Role of Composition and Substrate Temperature on Nonlinear Optical Properties of GeSeTe Thin Films in 0.4-2.4- \mu \text Wavelength Range
The nonlinear optical properties of Ge 10 Se 90- x Te x (<inline-formula> <tex-math notation="LaTeX">x = 0 </tex-math></inline-formula>, 10, 20, 30, 40, 50) thin films have been investigated as a function of composition and substrate deposition temperatures (303, 36...
Ausführliche Beschreibung
Autor*in: |
Sati, Dinesh Chandra [verfasserIn] |
---|
Format: |
Artikel |
---|---|
Sprache: |
Englisch |
Erschienen: |
2016 |
---|
Schlagwörter: |
---|
Übergeordnetes Werk: |
Enthalten in: IEEE transactions on electron devices - New York, NY : IEEE, 1963, 63(2016), 2, Seite 698-703 |
---|---|
Übergeordnetes Werk: |
volume:63 ; year:2016 ; number:2 ; pages:698-703 |
Links: |
---|
DOI / URN: |
10.1109/TED.2015.2505713 |
---|
Katalog-ID: |
OLC1970870176 |
---|
LEADER | 01000caa a2200265 4500 | ||
---|---|---|---|
001 | OLC1970870176 | ||
003 | DE-627 | ||
005 | 20210716064845.0 | ||
007 | tu | ||
008 | 160212s2016 xx ||||| 00| ||eng c | ||
024 | 7 | |a 10.1109/TED.2015.2505713 |2 doi | |
028 | 5 | 2 | |a PQ20160430 |
035 | |a (DE-627)OLC1970870176 | ||
035 | |a (DE-599)GBVOLC1970870176 | ||
035 | |a (PRQ)ieee_primary_0b00006484b4c1b10 | ||
035 | |a (KEY)0079428720160000063000200698roleofcompositionandsubstratetemperatureonnonlinea | ||
040 | |a DE-627 |b ger |c DE-627 |e rakwb | ||
041 | |a eng | ||
082 | 0 | 4 | |a 620 |q DNB |
100 | 1 | |a Sati, Dinesh Chandra |e verfasserin |4 aut | |
245 | 1 | 0 | |a Role of Composition and Substrate Temperature on Nonlinear Optical Properties of GeSeTe Thin Films in 0.4-2.4- \mu \text Wavelength Range |
264 | 1 | |c 2016 | |
336 | |a Text |b txt |2 rdacontent | ||
337 | |a ohne Hilfsmittel zu benutzen |b n |2 rdamedia | ||
338 | |a Band |b nc |2 rdacarrier | ||
520 | |a The nonlinear optical properties of Ge 10 Se 90- x Te x (<inline-formula> <tex-math notation="LaTeX">x = 0 </tex-math></inline-formula>, 10, 20, 30, 40, 50) thin films have been investigated as a function of composition and substrate deposition temperatures (303, 363, and 423 K). The third-order nonlinear susceptibility and nonlinear refractive index have been estimated. Nonlinearity in refractive index increases with Te content and also with increasing substrate temperature. Among the investigated compositions of Ge 10 Se 90- x Te x , the Ge 10 Se 40 Te 50 composition shows more prominent nonlinear refractive index in comparison with pure silica. The high third-order susceptibility and nonlinear refractive index may make these materials capable for high-speed communication fibers. | ||
650 | 4 | |a Optical variables control | |
650 | 4 | |a Nonlinear optics | |
650 | 4 | |a thin films | |
650 | 4 | |a photorefractive effect | |
650 | 4 | |a Substrates | |
650 | 4 | |a Optical films | |
650 | 4 | |a Optical refraction | |
650 | 4 | |a Glass | |
650 | 4 | |a Refractive index | |
650 | 4 | |a Optical signal processing | |
700 | 1 | |a Katyal, Subhash Chander |4 oth | |
700 | 1 | |a Sharma, Pankaj |4 oth | |
773 | 0 | 8 | |i Enthalten in |t IEEE transactions on electron devices |d New York, NY : IEEE, 1963 |g 63(2016), 2, Seite 698-703 |w (DE-627)129602922 |w (DE-600)241634-7 |w (DE-576)015096734 |x 0018-9383 |7 nnns |
773 | 1 | 8 | |g volume:63 |g year:2016 |g number:2 |g pages:698-703 |
856 | 4 | 1 | |u http://dx.doi.org/10.1109/TED.2015.2505713 |3 Volltext |
856 | 4 | 2 | |u http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7362164 |
912 | |a GBV_USEFLAG_A | ||
912 | |a SYSFLAG_A | ||
912 | |a GBV_OLC | ||
912 | |a SSG-OLC-TEC | ||
912 | |a SSG-OLC-MAT | ||
912 | |a GBV_ILN_70 | ||
912 | |a GBV_ILN_2004 | ||
912 | |a GBV_ILN_4313 | ||
951 | |a AR | ||
952 | |d 63 |j 2016 |e 2 |h 698-703 |
author_variant |
d c s dc dcs |
---|---|
matchkey_str |
article:00189383:2016----::oefopstoadusrttmeauenolnaotclrprisfeeehnim |
hierarchy_sort_str |
2016 |
publishDate |
2016 |
allfields |
