Analysis of leaf surfaces using scanning ion conductance microscopy
Leaf surfaces are highly complex functional systems with well defined chemistry and structure dictating the barrier and transport properties of the leaf cuticle. It is a significant imaging challenge to analyse the very thin and often complex wax‐like leaf cuticle morphology in their natural state....
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
WALKER, SHAUN C [verfasserIn] |
|---|
| Format: |
Artikel |
|---|---|
| Sprache: |
Englisch |
| Erschienen: |
2015 |
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| Rechteinformationen: |
Nutzungsrecht: 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society. |
|---|
| Schlagwörter: |
scanning ion conductance microscopy Microscopy, Electron, Scanning - methods Microscopy, Atomic Force - instrumentation Microscopy, Atomic Force - methods |
|---|
| Übergeordnetes Werk: |
Enthalten in: Journal of microscopy - Oxford : Wiley-Blackwell, 1969, 258(2015), 2, Seite 119-126 |
|---|---|
| Übergeordnetes Werk: |
volume:258 ; year:2015 ; number:2 ; pages:119-126 |
| Links: |
|---|
| DOI / URN: |
10.1111/jmi.12225 |
|---|
| Katalog-ID: |
OLC1964493641 |
|---|
| LEADER | 01000caa a2200265 4500 | ||
|---|---|---|---|
| 001 | OLC1964493641 | ||
| 003 | DE-627 | ||
| 005 | 20230714162516.0 | ||
| 007 | tu | ||
| 008 | 160206s2015 xx ||||| 00| ||eng c | ||
| 024 | 7 | |a 10.1111/jmi.12225 |2 doi | |
| 028 | 5 | 2 | |a PQ20160617 |
| 035 | |a (DE-627)OLC1964493641 | ||
| 035 | |a (DE-599)GBVOLC1964493641 | ||
| 035 | |a (PRQ)p1745-b29ddba6fcdae451ed452ce6a050743ba3915f43fdd3e94065da10ddea170e4d0 | ||
| 035 | |a (KEY)0031376920150000258000200119analysisofleafsurfacesusingscanningionconductancem | ||
| 040 | |a DE-627 |b ger |c DE-627 |e rakwb | ||
| 041 | |a eng | ||
| 082 | 0 | 4 | |a 570 |q DNB |
| 084 | |a BIODIV |2 fid | ||
| 100 | 1 | |a WALKER, SHAUN C |e verfasserin |4 aut | |
| 245 | 1 | 0 | |a Analysis of leaf surfaces using scanning ion conductance microscopy |
| 264 | 1 | |c 2015 | |
| 336 | |a Text |b txt |2 rdacontent | ||
| 337 | |a ohne Hilfsmittel zu benutzen |b n |2 rdamedia | ||
| 338 | |a Band |b nc |2 rdacarrier | ||
| 520 | |a Leaf surfaces are highly complex functional systems with well defined chemistry and structure dictating the barrier and transport properties of the leaf cuticle. It is a significant imaging challenge to analyse the very thin and often complex wax‐like leaf cuticle morphology in their natural state. Scanning electron microscopy (SEM) and to a lesser extent Atomic force microscopy are techniques that have been used to study the leaf surface but their remains information that is difficult to obtain via these approaches. SEM is able to produce highly detailed and high‐resolution images needed to study leaf structures at the submicron level. It typically operates in a vacuum or low pressure environment and as a consequence is generally unable to deal with the in situ analysis of dynamic surface events at submicron scales. Atomic force microscopy also possess the high‐resolution imaging required and can follow dynamic events in ambient and liquid environments, but can over exaggerate small features and cannot image most leaf surfaces due to their inherent roughness at the micron scale. Scanning ion conductance microscopy (SICM), which operates in a liquid environment, provides a potential complementary analytical approach able to address these issues and which is yet to be explored for studying leaf surfaces. Here we illustrate the potential of SICM on various leaf surfaces and compare the data to SEM and atomic force microscopy images on the same samples. In achieving successful imaging we also show that SICM can be used to study the wetting of hydrophobic surfaces in situ . This has potentially wider implications than the study of leaves alone as surface wetting phenomena are important in a range of fundamental and applied studies. Plant leaves are an important part of the plant, they generate energy the plant used to grow, the surface of leaves are equally important. The surface of leaves have small wax structures and these structures protect the leaf, from insects, fungus or water. These structures are important to scientists because this is the main barrier for pesticide, herbicides and have processors related to their structures. Scanning ion conductance microscopy is a new imaging device that has been developed for imaging cells, in this article we use this device to image plant leaves and compare this new device with other established microscopes. Imaging the leaves of strawberry, English ivy, pea and oil seed rape. Scanning ion conductance microscopy is different from the conventional microscopes because it does not require altering the leaf to image unlike scanning electron microscope, and is noncontact unlike atomic force microscopy. As well, this new technique was used to image a droplet wetting a leaf surface, using the microscope to image the different stages of the wetting process. Starting from droplet sitting on the surface of the structures then fully wetting the surface. | ||
| 540 | |a Nutzungsrecht: 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society | ||
| 540 | |a 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society. | ||
| 650 | 4 | |a atomic force microscopy | |
| 650 | 4 | |a AFM | |
| 650 | 4 | |a leaf surface | |
| 650 | 4 | |a SICM | |
| 650 | 4 | |a scanning ion conductance microscopy | |
| 650 | 4 | |a Microscopy - instrumentation | |
| 650 | 4 | |a Microscopy, Electron, Scanning - methods | |
| 650 | 4 | |a Microscopy - methods | |
| 650 | 4 | |a Plant Leaves - ultrastructure | |
| 650 | 4 | |a Microscopy, Atomic Force - instrumentation | |
| 650 | 4 | |a Microscopy, Atomic Force - methods | |
| 650 | 4 | |a Microscopy, Electron, Scanning - instrumentation | |
| 650 | 4 | |a Scanning electron microscopy | |
| 650 | 4 | |a Studies | |
| 650 | 4 | |a Microscopes | |
| 700 | 1 | |a ALLEN, STEPHANIE |4 oth | |
| 700 | 1 | |a BELL, GORDON |4 oth | |
| 700 | 1 | |a ROBERTS, CLIVE J |4 oth | |
| 773 | 0 | 8 | |i Enthalten in |t Journal of microscopy |d Oxford : Wiley-Blackwell, 1969 |g 258(2015), 2, Seite 119-126 |w (DE-627)129550426 |w (DE-600)219263-9 |w (DE-576)015003884 |x 0022-2720 |7 nnns |
| 773 | 1 | 8 | |g volume:258 |g year:2015 |g number:2 |g pages:119-126 |
| 856 | 4 | 1 | |u http://dx.doi.org/10.1111/jmi.12225 |3 Volltext |
| 856 | 4 | 2 | |u http://onlinelibrary.wiley.com/doi/10.1111/jmi.12225/abstract |
| 856 | 4 | 2 | |u http://www.ncbi.nlm.nih.gov/pubmed/25611705 |
| 856 | 4 | 2 | |u http://search.proquest.com/docview/1673140168 |
| 912 | |a GBV_USEFLAG_A | ||
| 912 | |a SYSFLAG_A | ||
| 912 | |a GBV_OLC | ||
| 912 | |a FID-BIODIV | ||
| 912 | |a SSG-OLC-PHY | ||
| 912 | |a GBV_ILN_22 | ||
| 912 | |a GBV_ILN_70 | ||
| 912 | |a GBV_ILN_150 | ||
| 912 | |a GBV_ILN_2219 | ||
| 912 | |a GBV_ILN_4012 | ||
| 951 | |a AR | ||
| 952 | |d 258 |j 2015 |e 2 |h 119-126 | ||
| author_variant |
s c w sc scw |
|---|---|
| matchkey_str |
article:00222720:2015----::nlssfefufcssnsanninod |
| hierarchy_sort_str |
2015 |
| publishDate |
2015 |
| allfields |
