An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements
A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based a...
Ausführliche Beschreibung
Autor*in: |
Tzu-Chien Hsueh [verfasserIn] |
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Format: |
Artikel |
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Sprache: |
Englisch |
Erschienen: |
2015 |
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Übergeordnetes Werk: |
Enthalten in: IEEE journal of solid state circuits - New York, NY : IEEE, 1966, 50(2015), 7, Seite 1711-1721 |
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Übergeordnetes Werk: |
volume:50 ; year:2015 ; number:7 ; pages:1711-1721 |
Links: |
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DOI / URN: |
10.1109/JSSC.2015.2431071 |
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Katalog-ID: |
OLC1965883443 |
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520 | |a A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates. | ||
650 | 4 | |a low-power electronics | |
650 | 4 | |a Synchronization | |
650 | 4 | |a supply noise measurement | |
650 | 4 | |a Correlation | |
650 | 4 | |a Autocorrelation Function | |
650 | 4 | |a frequency-domain measurements | |
650 | 4 | |a analogue-digital conversion | |
650 | 4 | |a power delivery | |
650 | 4 | |a equivalent time measurement | |
650 | 4 | |a CMOS technology | |
650 | 4 | |a active powers | |
650 | 4 | |a subsampled averaging-based analyzer | |
650 | 4 | |a phase noise | |
650 | 4 | |a autocorrelation measurements | |
650 | 4 | |a power delivery networks | |
650 | 4 | |a general large scale integrated circuits | |
650 | 4 | |a equivalent-time measurements | |
650 | 4 | |a noise measurement | |
650 | 4 | |a Noise | |
650 | 4 | |a voltage 1 mV | |
650 | 4 | |a logic gates | |
650 | 4 | |a equivalent-time domains | |
650 | 4 | |a voltage-controlled oscillators | |
650 | 4 | |a bandwidth 20 GHz | |
650 | 4 | |a frequency-domain analysis | |
650 | 4 | |a impedance measurement | |
650 | 4 | |a low-cost low-power in-situ power supply noise measurements | |
650 | 4 | |a glitch free | |
650 | 4 | |a synchronisation | |
650 | 4 | |a impedance characterization | |
650 | 4 | |a leakage powers | |
650 | 4 | |a time-domain analysis | |
650 | 4 | |a Power measurement | |
650 | 4 | |a clock-and-noise correlation | |
650 | 4 | |a spectral analysers | |
650 | 4 | |a on-die all-digital power supply noise analyzer | |
650 | 4 | |a digital random phase-noise accumulation technique | |
650 | 4 | |a size 32 nm | |
650 | 4 | |a MHz-range sampling clock frequency | |
650 | 4 | |a CMOS integrated circuits | |
650 | 4 | |a Clocks | |
650 | 4 | |a Frequency measurement | |
650 | 4 | |a enhanced spectrum measurements | |
650 | 4 | |a spectrum measurement | |
650 | 4 | |a power supply circuits | |
650 | 4 | |a phase noise accumulation | |
650 | 4 | |a low-resolution VCO-based ADCs | |
650 | 4 | |a integrated circuit noise | |
650 | 4 | |a clock-synchronized current-step response | |
700 | 1 | |a O'Mahony, Frank |4 oth | |
700 | 1 | |a Mansuri, Mozhgan |4 oth | |
700 | 1 | |a Casper, Bryan |4 oth | |
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10.1109/JSSC.2015.2431071 doi PQ20160617 (DE-627)OLC1965883443 (DE-599)GBVOLC1965883443 (PRQ)c1319-778568ab3e9e2c088a5b88ff1a01ff9d9b358dee5af8cd4e68e72fffce816aef0 (KEY)0050684220150000050000701711ondiealldigitalpowersupplynoiseanalyzerwithenhance DE-627 ger DE-627 rakwb eng 620 DNB Tzu-Chien Hsueh verfasserin aut An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates. low-power electronics Synchronization supply noise measurement Correlation Autocorrelation Function frequency-domain measurements analogue-digital conversion power delivery equivalent time measurement CMOS technology active powers subsampled averaging-based analyzer phase noise autocorrelation measurements power delivery networks general large scale integrated circuits equivalent-time measurements noise measurement Noise voltage 1 mV logic gates equivalent-time domains voltage-controlled oscillators bandwidth 20 GHz frequency-domain analysis impedance measurement low-cost low-power in-situ power supply noise measurements glitch free synchronisation impedance characterization leakage powers time-domain analysis Power measurement clock-and-noise correlation spectral analysers on-die all-digital power supply noise analyzer digital random phase-noise accumulation technique size 32 nm MHz-range sampling clock frequency CMOS integrated circuits Clocks Frequency measurement enhanced spectrum measurements spectrum measurement power supply circuits phase noise accumulation low-resolution VCO-based ADCs integrated circuit noise clock-synchronized current-step response O'Mahony, Frank oth Mansuri, Mozhgan oth Casper, Bryan oth Enthalten in IEEE journal of solid state circuits New York, NY : IEEE, 1966 50(2015), 7, Seite 1711-1721 (DE-627)129594865 (DE-600)240580-5 (DE-576)01508776X 0018-9200 nnns volume:50 year:2015 number:7 pages:1711-1721 http://dx.doi.org/10.1109/JSSC.2015.2431071 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7109950 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 GBV_ILN_2004 GBV_ILN_4313 AR 50 2015 7 1711-1721 |
