An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements

A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based a...
Ausführliche Beschreibung

Gespeichert in:

Autor*in:	Tzu-Chien Hsueh [verfasserIn] O'Mahony, Frank Mansuri, Mozhgan Casper, Bryan

Format:	Artikel
Sprache:	Englisch

Erschienen:	2015

Schlagwörter:	low-power electronics Synchronization supply noise measurement Correlation Autocorrelation Function frequency-domain measurements analogue-digital conversion power delivery equivalent time measurement CMOS technology active powers subsampled averaging-based analyzer phase noise autocorrelation measurements power delivery networks general large scale integrated circuits equivalent-time measurements noise measurement Noise voltage 1 mV logic gates equivalent-time domains voltage-controlled oscillators bandwidth 20 GHz frequency-domain analysis impedance measurement low-cost low-power in-situ power supply noise measurements glitch free synchronisation impedance characterization leakage powers time-domain analysis Power measurement clock-and-noise correlation spectral analysers on-die all-digital power supply noise analyzer digital random phase-noise accumulation technique size 32 nm MHz-range sampling clock frequency CMOS integrated circuits Clocks Frequency measurement enhanced spectrum measurements spectrum measurement power supply circuits phase noise accumulation low-resolution VCO-based ADCs integrated circuit noise clock-synchronized current-step response

Übergeordnetes Werk:	Enthalten in: IEEE journal of solid state circuits - New York, NY : IEEE, 1966, 50(2015), 7, Seite 1711-1721
Übergeordnetes Werk:	volume:50 ; year:2015 ; number:7 ; pages:1711-1721