10.1111/jmi.12225 doi PQ20160617 (DE-627)OLC1964493641 (DE-599)GBVOLC1964493641 (PRQ)p1745-b29ddba6fcdae451ed452ce6a050743ba3915f43fdd3e94065da10ddea170e4d0 (KEY)0031376920150000258000200119analysisofleafsurfacesusingscanningionconductancem DE-627 ger DE-627 rakwb eng 570 DNB BIODIV fid WALKER, SHAUN C verfasserin aut Analysis of leaf surfaces using scanning ion conductance microscopy 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Leaf surfaces are highly complex functional systems with well defined chemistry and structure dictating the barrier and transport properties of the leaf cuticle. It is a significant imaging challenge to analyse the very thin and often complex wax‐like leaf cuticle morphology in their natural state. Scanning electron microscopy (SEM) and to a lesser extent Atomic force microscopy are techniques that have been used to study the leaf surface but their remains information that is difficult to obtain via these approaches. SEM is able to produce highly detailed and high‐resolution images needed to study leaf structures at the submicron level. It typically operates in a vacuum or low pressure environment and as a consequence is generally unable to deal with the in situ analysis of dynamic surface events at submicron scales. Atomic force microscopy also possess the high‐resolution imaging required and can follow dynamic events in ambient and liquid environments, but can over exaggerate small features and cannot image most leaf surfaces due to their inherent roughness at the micron scale. Scanning ion conductance microscopy (SICM), which operates in a liquid environment, provides a potential complementary analytical approach able to address these issues and which is yet to be explored for studying leaf surfaces. Here we illustrate the potential of SICM on various leaf surfaces and compare the data to SEM and atomic force microscopy images on the same samples. In achieving successful imaging we also show that SICM can be used to study the wetting of hydrophobic surfaces in situ . This has potentially wider implications than the study of leaves alone as surface wetting phenomena are important in a range of fundamental and applied studies. Plant leaves are an important part of the plant, they generate energy the plant used to grow, the surface of leaves are equally important. The surface of leaves have small wax structures and these structures protect the leaf, from insects, fungus or water. These structures are important to scientists because this is the main barrier for pesticide, herbicides and have processors related to their structures. Scanning ion conductance microscopy is a new imaging device that has been developed for imaging cells, in this article we use this device to image plant leaves and compare this new device with other established microscopes. Imaging the leaves of strawberry, English ivy, pea and oil seed rape. Scanning ion conductance microscopy is different from the conventional microscopes because it does not require altering the leaf to image unlike scanning electron microscope, and is noncontact unlike atomic force microscopy. As well, this new technique was used to image a droplet wetting a leaf surface, using the microscope to image the different stages of the wetting process. Starting from droplet sitting on the surface of the structures then fully wetting the surface. Nutzungsrecht: 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society. atomic force microscopy AFM leaf surface SICM scanning ion conductance microscopy Microscopy - instrumentation Microscopy, Electron, Scanning - methods Microscopy - methods Plant Leaves - ultrastructure Microscopy, Atomic Force - instrumentation Microscopy, Atomic Force - methods Microscopy, Electron, Scanning - instrumentation Scanning electron microscopy Studies Microscopes ALLEN, STEPHANIE oth BELL, GORDON oth ROBERTS, CLIVE J oth Enthalten in Journal of microscopy Oxford : Wiley-Blackwell, 1969 258(2015), 2, Seite 119-126 (DE-627)129550426 (DE-600)219263-9 (DE-576)015003884 0022-2720 nnns volume:258 year:2015 number:2 pages:119-126 http://dx.doi.org/10.1111/jmi.12225 Volltext http://onlinelibrary.wiley.com/doi/10.1111/jmi.12225/abstract http://www.ncbi.nlm.nih.gov/pubmed/25611705 http://search.proquest.com/docview/1673140168 GBV_USEFLAG_A SYSFLAG_A GBV_OLC FID-BIODIV SSG-OLC-PHY GBV_ILN_22 GBV_ILN_70 GBV_ILN_150 GBV_ILN_2219 GBV_ILN_4012 AR 258 2015 2 119-126 |
| spelling |
10.1111/jmi.12225 doi PQ20160617 (DE-627)OLC1964493641 (DE-599)GBVOLC1964493641 (PRQ)p1745-b29ddba6fcdae451ed452ce6a050743ba3915f43fdd3e94065da10ddea170e4d0 (KEY)0031376920150000258000200119analysisofleafsurfacesusingscanningionconductancem DE-627 ger DE-627 rakwb eng 570 DNB BIODIV fid WALKER, SHAUN C verfasserin aut Analysis of leaf surfaces using scanning ion conductance microscopy 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Leaf surfaces are highly complex functional systems with well defined chemistry and structure dictating the barrier and transport properties of the leaf cuticle. It is a significant imaging challenge to analyse the very thin and often complex wax‐like leaf cuticle morphology in their natural state. Scanning electron microscopy (SEM) and to a lesser extent Atomic force microscopy are techniques that have been used to study the leaf surface but their remains information that is difficult to obtain via these approaches. SEM is able to produce highly detailed and high‐resolution images needed to study leaf structures at the submicron level. It typically operates in a vacuum or low pressure environment and as a consequence is generally unable to deal with the in situ analysis of dynamic surface events at submicron scales. Atomic force microscopy also possess the high‐resolution imaging required and can follow dynamic events in ambient and liquid environments, but can over exaggerate small features and cannot image most leaf surfaces due to their inherent roughness at the micron scale. Scanning ion conductance microscopy (SICM), which operates in a liquid environment, provides a potential complementary analytical approach able to address these issues and which is yet to be explored for studying leaf surfaces. Here we illustrate the potential of SICM on various leaf surfaces and compare the data to SEM and atomic force microscopy images on the same samples. In achieving successful imaging we also show that SICM can be used to study the wetting of hydrophobic surfaces in situ . This has potentially wider implications than the study of leaves alone as surface wetting phenomena are important in a range of fundamental and applied studies. Plant leaves are an important part of the plant, they generate energy the plant used to grow, the surface of leaves are equally important. The surface of leaves have small wax structures and these structures protect the leaf, from insects, fungus or water. These structures are important to scientists because this is the main barrier for pesticide, herbicides and have processors related to their structures. Scanning ion conductance microscopy is a new imaging device that has been developed for imaging cells, in this article we use this device to image plant leaves and compare this new device with other established microscopes. Imaging the leaves of strawberry, English ivy, pea and oil seed rape. Scanning ion conductance microscopy is different from the conventional microscopes because it does not require altering the leaf to image unlike scanning electron microscope, and is noncontact unlike atomic force microscopy. As well, this new technique was used