Development of standards for reliable surface analyses by ISO technical committee 201 on surface chemical analysis
The need for reliable surface analyses together with quality‐management requirements for analytical laboratories led the International Organization for Standardization (ISO) to form its Technical Committee (TC) 201 on Surface Chemical Analysis in 1991. This article describes the organization of TC 2...
Ausführliche Beschreibung
Autor*in: |
Powell, C. J [verfasserIn] |
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Format: |
Artikel |
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Sprache: |
Englisch |
Erschienen: |
2015 |
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Rechteinformationen: |
Nutzungsrecht: Copyright © 2014 John Wiley & Sons, Ltd. |
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Systematik: |
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Übergeordnetes Werk: |
Enthalten in: Surface and interface analysis - Chichester [u.a.] : Wiley, 1979, 47(2015), 1, Seite 127-134 |
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Übergeordnetes Werk: |
volume:47 ; year:2015 ; number:1 ; pages:127-134 |
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DOI / URN: |
10.1002/sia.5684 |
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10.1002/sia.5684 doi PQ20160617 (DE-627)OLC1968159525 (DE-599)GBVOLC1968159525 (PRQ)p2431-1270c011c392659efa26cee96ca5922c9b4302a3a90a48cc8b83aef78223706c3 (KEY)0093577820150000047000100127developmentofstandardsforreliablesurfaceanalysesby DE-627 ger DE-627 rakwb eng 540 530 DNB ZG 1100: AVZ rvk 51.00 bkl 33.68 bkl Powell, C. J verfasserin aut Development of standards for reliable surface analyses by ISO technical committee 201 on surface chemical analysis 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The need for reliable surface analyses together with quality‐management requirements for analytical laboratories led the International Organization for Standardization (ISO) to form its Technical Committee (TC) 201 on Surface Chemical Analysis in 1991. This article describes the organization of TC 201, the strategies that have been found useful for identifying and assessing possible projects for new international standards, and the 57 international standards and other documents prepared to date by TC 201. Standards have now been developed for Auger‐electron spectroscopy, glow‐discharge spectroscopy, various types of scanning probe microscopy, secondary‐ion mass spectrometry, sputter‐depth profiling, total‐reflection X‐ray fluorescence spectroscopy, X‐ray photoelectron spectroscopy, and X‐ray reflectometry. In addition, standards have been developed with definitions of terms used in surface chemical analysis; the handling, preparation of specimens for surface analysis; information and data‐transfer formats; and methods for determining the lateral resolution of beam‐based methods of surface analysis. Copyright © 2014 John Wiley & Sons, Ltd. Nutzungsrecht: Copyright © 2014 John Wiley & Sons, Ltd. ISO/TC 201 International standards surface chemical analysis Shimizu, R oth Yoshihara, K oth Ichimura, S oth Enthalten in Surface and interface analysis Chichester [u.a.] : Wiley, 1979 47(2015), 1, Seite 127-134 (DE-627)129377104 (DE-600)164045-8 (DE-576)01475908X 0142-2421 nnns volume:47 year:2015 number:1 pages:127-134 http://dx.doi.org/10.1002/sia.5684 Volltext http://onlinelibrary.wiley.com/doi/10.1002/sia.5684/abstract http://search.proquest.com/docview/1632518583 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-CHE GBV_ILN_70 ZG 1100: 51.00 AVZ 33.68 AVZ AR 47 2015 1 127-134 |
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10.1002/sia.5684 doi PQ20160617 (DE-627)OLC1968159525 (DE-599)GBVOLC1968159525 (PRQ)p2431-1270c011c392659efa26cee96ca5922c9b4302a3a90a48cc8b83aef78223706c3 (KEY)0093577820150000047000100127developmentofstandardsforreliablesurfaceanalysesby DE-627 ger DE-627 rakwb eng 540 530 DNB ZG 1100: AVZ rvk 51.00 bkl 33.68 bkl Powell, C. J verfasserin aut Development of standards for reliable surface analyses by ISO technical committee 201 on surface chemical analysis 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The need for reliable surface analyses together with quality‐management requirements for analytical laboratories led the International Organization for Standardization (ISO) to form its Technical Committee (TC) 201 on Surface Chemical Analysis in 1991. This article describes the organization of TC 201, the strategies that have been found useful for identifying and assessing possible projects for new international standards, and the 57 international standards and other documents prepared to date by TC 201. Standards have now been developed for Auger‐electron spectroscopy, glow‐discharge spectroscopy, various types of scanning probe microscopy, secondary‐ion mass spectrometry, sputter‐depth profiling, total‐reflection X‐ray fluorescence spectroscopy, X‐ray photoelectron spectroscopy, and X‐ray reflectometry. In addition, standards have been developed with definitions