Generalized Theory of the Thru-Reflect-Match Calibration Technique
The thru-reflect-match (TRM) calibration technique uses as standards a through connection of ports 1 and 2 of the vector network analyzer, two symmetrical highly reflecting loads, and two broadband loads (match) of impedance close to the measuring system impedance (Z o ). The classical theory of the...
Ausführliche Beschreibung
Autor*in: |
Pulido-Gaytan, Manuel Alejandro [verfasserIn] |
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Format: |
Artikel |
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Sprache: |
Englisch |
Erschienen: |
2015 |
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Schlagwörter: |
thru-reflect-match calibration technique Transmission line matrix methods Transmission line measurements |
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Übergeordnetes Werk: |
Enthalten in: IEEE transactions on microwave theory and techniques - New York, NY : IEEE, 1963, 63(2015), 5, Seite 1693-1699 |
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Übergeordnetes Werk: |
volume:63 ; year:2015 ; number:5 ; pages:1693-1699 |
Links: |
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DOI / URN: |
10.1109/TMTT.2015.2417860 |
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Katalog-ID: |
OLC1963488466 |
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LEADER | 01000caa a2200265 4500 | ||
---|---|---|---|
001 | OLC1963488466 | ||
003 | DE-627 | ||
005 | 20230714161121.0 | ||
007 | tu | ||
008 | 160206s2015 xx ||||| 00| ||eng c | ||
024 | 7 | |a 10.1109/TMTT.2015.2417860 |2 doi | |
028 | 5 | 2 | |a PQ20160617 |
035 | |a (DE-627)OLC1963488466 | ||
035 | |a (DE-599)GBVOLC1963488466 | ||
035 | |a (PRQ)i2225-5a2e6cd68a660cb48f27ce8736c9f63a04deeacb07de4335809728a8882ba6070 | ||
035 | |a (KEY)0017514520150000063000501693generalizedtheoryofthethrureflectmatchcalibrationt | ||
040 | |a DE-627 |b ger |c DE-627 |e rakwb | ||
041 | |a eng | ||
082 | 0 | 4 | |a 620 |q DNB |
084 | |a 53.00 |2 bkl | ||
100 | 1 | |a Pulido-Gaytan, Manuel Alejandro |e verfasserin |4 aut | |
245 | 1 | 0 | |a Generalized Theory of the Thru-Reflect-Match Calibration Technique |
264 | 1 | |c 2015 | |
336 | |a Text |b txt |2 rdacontent | ||
337 | |a ohne Hilfsmittel zu benutzen |b n |2 rdamedia | ||
338 | |a Band |b nc |2 rdacarrier | ||
520 | |a The thru-reflect-match (TRM) calibration technique uses as standards a through connection of ports 1 and 2 of the vector network analyzer, two symmetrical highly reflecting loads, and two broadband loads (match) of impedance close to the measuring system impedance (Z o ). The classical theory of the TRM calibration refers the calibration to the impedance of the load used as the match standard (Z M ), which is assumed as symmetrical. In practice, Z M may be frequency dependent. Moreover, as the frequency increases, the symmetry condition of the load used as match standard may become difficult to preserve, thus affecting the reference impedance definition and reducing the accuracy of the calibration. In this paper, the ABCD-parameters matrix formalism is used to introduce for the first time a generalized TRM calibration theory, allowing the use of either symmetrical or nonsymmetrical loads of arbitrary impedance as the match standard. | ||
650 | 4 | |a Calibration techniques | |
650 | 4 | |a Impedance measurement | |
650 | 4 | |a Impedance | |
650 | 4 | |a broadband loading | |
650 | 4 | |a arbitrary impedance matching | |
650 | 4 | |a vector network analyzer | |
650 | 4 | |a thru-reflect-match calibration technique | |
650 | 4 | |a measurement standards | |
650 | 4 | |a reflecting loading | |
650 | 4 | |a calibration | |
650 | 4 | |a microwave measurements | |
650 | 4 | |a TRM calibration technique | |
650 | 4 | |a Power transmission lines | |
650 | 4 | |a Transmission line matrix methods | |
650 | 4 | |a network analysers | |
650 | 4 | |a measurements techniques | |
650 | 4 | |a matrix algebra | |
650 | 4 | |a ABCD parameter matrix | |
650 | 4 | |a Transmission line measurements | |
650 | 4 | |a vector network analysis (VNA) | |
650 | 4 | |a impedance matching | |
650 | 4 | |a Standards | |
650 | 4 | |a on-wafer calibration | |
650 | 4 | |a reference impedance definition | |
650 | 4 | |a Calibration | |
700 | 1 | |a Apolinar Reynoso-Hernandez, J |4 oth | |
700 | 1 | |a Loo-Yau, Jose Raul |4 oth | |
700 | 1 | |a Zarate-de Landa, Andres |4 oth | |
700 | 1 | |a del Carmen Maya-Sánchez, María |4 oth | |
773 | 0 | 8 | |i Enthalten in |t IEEE transactions on microwave theory and techniques |d New York, NY : IEEE, 1963 |g 63(2015), 5, Seite 1693-1699 |w (DE-627)129547344 |w (DE-600)218509-X |w (DE-576)01499822X |x 0018-9480 |7 nnns |
773 | 1 | 8 | |g volume:63 |g year:2015 |g number:5 |g pages:1693-1699 |
856 | 4 | 1 | |u http://dx.doi.org/10.1109/TMTT.2015.2417860 |3 Volltext |
856 | 4 | 2 | |u http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7084159 |
856 | 4 | 2 | |u http://search.proquest.com/docview/1685290943 |
912 | |a GBV_USEFLAG_A | ||
912 | |a SYSFLAG_A | ||
912 | |a GBV_OLC | ||
912 | |a SSG-OLC-TEC | ||
912 | |a SSG-OLC-PHY | ||
912 | |a GBV_ILN_70 | ||
912 | |a GBV_ILN_170 | ||