to image a droplet wetting a leaf surface, using the microscope to image the different stages of the wetting process. Starting from droplet sitting on the surface of the structures then fully wetting the surface. Nutzungsrecht: 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society. atomic force microscopy AFM leaf surface SICM scanning ion conductance microscopy Microscopy - instrumentation Microscopy, Electron, Scanning - methods Microscopy - methods Plant Leaves - ultrastructure Microscopy, Atomic Force - instrumentation Microscopy, Atomic Force - methods Microscopy, Electron, Scanning - instrumentation Scanning electron microscopy Studies Microscopes ALLEN, STEPHANIE oth BELL, GORDON oth ROBERTS, CLIVE J oth Enthalten in Journal of microscopy Oxford : Wiley-Blackwell, 1969 258(2015), 2, Seite 119-126 (DE-627)129550426 (DE-600)219263-9 (DE-576)015003884 0022-2720 nnns volume:258 year:2015 number:2 pages:119-126 http://dx.doi.org/10.1111/jmi.12225 Volltext http://onlinelibrary.wiley.com/doi/10.1111/jmi.12225/abstract http://www.ncbi.nlm.nih.gov/pubmed/25611705 http://search.proquest.com/docview/1673140168 GBV_USEFLAG_A SYSFLAG_A GBV_OLC FID-BIODIV SSG-OLC-PHY GBV_ILN_22 GBV_ILN_70 GBV_ILN_150 GBV_ILN_2219 GBV_ILN_4012 AR 258 2015 2 119-126 |
| allfields_unstemmed |
10.1111/jmi.12225 doi PQ20160617 (DE-627)OLC1964493641 (DE-599)GBVOLC1964493641 (PRQ)p1745-b29ddba6fcdae451ed452ce6a050743ba3915f43fdd3e94065da10ddea170e4d0 (KEY)0031376920150000258000200119analysisofleafsurfacesusingscanningionconductancem DE-627 ger DE-627 rakwb eng 570 DNB BIODIV fid WALKER, SHAUN C verfasserin aut Analysis of leaf surfaces using scanning ion conductance microscopy 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Leaf surfaces are highly complex functional systems with well defined chemistry and structure dictating the barrier and transport properties of the leaf cuticle. It is a significant imaging challenge to analyse the very thin and often complex wax‐like leaf cuticle morphology in their natural state. Scanning electron microscopy (SEM) and to a lesser extent Atomic force microscopy are techniques that have been used to study the leaf surface but their remains information that is difficult to obtain via these approaches. SEM is able to produce highly detailed and high‐resolution images needed to study leaf structures at the submicron level. It typically operates in a vacuum or low pressure environment and as a consequence is generally unable to deal with the in situ analysis of dynamic surface events at submicron scales. Atomic force microscopy also possess the high‐resolution imaging required and can follow dynamic events in ambient and liquid environments, but can over exaggerate small features and cannot image most leaf surfaces due to their inherent roughness at the micron scale. Scanning ion conductance microscopy (SICM), which operates in a liquid environment, provides a potential complementary analytical approach able to address these issues and which is yet to be explored for studying leaf surfaces. Here we illustrate the potential of SICM on various leaf surfaces and compare the data to SEM and atomic force microscopy images on the same samples. In achieving successful imaging we also show that SICM can be used to study the wetting of hydrophobic surfaces in situ . This has potentially wider implications than the study of leaves alone as surface wetting phenomena are important in a range of fundamental and applied studies. Plant leaves are an important part of the plant, they generate energy the plant used to grow, the surface of leaves are equally important. The surface of leaves have small wax structures and these structures protect the leaf, from insects, fungus or water. These structures are important to scientists because this is the main barrier for pesticide, herbicides and have processors related to their structures. Scanning ion conductance microscopy is a new imaging device that has been developed for imaging cells, in this article we use this device to image plant leaves and compare this new device with other established microscopes. Imaging the leaves of strawberry, English ivy, pea and oil seed rape. Scanning ion conductance microscopy is different from the conventional microscopes because it does not require altering the leaf to image unlike scanning electron microscope, and is noncontact unlike atomic force microscopy. As well, this new technique was used to image a droplet wetting a leaf surface, using the microscope to image the different stages of the wetting process. Starting from droplet sitting on the surface of the structures then fully wetting the surface. Nutzungsrecht: 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society. atomic force microscopy AFM leaf surface SICM scanning ion conductance microscopy Microscopy - instrumentation Microscopy, Electron, Scanning - methods Microscopy - methods Plant Leaves - ultrastructure Microscopy, Atomic Force - instrumentation Microscopy, Atomic Force - methods Microscopy, Electron, Scanning - instrumentation Scanning electron microscopy Studies Microscopes ALLEN, STEPHANIE oth BELL, GORDON oth ROBERTS, CLIVE J oth Enthalten in Journal of microscopy Oxford : Wiley-Blackwell, 1969 258(2015), 2, Seite 119-126 (DE-627)129550426 (DE-600)219263-9 (DE-576)015003884 0022-2720 nnns volume:258 year:2015 number:2 pages:119-126 http://dx.doi.org/10.1111/jmi.12225 Volltext http://onlinelibrary.wiley.com/doi/10.1111/jmi.12225/abstract http://www.ncbi.nlm.nih.gov/pubmed/25611705 http://search.proquest.com/docview/1673140168 GBV_USEFLAG_A SYSFLAG_A GBV_OLC FID-BIODIV SSG-OLC-PHY GBV_ILN_22 GBV_ILN_70 GBV_ILN_150 GBV_ILN_2219 GBV_ILN_4012 AR 258 2015 2 119-126 |
| allfieldsGer |
10.1111/jmi.12225 doi PQ20160617 (DE-627)OLC1964493641 (DE-599)GBVOLC1964493641 (PRQ)p1745-b29ddba6fcdae451ed452ce6a050743ba3915f43fdd3e94065da10ddea170e4d0 (KEY)0031376920150000258000200119analysisofleafsurfacesusingscanningionconductancem DE-627 ger DE-627 rakwb eng 570 DNB BIODIV fid WALKER, SHAUN C verfasserin aut Analysis of leaf surfaces using scanning ion conductance microscopy 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Leaf surfaces are highly complex functional systems with well defined chemistry and structure dictating the barrier and transport properties of the leaf cuticle. It is a significant imaging challenge to analyse the very thin and often complex wax‐like leaf cuticle morphology in their natural state. Scanning electron microscopy (SEM) and to a lesser extent Atomic force microscopy are techniques that have been used to study the leaf surface but their remains information that is difficult to obtain via these approaches. SEM is able to produce highly detailed and high‐resolution images needed to study leaf structures at the submicron level. It typically operates in a vacuum or low pressure environment and as a consequence is generally unable to deal with the in situ analysis of dynamic surface events at submicron scales. Atomic force microscopy also possess the high‐resolution imaging required and can follow dynamic events in ambient and liquid environments, but can over exaggerate small features and cannot image most leaf surfaces due to their inherent roughness at the micron scale. Scanning ion conductance microscopy (SICM), which operates in a liquid environment, provides a potential