725851 |
912 | |a GBV_USEFLAG_A | ||
912 | |a SYSFLAG_A | ||
912 | |a GBV_OLC | ||
912 | |a SSG-OLC-TEC | ||
912 | |a SSG-OLC-PHY | ||
912 | |a GBV_ILN_21 | ||
912 | |a GBV_ILN_47 | ||
912 | |a GBV_ILN_59 | ||
912 | |a GBV_ILN_70 | ||
912 | |a GBV_ILN_170 | ||
912 | |a GBV_ILN_2219 | ||
912 | |a GBV_ILN_2279 | ||
912 | |a GBV_ILN_4306 | ||
912 | |a GBV_ILN_4310 | ||
951 | |a AR | ||
952 | |d 86 |j 2015 |e 2 |
author_variant |
j k jk |
---|---|
matchkey_str |
article:00346748:2015----::lentvcniuainceeosgaapiiainihcnigo |
hierarchy_sort_str |
2015 |
publishDate |
2015 |
allfields |
10.1063/1.4907360 doi PQ20160617 (DE-627)OLC1963355032 (DE-599)GBVOLC1963355032 (PRQ)c1175-8262f7ed578f5de6aaf21b4fd08b4d78a86a290afa5c6b0f347e17ec3632832b0 (KEY)0016010520150000086000200000alternativeconfigurationschemeforsignalamplificati DE-627 ger DE-627 rakwb eng 530 620 DNB Kim, Joonhui verfasserin aut Alternative configuration scheme for signal amplification with scanning ion conductance microscopy 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Scanning Ion Conductance Microscopy (SICM) is an emerging nanotechnology tool to investigate the morphology and charge transport properties of nanomaterials, including soft matter. SICM uses an electrolyte filled nanopipette as a scanning probe and detects current changes based on the distance between the nanopipette apex and the target sample in an electrolyte solution. In conventional SICM, the pipette sensor is excited by applying voltage as it raster scans near the surface. There have been attempts to improve upon raster scanning because it can induce collisions between the pipette sidewalls and target sample, especially for soft, dynamic materials (e.g., biological cells). Recently, Novak et al. demonstrated that hopping probe ion conductance microscopy (HPICM) with an adaptive scan method can improve the image quality obtained by SICM for such materials. However, HPICM is inherently slower than conventional raster scanning. In order to optimize both image quality and scanning speed, we report the development of an alternative configuration scheme for SICM signal amplification that is based on applying current to the nanopipette. This scheme overcomes traditional challenges associated with low bandwidth requirements of conventional SICM. Using our alternative scheme, we demonstrate successful imaging of L929 fibroblast cells and discuss the capabilities of this instrument configuration for future applications. Microscopy - instrumentation Nanotechnology - instrumentation Kim, Seong-Oh oth Cho, Nam-Joon oth Enthalten in Review of scientific instruments Melville, NY : AIP, 1930 86(2015), 2 (DE-627)129509175 (DE-600)209865-9 (DE-576)014915782 0034-6748 nnns volume:86 year:2015 number:2 http://dx.doi.org/10.1063/1.4907360 Volltext http://www.ncbi.nlm.nih.gov/pubmed/25725851 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_21 GBV_ILN_47 GBV_ILN_59 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2219 GBV_ILN_2279 GBV_ILN_4306 GBV_ILN_4310 AR 86 2015 2 |
spelling |
10.1063/1.4907360 doi PQ20160617 (DE-627)OLC1963355032 (DE-599)GBVOLC1963355032 (PRQ)c1175-8262f7ed578f5de6aaf21b4fd08b4d78a86a290afa5c6b0f347e17ec3632832b0 (KEY)0016010520150000086000200000alternativeconfigurationschemeforsignalamplificati DE-627 ger DE-627 rakwb eng 530 620 DNB Kim, Joonhui verfasserin aut Alternative configuration scheme for signal amplification with scanning ion conductance microscopy 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Scanning Ion Conductance Microscopy (SICM) is an emerging nanotechnology tool to investigate the morphology and charge transport properties of nanomaterials, including soft matter. SICM uses an electrolyte filled nanopipette as a scanning probe and detects current changes based on the distance between the nanopipette apex and the target sample in an electrolyte solution. In conventional SICM, the pipette sensor is excited by applying voltage as it raster scans near the surface. There have been attempts to improve upon raster scanning because it can induce collisions between the pipette sidewalls and target sample, especially for soft, dynamic materials (e.g., biological cells). Recently, Novak et al. demonstrated that hopping probe ion conductance microscopy (HPICM) with an adaptive scan method can improve the image quality obtained by SICM for such materials. However, HPICM is inherently slower than conventional raster scanning. In order to optimize both image quality and scanning speed, we report the development of an alternative configuration scheme for SICM signal amplification that is based on applying current to the nanopipette. This scheme overcomes traditional challenges associated with low bandwidth requirements of conventional SICM. Using our alternative scheme, we demonstrate successful imaging of L929 fibroblast cells and discuss the capabilities of this instrument configuration for future applications. Microscopy - instrumentation Nanotechnology - instrumentation Kim, Seong-Oh oth Cho, Nam-Joon oth Enthalten in Review of scientific instruments Melville, NY : AIP, 1930 86(2015), 2 (DE-627)129509175 (DE-600)209865-9 (DE-576)014915782 0034-6748 nnns volume:86 year:2015 number:2 http://dx.doi.org/10.1063/1.4907360 Volltext http://www.ncbi.nlm.nih.gov/pubmed/25725851 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_21 GBV_ILN_47 GBV_ILN_59 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2219 GBV_ILN_2279 GBV_ILN_4306 GBV_ILN_4310 AR 86 2015 2 |