912 | |a GBV_ILN_2004 | ||
912 | |a GBV_ILN_2005 | ||
912 | |a GBV_ILN_2016 | ||
912 | |a GBV_ILN_4313 | ||
912 | |a GBV_ILN_4318 | ||
936 | b | k | |a 53.00 |q AVZ |
951 | |a AR | ||
952 | |d 63 |j 2015 |e 5 |h 1693-1699 |
author_variant |
m a p g map mapg |
---|---|
matchkey_str |
article:00189480:2015----::eeaieterotehuelcmthai |
hierarchy_sort_str |
2015 |
bklnumber |
53.00 |
publishDate |
2015 |
allfields |
10.1109/TMTT.2015.2417860 doi PQ20160617 (DE-627)OLC1963488466 (DE-599)GBVOLC1963488466 (PRQ)i2225-5a2e6cd68a660cb48f27ce8736c9f63a04deeacb07de4335809728a8882ba6070 (KEY)0017514520150000063000501693generalizedtheoryofthethrureflectmatchcalibrationt DE-627 ger DE-627 rakwb eng 620 DNB 53.00 bkl Pulido-Gaytan, Manuel Alejandro verfasserin aut Generalized Theory of the Thru-Reflect-Match Calibration Technique 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The thru-reflect-match (TRM) calibration technique uses as standards a through connection of ports 1 and 2 of the vector network analyzer, two symmetrical highly reflecting loads, and two broadband loads (match) of impedance close to the measuring system impedance (Z o ). The classical theory of the TRM calibration refers the calibration to the impedance of the load used as the match standard (Z M ), which is assumed as symmetrical. In practice, Z M may be frequency dependent. Moreover, as the frequency increases, the symmetry condition of the load used as match standard may become difficult to preserve, thus affecting the reference impedance definition and reducing the accuracy of the calibration. In this paper, the ABCD-parameters matrix formalism is used to introduce for the first time a generalized TRM calibration theory, allowing the use of either symmetrical or nonsymmetrical loads of arbitrary impedance as the match standard. Calibration techniques Impedance measurement Impedance broadband loading arbitrary impedance matching vector network analyzer thru-reflect-match calibration technique measurement standards reflecting loading calibration microwave measurements TRM calibration technique Power transmission lines Transmission line matrix methods network analysers measurements techniques matrix algebra ABCD parameter matrix Transmission line measurements vector network analysis (VNA) impedance matching Standards on-wafer calibration reference impedance definition Calibration Apolinar Reynoso-Hernandez, J oth Loo-Yau, Jose Raul oth Zarate-de Landa, Andres oth del Carmen Maya-Sánchez, María oth Enthalten in IEEE transactions on microwave theory and techniques New York, NY : IEEE, 1963 63(2015), 5, Seite 1693-1699 (DE-627)129547344 (DE-600)218509-X (DE-576)01499822X 0018-9480 nnns volume:63 year:2015 number:5 pages:1693-1699 http://dx.doi.org/10.1109/TMTT.2015.2417860 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7084159 http://search.proquest.com/docview/1685290943 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2016 GBV_ILN_4313 GBV_ILN_4318 53.00 AVZ AR 63 2015 5 1693-1699 |
spelling |
10.1109/TMTT.2015.2417860 doi PQ20160617 (DE-627)OLC1963488466 (DE-599)GBVOLC1963488466 (PRQ)i2225-5a2e6cd68a660cb48f27ce8736c9f63a04deeacb07de4335809728a8882ba6070 (KEY)0017514520150000063000501693generalizedtheoryofthethrureflectmatchcalibrationt DE-627 ger DE-627 rakwb eng 620 DNB 53.00 bkl Pulido-Gaytan, Manuel Alejandro verfasserin aut Generalized Theory of the Thru-Reflect-Match Calibration Technique 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The thru-reflect-match (TRM) calibration technique uses as standards a through connection of ports 1 and 2 of the vector network analyzer, two symmetrical highly reflecting loads, and two broadband loads (match) of impedance close to the measuring system impedance (Z o ). The classical theory of the TRM calibration refers the calibration to the impedance of the load used as the match standard (Z M ), which is assumed as symmetrical. In practice, Z M may be frequency dependent. Moreover, as the frequency increases, the symmetry condition of the load used as match standard may become difficult to preserve, thus affecting the reference impedance definition and reducing the accuracy of the calibration. In this paper, the ABCD-parameters matrix formalism is used to introduce for the first time a generalized TRM calibration theory, allowing the use of either symmetrical or nonsymmetrical loads of arbitrary impedance as the match standard. Calibration techniques Impedance measurement Impedance broadband loading arbitrary impedance matching vector network analyzer thru-reflect-match calibration technique measurement standards reflecting loading calibration microwave measurements TRM calibration technique Power transmission lines Transmission line matrix methods network analysers measurements techniques matrix algebra ABCD parameter matrix Transmission line measurements vector network analysis (VNA) impedance matching Standards on-wafer calibration reference impedance definition Calibration Apolinar Reynoso-Hernandez, J oth Loo-Yau, Jose Raul oth Zarate-de Landa, Andres oth del Carmen Maya-Sánchez, María oth Enthalten in IEEE transactions on microwave theory and techniques New York, NY : IEEE, 1963 63(2015), 5, Seite 1693-1699 (DE-627)129547344 (DE-600)218509-X (DE-576)01499822X 0018-9480 nnns volume:63 year:2015 number:5 pages:1693-1699 http://dx.doi.org/10.1109/TMTT.2015.2417860 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7084159 http://search.proquest.com/docview/1685290943 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2016 GBV_ILN_4313 GBV_ILN_4318 53.00 AVZ AR 63 2015 5 1693-1699 |
