An Overview of the New Test Stand for H- Ion Sources at FNAL
A new test stand at FNAL is being constructed to carry out experiments to develop and upgrade the present magnetron-type sources of H- ions of up to 80 mA at 35 keV in the context of the Proton Improvement Plan (PIP). The aim of this plan is to provide high-power proton beams for the experiments at...
Ausführliche Beschreibung
Autor*in: |
Sosa, A [verfasserIn] |
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Format: |
Artikel |
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Sprache: |
Englisch |
Erschienen: |
2015 |
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Übergeordnetes Werk: |
Enthalten in: Review of scientific instruments - Melville, NY : AIP, 1930, (2015) |
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Übergeordnetes Werk: |
year:2015 |
Links: |
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DOI / URN: |
10.1063/1.4932119 |
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Katalog-ID: |
OLC1963361601 |
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A new test stand at FNAL is being constructed to carry out experiments to develop and upgrade the present magnetron-type sources of H- ions of up to 80 mA at 35 keV in the context of the Proton Improvement Plan (PIP). The aim of this plan is to provide high-power proton beams for the experiments at FNAL. The technical details of the construction and layout of this test stand are presented, along with a prospective set of diagnostics to monitor the sources. |
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A new test stand at FNAL is being constructed to carry out experiments to develop and upgrade the present magnetron-type sources of H- ions of up to 80 mA at 35 keV in the context of the Proton Improvement Plan (PIP). The aim of this plan is to provide high-power proton beams for the experiments at FNAL. The technical details of the construction and layout of this test stand are presented, along with a prospective set of diagnostics to monitor the sources. |
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A new test stand at FNAL is being constructed to carry out experiments to develop and upgrade the present magnetron-type sources of H- ions of up to 80 mA at 35 keV in the context of the Proton Improvement Plan (PIP). The aim of this plan is to provide high-power proton beams for the experiments at FNAL. The technical details of the construction and layout of this test stand are presented, along with a prospective set of diagnostics to monitor the sources. |
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