10.1109/TED.2015.2505713 doi PQ20160430 (DE-627)OLC1970870176 (DE-599)GBVOLC1970870176 (PRQ)ieee_primary_0b00006484b4c1b10 (KEY)0079428720160000063000200698roleofcompositionandsubstratetemperatureonnonlinea DE-627 ger DE-627 rakwb eng 620 DNB Sati, Dinesh Chandra verfasserin aut Role of Composition and Substrate Temperature on Nonlinear Optical Properties of GeSeTe Thin Films in 0.4-2.4- \mu \text Wavelength Range 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The nonlinear optical properties of Ge 10 Se 90- x Te x (<inline-formula> <tex-math notation="LaTeX">x = 0 </tex-math></inline-formula>, 10, 20, 30, 40, 50) thin films have been investigated as a function of composition and substrate deposition temperatures (303, 363, and 423 K). The third-order nonlinear susceptibility and nonlinear refractive index have been estimated. Nonlinearity in refractive index increases with Te content and also with increasing substrate temperature. Among the investigated compositions of Ge 10 Se 90- x Te x , the Ge 10 Se 40 Te 50 composition shows more prominent nonlinear refractive index in comparison with pure silica. The high third-order susceptibility and nonlinear refractive index may make these materials capable for high-speed communication fibers. Optical variables control Nonlinear optics thin films photorefractive effect Substrates Optical films Optical refraction Glass Refractive index Optical signal processing Katyal, Subhash Chander oth Sharma, Pankaj oth Enthalten in IEEE transactions on electron devices New York, NY : IEEE, 1963 63(2016), 2, Seite 698-703 (DE-627)129602922 (DE-600)241634-7 (DE-576)015096734 0018-9383 nnns volume:63 year:2016 number:2 pages:698-703 http://dx.doi.org/10.1109/TED.2015.2505713 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7362164 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_2004 GBV_ILN_4313 AR 63 2016 2 698-703 |
spelling |
10.1109/TED.2015.2505713 doi PQ20160430 (DE-627)OLC1970870176 (DE-599)GBVOLC1970870176 (PRQ)ieee_primary_0b00006484b4c1b10 (KEY)0079428720160000063000200698roleofcompositionandsubstratetemperatureonnonlinea DE-627 ger DE-627 rakwb eng 620 DNB Sati, Dinesh Chandra verfasserin aut Role of Composition and Substrate Temperature on Nonlinear Optical Properties of GeSeTe Thin Films in 0.4-2.4- \mu \text Wavelength Range 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The nonlinear optical properties of Ge 10 Se 90- x Te x (<inline-formula> <tex-math notation="LaTeX">x = 0 </tex-math></inline-formula>, 10, 20, 30, 40, 50) thin films have been investigated as a function of composition and substrate deposition temperatures (303, 363, and 423 K). The third-order nonlinear susceptibility and nonlinear refractive index have been estimated. Nonlinearity in refractive index increases with Te content and also with increasing substrate temperature. Among the investigated compositions of Ge 10 Se 90- x Te x , the Ge 10 Se 40 Te 50 composition shows more prominent nonlinear refractive index in comparison with pure silica. The high third-order susceptibility and nonlinear refractive index may make these materials capable for high-speed communication fibers. Optical variables control Nonlinear optics thin films photorefractive effect Substrates Optical films Optical refraction Glass Refractive index Optical signal processing Katyal, Subhash Chander oth Sharma, Pankaj oth Enthalten in IEEE transactions on electron devices New York, NY : IEEE, 1963 63(2016), 2, Seite 698-703 (DE-627)129602922 (DE-600)241634-7 (DE-576)015096734 0018-9383 nnns volume:63 year:2016 number:2 pages:698-703 http://dx.doi.org/10.1109/TED.2015.2505713 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7362164 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_2004 GBV_ILN_4313 AR 63 2016 2 698-703 |
allfields_unstemmed |