of terms used in surface chemical analysis; the handling, preparation of specimens for surface analysis; information and data‐transfer formats; and methods for determining the lateral resolution of beam‐based methods of surface analysis. Copyright © 2014 John Wiley & Sons, Ltd. Nutzungsrecht: Copyright © 2014 John Wiley & Sons, Ltd. ISO/TC 201 International standards surface chemical analysis Shimizu, R oth Yoshihara, K oth Ichimura, S oth Enthalten in Surface and interface analysis Chichester [u.a.] : Wiley, 1979 47(2015), 1, Seite 127-134 (DE-627)129377104 (DE-600)164045-8 (DE-576)01475908X 0142-2421 nnns volume:47 year:2015 number:1 pages:127-134 http://dx.doi.org/10.1002/sia.5684 Volltext http://onlinelibrary.wiley.com/doi/10.1002/sia.5684/abstract http://search.proquest.com/docview/1632518583 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-CHE GBV_ILN_70 ZG 1100: 51.00 AVZ 33.68 AVZ AR 47 2015 1 127-134 |
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10.1002/sia.5684 doi PQ20160617 (DE-627)OLC1968159525 (DE-599)GBVOLC1968159525 (PRQ)p2431-1270c011c392659efa26cee96ca5922c9b4302a3a90a48cc8b83aef78223706c3 (KEY)0093577820150000047000100127developmentofstandardsforreliablesurfaceanalysesby DE-627 ger DE-627 rakwb eng 540 530 DNB ZG 1100: AVZ rvk 51.00 bkl 33.68 bkl Powell, C. J verfasserin aut Development of standards for reliable surface analyses by ISO technical committee 201 on surface chemical analysis 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The need for reliable surface analyses together with quality‐management requirements for analytical laboratories led the International Organization for Standardization (ISO) to form its Technical Committee (TC) 201 on Surface Chemical Analysis in 1991. This article describes the organization of TC 201, the strategies that have been found useful for identifying and assessing possible projects for new international standards, and the 57 international standards and other documents prepared to date by TC 201. Standards have now been developed for Auger‐electron spectroscopy, glow‐discharge spectroscopy, various types of scanning probe microscopy, secondary‐ion mass spectrometry, sputter‐depth profiling, total‐reflection X‐ray fluorescence spectroscopy, X‐ray photoelectron spectroscopy, and X‐ray reflectometry. In addition, standards have been developed with definitions of terms used in surface chemical analysis; the handling, preparation of specimens for surface analysis; information and data‐transfer formats; and methods for determining the lateral resolution of beam‐based methods of surface analysis. Copyright © 2014 John Wiley & Sons, Ltd. Nutzungsrecht: Copyright © 2014 John Wiley & Sons, Ltd. ISO/TC 201 International standards surface chemical analysis Shimizu, R oth Yoshihara, K oth Ichimura, S oth Enthalten in Surface and interface analysis Chichester [u.a.] : Wiley, 1979 47(2015), 1, Seite 127-134 (DE-627)129377104 (DE-600)164045-8 (DE-576)01475908X 0142-2421 nnns volume:47 year:2015 number:1 pages:127-134 http://dx.doi.org/10.1002/sia.5684 Volltext http://onlinelibrary.wiley.com/doi/10.1002/sia.5684/abstract http://search.proquest.com/docview/1632518583 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-CHE GBV_ILN_70 ZG 1100: 51.00 AVZ 33.68 AVZ AR 47 2015 1 127-134 |
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10.1002/sia.5684 doi PQ20160617 (DE-627)OLC1968159525 (DE-599)GBVOLC1968159525 (PRQ)p2431-1270c011c392659efa26cee96ca5922c9b4302a3a90a48cc8b83aef78223706c3 (KEY)0093577820150000047000100127developmentofstandardsforreliablesurfaceanalysesby DE-627 ger DE-627 rakwb eng 540 530 DNB ZG 1100: AVZ rvk 51.00 bkl 33.68 bkl Powell, C. J verfasserin aut Development of standards for reliable surface analyses by ISO technical committee 201 on surface chemical analysis 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The need for reliable surface analyses together with quality‐management requirements for analytical laboratories led the International Organization for Standardization (ISO) to form its Technical Committee (TC) 201 on Surface Chemical Analysis in 1991. This article describes the organization of TC 201, the strategies that have been found useful for identifying and assessing possible projects for new international standards, and the 57 international standards and other documents prepared to date by TC 201. Standards have now been developed for Auger‐electron spectroscopy, glow‐discharge spectroscopy, various types of scanning probe microscopy, secondary‐ion mass spectrometry, sputter‐depth profiling, total‐reflection X‐ray fluorescence spectroscopy, X‐ray photoelectron spectroscopy, and X‐ray reflectometry. In addition, standards have been developed with definitions of terms used in surface chemical analysis; the handling, preparation of specimens for surface analysis; information and data‐transfer formats; and methods for determining the lateral resolution of beam‐based methods of surface analysis. Copyright © 2014 John Wiley & Sons, Ltd. Nutzungsrecht: Copyright © 2014 John Wiley & Sons, Ltd. ISO/TC 201 International standards surface chemical analysis Shimizu, R oth Yoshihara, K oth Ichimura, S oth Enthalten in Surface and interface analysis Chichester [u.a.] : Wiley, 1979 47(2015), 1, Seite 127-134 (DE-627)129377104 (DE-600)164045-8 (DE-576)01475908X 0142-2421 nnns volume:47 year:2015 number:1 pages:127-134 http://dx.doi.org/10.1002/sia.5684 Volltext http://onlinelibrary.wiley.com/doi/10.1002/sia.5684/abstract http://search.proquest.com/docview/1632518583 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-CHE GBV_ILN_70 ZG 1100: 51.00 AVZ 33.68 AVZ AR 47 2015 1 127-134 |
