Measurement of valence-band offset at native oxide/Ba[Si.sub.2] interfaces by hard x-ray photoelectron spectroscopy
Autor*in: |
Takabe, Ryota [verfasserIn] |
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Format: |
Artikel |
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Sprache: |
Englisch |
Erschienen: |
2016 |
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Schlagwörter: |
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Übergeordnetes Werk: |
Enthalten in: Journal of applied physics - Melville, NY : AIP, 1937, 119(2016), 2 |
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Übergeordnetes Werk: |
volume:119 ; year:2016 ; number:2 |
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PQ20160430 (DE-627)OLC1973855402 (DE-599)GBVOLC1973855402 (PRQ)gale_infotrac_4430210050 (KEY)0076740920160000119000200000measurementofvalencebandoffsetatnativeoxidebasisub DE-627 ger DE-627 rakwb eng 530 DNB Takabe, Ryota verfasserin aut Measurement of valence-band offset at native oxide/Ba[Si.sub.2] interfaces by hard x-ray photoelectron spectroscopy 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Barium compounds X-ray spectroscopy Electric properties Usage Weijie Du oth Ito, Keita oth Takeuchi, Hiroki oth Toko, Kaoru oth Ueda, Shigenori oth Kimura, Akio oth Suemasu, Takashi oth Enthalten in Journal of applied physics Melville, NY : AIP, 1937 119(2016), 2 (DE-627)129079030 (DE-600)3112-4 (DE-576)014411652 0021-8979 nnns volume:119 year:2016 number:2 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_21 GBV_ILN_59 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2279 GBV_ILN_4319 AR 119 2016 2 |
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