Design-for-Testability for Functional Broadside Tests under Primary Input Constraints
Functional broadside tests avoid overtesting of delay faults by creating functional operation conditions during the clock cycles where delay faults are detected. When a circuit is embedded in a larger design, a functional broadside test needs to take into consideration the functional constraints tha...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Pomeranz, Irith [verfasserIn] |
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| Format: |
Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2016 |
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| Schlagwörter: |
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| Übergeordnetes Werk: |
Enthalten in: ACM transactions on design automation of electronic systems - New York, NY : ACM Press, 1996, 21(2016), 2, Seite 1-18 |
|---|---|
| Übergeordnetes Werk: |
volume:21 ; year:2016 ; number:2 ; pages:1-18 |
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| DOI / URN: |
10.1145/2831231 |
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OLC1974238806 |
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| 520 | |a Functional broadside tests avoid overtesting of delay faults by creating functional operation conditions during the clock cycles where delay faults are detected. When a circuit is embedded in a larger design, a functional broadside test needs to take into consideration the functional constraints that the design creates for its primary input vectors. At the same time, application of primary input vectors as part of a scan-based test requires hardware support. An earlier work considered the case where a primary input vector is held constant during a test. The approach described in this article matches the hardware for applying primary input vectors to the functional constraints that the design creates. This increases the transition fault coverage that can be achieved by functional broadside tests. This article also considers the effect on the transition fault coverage achievable using close-to-functional broadside tests. | ||
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10.1145/2831231 doi PQ20160430 (DE-627)OLC1974238806 (DE-599)GBVOLC1974238806 (PRQ)a797-9ca5366ef75148a28d85a355ccf21165d17ceb4f7f3310041a94f1f50220755a0 (KEY)0304613320160000021000200001designfortestabilityforfunctionalbroadsidetestsund DE-627 ger DE-627 rakwb eng 540 620 DNB 54.00 bkl Pomeranz, Irith verfasserin aut Design-for-Testability for Functional Broadside Tests under Primary Input Constraints 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Functional broadside tests avoid overtesting of delay faults by creating functional operation conditions during the clock cycles where delay faults are detected. When a circuit is embedded in a larger design, a functional broadside test needs to take into consideration the functional constraints that the design creates for its primary input vectors. At the same time, application of primary input vectors as part of a scan-based test requires hardware support. An earlier work considered the case where a primary input vector is held constant during a test. The approach described in this article matches the hardware for applying primary input vectors to the functional constraints that the design creates. This increases the transition fault coverage that can be achieved by functional broadside tests. This article also considers the effect on the transition fault coverage achievable using close-to-functional broadside tests. transition faults Design-for-testability scan circuits functional broadside tests Enthalten in ACM transactions on design automation of electronic systems New York, NY : ACM Press, 1996 21(2016), 2, Seite 1-18 (DE-627)214067289 (DE-600)1325337-2 (DE-576)053039084 1084-4309 nnns volume:21 year:2016 number:2 pages:1-18 http://dx.doi.org/10.1145/2831231 Volltext http://dl.acm.org/citation.cfm?id=2831231 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_2021 GBV_ILN_2190 GBV_ILN_4125 54.00 AVZ AR 21 2016 2 1-18 |