Links:	Volltext Link aufrufen

DOI / URN:	10.1109/JSSC.2015.2431071

Katalog-ID:	OLC1965883443

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520			\|a A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates.
650		4	\|a low-power electronics
650		4	\|a Synchronization
650		4	\|a supply noise measurement
650		4	\|a Correlation
650		4	\|a Autocorrelation Function
650		4	\|a frequency-domain measurements
650		4	\|a analogue-digital conversion
650		4	\|a power delivery
650		4	\|a equivalent time measurement
650		4	\|a CMOS technology
650		4	\|a active powers
650		4	\|a subsampled averaging-based analyzer
650		4	\|a phase noise
650		4	\|a autocorrelation measurements
650		4	\|a power delivery networks
650		4	\|a general large scale integrated circuits
650		4	\|a equivalent-time measurements
650		4	\|a noise measurement
650		4	\|a Noise
650		4	\|a voltage 1 mV
650		4	\|a logic gates
650		4	\|a equivalent-time domains
650		4	\|a voltage-controlled oscillators
650		4	\|a bandwidth 20 GHz
650		4	\|a frequency-domain analysis
650		4	\|a impedance measurement
650		4	\|a low-cost low-power in-situ power supply noise measurements
650		4	\|a glitch free
650		4	\|a synchronisation
650		4	\|a impedance characterization
650		4	\|a leakage powers
650		4	\|a time-domain analysis
650		4	\|a Power measurement
650		4	\|a clock-and-noise correlation
650		4	\|a spectral analysers
650		4	\|a on-die all-digital power supply noise analyzer
650		4	\|a digital random phase-noise accumulation technique
650		4	\|a size 32 nm
650		4	\|a MHz-range sampling clock frequency
650		4	\|a CMOS integrated circuits
650		4	\|a Clocks
650		4	\|a Frequency measurement
650		4	\|a enhanced spectrum measurements
650		4	\|a spectrum measurement
650		4	\|a power supply circuits
650		4	\|a phase noise accumulation
650		4	\|a low-resolution VCO-based ADCs
650		4	\|a integrated circuit noise
650		4	\|a clock-synchronized current-step response
700	1		\|a O'Mahony, Frank \|4 oth
700	1		\|a Mansuri, Mozhgan \|4 oth
700	1		\|a Casper, Bryan \|4 oth
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allfields	10.1109/JSSC.2015.2431071 doi PQ20160617 (DE-627)OLC1965883443 (DE-599)GBVOLC1965883443 (PRQ)c1319-778568ab3e9e2c088a5b88ff1a01ff9d9b358dee5af8cd4e68e72fffce816aef0 (KEY)0050684220150000050000701711ondiealldigitalpowersupplynoiseanalyzerwithenhance DE-627 ger DE-627 rakwb eng 620 DNB Tzu-Chien Hsueh verfasserin aut An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates. low-power electronics Synchronization supply noise measurement Correlation Autocorrelation Function frequency-domain measurements analogue-digital conversion power delivery equivalent time measurement CMOS technology active powers subsampled averaging-based analyzer phase noise autocorrelation measurements power delivery networks general large scale integrated circuits equivalent-time measurements noise measurement Noise voltage 1 mV logic gates equivalent-time domains voltage-controlled oscillators bandwidth 20 GHz frequency-domain analysis impedance measurement low-cost low-power in-situ power supply noise measurements glitch free synchronisation impedance characterization leakage powers time-domain analysis Power measurement clock-and-noise correlation spectral analysers on-die all-digital power supply noise analyzer digital random phase-noise accumulation technique size 32 nm MHz-range sampling clock frequency CMOS integrated circuits Clocks Frequency measurement enhanced spectrum measurements spectrum measurement power supply circuits phase noise accumulation low-resolution VCO-based ADCs integrated circuit noise clock-synchronized current-step response O'Mahony, Frank oth Mansuri, Mozhgan oth Casper, Bryan oth Enthalten in IEEE journal of solid state circuits New York, NY : IEEE, 1966 50(2015), 7, Seite 1711-1721 (DE-627)129594865 (DE-600)240580-5 (DE-576)01508776X 0018-9200 nnns volume:50 year:2015 number:7 pages:1711-1721 http://dx.doi.org/10.1109/JSSC.2015.2431071 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7109950 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 GBV_ILN_2004 GBV_ILN_4313 AR 50 2015 7 1711-1721
spelling	10.1109/JSSC.2015.2431071 doi PQ20160617 (DE-627)OLC1965883443 (DE-599)GBVOLC1965883443 (PRQ)c1319-778568ab3e9e2c088a5b88ff1a01ff9d9b358dee5af8cd4e68e72fffce816aef0 (KEY)0050684220150000050000701711ondiealldigitalpowersupplynoiseanalyzerwithenhance DE-627 ger DE-627 rakwb eng 620 DNB Tzu-Chien Hsueh verfasserin aut An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates. low-power electronics Synchronization supply noise measurement Correlation Autocorrelation Function frequency-domain measurements analogue-digital conversion power delivery equivalent time measurement CMOS technology active powers subsampled averaging-based analyzer phase noise autocorrelation measurements power delivery networks general large scale integrated circuits equivalent-time measurements noise measurement Noise voltage 1 mV logic gates equivalent-time domains voltage-controlled oscillators bandwidth 20 GHz frequency-domain analysis impedance measurement low-cost low-power in-situ power supply noise measurements glitch free synchronisation impedance characterization leakage powers time-domain analysis Power measurement clock-and-noise correlation spectral analysers on-die all-digital power supply noise analyzer digital random phase-noise accumulation technique size 32 nm MHz-range sampling clock frequency CMOS integrated circuits Clocks Frequency measurement enhanced spectrum measurements spectrum measurement power supply circuits phase noise accumulation low-resolution VCO-based ADCs integrated circuit noise clock-synchronized current-step response O'Mahony, Frank oth Mansuri, Mozhgan oth Casper, Bryan oth Enthalten in IEEE journal of solid state circuits New York, NY : IEEE, 1966 50(2015), 7, Seite 1711-1721 (DE-627)129594865 (DE-600)240580-5 (DE-576)01508776X 0018-9200 nnns volume:50 year:2015 number:7 pages:1711-1721 http://dx.doi.org/10.1109/JSSC.2015.2431071 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7109950 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 GBV_ILN_2004 GBV_ILN_4313 AR 50 2015 7 1711-1721