10.1109/TED.2015.2505713 doi PQ20160430 (DE-627)OLC1970870176 (DE-599)GBVOLC1970870176 (PRQ)ieee_primary_0b00006484b4c1b10 (KEY)0079428720160000063000200698roleofcompositionandsubstratetemperatureonnonlinea DE-627 ger DE-627 rakwb eng 620 DNB Sati, Dinesh Chandra verfasserin aut Role of Composition and Substrate Temperature on Nonlinear Optical Properties of GeSeTe Thin Films in 0.4-2.4- \mu \text Wavelength Range 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The nonlinear optical properties of Ge 10 Se 90- x Te x (<inline-formula> <tex-math notation="LaTeX">x = 0 </tex-math></inline-formula>, 10, 20, 30, 40, 50) thin films have been investigated as a function of composition and substrate deposition temperatures (303, 363, and 423 K). The third-order nonlinear susceptibility and nonlinear refractive index have been estimated. Nonlinearity in refractive index increases with Te content and also with increasing substrate temperature. Among the investigated compositions of Ge 10 Se 90- x Te x , the Ge 10 Se 40 Te 50 composition shows more prominent nonlinear refractive index in comparison with pure silica. The high third-order susceptibility and nonlinear refractive index may make these materials capable for high-speed communication fibers. Optical variables control Nonlinear optics thin films photorefractive effect Substrates Optical films Optical refraction Glass Refractive index Optical signal processing Katyal, Subhash Chander oth Sharma, Pankaj oth Enthalten in IEEE transactions on electron devices New York, NY : IEEE, 1963 63(2016), 2, Seite 698-703 (DE-627)129602922 (DE-600)241634-7 (DE-576)015096734 0018-9383 nnns volume:63 year:2016 number:2 pages:698-703 http://dx.doi.org/10.1109/TED.2015.2505713 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7362164 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_2004 GBV_ILN_4313 AR 63 2016 2 698-703 |
allfieldsGer |
10.1109/TED.2015.2505713 doi PQ20160430 (DE-627)OLC1970870176 (DE-599)GBVOLC1970870176 (PRQ)ieee_primary_0b00006484b4c1b10 (KEY)0079428720160000063000200698roleofcompositionandsubstratetemperatureonnonlinea DE-627 ger DE-627 rakwb eng 620 DNB Sati, Dinesh Chandra verfasserin aut Role of Composition and Substrate Temperature on Nonlinear Optical Properties of GeSeTe Thin Films in 0.4-2.4- \mu \text Wavelength Range 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The nonlinear optical properties of Ge 10 Se 90- x Te x (<inline-formula> <tex-math notation="LaTeX">x = 0 </tex-math></inline-formula>, 10, 20, 30, 40, 50) thin films have been investigated as a function of composition and substrate deposition temperatures (303, 363, and 423 K). The third-order nonlinear susceptibility and nonlinear refractive index have been estimated. Nonlinearity in refractive index increases with Te content and also with increasing substrate temperature. Among the investigated compositions of Ge 10 Se 90- x Te x , the Ge 10 Se 40 Te 50 composition shows more prominent nonlinear refractive index in comparison with pure silica. The high third-order susceptibility and nonlinear refractive index may make these materials capable for high-speed communication fibers. Optical variables control Nonlinear optics thin films photorefractive effect Substrates Optical films Optical refraction Glass Refractive index Optical signal processing Katyal, Subhash Chander oth Sharma, Pankaj oth Enthalten in IEEE transactions on electron devices New York, NY : IEEE, 1963 63(2016), 2, Seite 698-703 (DE-627)129602922 (DE-600)241634-7 (DE-576)015096734 0018-9383 nnns volume:63 year:2016 number:2 pages:698-703 http://dx.doi.org/10.1109/TED.2015.2505713 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7362164 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_2004 GBV_ILN_4313 AR 63 2016 2 698-703 |
allfieldsSound |
10.1109/TED.2015.2505713 doi PQ20160430 (DE-627)OLC1970870176 (DE-599)GBVOLC1970870176 (PRQ)ieee_primary_0b00006484b4c1b10 (KEY)0079428720160000063000200698roleofcompositionandsubstratetemperatureonnonlinea DE-627 ger DE-627 rakwb eng 620 DNB Sati, Dinesh Chandra verfasserin aut Role of Composition and Substrate Temperature on Nonlinear Optical Properties of GeSeTe Thin Films in 0.4-2.4- \mu \text Wavelength Range 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The nonlinear optical properties of Ge 10 Se 90- x Te x (<inline-formula> <tex-math notation="LaTeX">x = 0 </tex-math></inline-formula>, 10, 20, 30, 40, 50) thin films have been investigated as a function of composition and substrate deposition temperatures (303, 363, and 423 K). The third-order nonlinear susceptibility and nonlinear refractive index have been estimated. Nonlinearity in refractive index increases