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10.1109/JSSC.2015.2431071 doi PQ20160617 (DE-627)OLC1965883443 (DE-599)GBVOLC1965883443 (PRQ)c1319-778568ab3e9e2c088a5b88ff1a01ff9d9b358dee5af8cd4e68e72fffce816aef0 (KEY)0050684220150000050000701711ondiealldigitalpowersupplynoiseanalyzerwithenhance DE-627 ger DE-627 rakwb eng 620 DNB Tzu-Chien Hsueh verfasserin aut An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates. low-power electronics Synchronization supply noise measurement Correlation Autocorrelation Function frequency-domain measurements analogue-digital conversion power delivery equivalent time measurement CMOS technology active powers subsampled averaging-based analyzer phase noise autocorrelation measurements power delivery networks general large scale integrated circuits equivalent-time measurements noise measurement Noise voltage 1 mV logic gates equivalent-time domains voltage-controlled oscillators bandwidth 20 GHz frequency-domain analysis impedance measurement low-cost low-power in-situ power supply noise measurements glitch free synchronisation impedance characterization leakage powers time-domain analysis Power measurement clock-and-noise correlation spectral analysers on-die all-digital power supply noise analyzer digital random phase-noise accumulation technique size 32 nm MHz-range sampling clock frequency CMOS integrated circuits Clocks Frequency measurement enhanced spectrum measurements spectrum measurement power supply circuits phase noise accumulation low-resolution VCO-based ADCs integrated circuit noise clock-synchronized current-step response O'Mahony, Frank oth Mansuri, Mozhgan oth Casper, Bryan oth Enthalten in IEEE journal of solid state circuits New York, NY : IEEE, 1966 50(2015), 7, Seite 1711-1721 (DE-627)129594865 (DE-600)240580-5 (DE-576)01508776X 0018-9200 nnns volume:50 year:2015 number:7 pages:1711-1721 http://dx.doi.org/10.1109/JSSC.2015.2431071 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7109950 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 GBV_ILN_2004 GBV_ILN_4313 AR 50 2015 7 1711-1721 |
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10.1109/JSSC.2015.2431071 doi PQ20160617 (DE-627)OLC1965883443 (DE-599)GBVOLC1965883443 (PRQ)c1319-778568ab3e9e2c088a5b88ff1a01ff9d9b358dee5af8cd4e68e72fffce816aef0 (KEY)0050684220150000050000701711ondiealldigitalpowersupplynoiseanalyzerwithenhance DE-627 ger DE-627 rakwb eng 620 DNB Tzu-Chien Hsueh verfasserin aut An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates. low-power electronics Synchronization supply noise measurement Correlation Autocorrelation Function frequency-domain measurements analogue-digital conversion power delivery equivalent time measurement CMOS technology active powers subsampled averaging-based analyzer phase noise autocorrelation measurements power delivery networks general large scale integrated circuits equivalent-time measurements noise measurement Noise voltage 1 mV logic gates equivalent-time domains voltage-controlled oscillators bandwidth 20 GHz frequency-domain analysis impedance measurement low-cost low-power in-situ power supply noise measurements glitch free synchronisation impedance characterization leakage powers time-domain analysis Power measurement clock-and-noise correlation spectral analysers on-die all-digital power supply noise analyzer digital random phase-noise accumulation technique size 32 nm MHz-range sampling clock frequency CMOS integrated circuits Clocks Frequency measurement enhanced spectrum measurements spectrum measurement power supply circuits phase noise accumulation low-resolution VCO-based ADCs integrated circuit noise clock-synchronized current-step response O'Mahony, Frank oth Mansuri, Mozhgan oth Casper, Bryan oth Enthalten in IEEE journal of solid state circuits New York, NY : IEEE, 1966 50(2015), 7, Seite 1711-1721 (DE-627)129594865 (DE-600)240580-5 (DE-576)01508776X 0018-9200 nnns volume:50 year:2015 number:7 pages:1711-1721 http://dx.doi.org/10.1109/JSSC.2015.2431071 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7109950 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 GBV_ILN_2004 GBV_ILN_4313 AR 50 2015 7 1711-1721 |
