Time-dependent creep behavior of amorphous ZrCu and nanocrystalline Zr thin films – A comparison

Gespeichert in:

Autor*in:	Chen, Y.H [verfasserIn] Huang, J.C Du, X.H Wang, X

Format:	Artikel
Sprache:	Englisch

Erschienen:	2016

Übergeordnetes Werk:	Enthalten in: Intermetallics - Barking : Elsevier Science Publ., 1993, 68(2016), Seite 101-106
Übergeordnetes Werk:	volume:68 ; year:2016 ; pages:101-106

Links:	Volltext

DOI / URN:	10.1016/j.intermet.2015.10.001

Katalog-ID:	OLC1971291765

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