with Te content and also with increasing substrate temperature. Among the investigated compositions of Ge 10 Se 90- x Te x , the Ge 10 Se 40 Te 50 composition shows more prominent nonlinear refractive index in comparison with pure silica. The high third-order susceptibility and nonlinear refractive index may make these materials capable for high-speed communication fibers. Optical variables control Nonlinear optics thin films photorefractive effect Substrates Optical films Optical refraction Glass Refractive index Optical signal processing Katyal, Subhash Chander oth Sharma, Pankaj oth Enthalten in IEEE transactions on electron devices New York, NY : IEEE, 1963 63(2016), 2, Seite 698-703 (DE-627)129602922 (DE-600)241634-7 (DE-576)015096734 0018-9383 nnns volume:63 year:2016 number:2 pages:698-703 http://dx.doi.org/10.1109/TED.2015.2505713 Volltext http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7362164 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_2004 GBV_ILN_4313 AR 63 2016 2 698-703 |
language |
English |
source |
Enthalten in IEEE transactions on electron devices 63(2016), 2, Seite 698-703 volume:63 year:2016 number:2 pages:698-703 |
sourceStr |
Enthalten in IEEE transactions on electron devices 63(2016), 2, Seite 698-703 volume:63 year:2016 number:2 pages:698-703 |
format_phy_str_mv |
Article |
institution |
findex.gbv.de |
topic_facet |
Optical variables control Nonlinear optics thin films photorefractive effect Substrates Optical films Optical refraction Glass Refractive index Optical signal processing |
dewey-raw |
620 |
isfreeaccess_bool |
false |
container_title |
IEEE transactions on electron devices |
authorswithroles_txt_mv |
Sati, Dinesh Chandra @@aut@@ Katyal, Subhash Chander @@oth@@ Sharma, Pankaj @@oth@@ |
publishDateDaySort_date |
2016-01-01T00:00:00Z |
hierarchy_top_id |
129602922 |
dewey-sort |
3620 |
id |
OLC1970870176 |
language_de |
englisch |
fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a2200265 4500</leader><controlfield tag="001">OLC1970870176</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20210716064845.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">160212s2016 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1109/TED.2015.2505713</subfield><subfield code="2">doi</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">PQ20160430</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1970870176</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1970870176</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(PRQ)ieee_primary_0b00006484b4c1b10</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(KEY)0079428720160000063000200698roleofcompositionandsubstratetemperatureonnonlinea</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620</subfield><subfield code="q">DNB</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Sati, Dinesh Chandra</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Role of Composition and Substrate Temperature on Nonlinear Optical Properties of GeSeTe Thin Films in 0.4-2.4- \mu \text Wavelength Range</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2016</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">The nonlinear optical properties of Ge 10 Se 90- x Te x (<inline-formula> <tex-math notation="LaTeX">x = 0 </tex-math></inline-formula>, 10, 20, 30, 40, 50) thin films have been investigated as a function of composition and substrate deposition temperatures (303, 363, and 423 K). The third-order nonlinear susceptibility and nonlinear refractive index have been estimated. Nonlinearity in refractive index increases with Te content and also with increasing substrate temperature. Among the investigated compositions of Ge 10 Se 90- x Te x , the Ge 10 Se 40 Te 50 composition shows more prominent nonlinear refractive index in comparison with pure silica. The high third-order susceptibility and nonlinear refractive index may make these materials capable for high-speed communication fibers.