complementary analytical approach able to address these issues and which is yet to be explored for studying leaf surfaces. Here we illustrate the potential of SICM on various leaf surfaces and compare the data to SEM and atomic force microscopy images on the same samples. In achieving successful imaging we also show that SICM can be used to study the wetting of hydrophobic surfaces in situ . This has potentially wider implications than the study of leaves alone as surface wetting phenomena are important in a range of fundamental and applied studies. Plant leaves are an important part of the plant, they generate energy the plant used to grow, the surface of leaves are equally important. The surface of leaves have small wax structures and these structures protect the leaf, from insects, fungus or water. These structures are important to scientists because this is the main barrier for pesticide, herbicides and have processors related to their structures. Scanning ion conductance microscopy is a new imaging device that has been developed for imaging cells, in this article we use this device to image plant leaves and compare this new device with other established microscopes. Imaging the leaves of strawberry, English ivy, pea and oil seed rape. Scanning ion conductance microscopy is different from the conventional microscopes because it does not require altering the leaf to image unlike scanning electron microscope, and is noncontact unlike atomic force microscopy. As well, this new technique was used to image a droplet wetting a leaf surface, using the microscope to image the different stages of the wetting process. Starting from droplet sitting on the surface of the structures then fully wetting the surface. Nutzungsrecht: 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society. atomic force microscopy AFM leaf surface SICM scanning ion conductance microscopy Microscopy - instrumentation Microscopy, Electron, Scanning - methods Microscopy - methods Plant Leaves - ultrastructure Microscopy, Atomic Force - instrumentation Microscopy, Atomic Force - methods Microscopy, Electron, Scanning - instrumentation Scanning electron microscopy Studies Microscopes ALLEN, STEPHANIE oth BELL, GORDON oth ROBERTS, CLIVE J oth Enthalten in Journal of microscopy Oxford : Wiley-Blackwell, 1969 258(2015), 2, Seite 119-126 (DE-627)129550426 (DE-600)219263-9 (DE-576)015003884 0022-2720 nnns volume:258 year:2015 number:2 pages:119-126 http://dx.doi.org/10.1111/jmi.12225 Volltext http://onlinelibrary.wiley.com/doi/10.1111/jmi.12225/abstract http://www.ncbi.nlm.nih.gov/pubmed/25611705 http://search.proquest.com/docview/1673140168 GBV_USEFLAG_A SYSFLAG_A GBV_OLC FID-BIODIV SSG-OLC-PHY GBV_ILN_22 GBV_ILN_70 GBV_ILN_150 GBV_ILN_2219 GBV_ILN_4012 AR 258 2015 2 119-126 |
| allfieldsSound |
10.1111/jmi.12225 doi PQ20160617 (DE-627)OLC1964493641 (DE-599)GBVOLC1964493641 (PRQ)p1745-b29ddba6fcdae451ed452ce6a050743ba3915f43fdd3e94065da10ddea170e4d0 (KEY)0031376920150000258000200119analysisofleafsurfacesusingscanningionconductancem DE-627 ger DE-627 rakwb eng 570 DNB BIODIV fid WALKER, SHAUN C verfasserin aut Analysis of leaf surfaces using scanning ion conductance microscopy 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Leaf surfaces are highly complex functional systems with well defined chemistry and structure dictating the barrier and transport properties of the leaf cuticle. It is a significant imaging challenge to analyse the very thin and often complex wax‐like leaf cuticle morphology in their natural state. Scanning electron microscopy (SEM) and to a lesser extent Atomic force microscopy are techniques that have been used to study the leaf surface but their remains information that is difficult to obtain via these approaches. SEM is able to produce highly detailed and high‐resolution images needed to study leaf structures at the submicron level. It typically operates in a vacuum or low pressure environment and as a consequence is generally unable to deal with the in situ analysis of dynamic surface events at submicron scales. Atomic force microscopy also possess the high‐resolution imaging required and can follow dynamic events in ambient and liquid environments, but can over exaggerate small features and cannot image most leaf surfaces due to their inherent roughness at the micron scale. Scanning ion conductance microscopy (SICM), which operates in a liquid environment, provides a potential complementary analytical approach able to address these issues and which is yet to be explored for studying leaf surfaces. Here we illustrate the potential of SICM on various leaf surfaces and compare the data to SEM and atomic force microscopy images on the same samples. In achieving successful imaging we also show that SICM can be used to study the wetting of hydrophobic surfaces in situ . This has potentially wider implications than the study of leaves alone as surface wetting phenomena are important in a range of fundamental and applied studies. Plant leaves are an important part of the plant, they generate energy the plant used to grow, the surface of leaves are equally important. The surface of leaves have small wax structures and these structures protect the leaf, from insects, fungus or water. These structures are important to scientists because this is the main barrier for pesticide, herbicides and have processors related to their structures. Scanning ion conductance microscopy is a new imaging device that has been developed for imaging cells, in this article we use this device to image plant leaves and compare this new device with other established microscopes. Imaging the leaves of strawberry, English ivy, pea and oil seed rape. Scanning ion conductance microscopy is different from the conventional microscopes because it does not require altering the leaf to image unlike scanning electron microscope, and is noncontact unlike atomic force microscopy. As well, this new technique was used to image a droplet wetting a leaf surface, using the microscope to image the different stages of the wetting process. Starting from droplet sitting on the surface of the structures then fully wetting the surface. Nutzungsrecht: 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society. atomic force microscopy AFM leaf surface SICM scanning ion conductance microscopy Microscopy - instrumentation Microscopy, Electron, Scanning - methods Microscopy - methods Plant Leaves - ultrastructure Microscopy, Atomic Force - instrumentation Microscopy, Atomic Force - methods Microscopy, Electron, Scanning - instrumentation Scanning electron microscopy Studies Microscopes ALLEN, STEPHANIE oth BELL, GORDON oth ROBERTS, CLIVE J oth Enthalten in Journal of microscopy Oxford : Wiley-Blackwell, 1969 258(2015), 2, Seite 119-126 (DE-627)129550426 (DE-600)219263-9 (DE-576)015003884 0022-2720 nnns volume:258 year:2015 number:2 pages:119-126 http://dx.doi.org/10.1111/jmi.12225 Volltext http://onlinelibrary.wiley.com/doi/10.1111/jmi.12225/abstract http://www.ncbi.nlm.nih.gov/pubmed/25611705 http://search.proquest.com/docview/1673140168 GBV_USEFLAG_A SYSFLAG_A GBV_OLC FID-BIODIV SSG-OLC-PHY GBV_ILN_22 GBV_ILN_70 GBV_ILN_150 GBV_ILN_2219 GBV_ILN_4012 AR 258 2015 2 119-126 |
| language |
English |
| source |
Enthalten in Journal of microscopy 258(2015), 2, Seite 119-126 volume:258 year:2015 number:2 pages:119-126 |
| sourceStr |