allfields_unstemmed |
10.1109/TMTT.2015.2417860 doi PQ20160617 (DE-627)OLC1963488466 (DE-599)GBVOLC1963488466 (PRQ)i2225-5a2e6cd68a660cb48f27ce8736c9f63a04deeacb07de4335809728a8882ba6070 (KEY)0017514520150000063000501693generalizedtheoryofthethrureflectmatchcalibrationt DE-627 ger DE-627 rakwb eng 620 DNB 53.00 bkl Pulido-Gaytan, Manuel Alejandro verfasserin aut Generalized Theory of the Thru-Reflect-Match Calibration Technique 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The thru-reflect-match (TRM) calibration technique uses as standards a through connection of ports 1 and 2 of the vector network analyzer, two symmetrical highly reflecting loads, and two broadband loads (match) of impedance close to the measuring system impedance (Z o ). The classical theory of the TRM calibration refers the calibration to the impedance of the load used as the match standard (Z M ), which is assumed as symmetrical. In practice, Z M may be frequency dependent. Moreover, as the frequency increases, the symmetry condition of the load used as match standard may become difficult to preserve, thus affecting the reference impedance definition and reducing the accuracy of the calibration. In this paper, the ABCD-parameters matrix formalism is used to introduce for the first time a generalized TRM calibration theory, allowing the use of either symmetrical or nonsymmetrical loads of arbitrary impedance as the match standard. Calibration techniques Impedance measurement Impedance broadband loading arbitrary impedance matching vector network analyzer thru-reflect-match calibration technique measurement standards reflecting loading calibration microwave measurements TRM calibration technique Power transmission lines Transmission line matrix methods network analysers measurements techniques matrix algebra ABCD parameter matrix Transmission line measurements vector network analysis (VNA) impedance matching Standards on-wafer calibration reference impedance definition Calibration Apolinar Reynoso-Hernandez, J oth Loo-Yau, Jose Raul oth Zarate-de Landa, Andres oth del Carmen Maya-Sánchez, María oth Enthalten in IEEE transactions on microwave theory and techniques New York, NY : IEEE, 1963 63(2015), 5, Seite 1693-1699 (DE-627)129547344 (DE-600)218509-X (DE-576)01499822X 0018-9480 nnns volume:63 year:2015 number:5 pages:1693-1699 http://dx.doi.org/10.1109/TMTT.2015.2417860 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7084159 http://search.proquest.com/docview/1685290943 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2016 GBV_ILN_4313 GBV_ILN_4318 53.00 AVZ AR 63 2015 5 1693-1699 |
allfieldsGer |
10.1109/TMTT.2015.2417860 doi PQ20160617 (DE-627)OLC1963488466 (DE-599)GBVOLC1963488466 (PRQ)i2225-5a2e6cd68a660cb48f27ce8736c9f63a04deeacb07de4335809728a8882ba6070 (KEY)0017514520150000063000501693generalizedtheoryofthethrureflectmatchcalibrationt DE-627 ger DE-627 rakwb eng 620 DNB 53.00 bkl Pulido-Gaytan, Manuel Alejandro verfasserin aut Generalized Theory of the Thru-Reflect-Match Calibration Technique 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The thru-reflect-match (TRM) calibration technique uses as standards a through connection of ports 1 and 2 of the vector network analyzer, two symmetrical highly reflecting loads, and two broadband loads (match) of impedance close to the measuring system impedance (Z o ). The classical theory of the TRM calibration refers the calibration to the impedance of the load used as the match standard (Z M ), which is assumed as symmetrical. In practice, Z M may be frequency dependent. Moreover, as the frequency increases, the symmetry condition of the load used as match standard may become difficult to preserve, thus affecting the reference impedance definition and reducing the accuracy of the calibration. In this paper, the ABCD-parameters matrix formalism is used to introduce for the first time a generalized TRM calibration theory, allowing the use of either symmetrical or nonsymmetrical loads of arbitrary impedance as the match standard. Calibration techniques Impedance measurement Impedance broadband loading arbitrary impedance matching vector network analyzer thru-reflect-match calibration technique measurement standards reflecting loading calibration microwave measurements TRM calibration technique Power transmission lines Transmission line matrix methods network analysers measurements techniques matrix algebra ABCD parameter matrix Transmission line measurements vector network analysis (VNA) impedance matching Standards on-wafer calibration reference impedance definition Calibration Apolinar Reynoso-Hernandez, J oth Loo-Yau, Jose Raul oth Zarate-de Landa, Andres oth del Carmen Maya-Sánchez, María oth Enthalten in IEEE transactions on microwave theory and techniques New York, NY : IEEE, 1963 63(2015), 5, Seite 1693-1699 (DE-627)129547344 (DE-600)218509-X (DE-576)01499822X 0018-9480 nnns volume:63 year:2015 number:5 pages:1693-1699 http://dx.doi.org/10.1109/TMTT.2015.2417860 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7084159 http://search.proquest.com/docview/1685290943 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2016 GBV_ILN_4313 GBV_ILN_4318 53.00 AVZ AR 63 2015 5 1693-1699 |