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10.1109/JSSC.2015.2431071 doi PQ20160617 (DE-627)OLC1965883443 (DE-599)GBVOLC1965883443 (PRQ)c1319-778568ab3e9e2c088a5b88ff1a01ff9d9b358dee5af8cd4e68e72fffce816aef0 (KEY)0050684220150000050000701711ondiealldigitalpowersupplynoiseanalyzerwithenhance DE-627 ger DE-627 rakwb eng 620 DNB Tzu-Chien Hsueh verfasserin aut An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates. low-power electronics Synchronization supply noise measurement Correlation Autocorrelation Function frequency-domain measurements analogue-digital conversion power delivery equivalent time measurement CMOS technology active powers subsampled averaging-based analyzer phase noise autocorrelation measurements power delivery networks general large scale integrated circuits equivalent-time measurements noise measurement Noise voltage 1 mV logic gates equivalent-time domains voltage-controlled oscillators bandwidth 20 GHz frequency-domain analysis impedance measurement low-cost low-power in-situ power supply noise measurements glitch free synchronisation impedance characterization leakage powers time-domain analysis Power measurement clock-and-noise correlation spectral analysers on-die all-digital power supply noise analyzer digital random phase-noise accumulation technique size 32 nm MHz-range sampling clock frequency CMOS integrated circuits Clocks Frequency measurement enhanced spectrum measurements spectrum measurement power supply circuits phase noise accumulation low-resolution VCO-based ADCs integrated circuit noise clock-synchronized current-step response O'Mahony, Frank oth Mansuri, Mozhgan oth Casper, Bryan oth Enthalten in IEEE journal of solid state circuits New York, NY : IEEE, 1966 50(2015), 7, Seite 1711-1721 (DE-627)129594865 (DE-600)240580-5 (DE-576)01508776X 0018-9200 nnns volume:50 year:2015 number:7 pages:1711-1721 http://dx.doi.org/10.1109/JSSC.2015.2431071 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7109950 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 GBV_ILN_2004 GBV_ILN_4313 AR 50 2015 7 1711-1721 |
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10.1109/JSSC.2015.2431071 doi PQ20160617 (DE-627)OLC1965883443 (DE-599)GBVOLC1965883443 (PRQ)c1319-778568ab3e9e2c088a5b88ff1a01ff9d9b358dee5af8cd4e68e72fffce816aef0 (KEY)0050684220150000050000701711ondiealldigitalpowersupplynoiseanalyzerwithenhance DE-627 ger DE-627 rakwb eng 620 DNB Tzu-Chien Hsueh verfasserin aut An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates. low-power electronics Synchronization supply noise measurement Correlation Autocorrelation Function frequency-domain measurements analogue-digital conversion power delivery equivalent time measurement CMOS technology active powers subsampled averaging-based analyzer phase noise autocorrelation measurements power delivery networks general large scale integrated circuits equivalent-time measurements noise measurement Noise voltage 1 mV logic gates equivalent-time domains voltage-controlled oscillators bandwidth 20 GHz frequency-domain analysis impedance measurement low-cost low-power in-situ power supply noise measurements glitch free synchronisation impedance characterization leakage powers time-domain analysis Power measurement clock-and-noise correlation spectral analysers on-die all-digital power supply noise analyzer digital random phase-noise accumulation technique size 32 nm MHz-range sampling clock frequency CMOS integrated circuits Clocks Frequency measurement enhanced spectrum measurements spectrum measurement power supply circuits phase noise accumulation low-resolution VCO-based ADCs integrated circuit noise clock-synchronized current-step response O'Mahony, Frank oth Mansuri, Mozhgan oth Casper, Bryan oth Enthalten in IEEE journal of solid state circuits New York, NY : IEEE, 1966 50(2015), 7, Seite 1711-1721 (DE-627)129594865 (DE-600)240580-5 (DE-576)01508776X 0018-9200 nnns volume:50 year:2015 number:7 pages:1711-1721 http://dx.doi.org/10.1109/JSSC.2015.2431071 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7109950 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 GBV_ILN_2004 GBV_ILN_4313 AR 50 2015 7 1711-1721 |