allfields_unstemmed |
10.1063/1.4907360 doi PQ20160617 (DE-627)OLC1963355032 (DE-599)GBVOLC1963355032 (PRQ)c1175-8262f7ed578f5de6aaf21b4fd08b4d78a86a290afa5c6b0f347e17ec3632832b0 (KEY)0016010520150000086000200000alternativeconfigurationschemeforsignalamplificati DE-627 ger DE-627 rakwb eng 530 620 DNB Kim, Joonhui verfasserin aut Alternative configuration scheme for signal amplification with scanning ion conductance microscopy 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Scanning Ion Conductance Microscopy (SICM) is an emerging nanotechnology tool to investigate the morphology and charge transport properties of nanomaterials, including soft matter. SICM uses an electrolyte filled nanopipette as a scanning probe and detects current changes based on the distance between the nanopipette apex and the target sample in an electrolyte solution. In conventional SICM, the pipette sensor is excited by applying voltage as it raster scans near the surface. There have been attempts to improve upon raster scanning because it can induce collisions between the pipette sidewalls and target sample, especially for soft, dynamic materials (e.g., biological cells). Recently, Novak et al. demonstrated that hopping probe ion conductance microscopy (HPICM) with an adaptive scan method can improve the image quality obtained by SICM for such materials. However, HPICM is inherently slower than conventional raster scanning. In order to optimize both image quality and scanning speed, we report the development of an alternative configuration scheme for SICM signal amplification that is based on applying current to the nanopipette. This scheme overcomes traditional challenges associated with low bandwidth requirements of conventional SICM. Using our alternative scheme, we demonstrate successful imaging of L929 fibroblast cells and discuss the capabilities of this instrument configuration for future applications. Microscopy - instrumentation Nanotechnology - instrumentation Kim, Seong-Oh oth Cho, Nam-Joon oth Enthalten in Review of scientific instruments Melville, NY : AIP, 1930 86(2015), 2 (DE-627)129509175 (DE-600)209865-9 (DE-576)014915782 0034-6748 nnns volume:86 year:2015 number:2 http://dx.doi.org/10.1063/1.4907360 Volltext http://www.ncbi.nlm.nih.gov/pubmed/25725851 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_21 GBV_ILN_47 GBV_ILN_59 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2219 GBV_ILN_2279 GBV_ILN_4306 GBV_ILN_4310 AR 86 2015 2 |
allfieldsGer |
10.1063/1.4907360 doi PQ20160617 (DE-627)OLC1963355032 (DE-599)GBVOLC1963355032 (PRQ)c1175-8262f7ed578f5de6aaf21b4fd08b4d78a86a290afa5c6b0f347e17ec3632832b0 (KEY)0016010520150000086000200000alternativeconfigurationschemeforsignalamplificati DE-627 ger DE-627 rakwb eng 530 620 DNB Kim, Joonhui verfasserin aut Alternative configuration scheme for signal amplification with scanning ion conductance microscopy 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Scanning Ion Conductance Microscopy (SICM) is an emerging nanotechnology tool to investigate the morphology and charge transport properties of nanomaterials, including soft matter. SICM uses an electrolyte filled nanopipette as a scanning probe and detects current changes based on the distance between the nanopipette apex and the target sample in an electrolyte solution. In conventional SICM, the pipette sensor is excited by applying voltage as it raster scans near the surface. There have been attempts to improve upon raster scanning because it can induce collisions between the pipette sidewalls and target sample, especially for soft, dynamic materials (e.g., biological cells). Recently, Novak et al. demonstrated that hopping probe ion conductance microscopy (HPICM) with an adaptive scan method can improve the image quality obtained by SICM for such materials. However, HPICM is inherently slower than conventional raster scanning. In order to optimize both image quality and scanning speed, we report the development of an alternative configuration scheme for SICM signal amplification that is based on applying current to the nanopipette. This scheme overcomes traditional challenges associated with low bandwidth requirements of conventional SICM. Using our alternative scheme, we demonstrate successful imaging of L929 fibroblast cells and discuss the capabilities of this instrument configuration for future applications. Microscopy - instrumentation Nanotechnology - instrumentation Kim, Seong-Oh oth Cho, Nam-Joon oth Enthalten in Review of scientific instruments Melville, NY : AIP, 1930 86(2015), 2 (DE-627)129509175 (DE-600)209865-9 (DE-576)014915782 0034-6748 nnns volume:86 year:2015 number:2 http://dx.doi.org/10.1063/1.4907360 Volltext http://www.ncbi.nlm.nih.gov/pubmed/25725851 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_21 GBV_ILN_47 GBV_ILN_59 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2219 GBV_ILN_2279 GBV_ILN_4306 GBV_ILN_4310 AR 86 2015 2 |