Enthalten in Journal of microscopy 258(2015), 2, Seite 119-126 volume:258 year:2015 number:2 pages:119-126 |
| format_phy_str_mv |
Article |
| institution |
findex.gbv.de |
| topic_facet |
atomic force microscopy AFM leaf surface SICM scanning ion conductance microscopy Microscopy - instrumentation Microscopy, Electron, Scanning - methods Microscopy - methods Plant Leaves - ultrastructure Microscopy, Atomic Force - instrumentation Microscopy, Atomic Force - methods Microscopy, Electron, Scanning - instrumentation Scanning electron microscopy Studies Microscopes |
| dewey-raw |
570 |
| isfreeaccess_bool |
false |
| container_title |
Journal of microscopy |
| authorswithroles_txt_mv |
WALKER, SHAUN C @@aut@@ ALLEN, STEPHANIE @@oth@@ BELL, GORDON @@oth@@ ROBERTS, CLIVE J @@oth@@ |
| publishDateDaySort_date |
2015-01-01T00:00:00Z |
| hierarchy_top_id |
129550426 |
| dewey-sort |
3570 |
| id |
OLC1964493641 |
| language_de |
englisch |
| fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a2200265 4500</leader><controlfield tag="001">OLC1964493641</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230714162516.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">160206s2015 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1111/jmi.12225</subfield><subfield code="2">doi</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">PQ20160617</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1964493641</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1964493641</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(PRQ)p1745-b29ddba6fcdae451ed452ce6a050743ba3915f43fdd3e94065da10ddea170e4d0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(KEY)0031376920150000258000200119analysisofleafsurfacesusingscanningionconductancem</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">570</subfield><subfield code="q">DNB</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">BIODIV</subfield><subfield code="2">fid</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">WALKER, SHAUN C</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Analysis of leaf surfaces using scanning ion conductance microscopy</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2015</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Leaf surfaces are highly complex functional systems with well defined chemistry and structure dictating the barrier and transport properties of the leaf cuticle. It is a significant imaging challenge to analyse the very thin and often complex wax‐like leaf cuticle morphology in their natural state. Scanning electron microscopy (SEM) and to a lesser extent Atomic force microscopy are techniques that have been used to study the leaf surface but their remains information that is difficult to obtain via these approaches. SEM is able to produce highly detailed and high‐resolution images needed to study leaf structures at the submicron level. It typically operates in a vacuum or low pressure environment and as a consequence is generally unable to deal with the in situ analysis of dynamic surface events at submicron scales. Atomic force microscopy also possess the high‐resolution imaging required and can follow dynamic events in ambient and liquid environments, but can over exaggerate small features and cannot image most leaf surfaces due to their inherent roughness at the micron scale. Scanning ion conductance microscopy (SICM), which operates in a liquid environment, provides a potential complementary analytical approach able to address these issues and which is yet to be explored for studying leaf surfaces. Here we illustrate the potential of SICM on various leaf surfaces and compare the data to SEM and atomic force microscopy images on the same samples. In achieving successful imaging we also show that SICM can be used to study the wetting of hydrophobic surfaces in situ . This has potentially wider implications than the study of leaves alone as surface wetting phenomena are important in a range of fundamental and applied studies. Plant leaves are an important part of the plant, they generate energy the plant used to grow, the surface of leaves are equally important. The surface of leaves have small wax structures and these structures protect the leaf, from insects, fungus or water. These structures are important to scientists because this is the main barrier for pesticide, herbicides and have processors related to their structures. Scanning ion conductance microscopy is a new imaging device that has been developed for imaging cells, in this article we use this device to image plant leaves and compare this new device with other established microscopes. Imaging the leaves of strawberry, English ivy, pea and oil seed rape. Scanning ion conductance microscopy is different from the conventional microscopes because it does not require altering the leaf to image unlike scanning electron microscope, and is noncontact unlike atomic force microscopy. As well, this new technique was used to image a droplet wetting a leaf surface, using the microscope to image the different stages of the wetting process. Starting from droplet sitting on the surface of the structures then fully wetting the surface.</subfield></datafield><datafield tag="540" ind1=" " ind2=" "><subfield code="a">Nutzungsrecht: 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society</subfield></datafield><datafield tag="540" ind1=" " ind2=" "><subfield code="a">2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">atomic force microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">AFM</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">leaf surface</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">SICM</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">scanning ion conductance microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy - instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy, Electron, Scanning - methods</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy - methods</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Plant Leaves - ultrastructure</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy, Atomic Force - instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy, Atomic Force - methods</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy, Electron, Scanning - instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Scanning electron microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Studies</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopes</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">ALLEN, STEPHANIE</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">BELL, GORDON</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">ROBERTS, CLIVE J</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Journal of microscopy</subfield><subfield code="d">Oxford : Wiley-Blackwell, 1969</subfield><subfield code="g">258(2015), 2, Seite 119-126</subfield><subfield code="w">(DE-627)129550426</subfield><subfield code="w">(DE-600)219263-9</subfield><subfield code="w">(DE-576)015003884</subfield><subfield code="x">0022-2720</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:258</subfield><subfield code="g">year:2015</subfield><subfield code="g">number:2</subfield><subfield code="g">pages:119-126</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">http://dx.doi.org/10.1111/jmi.12225</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">http://onlinelibrary.wiley.com/doi/10.1111/jmi.12225/abstract</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">http://www.ncbi.nlm.nih.gov/pubmed/25611705</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">http://search.proquest.com/docview/1673140168</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">FID-BIODIV</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_150</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2219</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4012</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">258</subfield><subfield code="j">2015</subfield><subfield code="e">2</subfield><subfield code="h">119-126</subfield></datafield></record></collection>