allfieldsSound |
10.1109/TMTT.2015.2417860 doi PQ20160617 (DE-627)OLC1963488466 (DE-599)GBVOLC1963488466 (PRQ)i2225-5a2e6cd68a660cb48f27ce8736c9f63a04deeacb07de4335809728a8882ba6070 (KEY)0017514520150000063000501693generalizedtheoryofthethrureflectmatchcalibrationt DE-627 ger DE-627 rakwb eng 620 DNB 53.00 bkl Pulido-Gaytan, Manuel Alejandro verfasserin aut Generalized Theory of the Thru-Reflect-Match Calibration Technique 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The thru-reflect-match (TRM) calibration technique uses as standards a through connection of ports 1 and 2 of the vector network analyzer, two symmetrical highly reflecting loads, and two broadband loads (match) of impedance close to the measuring system impedance (Z o ). The classical theory of the TRM calibration refers the calibration to the impedance of the load used as the match standard (Z M ), which is assumed as symmetrical. In practice, Z M may be frequency dependent. Moreover, as the frequency increases, the symmetry condition of the load used as match standard may become difficult to preserve, thus affecting the reference impedance definition and reducing the accuracy of the calibration. In this paper, the ABCD-parameters matrix formalism is used to introduce for the first time a generalized TRM calibration theory, allowing the use of either symmetrical or nonsymmetrical loads of arbitrary impedance as the match standard. Calibration techniques Impedance measurement Impedance broadband loading arbitrary impedance matching vector network analyzer thru-reflect-match calibration technique measurement standards reflecting loading calibration microwave measurements TRM calibration technique Power transmission lines Transmission line matrix methods network analysers measurements techniques matrix algebra ABCD parameter matrix Transmission line measurements vector network analysis (VNA) impedance matching Standards on-wafer calibration reference impedance definition Calibration Apolinar Reynoso-Hernandez, J oth Loo-Yau, Jose Raul oth Zarate-de Landa, Andres oth del Carmen Maya-Sánchez, María oth Enthalten in IEEE transactions on microwave theory and techniques New York, NY : IEEE, 1963 63(2015), 5, Seite 1693-1699 (DE-627)129547344 (DE-600)218509-X (DE-576)01499822X 0018-9480 nnns volume:63 year:2015 number:5 pages:1693-1699 http://dx.doi.org/10.1109/TMTT.2015.2417860 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7084159 http://search.proquest.com/docview/1685290943 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2016 GBV_ILN_4313 GBV_ILN_4318 53.00 AVZ AR 63 2015 5 1693-1699 |
language |
English |
source |
Enthalten in IEEE transactions on microwave theory and techniques 63(2015), 5, Seite 1693-1699 volume:63 year:2015 number:5 pages:1693-1699 |
sourceStr |
Enthalten in IEEE transactions on microwave theory and techniques 63(2015), 5, Seite 1693-1699 volume:63 year:2015 number:5 pages:1693-1699 |
format_phy_str_mv |
Article |
institution |
findex.gbv.de |
topic_facet |
Calibration techniques Impedance measurement Impedance broadband loading arbitrary impedance matching vector network analyzer thru-reflect-match calibration technique measurement standards reflecting loading calibration microwave measurements TRM calibration technique Power transmission lines Transmission line matrix methods network analysers measurements techniques matrix algebra ABCD parameter matrix Transmission line measurements vector network analysis (VNA) impedance matching Standards on-wafer calibration reference impedance definition Calibration |
dewey-raw |
620 |
isfreeaccess_bool |
false |
container_title |
IEEE transactions on microwave theory and techniques |
authorswithroles_txt_mv |
Pulido-Gaytan, Manuel Alejandro @@aut@@ Apolinar Reynoso-Hernandez, J @@oth@@ Loo-Yau, Jose Raul @@oth@@ Zarate-de Landa, Andres @@oth@@ del Carmen Maya-Sánchez, María @@oth@@ |
publishDateDaySort_date |
2015-01-01T00:00:00Z |
hierarchy_top_id |
129547344 |
dewey-sort |
3620 |
id |
OLC1963488466 |
language_de |
englisch |
fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a2200265 4500</leader><controlfield tag="001">OLC1963488466</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230714161121.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">160206s2015 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1109/TMTT.2015.2417860</subfield><subfield code="2">doi</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">PQ20160617</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1963488466</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1963488466</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(PRQ)i2225-5a2e6cd68a660cb48f27ce8736c9f63a04deeacb07de4335809728a8882ba6070</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(KEY)0017514520150000063000501693generalizedtheoryofthethrureflectmatchcalibrationt</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620</subfield><subfield code="q">DNB</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">53.00</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Pulido-Gaytan, Manuel Alejandro</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Generalized Theory of the Thru-Reflect-Match Calibration Technique</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2015</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">The thru-reflect-match (TRM) calibration technique uses as standards a through connection of ports 1 and 2 of the vector network analyzer, two symmetrical highly reflecting loads, and two broadband loads (match) of impedance close to the measuring system impedance (Z o ). The classical theory of the TRM calibration refers the calibration to the impedance of the load used as the match standard (Z M ), which is assumed as symmetrical. In practice, Z M may be frequency dependent. Moreover, as the frequency increases, the symmetry condition of the load used as match standard may become difficult to preserve, thus affecting the reference impedance definition and reducing the accuracy of the calibration. In this paper, the ABCD-parameters matrix formalism is used to introduce for the first time a generalized TRM calibration theory, allowing the use of either symmetrical or nonsymmetrical loads of arbitrary impedance as the match standard.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Calibration techniques</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Impedance measurement</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Impedance</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">broadband loading</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">arbitrary impedance matching</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">vector network analyzer</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">thru-reflect-match calibration technique</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">measurement standards</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">reflecting loading</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">calibration</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">microwave measurements</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">TRM calibration technique</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Power transmission lines</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Transmission line matrix methods</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">network analysers</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">measurements techniques</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">matrix algebra</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">ABCD parameter matrix</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Transmission line measurements</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">vector network analysis (VNA)</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">impedance matching</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Standards</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">on-wafer calibration</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">reference impedance definition</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Calibration</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Apolinar Reynoso-Hernandez, J</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Loo-Yau, Jose Raul</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zarate-de Landa, Andres</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">del Carmen Maya-Sánchez, María</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">IEEE transactions on microwave theory and techniques</subfield><subfield code="d">New York, NY : IEEE, 1963</subfield><subfield code="g">63(2015), 5, Seite 1693-1699</subfield><subfield code="w">(DE-627)129547344</subfield><subfield code="w">(DE-600)218509-X</subfield><subfield code="w">(DE-576)01499822X</subfield><subfield code="x">0018-9480</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:63</subfield><subfield code="g">year:2015</subfield><subfield code="g">number:5</subfield><subfield code="g">pages:1693-1699</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">http://dx.doi.org/10.1109/TMTT.2015.2417860</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7084159</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">http://search.proquest.com/docview/1685290943</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_170</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2004</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2005</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2016</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4313</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4318</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">53.00</subfield><subfield code="q">AVZ</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">63</subfield><subfield code="j">2015</subfield><subfield code="e">5</subfield><subfield code="h">1693-1699</subfield></datafield></record></collection>