allfields_unstemmed	10.1109/JSSC.2015.2431071 doi PQ20160617 (DE-627)OLC1965883443 (DE-599)GBVOLC1965883443 (PRQ)c1319-778568ab3e9e2c088a5b88ff1a01ff9d9b358dee5af8cd4e68e72fffce816aef0 (KEY)0050684220150000050000701711ondiealldigitalpowersupplynoiseanalyzerwithenhance DE-627 ger DE-627 rakwb eng 620 DNB Tzu-Chien Hsueh verfasserin aut An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates. low-power electronics Synchronization supply noise measurement Correlation Autocorrelation Function frequency-domain measurements analogue-digital conversion power delivery equivalent time measurement CMOS technology active powers subsampled averaging-based analyzer phase noise autocorrelation measurements power delivery networks general large scale integrated circuits equivalent-time measurements noise measurement Noise voltage 1 mV logic gates equivalent-time domains voltage-controlled oscillators bandwidth 20 GHz frequency-domain analysis impedance measurement low-cost low-power in-situ power supply noise measurements glitch free synchronisation impedance characterization leakage powers time-domain analysis Power measurement clock-and-noise correlation spectral analysers on-die all-digital power supply noise analyzer digital random phase-noise accumulation technique size 32 nm MHz-range sampling clock frequency CMOS integrated circuits Clocks Frequency measurement enhanced spectrum measurements spectrum measurement power supply circuits phase noise accumulation low-resolution VCO-based ADCs integrated circuit noise clock-synchronized current-step response O'Mahony, Frank oth Mansuri, Mozhgan oth Casper, Bryan oth Enthalten in IEEE journal of solid state circuits New York, NY : IEEE, 1966 50(2015), 7, Seite 1711-1721 (DE-627)129594865 (DE-600)240580-5 (DE-576)01508776X 0018-9200 nnns volume:50 year:2015 number:7 pages:1711-1721 http://dx.doi.org/10.1109/JSSC.2015.2431071 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7109950 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 GBV_ILN_2004 GBV_ILN_4313 AR 50 2015 7 1711-1721
allfieldsGer	10.1109/JSSC.2015.2431071 doi PQ20160617 (DE-627)OLC1965883443 (DE-599)GBVOLC1965883443 (PRQ)c1319-778568ab3e9e2c088a5b88ff1a01ff9d9b358dee5af8cd4e68e72fffce816aef0 (KEY)0050684220150000050000701711ondiealldigitalpowersupplynoiseanalyzerwithenhance DE-627 ger DE-627 rakwb eng 620 DNB Tzu-Chien Hsueh verfasserin aut An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates. low-power electronics Synchronization supply noise measurement Correlation Autocorrelation Function frequency-domain measurements analogue-digital conversion power delivery equivalent time measurement CMOS technology active powers subsampled averaging-based analyzer phase noise autocorrelation measurements power delivery networks general large scale integrated circuits equivalent-time measurements noise measurement Noise voltage 1 mV logic gates equivalent-time domains voltage-controlled oscillators bandwidth 20 GHz frequency-domain analysis impedance measurement low-cost low-power in-situ power supply noise measurements glitch free synchronisation impedance characterization leakage powers time-domain analysis Power measurement clock-and-noise correlation spectral analysers on-die all-digital power supply noise analyzer digital random phase-noise accumulation technique size 32 nm MHz-range sampling clock frequency CMOS integrated circuits Clocks Frequency measurement enhanced spectrum measurements spectrum measurement power supply circuits phase noise accumulation low-resolution VCO-based ADCs integrated circuit noise clock-synchronized current-step response O'Mahony, Frank oth Mansuri, Mozhgan oth Casper, Bryan oth Enthalten in IEEE journal of solid state circuits New York, NY : IEEE, 1966 50(2015), 7, Seite 1711-1721 (DE-627)129594865 (DE-600)240580-5 (DE-576)01508776X 0018-9200 nnns volume:50 year:2015 number:7 pages:1711-1721 http://dx.doi.org/10.1109/JSSC.2015.2431071 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7109950 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 GBV_ILN_2004 GBV_ILN_4313 AR 50 2015 7 1711-1721
allfieldsSound	10.1109/JSSC.2015.2431071 doi PQ20160617 (DE-627)OLC1965883443 (DE-599)GBVOLC1965883443 (PRQ)c1319-778568ab3e9e2c088a5b88ff1a01ff9d9b358dee5af8cd4e68e72fffce816aef0 (KEY)0050684220150000050000701711ondiealldigitalpowersupplynoiseanalyzerwithenhance DE-627 ger DE-627 rakwb eng 620 DNB Tzu-Chien Hsueh verfasserin aut An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates. low-power electronics Synchronization supply noise measurement Correlation Autocorrelation Function frequency-domain measurements analogue-digital conversion power delivery equivalent time measurement CMOS technology active powers subsampled averaging-based analyzer phase noise autocorrelation measurements power delivery networks general large scale integrated circuits equivalent-time measurements noise measurement Noise voltage 1 mV logic gates equivalent-time domains voltage-controlled oscillators bandwidth 20 GHz frequency-domain analysis impedance measurement low-cost low-power in-situ power supply noise measurements glitch free synchronisation impedance characterization leakage powers time-domain analysis Power measurement clock-and-noise correlation spectral analysers on-die all-digital power supply noise analyzer digital random phase-noise accumulation technique size 32 nm MHz-range sampling clock frequency CMOS integrated circuits Clocks Frequency measurement enhanced spectrum measurements spectrum measurement power supply circuits phase noise accumulation low-resolution VCO-based ADCs integrated circuit noise clock-synchronized current-step response O'Mahony, Frank oth Mansuri, Mozhgan oth Casper, Bryan oth Enthalten in IEEE journal of solid state circuits New York, NY : IEEE, 1966 50(2015), 7, Seite 1711-1721 (DE-627)129594865 (DE-600)240580-5 (DE-576)01508776X 0018-9200 nnns volume:50 year:2015 number:7 pages:1711-1721 http://dx.doi.org/10.1109/JSSC.2015.2431071 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7109950 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 GBV_ILN_2004 GBV_ILN_4313 AR 50 2015 7 1711-1721