|
| author |
WALKER, SHAUN C |
| spellingShingle |
WALKER, SHAUN C ddc 570 fid BIODIV misc atomic force microscopy misc AFM misc leaf surface misc SICM misc scanning ion conductance microscopy misc Microscopy - instrumentation misc Microscopy, Electron, Scanning - methods misc Microscopy - methods misc Plant Leaves - ultrastructure misc Microscopy, Atomic Force - instrumentation misc Microscopy, Atomic Force - methods misc Microscopy, Electron, Scanning - instrumentation misc Scanning electron microscopy misc Studies misc Microscopes Analysis of leaf surfaces using scanning ion conductance microscopy |
| authorStr |
WALKER, SHAUN C |
| ppnlink_with_tag_str_mv |
@@773@@(DE-627)129550426 |
| format |
Article |
| dewey-ones |
570 - Life sciences; biology |
| delete_txt_mv |
keep |
| author_role |
aut |
| collection |
OLC |
| remote_str |
false |
| illustrated |
Not Illustrated |
| issn |
0022-2720 |
| topic_title |
570 DNB BIODIV fid Analysis of leaf surfaces using scanning ion conductance microscopy atomic force microscopy AFM leaf surface SICM scanning ion conductance microscopy Microscopy - instrumentation Microscopy, Electron, Scanning - methods Microscopy - methods Plant Leaves - ultrastructure Microscopy, Atomic Force - instrumentation Microscopy, Atomic Force - methods Microscopy, Electron, Scanning - instrumentation Scanning electron microscopy Studies Microscopes |
| topic |
ddc 570 fid BIODIV misc atomic force microscopy misc AFM misc leaf surface misc SICM misc scanning ion conductance microscopy misc Microscopy - instrumentation misc Microscopy, Electron, Scanning - methods misc Microscopy - methods misc Plant Leaves - ultrastructure misc Microscopy, Atomic Force - instrumentation misc Microscopy, Atomic Force - methods misc Microscopy, Electron, Scanning - instrumentation misc Scanning electron microscopy misc Studies misc Microscopes |
| topic_unstemmed |
ddc 570 fid BIODIV misc atomic force microscopy misc AFM misc leaf surface misc SICM misc scanning ion conductance microscopy misc Microscopy - instrumentation misc Microscopy, Electron, Scanning - methods misc Microscopy - methods misc Plant Leaves - ultrastructure misc Microscopy, Atomic Force - instrumentation misc Microscopy, Atomic Force - methods misc Microscopy, Electron, Scanning - instrumentation misc Scanning electron microscopy misc Studies misc Microscopes |
| topic_browse |
ddc 570 fid BIODIV misc atomic force microscopy misc AFM misc leaf surface misc SICM misc scanning ion conductance microscopy misc Microscopy - instrumentation misc Microscopy, Electron, Scanning - methods misc Microscopy - methods misc Plant Leaves - ultrastructure misc Microscopy, Atomic Force - instrumentation misc Microscopy, Atomic Force - methods misc Microscopy, Electron, Scanning - instrumentation misc Scanning electron microscopy misc Studies misc Microscopes |
| format_facet |
Aufsätze Gedruckte Aufsätze |
| format_main_str_mv |
Text Zeitschrift/Artikel |
| carriertype_str_mv |
nc |
| author2_variant |
s a sa g b gb c j r cj cjr |
| hierarchy_parent_title |
Journal of microscopy |
| hierarchy_parent_id |
129550426 |
| dewey-tens |
570 - Life sciences; biology |
| hierarchy_top_title |
Journal of microscopy |
| isfreeaccess_txt |
false |
| familylinks_str_mv |
(DE-627)129550426 (DE-600)219263-9 (DE-576)015003884 |
| title |
Analysis of leaf surfaces using scanning ion conductance microscopy |
| ctrlnum |
(DE-627)OLC1964493641 (DE-599)GBVOLC1964493641 (PRQ)p1745-b29ddba6fcdae451ed452ce6a050743ba3915f43fdd3e94065da10ddea170e4d0 (KEY)0031376920150000258000200119analysisofleafsurfacesusingscanningionconductancem |
| title_full |
Analysis of leaf surfaces using scanning ion conductance microscopy |
| author_sort |
WALKER, SHAUN C |
| journal |
Journal of microscopy |
| journalStr |
Journal of microscopy |
| lang_code |
eng |
| isOA_bool |
false |
| dewey-hundreds |
500 - Science |
| recordtype |
marc |
| publishDateSort |
2015 |
| contenttype_str_mv |
txt |
| container_start_page |
119 |
| author_browse |
WALKER, SHAUN C |
| container_volume |
258 |
| class |
570 DNB BIODIV fid |
| format_se |
Aufsätze |
| author-letter |
WALKER, SHAUN C |
| doi_str_mv |
10.1111/jmi.12225 |
| dewey-full |
570 |
| title_sort |
analysis of leaf surfaces using scanning ion conductance microscopy |
| title_auth |
Analysis of leaf surfaces using scanning ion conductance microscopy |
| abstract |
Leaf surfaces are highly complex functional systems with well defined chemistry and structure dictating the barrier and transport properties of the leaf cuticle. It is a significant imaging challenge to analyse the very thin and often complex wax‐like leaf cuticle morphology in their natural state. Scanning electron microscopy (SEM) and to a lesser extent Atomic force microscopy are techniques that have been used to study the leaf surface but their remains information that is difficult to obtain via these approaches. SEM is able to produce highly detailed and high‐resolution images needed to study leaf structures at the submicron level. It typically operates in a vacuum or low pressure environment and as a consequence is generally unable to deal with the in situ analysis of dynamic surface events at submicron scales. Atomic force microscopy also possess the high‐resolution imaging required and can follow dynamic events in ambient and liquid environments, but can over exaggerate small features and cannot image most leaf surfaces due to their inherent roughness at the micron scale. Scanning ion conductance microscopy (SICM), which operates in a liquid environment, provides a potential complementary analytical approach able to address these issues and which is yet to be explored for studying leaf surfaces. Here we illustrate the potential of SICM on various leaf surfaces and compare the data to SEM and atomic force microscopy images on the same samples. In achieving successful imaging we also show that SICM can be used to study the wetting of hydrophobic surfaces in situ . This has potentially wider implications than the study of leaves alone as surface wetting phenomena are important in a range of fundamental and applied studies. Plant leaves are an important part of the plant, they generate energy the plant used to grow, the surface of leaves are equally important. The surface of leaves have small wax structures and these structures protect the leaf, from insects, fungus or water. These structures are important to scientists because this is the main barrier for pesticide, herbicides and have processors related to their structures. Scanning ion conductance microscopy is a new imaging device that has been developed for imaging cells, in this article we use this device to image plant leaves and compare this new device with other established microscopes. Imaging the leaves of strawberry, English ivy, pea and oil seed rape. Scanning ion conductance microscopy is different from the conventional microscopes because it does not require altering the leaf to image unlike scanning electron microscope, and is noncontact unlike atomic force microscopy. As well, this new technique was used to image a droplet wetting a leaf surface, using the microscope to image the different stages of the wetting process. Starting from droplet sitting on the surface of the structures then fully wetting the surface. |