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low-power electronics Synchronization supply noise measurement Correlation Autocorrelation Function frequency-domain measurements analogue-digital conversion power delivery equivalent time measurement CMOS technology active powers subsampled averaging-based analyzer phase noise autocorrelation measurements power delivery networks general large scale integrated circuits equivalent-time measurements noise measurement Noise voltage 1 mV logic gates equivalent-time domains voltage-controlled oscillators bandwidth 20 GHz frequency-domain analysis impedance measurement low-cost low-power in-situ power supply noise measurements glitch free synchronisation impedance characterization leakage powers time-domain analysis Power measurement clock-and-noise correlation spectral analysers on-die all-digital power supply noise analyzer digital random phase-noise accumulation technique size 32 nm MHz-range sampling clock frequency CMOS integrated circuits Clocks Frequency measurement enhanced spectrum measurements spectrum measurement power supply circuits phase noise accumulation low-resolution VCO-based ADCs integrated circuit noise clock-synchronized current-step response |
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Tzu-Chien Hsueh |
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Tzu-Chien Hsueh ddc 620 misc low-power electronics misc Synchronization misc supply noise measurement misc Correlation misc Autocorrelation Function misc frequency-domain measurements misc analogue-digital conversion misc power delivery misc equivalent time measurement misc CMOS technology misc active powers misc subsampled averaging-based analyzer misc phase noise misc autocorrelation measurements misc power delivery networks misc general large scale integrated circuits misc equivalent-time measurements misc noise measurement misc Noise misc voltage 1 mV misc logic gates misc equivalent-time domains misc voltage-controlled oscillators misc bandwidth 20 GHz misc frequency-domain analysis misc impedance measurement misc low-cost low-power in-situ power supply noise measurements misc glitch free misc synchronisation misc impedance characterization misc leakage powers misc time-domain analysis misc Power measurement misc clock-and-noise correlation misc spectral analysers misc on-die all-digital power supply noise analyzer misc digital random phase-noise accumulation technique misc size 32 nm misc MHz-range sampling clock frequency misc CMOS integrated circuits misc Clocks misc Frequency measurement misc enhanced spectrum measurements misc spectrum measurement misc power supply circuits misc phase noise accumulation misc low-resolution VCO-based ADCs misc integrated circuit noise misc clock-synchronized current-step response An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements |
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620 DNB An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements low-power electronics Synchronization supply noise measurement Correlation Autocorrelation Function frequency-domain measurements analogue-digital conversion power delivery equivalent time measurement CMOS technology active powers subsampled averaging-based analyzer phase noise autocorrelation measurements power delivery networks general large scale integrated circuits equivalent-time measurements noise measurement Noise voltage 1 mV logic gates equivalent-time domains voltage-controlled oscillators bandwidth 20 GHz frequency-domain analysis impedance measurement low-cost low-power in-situ power supply noise measurements glitch free synchronisation impedance characterization leakage powers time-domain analysis Power measurement clock-and-noise correlation spectral analysers on-die all-digital power supply noise analyzer digital random phase-noise accumulation technique size 32 nm MHz-range sampling clock frequency CMOS integrated circuits Clocks Frequency measurement enhanced spectrum measurements spectrum measurement power supply circuits phase noise accumulation low-resolution VCO-based ADCs integrated circuit noise clock-synchronized current-step response |
topic |
ddc 620 misc low-power electronics misc Synchronization misc supply noise measurement misc Correlation misc Autocorrelation Function misc frequency-domain measurements misc analogue-digital conversion misc power delivery misc equivalent time measurement misc CMOS technology misc active powers misc subsampled averaging-based analyzer misc phase noise misc autocorrelation measurements misc power delivery networks misc general large scale integrated circuits misc equivalent-time measurements misc noise measurement misc Noise misc voltage 1 mV misc logic gates misc equivalent-time domains misc voltage-controlled oscillators misc bandwidth 20 GHz misc frequency-domain analysis misc impedance measurement misc low-cost low-power in-situ power supply noise measurements misc glitch free misc synchronisation misc impedance characterization misc leakage powers misc time-domain analysis misc Power measurement misc clock-and-noise correlation misc spectral analysers misc on-die all-digital power supply noise analyzer misc digital random phase-noise accumulation technique misc size 32 nm misc MHz-range sampling clock frequency misc CMOS integrated circuits misc Clocks misc Frequency measurement misc enhanced spectrum measurements misc spectrum measurement misc power supply circuits misc phase noise accumulation misc low-resolution VCO-based ADCs misc integrated circuit noise misc clock-synchronized current-step response |