allfieldsSound |
10.1063/1.4907360 doi PQ20160617 (DE-627)OLC1963355032 (DE-599)GBVOLC1963355032 (PRQ)c1175-8262f7ed578f5de6aaf21b4fd08b4d78a86a290afa5c6b0f347e17ec3632832b0 (KEY)0016010520150000086000200000alternativeconfigurationschemeforsignalamplificati DE-627 ger DE-627 rakwb eng 530 620 DNB Kim, Joonhui verfasserin aut Alternative configuration scheme for signal amplification with scanning ion conductance microscopy 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Scanning Ion Conductance Microscopy (SICM) is an emerging nanotechnology tool to investigate the morphology and charge transport properties of nanomaterials, including soft matter. SICM uses an electrolyte filled nanopipette as a scanning probe and detects current changes based on the distance between the nanopipette apex and the target sample in an electrolyte solution. In conventional SICM, the pipette sensor is excited by applying voltage as it raster scans near the surface. There have been attempts to improve upon raster scanning because it can induce collisions between the pipette sidewalls and target sample, especially for soft, dynamic materials (e.g., biological cells). Recently, Novak et al. demonstrated that hopping probe ion conductance microscopy (HPICM) with an adaptive scan method can improve the image quality obtained by SICM for such materials. However, HPICM is inherently slower than conventional raster scanning. In order to optimize both image quality and scanning speed, we report the development of an alternative configuration scheme for SICM signal amplification that is based on applying current to the nanopipette. This scheme overcomes traditional challenges associated with low bandwidth requirements of conventional SICM. Using our alternative scheme, we demonstrate successful imaging of L929 fibroblast cells and discuss the capabilities of this instrument configuration for future applications. Microscopy - instrumentation Nanotechnology - instrumentation Kim, Seong-Oh oth Cho, Nam-Joon oth Enthalten in Review of scientific instruments Melville, NY : AIP, 1930 86(2015), 2 (DE-627)129509175 (DE-600)209865-9 (DE-576)014915782 0034-6748 nnns volume:86 year:2015 number:2 http://dx.doi.org/10.1063/1.4907360 Volltext http://www.ncbi.nlm.nih.gov/pubmed/25725851 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_21 GBV_ILN_47 GBV_ILN_59 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2219 GBV_ILN_2279 GBV_ILN_4306 GBV_ILN_4310 AR 86 2015 2 |
language |
English |
source |
Enthalten in Review of scientific instruments 86(2015), 2 volume:86 year:2015 number:2 |
sourceStr |
Enthalten in Review of scientific instruments 86(2015), 2 volume:86 year:2015 number:2 |
format_phy_str_mv |
Article |
institution |
findex.gbv.de |
topic_facet |
Microscopy - instrumentation Nanotechnology - instrumentation |
dewey-raw |
530 |
isfreeaccess_bool |
false |
container_title |
Review of scientific instruments |
authorswithroles_txt_mv |
Kim, Joonhui @@aut@@ Kim, Seong-Oh @@oth@@ Cho, Nam-Joon @@oth@@ |
publishDateDaySort_date |
2015-01-01T00:00:00Z |
hierarchy_top_id |
129509175 |
dewey-sort |
3530 |
id |
OLC1963355032 |
language_de |
englisch |
fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a2200265 4500</leader><controlfield tag="001">OLC1963355032</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230714160910.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">160206s2015 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1063/1.4907360</subfield><subfield code="2">doi</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">PQ20160617</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1963355032</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1963355032</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(PRQ)c1175-8262f7ed578f5de6aaf21b4fd08b4d78a86a290afa5c6b0f347e17ec3632832b0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(KEY)0016010520150000086000200000alternativeconfigurationschemeforsignalamplificati</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">530</subfield><subfield code="a">620</subfield><subfield code="q">DNB</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Kim, Joonhui</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Alternative configuration scheme for signal amplification with scanning ion conductance microscopy</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2015</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Scanning Ion Conductance Microscopy (SICM) is an emerging nanotechnology tool to investigate the morphology and