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topic_facet	low-power electronics Synchronization supply noise measurement Correlation Autocorrelation Function frequency-domain measurements analogue-digital conversion power delivery equivalent time measurement CMOS technology active powers subsampled averaging-based analyzer phase noise autocorrelation measurements power delivery networks general large scale integrated circuits equivalent-time measurements noise measurement Noise voltage 1 mV logic gates equivalent-time domains voltage-controlled oscillators bandwidth 20 GHz frequency-domain analysis impedance measurement low-cost low-power in-situ power supply noise measurements glitch free synchronisation impedance characterization leakage powers time-domain analysis Power measurement clock-and-noise correlation spectral analysers on-die all-digital power supply noise analyzer digital random phase-noise accumulation technique size 32 nm MHz-range sampling clock frequency CMOS integrated circuits Clocks Frequency measurement enhanced spectrum measurements spectrum measurement power supply circuits phase noise accumulation low-resolution VCO-based ADCs integrated circuit noise clock-synchronized current-step response
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author	Tzu-Chien Hsueh
spellingShingle	Tzu-Chien Hsueh ddc 620 misc low-power electronics misc Synchronization misc supply noise measurement misc Correlation misc Autocorrelation Function misc frequency-domain measurements misc analogue-digital conversion misc power delivery misc equivalent time measurement misc CMOS technology misc active powers misc subsampled averaging-based analyzer misc phase noise misc autocorrelation measurements misc power delivery networks misc general large scale integrated circuits misc equivalent-time measurements misc noise measurement misc Noise misc voltage 1 mV misc logic gates misc equivalent-time domains misc voltage-controlled oscillators misc bandwidth 20 GHz misc frequency-domain analysis misc impedance measurement misc low-cost low-power in-situ power supply noise measurements misc glitch free misc synchronisation misc impedance characterization misc leakage powers misc time-domain analysis misc Power measurement misc clock-and-noise correlation misc spectral analysers misc on-die all-digital power supply noise analyzer misc digital random phase-noise accumulation technique misc size 32 nm misc MHz-range sampling clock frequency misc CMOS integrated circuits misc Clocks misc Frequency measurement misc enhanced spectrum measurements misc spectrum measurement misc power supply circuits misc phase noise accumulation misc low-resolution VCO-based ADCs misc integrated circuit noise misc clock-synchronized current-step response An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements
authorStr	Tzu-Chien Hsueh
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topic_title	620 DNB An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements low-power electronics Synchronization supply noise measurement Correlation Autocorrelation Function frequency-domain measurements analogue-digital conversion power delivery equivalent time measurement CMOS technology active powers subsampled averaging-based analyzer phase noise autocorrelation measurements power delivery networks general large scale integrated circuits equivalent-time measurements noise measurement Noise voltage 1 mV logic gates equivalent-time domains voltage-controlled oscillators bandwidth 20 GHz frequency-domain analysis impedance measurement low-cost low-power in-situ power supply noise measurements glitch free synchronisation impedance characterization leakage powers time-domain analysis Power measurement clock-and-noise correlation spectral analysers on-die all-digital power supply noise analyzer digital random phase-noise accumulation technique size 32 nm MHz-range sampling clock frequency CMOS integrated circuits Clocks Frequency measurement enhanced spectrum measurements spectrum measurement power supply circuits phase noise accumulation low-resolution VCO-based ADCs integrated circuit noise clock-synchronized current-step response
topic	ddc 620 misc low-power electronics misc Synchronization misc supply noise measurement misc Correlation misc Autocorrelation Function misc frequency-domain measurements misc analogue-digital conversion misc power delivery misc equivalent time measurement misc CMOS technology misc active powers misc subsampled averaging-based analyzer misc phase noise misc autocorrelation measurements misc power delivery networks misc general large scale integrated circuits misc equivalent-time measurements misc noise measurement misc Noise misc voltage 1 mV misc logic gates misc equivalent-time domains misc voltage-controlled oscillators misc bandwidth 20 GHz misc frequency-domain analysis misc impedance measurement misc low-cost low-power in-situ power supply noise measurements misc glitch free misc synchronisation misc impedance characterization misc leakage powers misc time-domain analysis misc Power measurement misc clock-and-noise correlation misc spectral analysers misc on-die all-digital power supply noise analyzer misc digital random phase-noise accumulation technique misc size 32 nm misc MHz-range sampling clock frequency misc CMOS integrated circuits misc Clocks misc Frequency measurement misc enhanced spectrum measurements misc spectrum measurement misc power supply circuits misc phase noise accumulation misc low-resolution VCO-based ADCs misc integrated circuit noise misc clock-synchronized current-step response