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ddc 620 misc low-power electronics misc Synchronization misc supply noise measurement misc Correlation misc Autocorrelation Function misc frequency-domain measurements misc analogue-digital conversion misc power delivery misc equivalent time measurement misc CMOS technology misc active powers misc subsampled averaging-based analyzer misc phase noise misc autocorrelation measurements misc power delivery networks misc general large scale integrated circuits misc equivalent-time measurements misc noise measurement misc Noise misc voltage 1 mV misc logic gates misc equivalent-time domains misc voltage-controlled oscillators misc bandwidth 20 GHz misc frequency-domain analysis misc impedance measurement misc low-cost low-power in-situ power supply noise measurements misc glitch free misc synchronisation misc impedance characterization misc leakage powers misc time-domain analysis misc Power measurement misc clock-and-noise correlation misc spectral analysers misc on-die all-digital power supply noise analyzer misc digital random phase-noise accumulation technique misc size 32 nm misc MHz-range sampling clock frequency misc CMOS integrated circuits misc Clocks misc Frequency measurement misc enhanced spectrum measurements misc spectrum measurement misc power supply circuits misc phase noise accumulation misc low-resolution VCO-based ADCs misc integrated circuit noise misc clock-synchronized current-step response |
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ddc 620 misc low-power electronics misc Synchronization misc supply noise measurement misc Correlation misc Autocorrelation Function misc frequency-domain measurements misc analogue-digital conversion misc power delivery misc equivalent time measurement misc CMOS technology misc active powers misc subsampled averaging-based analyzer misc phase noise misc autocorrelation measurements misc power delivery networks misc general large scale integrated circuits misc equivalent-time measurements misc noise measurement misc Noise misc voltage 1 mV misc logic gates misc equivalent-time domains misc voltage-controlled oscillators misc bandwidth 20 GHz misc frequency-domain analysis misc impedance measurement misc low-cost low-power in-situ power supply noise measurements misc glitch free misc synchronisation misc impedance characterization misc leakage powers misc time-domain analysis misc Power measurement misc clock-and-noise correlation misc spectral analysers misc on-die all-digital power supply noise analyzer misc digital random phase-noise accumulation technique misc size 32 nm misc MHz-range sampling clock frequency misc CMOS integrated circuits misc Clocks misc Frequency measurement misc enhanced spectrum measurements misc spectrum measurement misc power supply circuits misc phase noise accumulation misc low-resolution VCO-based ADCs misc integrated circuit noise misc clock-synchronized current-step response |
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An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements |
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An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements |
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on-die all-digital power supply noise analyzer with enhanced spectrum measurements |
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An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements |
abstract |
A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates. |
abstractGer |
A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates. |
abstract_unstemmed |
A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates. |
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title_short |
An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements |
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http://dx.doi.org/10.1109/JSSC.2015.2431071 http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7109950 |
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O'Mahony, Frank Mansuri, Mozhgan Casper, Bryan |
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