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical variables control</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Nonlinear optics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">thin films</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">photorefractive effect</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Substrates</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical films</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical refraction</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Glass</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Refractive index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical signal processing</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Katyal, Subhash Chander</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Sharma, Pankaj</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">IEEE transactions on electron devices</subfield><subfield code="d">New York, NY : IEEE, 1963</subfield><subfield code="g">63(2016), 2, Seite 698-703</subfield><subfield code="w">(DE-627)129602922</subfield><subfield code="w">(DE-600)241634-7</subfield><subfield code="w">(DE-576)015096734</subfield><subfield code="x">0018-9383</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:63</subfield><subfield code="g">year:2016</subfield><subfield code="g">number:2</subfield><subfield code="g">pages:698-703</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">http://dx.doi.org/10.1109/TED.2015.2505713</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7362164</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-MAT</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2004</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4313</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">63</subfield><subfield code="j">2016</subfield><subfield code="e">2</subfield><subfield code="h">698-703</subfield></datafield></record></collection>
|
author |
Sati, Dinesh Chandra |
spellingShingle |
Sati, Dinesh Chandra ddc 620 misc Optical variables control misc Nonlinear optics misc thin films misc photorefractive effect misc Substrates misc Optical films misc Optical refraction misc Glass misc Refractive index misc Optical signal processing Role of Composition and Substrate Temperature on Nonlinear Optical Properties of GeSeTe Thin Films in 0.4-2.4- \mu \text Wavelength Range |
authorStr |
Sati, Dinesh Chandra |
ppnlink_with_tag_str_mv |
@@773@@(DE-627)129602922 |
format |
Article |
dewey-ones |
620 - Engineering & allied operations |
delete_txt_mv |
keep |
author_role |
aut |
collection |
OLC |
remote_str |
false |
illustrated |
Not Illustrated |
issn |
0018-9383 |
topic_title |
620 DNB Role of Composition and Substrate Temperature on Nonlinear Optical Properties of GeSeTe Thin Films in 0.4-2.4- \mu \text Wavelength Range Optical variables control Nonlinear optics thin films photorefractive effect Substrates Optical films Optical refraction Glass Refractive index Optical signal processing |
topic |
ddc 620 misc Optical variables control misc Nonlinear optics misc thin films misc photorefractive effect misc Substrates misc Optical films misc Optical refraction misc Glass misc Refractive index misc Optical signal processing |
topic_unstemmed |
ddc 620 misc Optical variables control misc Nonlinear optics misc thin films misc photorefractive effect misc Substrates misc Optical films misc Optical refraction misc Glass misc Refractive index misc Optical signal processing |
topic_browse |
ddc 620 misc Optical variables control misc Nonlinear optics misc thin films misc photorefractive effect misc Substrates misc Optical films misc Optical refraction misc Glass misc Refractive index misc Optical signal processing |
format_facet |
Aufsätze Gedruckte Aufsätze |
format_main_str_mv |
Text Zeitschrift/Artikel |
carriertype_str_mv |
nc |
author2_variant |
s c k sc sck p s ps |
hierarchy_parent_title |
IEEE transactions on electron devices |
hierarchy_parent_id |
129602922 |
dewey-tens |
620 - Engineering |
hierarchy_top_title |
IEEE transactions on electron devices |
isfreeaccess_txt |
false |
familylinks_str_mv |
(DE-627)129602922 (DE-600)241634-7 (DE-576)015096734 |
title |
Role of Composition and Substrate Temperature on Nonlinear Optical Properties of GeSeTe Thin Films in 0.4-2.4- \mu \text Wavelength Range |
ctrlnum |