|
author |
Pulido-Gaytan, Manuel Alejandro |
spellingShingle |
Pulido-Gaytan, Manuel Alejandro ddc 620 bkl 53.00 misc Calibration techniques misc Impedance measurement misc Impedance misc broadband loading misc arbitrary impedance matching misc vector network analyzer misc thru-reflect-match calibration technique misc measurement standards misc reflecting loading misc calibration misc microwave measurements misc TRM calibration technique misc Power transmission lines misc Transmission line matrix methods misc network analysers misc measurements techniques misc matrix algebra misc ABCD parameter matrix misc Transmission line measurements misc vector network analysis (VNA) misc impedance matching misc Standards misc on-wafer calibration misc reference impedance definition misc Calibration Generalized Theory of the Thru-Reflect-Match Calibration Technique |
authorStr |
Pulido-Gaytan, Manuel Alejandro |
ppnlink_with_tag_str_mv |
@@773@@(DE-627)129547344 |
format |
Article |
dewey-ones |
620 - Engineering & allied operations |
delete_txt_mv |
keep |
author_role |
aut |
collection |
OLC |
remote_str |
false |
illustrated |
Not Illustrated |
issn |
0018-9480 |
topic_title |
620 DNB 53.00 bkl Generalized Theory of the Thru-Reflect-Match Calibration Technique Calibration techniques Impedance measurement Impedance broadband loading arbitrary impedance matching vector network analyzer thru-reflect-match calibration technique measurement standards reflecting loading calibration microwave measurements TRM calibration technique Power transmission lines Transmission line matrix methods network analysers measurements techniques matrix algebra ABCD parameter matrix Transmission line measurements vector network analysis (VNA) impedance matching Standards on-wafer calibration reference impedance definition Calibration |
topic |
ddc 620 bkl 53.00 misc Calibration techniques misc Impedance measurement misc Impedance misc broadband loading misc arbitrary impedance matching misc vector network analyzer misc thru-reflect-match calibration technique misc measurement standards misc reflecting loading misc calibration misc microwave measurements misc TRM calibration technique misc Power transmission lines misc Transmission line matrix methods misc network analysers misc measurements techniques misc matrix algebra misc ABCD parameter matrix misc Transmission line measurements misc vector network analysis (VNA) misc impedance matching misc Standards misc on-wafer calibration misc reference impedance definition misc Calibration |
topic_unstemmed |
ddc 620 bkl 53.00 misc Calibration techniques misc Impedance measurement misc Impedance misc broadband loading misc arbitrary impedance matching misc vector network analyzer misc thru-reflect-match calibration technique misc measurement standards misc reflecting loading misc calibration misc microwave measurements misc TRM calibration technique misc Power transmission lines misc Transmission line matrix methods misc network analysers misc measurements techniques misc matrix algebra misc ABCD parameter matrix misc Transmission line measurements misc vector network analysis (VNA) misc impedance matching misc Standards misc on-wafer calibration misc reference impedance definition misc Calibration |
topic_browse |
ddc 620 bkl 53.00 misc Calibration techniques misc Impedance measurement misc Impedance misc broadband loading misc arbitrary impedance matching misc vector network analyzer misc thru-reflect-match calibration technique misc measurement standards misc reflecting loading misc calibration misc microwave measurements misc TRM calibration technique misc Power transmission lines misc Transmission line matrix methods misc network analysers misc measurements techniques misc matrix algebra misc ABCD parameter matrix misc Transmission line measurements misc vector network analysis (VNA) misc impedance matching misc Standards misc on-wafer calibration misc reference impedance definition misc Calibration |
format_facet |
Aufsätze Gedruckte Aufsätze |
format_main_str_mv |
Text Zeitschrift/Artikel |
carriertype_str_mv |
nc |
author2_variant |
r h j a rhj rhja j r l y jrl jrly l a z d laz lazd c m s m d cmsm cmsmd |
hierarchy_parent_title |
IEEE transactions on microwave theory and techniques |
hierarchy_parent_id |
129547344 |
dewey-tens |
620 - Engineering |
hierarchy_top_title |
IEEE transactions on microwave theory and techniques |
isfreeaccess_txt |
false |
familylinks_str_mv |
(DE-627)129547344 (DE-600)218509-X (DE-576)01499822X |
title |
Generalized Theory of the Thru-Reflect-Match Calibration Technique |
ctrlnum |
(DE-627)OLC1963488466 (DE-599)GBVOLC1963488466 (PRQ)i2225-5a2e6cd68a660cb48f27ce8736c9f63a04deeacb07de4335809728a8882ba6070 (KEY)0017514520150000063000501693generalizedtheoryofthethrureflectmatchcalibrationt |
title_full |
Generalized Theory of the Thru-Reflect-Match Calibration Technique |
author_sort |
Pulido-Gaytan, Manuel Alejandro |
journal |
IEEE transactions on microwave theory and techniques |
journalStr |
IEEE transactions on microwave theory and techniques |
lang_code |
eng |
isOA_bool |
false |
dewey-hundreds |