| abstractGer |
Leaf surfaces are highly complex functional systems with well defined chemistry and structure dictating the barrier and transport properties of the leaf cuticle. It is a significant imaging challenge to analyse the very thin and often complex wax‐like leaf cuticle morphology in their natural state. Scanning electron microscopy (SEM) and to a lesser extent Atomic force microscopy are techniques that have been used to study the leaf surface but their remains information that is difficult to obtain via these approaches. SEM is able to produce highly detailed and high‐resolution images needed to study leaf structures at the submicron level. It typically operates in a vacuum or low pressure environment and as a consequence is generally unable to deal with the in situ analysis of dynamic surface events at submicron scales. Atomic force microscopy also possess the high‐resolution imaging required and can follow dynamic events in ambient and liquid environments, but can over exaggerate small features and cannot image most leaf surfaces due to their inherent roughness at the micron scale. Scanning ion conductance microscopy (SICM), which operates in a liquid environment, provides a potential complementary analytical approach able to address these issues and which is yet to be explored for studying leaf surfaces. Here we illustrate the potential of SICM on various leaf surfaces and compare the data to SEM and atomic force microscopy images on the same samples. In achieving successful imaging we also show that SICM can be used to study the wetting of hydrophobic surfaces in situ . This has potentially wider implications than the study of leaves alone as surface wetting phenomena are important in a range of fundamental and applied studies. Plant leaves are an important part of the plant, they generate energy the plant used to grow, the surface of leaves are equally important. The surface of leaves have small wax structures and these structures protect the leaf, from insects, fungus or water. These structures are important to scientists because this is the main barrier for pesticide, herbicides and have processors related to their structures. Scanning ion conductance microscopy is a new imaging device that has been developed for imaging cells, in this article we use this device to image plant leaves and compare this new device with other established microscopes. Imaging the leaves of strawberry, English ivy, pea and oil seed rape. Scanning ion conductance microscopy is different from the conventional microscopes because it does not require altering the leaf to image unlike scanning electron microscope, and is noncontact unlike atomic force microscopy. As well, this new technique was used to image a droplet wetting a leaf surface, using the microscope to image the different stages of the wetting process. Starting from droplet sitting on the surface of the structures then fully wetting the surface. |
| abstract_unstemmed |
Leaf surfaces are highly complex functional systems with well defined chemistry and structure dictating the barrier and transport properties of the leaf cuticle. It is a significant imaging challenge to analyse the very thin and often complex wax‐like leaf cuticle morphology in their natural state. Scanning electron microscopy (SEM) and to a lesser extent Atomic force microscopy are techniques that have been used to study the leaf surface but their remains information that is difficult to obtain via these approaches. SEM is able to produce highly detailed and high‐resolution images needed to study leaf structures at the submicron level. It typically operates in a vacuum or low pressure environment and as a consequence is generally unable to deal with the in situ analysis of dynamic surface events at submicron scales. Atomic force microscopy also possess the high‐resolution imaging required and can follow dynamic events in ambient and liquid environments, but can over exaggerate small features and cannot image most leaf surfaces due to their inherent roughness at the micron scale. Scanning ion conductance microscopy (SICM), which operates in a liquid environment, provides a potential complementary analytical approach able to address these issues and which is yet to be explored for studying leaf surfaces. Here we illustrate the potential of SICM on various leaf surfaces and compare the data to SEM and atomic force microscopy images on the same samples. In achieving successful imaging we also show that SICM can be used to study the wetting of hydrophobic surfaces in situ . This has potentially wider implications than the study of leaves alone as surface wetting phenomena are important in a range of fundamental and applied studies. Plant leaves are an important part of the plant, they generate energy the plant used to grow, the surface of leaves are equally important. The surface of leaves have small wax structures and these structures protect the leaf, from insects, fungus or water. These structures are important to scientists because this is the main barrier for pesticide, herbicides and have processors related to their structures. Scanning ion conductance microscopy is a new imaging device that has been developed for imaging cells, in this article we use this device to image plant leaves and compare this new device with other established microscopes. Imaging the leaves of strawberry, English ivy, pea and oil seed rape. Scanning ion conductance microscopy is different from the conventional microscopes because it does not require altering the leaf to image unlike scanning electron microscope, and is noncontact unlike atomic force microscopy. As well, this new technique was used to image a droplet wetting a leaf surface, using the microscope to image the different stages of the wetting process. Starting from droplet sitting on the surface of the structures then fully wetting the surface. |
| collection_details |
GBV_USEFLAG_A SYSFLAG_A GBV_OLC FID-BIODIV SSG-OLC-PHY GBV_ILN_22 GBV_ILN_70 GBV_ILN_150 GBV_ILN_2219 GBV_ILN_4012 |
| container_issue |
2 |
| title_short |
Analysis of leaf surfaces using scanning ion conductance microscopy |
| url |
http://dx.doi.org/10.1111/jmi.12225 http://onlinelibrary.wiley.com/doi/10.1111/jmi.12225/abstract http://www.ncbi.nlm.nih.gov/pubmed/25611705 http://search.proquest.com/docview/1673140168 |
| remote_bool |
false |
| author2 |
ALLEN, STEPHANIE BELL, GORDON ROBERTS, CLIVE J |
| author2Str |
ALLEN, STEPHANIE BELL, GORDON ROBERTS, CLIVE J |
| ppnlink |
129550426 |
| mediatype_str_mv |
n |
| isOA_txt |
false |
| hochschulschrift_bool |
false |
| author2_role |
oth oth oth |
| doi_str |
10.1111/jmi.12225 |
| up_date |