(DE-627)OLC1970870176 (DE-599)GBVOLC1970870176 (PRQ)ieee_primary_0b00006484b4c1b10 (KEY)0079428720160000063000200698roleofcompositionandsubstratetemperatureonnonlinea |
title_full |
Role of Composition and Substrate Temperature on Nonlinear Optical Properties of GeSeTe Thin Films in 0.4-2.4- \mu \text Wavelength Range |
author_sort |
Sati, Dinesh Chandra |
journal |
IEEE transactions on electron devices |
journalStr |
IEEE transactions on electron devices |
lang_code |
eng |
isOA_bool |
false |
dewey-hundreds |
600 - Technology |
recordtype |
marc |
publishDateSort |
2016 |
contenttype_str_mv |
txt |
container_start_page |
698 |
author_browse |
Sati, Dinesh Chandra |
container_volume |
63 |
class |
620 DNB |
format_se |
Aufsätze |
author-letter |
Sati, Dinesh Chandra |
doi_str_mv |
10.1109/TED.2015.2505713 |
dewey-full |
620 |
title_sort |
role of composition and substrate temperature on nonlinear optical properties of gesete thin films in 0.4-2.4- \mu \text wavelength range |
title_auth |
Role of Composition and Substrate Temperature on Nonlinear Optical Properties of GeSeTe Thin Films in 0.4-2.4- \mu \text Wavelength Range |
abstract |
The nonlinear optical properties of Ge 10 Se 90- x Te x (<inline-formula> <tex-math notation="LaTeX">x = 0 </tex-math></inline-formula>, 10, 20, 30, 40, 50) thin films have been investigated as a function of composition and substrate deposition temperatures (303, 363, and 423 K). The third-order nonlinear susceptibility and nonlinear refractive index have been estimated. Nonlinearity in refractive index increases with Te content and also with increasing substrate temperature. Among the investigated compositions of Ge 10 Se 90- x Te x , the Ge 10 Se 40 Te 50 composition shows more prominent nonlinear refractive index in comparison with pure silica. The high third-order susceptibility and nonlinear refractive index may make these materials capable for high-speed communication fibers. |
abstractGer |
The nonlinear optical properties of Ge 10 Se 90- x Te x (<inline-formula> <tex-math notation="LaTeX">x = 0 </tex-math></inline-formula>, 10, 20, 30, 40, 50) thin films have been investigated as a function of composition and substrate deposition temperatures (303, 363, and 423 K). The third-order nonlinear susceptibility and nonlinear refractive index have been estimated. Nonlinearity in refractive index increases with Te content and also with increasing substrate temperature. Among the investigated compositions of Ge 10 Se 90- x Te x , the Ge 10 Se 40 Te 50 composition shows more prominent nonlinear refractive index in comparison with pure silica. The high third-order susceptibility and nonlinear refractive index may make these materials capable for high-speed communication fibers. |
abstract_unstemmed |
The nonlinear optical properties of Ge 10 Se 90- x Te x (<inline-formula> <tex-math notation="LaTeX">x = 0 </tex-math></inline-formula>, 10, 20, 30, 40, 50) thin films have been investigated as a function of composition and substrate deposition temperatures (303, 363, and 423 K). The third-order nonlinear susceptibility and nonlinear refractive index have been estimated. Nonlinearity in refractive index increases with Te content and also with increasing substrate temperature. Among the investigated compositions of Ge 10 Se 90- x Te x , the Ge 10 Se 40 Te 50 composition shows more prominent nonlinear refractive index in comparison with pure silica. The high third-order susceptibility and nonlinear refractive index may make these materials capable for high-speed communication fibers. |
collection_details |
GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_2004 GBV_ILN_4313 |
container_issue |
2 |
title_short |
Role of Composition and Substrate Temperature on Nonlinear Optical Properties of GeSeTe Thin Films in 0.4-2.4- \mu \text Wavelength Range |
url |
http://dx.doi.org/10.1109/TED.2015.2505713 http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7362164 |
remote_bool |
false |
author2 |
Katyal, Subhash Chander Sharma, Pankaj |
author2Str |
Katyal, Subhash Chander Sharma, Pankaj |
ppnlink |
129602922 |
mediatype_str_mv |
n |
isOA_txt |
false |
hochschulschrift_bool |
false |