600 - Technology |
recordtype |
marc |
publishDateSort |
2015 |
contenttype_str_mv |
txt |
container_start_page |
1693 |
author_browse |
Pulido-Gaytan, Manuel Alejandro |
container_volume |
63 |
class |
620 DNB 53.00 bkl |
format_se |
Aufsätze |
author-letter |
Pulido-Gaytan, Manuel Alejandro |
doi_str_mv |
10.1109/TMTT.2015.2417860 |
dewey-full |
620 |
title_sort |
generalized theory of the thru-reflect-match calibration technique |
title_auth |
Generalized Theory of the Thru-Reflect-Match Calibration Technique |
abstract |
The thru-reflect-match (TRM) calibration technique uses as standards a through connection of ports 1 and 2 of the vector network analyzer, two symmetrical highly reflecting loads, and two broadband loads (match) of impedance close to the measuring system impedance (Z o ). The classical theory of the TRM calibration refers the calibration to the impedance of the load used as the match standard (Z M ), which is assumed as symmetrical. In practice, Z M may be frequency dependent. Moreover, as the frequency increases, the symmetry condition of the load used as match standard may become difficult to preserve, thus affecting the reference impedance definition and reducing the accuracy of the calibration. In this paper, the ABCD-parameters matrix formalism is used to introduce for the first time a generalized TRM calibration theory, allowing the use of either symmetrical or nonsymmetrical loads of arbitrary impedance as the match standard. |
abstractGer |
The thru-reflect-match (TRM) calibration technique uses as standards a through connection of ports 1 and 2 of the vector network analyzer, two symmetrical highly reflecting loads, and two broadband loads (match) of impedance close to the measuring system impedance (Z o ). The classical theory of the TRM calibration refers the calibration to the impedance of the load used as the match standard (Z M ), which is assumed as symmetrical. In practice, Z M may be frequency dependent. Moreover, as the frequency increases, the symmetry condition of the load used as match standard may become difficult to preserve, thus affecting the reference impedance definition and reducing the accuracy of the calibration. In this paper, the ABCD-parameters matrix formalism is used to introduce for the first time a generalized TRM calibration theory, allowing the use of either symmetrical or nonsymmetrical loads of arbitrary impedance as the match standard. |
abstract_unstemmed |
The thru-reflect-match (TRM) calibration technique uses as standards a through connection of ports 1 and 2 of the vector network analyzer, two symmetrical highly reflecting loads, and two broadband loads (match) of impedance close to the measuring system impedance (Z o ). The classical theory of the TRM calibration refers the calibration to the impedance of the load used as the match standard (Z M ), which is assumed as symmetrical. In practice, Z M may be frequency dependent. Moreover, as the frequency increases, the symmetry condition of the load used as match standard may become difficult to preserve, thus affecting the reference impedance definition and reducing the accuracy of the calibration. In this paper, the ABCD-parameters matrix formalism is used to introduce for the first time a generalized TRM calibration theory, allowing the use of either symmetrical or nonsymmetrical loads of arbitrary impedance as the match standard. |
collection_details |
GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 GBV_ILN_170 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2016 GBV_ILN_4313 GBV_ILN_4318 |
container_issue |
5 |
title_short |
Generalized Theory of the Thru-Reflect-Match Calibration Technique |
url |
http://dx.doi.org/10.1109/TMTT.2015.2417860 http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7084159 http://search.proquest.com/docview/1685290943 |
remote_bool |
false |
author2 |
Apolinar Reynoso-Hernandez, J Loo-Yau, Jose Raul Zarate-de Landa, Andres del Carmen Maya-Sánchez, María |
author2Str |
Apolinar Reynoso-Hernandez, J Loo-Yau, Jose Raul Zarate-de Landa, Andres del Carmen Maya-Sánchez, María |
ppnlink |
129547344 |
mediatype_str_mv |
n |
isOA_txt |
false |
hochschulschrift_bool |
false |
author2_role |
oth oth oth oth |
doi_str |
10.1109/TMTT.2015.2417860 |
up_date |
2024-07-04T05:51:49.377Z |
_version_ |
1803626541879394304 |
fullrecord_marcxml |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a2200265 4500</leader><controlfield tag="001">OLC1963488466</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230714161121.