charge transport properties of nanomaterials, including soft matter. SICM uses an electrolyte filled nanopipette as a scanning probe and detects current changes based on the distance between the nanopipette apex and the target sample in an electrolyte solution. In conventional SICM, the pipette sensor is excited by applying voltage as it raster scans near the surface. There have been attempts to improve upon raster scanning because it can induce collisions between the pipette sidewalls and target sample, especially for soft, dynamic materials (e.g., biological cells). Recently, Novak et al. demonstrated that hopping probe ion conductance microscopy (HPICM) with an adaptive scan method can improve the image quality obtained by SICM for such materials. However, HPICM is inherently slower than conventional raster scanning. In order to optimize both image quality and scanning speed, we report the development of an alternative configuration scheme for SICM signal amplification that is based on applying current to the nanopipette. This scheme overcomes traditional challenges associated with low bandwidth requirements of conventional SICM. Using our alternative scheme, we demonstrate successful imaging of L929 fibroblast cells and discuss the capabilities of this instrument configuration for future applications.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy - instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Nanotechnology - instrumentation</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kim, Seong-Oh</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Cho, Nam-Joon</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Review of scientific instruments</subfield><subfield code="d">Melville, NY : AIP, 1930</subfield><subfield code="g">86(2015), 2</subfield><subfield code="w">(DE-627)129509175</subfield><subfield code="w">(DE-600)209865-9</subfield><subfield code="w">(DE-576)014915782</subfield><subfield code="x">0034-6748</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:86</subfield><subfield code="g">year:2015</subfield><subfield code="g">number:2</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">http://dx.doi.org/10.1063/1.4907360</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">http://www.ncbi.nlm.nih.gov/pubmed/25725851</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_21</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_47</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_59</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_170</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2219</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2279</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4306</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4310</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">86</subfield><subfield code="j">2015</subfield><subfield code="e">2</subfield></datafield></record></collection>
|
author |
Kim, Joonhui |
spellingShingle |
Kim, Joonhui ddc 530 misc Microscopy - instrumentation misc Nanotechnology - instrumentation Alternative configuration scheme for signal amplification with scanning ion conductance microscopy |
authorStr |
Kim, Joonhui |
ppnlink_with_tag_str_mv |
@@773@@(DE-627)129509175 |
format |
Article |
dewey-ones |
530 - Physics 620 - Engineering & allied operations |
delete_txt_mv |
keep |
author_role |
aut |
collection |
OLC |
remote_str |
false |
illustrated |
Not Illustrated |
issn |
0034-6748 |
topic_title |
530 620 DNB Alternative configuration scheme for signal amplification with scanning ion conductance microscopy Microscopy - instrumentation Nanotechnology - instrumentation |
topic |
ddc 530 misc Microscopy - instrumentation misc Nanotechnology - instrumentation |
topic_unstemmed |
ddc 530 misc Microscopy - instrumentation misc Nanotechnology - instrumentation |
topic_browse |
ddc 530 misc Microscopy - instrumentation misc Nanotechnology - instrumentation |
format_facet |
Aufsätze Gedruckte Aufsätze |
format_main_str_mv |
Text Zeitschrift/Artikel |
carriertype_str_mv |
nc |
author2_variant |
s o k sok n j c njc |
hierarchy_parent_title |
Review of scientific instruments |
hierarchy_parent_id |
129509175 |
dewey-tens |
530 - Physics 620 - Engineering |
hierarchy_top_title |
Review of scientific instruments |
isfreeaccess_txt |
false |
familylinks_str_mv |
(DE-627)129509175 (DE-600)209865-9 (DE-576)014915782 |
title |
Alternative configuration scheme for signal amplification with scanning ion conductance microscopy |
ctrlnum |
(DE-627)OLC1963355032 (DE-599)GBVOLC1963355032 (PRQ)c1175-8262f7ed578f5de6aaf21b4fd08b4d78a86a290afa5c6b0f347e17ec3632832b0 (KEY)0016010520150000086000200000alternativeconfigurationschemeforsignalamplificati |
title_full |
Alternative configuration scheme for signal amplification with scanning ion conductance microscopy |
author_sort |
Kim, Joonhui |
journal |
Review of scientific instruments |
journalStr |
Review of scientific instruments |
lang_code |
eng |
isOA_bool |
false |