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Development of standards for reliable surface analyses by ISO technical committee 201 on surface chemical analysis |
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Development of standards for reliable surface analyses by ISO technical committee 201 on surface chemical analysis |
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development of standards for reliable surface analyses by iso technical committee 201 on surface chemical analysis |
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Development of standards for reliable surface analyses by ISO technical committee 201 on surface chemical analysis |
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The need for reliable surface analyses together with quality‐management requirements for analytical laboratories led the International Organization for Standardization (ISO) to form its Technical Committee (TC) 201 on Surface Chemical Analysis in 1991. This article describes the organization of TC 201, the strategies that have been found useful for identifying and assessing possible projects for new international standards, and the 57 international standards and other documents prepared to date by TC 201. Standards have now been developed for Auger‐electron spectroscopy, glow‐discharge spectroscopy, various types of scanning probe microscopy, secondary‐ion mass spectrometry, sputter‐depth profiling, total‐reflection X‐ray fluorescence spectroscopy, X‐ray photoelectron spectroscopy, and X‐ray reflectometry. In addition, standards have been developed with definitions of terms used in surface chemical analysis; the handling, preparation of specimens for surface analysis; information and data‐transfer formats; and methods for determining the lateral resolution of beam‐based methods of surface analysis. Copyright © 2014 John Wiley & Sons, Ltd. |
abstractGer |
The need for reliable surface analyses together with quality‐management requirements for analytical laboratories led the International Organization for Standardization (ISO) to form its Technical Committee (TC) 201 on Surface Chemical Analysis in 1991. This article describes the organization of TC 201, the strategies that have been found useful for identifying and assessing possible projects for new international standards, and the 57 international standards and other documents prepared to date by TC 201. Standards have now been developed for Auger‐electron spectroscopy, glow‐discharge spectroscopy, various types of scanning probe microscopy, secondary‐ion mass spectrometry, sputter‐depth profiling, total‐reflection X‐ray fluorescence spectroscopy, X‐ray photoelectron spectroscopy, and X‐ray reflectometry. In addition, standards have been developed with definitions of terms used in surface chemical analysis; the handling, preparation of specimens for surface analysis; information and data‐transfer formats; and methods for determining the lateral resolution of beam‐based methods of surface analysis. Copyright © 2014 John Wiley & Sons, Ltd. |
abstract_unstemmed |
The need for reliable surface analyses together with quality‐management requirements for analytical laboratories led the International Organization for Standardization (ISO) to form its Technical Committee (TC) 201 on Surface Chemical Analysis in 1991. This article describes the organization of TC 201, the strategies that have been found useful for identifying and assessing possible projects for new international standards, and the 57 international standards and other documents prepared to date by TC 201. Standards have now been developed for Auger‐electron spectroscopy, glow‐discharge spectroscopy, various types of scanning probe microscopy, secondary‐ion mass spectrometry, sputter‐depth profiling, total‐reflection X‐ray fluorescence spectroscopy, X‐ray photoelectron spectroscopy, and X‐ray reflectometry. In addition, standards have been developed with definitions of terms used in surface chemical analysis; the handling, preparation of specimens for surface analysis; information and data‐transfer formats; and methods for determining the lateral resolution of beam‐based methods of surface analysis. Copyright © 2014 John Wiley & Sons, Ltd. |
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Development of standards for reliable surface analyses by ISO technical committee 201 on surface chemical analysis |
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