topic_unstemmed	ddc 620 misc low-power electronics misc Synchronization misc supply noise measurement misc Correlation misc Autocorrelation Function misc frequency-domain measurements misc analogue-digital conversion misc power delivery misc equivalent time measurement misc CMOS technology misc active powers misc subsampled averaging-based analyzer misc phase noise misc autocorrelation measurements misc power delivery networks misc general large scale integrated circuits misc equivalent-time measurements misc noise measurement misc Noise misc voltage 1 mV misc logic gates misc equivalent-time domains misc voltage-controlled oscillators misc bandwidth 20 GHz misc frequency-domain analysis misc impedance measurement misc low-cost low-power in-situ power supply noise measurements misc glitch free misc synchronisation misc impedance characterization misc leakage powers misc time-domain analysis misc Power measurement misc clock-and-noise correlation misc spectral analysers misc on-die all-digital power supply noise analyzer misc digital random phase-noise accumulation technique misc size 32 nm misc MHz-range sampling clock frequency misc CMOS integrated circuits misc Clocks misc Frequency measurement misc enhanced spectrum measurements misc spectrum measurement misc power supply circuits misc phase noise accumulation misc low-resolution VCO-based ADCs misc integrated circuit noise misc clock-synchronized current-step response
topic_browse	ddc 620 misc low-power electronics misc Synchronization misc supply noise measurement misc Correlation misc Autocorrelation Function misc frequency-domain measurements misc analogue-digital conversion misc power delivery misc equivalent time measurement misc CMOS technology misc active powers misc subsampled averaging-based analyzer misc phase noise misc autocorrelation measurements misc power delivery networks misc general large scale integrated circuits misc equivalent-time measurements misc noise measurement misc Noise misc voltage 1 mV misc logic gates misc equivalent-time domains misc voltage-controlled oscillators misc bandwidth 20 GHz misc frequency-domain analysis misc impedance measurement misc low-cost low-power in-situ power supply noise measurements misc glitch free misc synchronisation misc impedance characterization misc leakage powers misc time-domain analysis misc Power measurement misc clock-and-noise correlation misc spectral analysers misc on-die all-digital power supply noise analyzer misc digital random phase-noise accumulation technique misc size 32 nm misc MHz-range sampling clock frequency misc CMOS integrated circuits misc Clocks misc Frequency measurement misc enhanced spectrum measurements misc spectrum measurement misc power supply circuits misc phase noise accumulation misc low-resolution VCO-based ADCs misc integrated circuit noise misc clock-synchronized current-step response
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title	An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements
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title_full	An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements
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title_sort	on-die all-digital power supply noise analyzer with enhanced spectrum measurements
title_auth	An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements
abstract	A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates.
abstractGer	A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates.
abstract_unstemmed	A scalable all-digital power supply noise analyzer with 20 GHz sampling bandwidth and 1 mV resolution is demonstrated in 32 nm CMOS technology for enabling low-cost low-power in-situ power supply noise measurements without dedicated clean supplies and clock sources. This subsampled averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domains with low-resolution VCO-based ADCs. For equivalent-time measurements, the accurate impedance characterization of power delivery networks is simply done by measuring a clock-synchronized current-step response. For frequency-domain measurements, the digital random phase-noise accumulation technique is analyzed and verified to overcome the clock-and-noise correlation issue in autocorrelation measurements. In general large scale integrated circuits and systems, the entire power supply noise analyzer consumes negligible active and leakage powers because of the MHz-range sampling clock frequency and fully digital implementation with only hundreds of logic gates.
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title_short	An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements
url	http://dx.doi.org/10.1109/JSSC.2015.2431071 http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7109950
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author2	O'Mahony, Frank Mansuri, Mozhgan Casper, Bryan
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up_date	2024-07-03T19:31:05.211Z
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An On-Die All-Digital Power Supply Noise Analyzer With Enhanced Spectrum Measurements

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