dewey-hundreds |
500 - Science 600 - Technology |
recordtype |
marc |
publishDateSort |
2015 |
contenttype_str_mv |
txt |
author_browse |
Kim, Joonhui |
container_volume |
86 |
class |
530 620 DNB |
format_se |
Aufsätze |
author-letter |
Kim, Joonhui |
doi_str_mv |
10.1063/1.4907360 |
dewey-full |
530 620 |
title_sort |
alternative configuration scheme for signal amplification with scanning ion conductance microscopy |
title_auth |
Alternative configuration scheme for signal amplification with scanning ion conductance microscopy |
abstract |
Scanning Ion Conductance Microscopy (SICM) is an emerging nanotechnology tool to investigate the morphology and charge transport properties of nanomaterials, including soft matter. SICM uses an electrolyte filled nanopipette as a scanning probe and detects current changes based on the distance between the nanopipette apex and the target sample in an electrolyte solution. In conventional SICM, the pipette sensor is excited by applying voltage as it raster scans near the surface. There have been attempts to improve upon raster scanning because it can induce collisions between the pipette sidewalls and target sample, especially for soft, dynamic materials (e.g., biological cells). Recently, Novak et al. demonstrated that hopping probe ion conductance microscopy (HPICM) with an adaptive scan method can improve the image quality obtained by SICM for such materials. However, HPICM is inherently slower than conventional raster scanning. In order to optimize both image quality and scanning speed, we report the development of an alternative configuration scheme for SICM signal amplification that is based on applying current to the nanopipette. This scheme overcomes traditional challenges associated with low bandwidth requirements of conventional SICM. Using our alternative scheme, we demonstrate successful imaging of L929 fibroblast cells and discuss the capabilities of this instrument configuration for future applications. |
abstractGer |
Scanning Ion Conductance Microscopy (SICM) is an emerging nanotechnology tool to investigate the morphology and charge transport properties of nanomaterials, including soft matter. SICM uses an electrolyte filled nanopipette as a scanning probe and detects current changes based on the distance between the nanopipette apex and the target sample in an electrolyte solution. In conventional SICM, the pipette sensor is excited by applying voltage as it raster scans near the surface. There have been attempts to improve upon raster scanning because it can induce collisions between the pipette sidewalls and target sample, especially for soft, dynamic materials (e.g., biological cells). Recently, Novak et al. demonstrated that hopping probe ion conductance microscopy (HPICM) with an adaptive scan method can improve the image quality obtained by SICM for such materials. However, HPICM is inherently slower than conventional raster scanning. In order to optimize both image quality and scanning speed, we report the development of an alternative configuration scheme for SICM signal amplification that is based on applying current to the nanopipette. This scheme overcomes traditional challenges associated with low bandwidth requirements of conventional SICM. Using our alternative scheme, we demonstrate successful imaging of L929 fibroblast cells and discuss the capabilities of this instrument configuration for future applications. |
abstract_unstemmed |
Scanning Ion Conductance Microscopy (SICM) is an emerging nanotechnology tool to investigate the morphology and charge transport properties of nanomaterials, including soft matter. SICM uses an electrolyte filled nanopipette as a scanning probe and detects current changes based on the distance between the nanopipette apex and the target sample in an electrolyte solution. In conventional SICM, the pipette sensor is excited by applying voltage as it raster scans near the surface. There have been attempts to improve upon raster scanning because it can induce collisions between the pipette sidewalls and target sample, especially for soft, dynamic materials (e.g., biological cells). Recently, Novak et al. demonstrated that hopping probe ion conductance microscopy (HPICM) with an adaptive scan method can improve the image quality obtained by SICM for such materials. However, HPICM is inherently slower than conventional raster scanning. In order to optimize both image quality and scanning speed, we report the development of an alternative configuration scheme for SICM signal amplification that is based on applying current to the nanopipette. This scheme overcomes traditional challenges associated with low bandwidth requirements of conventional SICM. Using our alternative scheme, we demonstrate successful imaging of L929 fibroblast cells and discuss the capabilities of this instrument configuration for future applications. |
collection_details |
GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_21 GBV_ILN_47 GBV_ILN_59 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2219 GBV_ILN_2279 GBV_ILN_4306 GBV_ILN_4310 |
container_issue |
2 |
title_short |
Alternative configuration scheme for signal amplification with scanning ion conductance microscopy |
url |
http://dx.doi.org/10.1063/1.4907360 http://www.ncbi.nlm.nih.gov/pubmed/25725851 |
remote_bool |
false |
author2 |
Kim, Seong-Oh Cho, Nam-Joon |
author2Str |
Kim, Seong-Oh Cho, Nam-Joon |
ppnlink |
129509175 |
mediatype_str_mv |
n |
isOA_txt |
false |
hochschulschrift_bool |
false |
author2_role |
oth oth |
doi_str |
10.1063/1.4907360 |
up_date |
2024-07-04T05:33:04.431Z |
_version_ |
1803625362278580224 |
fullrecord_marcxml |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a2200265 4500</leader><controlfield tag="001">OLC1963355032</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230714160910.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">160206s2015 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1063/1.4907360</subfield><subfield code="2">doi</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">PQ20160617</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1963355032</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1963355032</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(PRQ)c1175-8262f7ed578f5de6aaf21b4fd08b4d78a86a290afa5c6b0f347e17ec3632832b0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(KEY)0016010520150000086000200000alternativeconfigurationschemeforsignalamplificati</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">530</subfield><subfield code="a">620</subfield><subfield code="q">DNB</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Kim, Joonhui</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Alternative configuration scheme for signal amplification with scanning ion conductance microscopy</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2015</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Scanning Ion Conductance Microscopy (SICM) is an emerging nanotechnology tool to investigate the morphology and charge transport properties of nanomaterials, including soft matter. SICM uses an electrolyte filled nanopipette as a scanning probe and detects current changes based on the distance between the nanopipette apex and the target sample in an electrolyte solution. In conventional SICM, the pipette sensor is excited by applying voltage as it raster scans near the surface. There have been attempts to improve upon raster scanning because it can induce collisions between the pipette sidewalls and target sample, especially for soft, dynamic materials (e.g., biological cells). Recently, Novak et al. demonstrated that hopping probe ion conductance microscopy (HPICM) with an adaptive scan method can improve the image quality obtained by SICM for such materials. However, HPICM is inherently slower than conventional raster scanning. In order to optimize both image quality and scanning speed, we report the development of an alternative configuration scheme for SICM signal amplification that is based on applying current to the nanopipette. This scheme overcomes traditional challenges associated with low bandwidth requirements of conventional SICM. Using our alternative scheme, we demonstrate successful imaging of L929 fibroblast cells and discuss the capabilities of this instrument configuration for future applications.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy - instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Nanotechnology - instrumentation</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kim, Seong-Oh</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Cho, Nam-Joon</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Review of scientific instruments</subfield><subfield code="d">Melville, NY : AIP, 1930</subfield><subfield code="g">86(2015), 2</subfield><subfield code="w">(DE-627)129509175</subfield><subfield code="w">(DE-600)209865-9</subfield><subfield code="w">(DE-576)014915782</subfield><subfield code="x">0034-6748</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:86</subfield><subfield code="g">year:2015</subfield><subfield code="g">number:2</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">http://dx.doi.org/10.1063/1.4907360</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">http://www.ncbi.nlm.nih.gov/pubmed/25725851</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_21</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_47</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_59</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_170</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2219</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2279</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4306</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4310</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">86</subfield><subfield code="j">2015</subfield><subfield code="e">2</subfield></datafield></record></collection>
|
score |
7.39777 |