2024-07-03T14:11:14.450Z |
| _version_ |
1803567365567283200 |
| fullrecord_marcxml |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a2200265 4500</leader><controlfield tag="001">OLC1964493641</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230714162516.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">160206s2015 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1111/jmi.12225</subfield><subfield code="2">doi</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">PQ20160617</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1964493641</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1964493641</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(PRQ)p1745-b29ddba6fcdae451ed452ce6a050743ba3915f43fdd3e94065da10ddea170e4d0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(KEY)0031376920150000258000200119analysisofleafsurfacesusingscanningionconductancem</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">570</subfield><subfield code="q">DNB</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">BIODIV</subfield><subfield code="2">fid</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">WALKER, SHAUN C</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Analysis of leaf surfaces using scanning ion conductance microscopy</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2015</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Leaf surfaces are highly complex functional systems with well defined chemistry and structure dictating the barrier and transport properties of the leaf cuticle. It is a significant imaging challenge to analyse the very thin and often complex wax‐like leaf cuticle morphology in their natural state. Scanning electron microscopy (SEM) and to a lesser extent Atomic force microscopy are techniques that have been used to study the leaf surface but their remains information that is difficult to obtain via these approaches. SEM is able to produce highly detailed and high‐resolution images needed to study leaf structures at the submicron level. It typically operates in a vacuum or low pressure environment and as a consequence is generally unable to deal with the in situ analysis of dynamic surface events at submicron scales. Atomic force microscopy also possess the high‐resolution imaging required and can follow dynamic events in ambient and liquid environments, but can over exaggerate small features and cannot image most leaf surfaces due to their inherent roughness at the micron scale. Scanning ion conductance microscopy (SICM), which operates in a liquid environment, provides a potential complementary analytical approach able to address these issues and which is yet to be explored for studying leaf surfaces. Here we illustrate the potential of SICM on various leaf surfaces and compare the data to SEM and atomic force microscopy images on the same samples. In achieving successful imaging we also show that SICM can be used to study the wetting of hydrophobic surfaces in situ . This has potentially wider implications than the study of leaves alone as surface wetting phenomena are important in a range of fundamental and applied studies. Plant leaves are an important part of the plant, they generate energy the plant used to grow, the surface of leaves are equally important. The surface of leaves have small wax structures and these structures protect the leaf, from insects, fungus or water. These structures are important to scientists because this is the main barrier for pesticide, herbicides and have processors related to their structures. Scanning ion conductance microscopy is a new imaging device that has been developed for imaging cells, in this article we use this device to image plant leaves and compare this new device with other established microscopes. Imaging the leaves of strawberry, English ivy, pea and oil seed rape. Scanning ion conductance microscopy is different from the conventional microscopes because it does not require altering the leaf to image unlike scanning electron microscope, and is noncontact unlike atomic force microscopy. As well, this new technique was used to image a droplet wetting a leaf surface, using the microscope to image the different stages of the wetting process. Starting from droplet sitting on the surface of the structures then fully wetting the surface.</subfield></datafield><datafield tag="540" ind1=" " ind2=" "><subfield code="a">Nutzungsrecht: 2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society</subfield></datafield><datafield tag="540" ind1=" " ind2=" "><subfield code="a">2015 The Authors Journal of Microscopy © 2015 Royal Microscopical Society.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">atomic force microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">AFM</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">leaf surface</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">SICM</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">scanning ion conductance microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy - instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy, Electron, Scanning - methods</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy - methods</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Plant Leaves - ultrastructure</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy, Atomic Force - instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy, Atomic Force - methods</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopy, Electron, Scanning - instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Scanning electron microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Studies</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microscopes</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">ALLEN, STEPHANIE</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">BELL, GORDON</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">ROBERTS, CLIVE J</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Journal of microscopy</subfield><subfield code="d">Oxford : Wiley-Blackwell, 1969</subfield><subfield code="g">258(2015), 2, Seite 119-126</subfield><subfield code="w">(DE-627)129550426</subfield><subfield code="w">(DE-600)219263-9</subfield><subfield code="w">(DE-576)015003884</subfield><subfield code="x">0022-2720</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:258</subfield><subfield code="g">year:2015</subfield><subfield code="g">number:2</subfield><subfield code="g">pages:119-126</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">http://dx.doi.org/10.1111/jmi.12225</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">http://onlinelibrary.wiley.com/doi/10.1111/jmi.12225/abstract</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">http://www.ncbi.nlm.nih.gov/pubmed/25611705</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">http://search.proquest.com/docview/1673140168</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">FID-BIODIV</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_150</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2219</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4012</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">258</subfield><subfield code="j">2015</subfield><subfield code="e">2</subfield><subfield code="h">119-126</subfield></datafield></record></collection>
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