author2_role |
oth oth |
doi_str |
10.1109/TED.2015.2505713 |
up_date |
2024-07-03T17:12:31.466Z |
_version_ |
1803578770948358144 |
fullrecord_marcxml |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a2200265 4500</leader><controlfield tag="001">OLC1970870176</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20210716064845.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">160212s2016 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1109/TED.2015.2505713</subfield><subfield code="2">doi</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">PQ20160430</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1970870176</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1970870176</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(PRQ)ieee_primary_0b00006484b4c1b10</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(KEY)0079428720160000063000200698roleofcompositionandsubstratetemperatureonnonlinea</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620</subfield><subfield code="q">DNB</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Sati, Dinesh Chandra</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Role of Composition and Substrate Temperature on Nonlinear Optical Properties of GeSeTe Thin Films in 0.4-2.4- \mu \text Wavelength Range</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2016</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">The nonlinear optical properties of Ge 10 Se 90- x Te x (<inline-formula> <tex-math notation="LaTeX">x = 0 </tex-math></inline-formula>, 10, 20, 30, 40, 50) thin films have been investigated as a function of composition and substrate deposition temperatures (303, 363, and 423 K). The third-order nonlinear susceptibility and nonlinear refractive index have been estimated. Nonlinearity in refractive index increases with Te content and also with increasing substrate temperature. Among the investigated compositions of Ge 10 Se 90- x Te x , the Ge 10 Se 40 Te 50 composition shows more prominent nonlinear refractive index in comparison with pure silica. The high third-order susceptibility and nonlinear refractive index may make these materials capable for high-speed communication fibers.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical variables control</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Nonlinear optics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">thin films</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">photorefractive effect</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Substrates</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical films</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical refraction</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Glass</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Refractive index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical signal processing</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Katyal, Subhash Chander</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Sharma, Pankaj</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">IEEE transactions on electron devices</subfield><subfield code="d">New York, NY : IEEE, 1963</subfield><subfield code="g">63(2016), 2, Seite 698-703</subfield><subfield code="w">(DE-627)129602922</subfield><subfield code="w">(DE-600)241634-7</subfield><subfield code="w">(DE-576)015096734</subfield><subfield code="x">0018-9383</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:63</subfield><subfield code="g">year:2016</subfield><subfield code="g">number:2</subfield><subfield code="g">pages:698-703</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">http://dx.doi.org/10.1109/TED.2015.2505713</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=7362164</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-MAT</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2004</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4313</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">63</subfield><subfield code="j">2016</subfield><subfield code="e">2</subfield><subfield code="h">698-703</subfield></datafield></record></collection>
|
score |
7.398568 |