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">160206s2015 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1109/TMTT.2015.2417860</subfield><subfield code="2">doi</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">PQ20160617</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1963488466</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1963488466</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(PRQ)i2225-5a2e6cd68a660cb48f27ce8736c9f63a04deeacb07de4335809728a8882ba6070</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(KEY)0017514520150000063000501693generalizedtheoryofthethrureflectmatchcalibrationt</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620</subfield><subfield code="q">DNB</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">53.00</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Pulido-Gaytan, Manuel Alejandro</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Generalized Theory of the Thru-Reflect-Match Calibration Technique</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2015</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">The thru-reflect-match (TRM) calibration technique uses as standards a through connection of ports 1 and 2 of the vector network analyzer, two symmetrical highly reflecting loads, and two broadband loads (match) of impedance close to the measuring system impedance (Z o ). The classical theory of the TRM calibration refers the calibration to the impedance of the load used as the match standard (Z M ), which is assumed as symmetrical. In practice, Z M may be frequency dependent. Moreover, as the frequency increases, the symmetry condition of the load used as match standard may become difficult to preserve, thus affecting the reference impedance definition and reducing the accuracy of the calibration. In this paper, the ABCD-parameters matrix formalism is used to introduce for the first time a generalized TRM calibration theory, allowing the use of either symmetrical or nonsymmetrical loads of arbitrary impedance as the match standard.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Calibration techniques</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Impedance measurement</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Impedance</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">broadband loading</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">arbitrary impedance matching</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">vector network analyzer</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">thru-reflect-match calibration technique</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">measurement standards</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">reflecting loading</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">calibration</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">microwave measurements</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">TRM calibration technique</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Power transmission lines</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Transmission line matrix methods</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">network analysers</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">measurements techniques</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">matrix algebra</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">ABCD parameter matrix</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Transmission line measurements</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">vector network analysis (VNA)</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">impedance matching</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Standards</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">on-wafer calibration</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">reference impedance definition</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Calibration</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Apolinar Reynoso-Hernandez, J</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Loo-Yau, Jose Raul</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zarate-de Landa, Andres</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">del Carmen Maya-Sánchez, María</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">IEEE transactions on microwave theory and techniques</subfield><subfield code="d">New York, NY : IEEE, 1963</subfield><subfield code="g">63(2015), 5, Seite 1693-1699</subfield><subfield code="w">(DE-627)129547344</subfield><subfield code="w">(DE-600)218509-X</subfield><subfield code="w">(DE-576)01499822X</subfield><subfield code="x">0018-9480</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:63</subfield><subfield code="g">year:2015</subfield><subfield code="g">number:5</subfield><subfield code="g">pages:1693-1699</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">http://dx.doi.org/10.1109/TMTT.2015.2417860</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7084159</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">http://search.proquest.com/docview/1685290943</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_170</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2004</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2005</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2016</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4313</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4318</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">53.00</subfield><subfield code="q">AVZ</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">63</subfield><subfield code="j">2015</subfield><subfield code="e">5</subfield><subfield code="h">1693-1699</subfield></datafield></record></collection>
|
score |
7.401924 |