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10.1145/2831231 doi PQ20160430 (DE-627)OLC1974238806 (DE-599)GBVOLC1974238806 (PRQ)a797-9ca5366ef75148a28d85a355ccf21165d17ceb4f7f3310041a94f1f50220755a0 (KEY)0304613320160000021000200001designfortestabilityforfunctionalbroadsidetestsund DE-627 ger DE-627 rakwb eng 540 620 DNB 54.00 bkl Pomeranz, Irith verfasserin aut Design-for-Testability for Functional Broadside Tests under Primary Input Constraints 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Functional broadside tests avoid overtesting of delay faults by creating functional operation conditions during the clock cycles where delay faults are detected. When a circuit is embedded in a larger design, a functional broadside test needs to take into consideration the functional constraints that the design creates for its primary input vectors. At the same time, application of primary input vectors as part of a scan-based test requires hardware support. An earlier work considered the case where a primary input vector is held constant during a test. The approach described in this article matches the hardware for applying primary input vectors to the functional constraints that the design creates. This increases the transition fault coverage that can be achieved by functional broadside tests. This article also considers the effect on the transition fault coverage achievable using close-to-functional broadside tests. transition faults Design-for-testability scan circuits functional broadside tests Enthalten in ACM transactions on design automation of electronic systems New York, NY : ACM Press, 1996 21(2016), 2, Seite 1-18 (DE-627)214067289 (DE-600)1325337-2 (DE-576)053039084 1084-4309 nnns volume:21 year:2016 number:2 pages:1-18 http://dx.doi.org/10.1145/2831231 Volltext http://dl.acm.org/citation.cfm?id=2831231 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_2021 GBV_ILN_2190 GBV_ILN_4125 54.00 AVZ AR 21 2016 2 1-18 |
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10.1145/2831231 doi PQ20160430 (DE-627)OLC1974238806 (DE-599)GBVOLC1974238806 (PRQ)a797-9ca5366ef75148a28d85a355ccf21165d17ceb4f7f3310041a94f1f50220755a0 (KEY)0304613320160000021000200001designfortestabilityforfunctionalbroadsidetestsund DE-627 ger DE-627 rakwb eng 540 620 DNB 54.00 bkl Pomeranz, Irith verfasserin aut Design-for-Testability for Functional Broadside Tests under Primary Input Constraints 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Functional broadside tests avoid overtesting of delay faults by creating functional operation conditions during the clock cycles where delay faults are detected. When a circuit is embedded in a larger design, a functional broadside test needs to take into consideration the functional constraints that the design creates for its primary input vectors. At the same time, application of primary input vectors as part of a scan-based test requires hardware support. An earlier work considered the case where a primary input vector is held constant during a test. The approach described in this article matches the hardware for applying primary input vectors to the functional constraints that the design creates. This increases the transition fault coverage that can be achieved by functional broadside tests. This article also considers the effect on the transition fault coverage achievable using close-to-functional broadside tests. transition faults Design-for-testability scan circuits functional broadside tests Enthalten in ACM transactions on design automation of electronic systems New York, NY : ACM Press, 1996 21(2016), 2, Seite 1-18 (DE-627)214067289 (DE-600)1325337-2 (DE-576)053039084 1084-4309 nnns volume:21 year:2016 number:2 pages:1-18 http://dx.doi.org/10.1145/2831231 Volltext http://dl.acm.org/citation.cfm?id=2831231 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-MAT GBV_ILN_70 GBV_ILN_2021 GBV_ILN_2190 GBV_ILN_4125 54.00 AVZ AR 21 2016 2 1-18 |
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Design-for-Testability for Functional Broadside Tests under Primary Input Constraints |
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Functional broadside tests avoid overtesting of delay faults by creating functional operation conditions during the clock cycles where delay faults are detected. When a circuit is embedded in a larger design, a functional broadside test needs to take into consideration the functional constraints that the design creates for its primary input vectors. At the same time, application of primary input vectors as part of a scan-based test requires hardware support. An earlier work considered the case where a primary input vector is held constant during a test. The approach described in this article matches the hardware for applying primary input vectors to the functional constraints that the design creates. This increases the transition fault coverage that can be achieved by functional broadside tests. This article also considers the effect on the transition fault coverage achievable using close-to-functional broadside tests. |
| abstractGer |
Functional broadside tests avoid overtesting of delay faults by creating functional operation conditions during the clock cycles where delay faults are detected. When a circuit is embedded in a larger design, a functional broadside test needs to take into consideration the functional constraints that the design creates for its primary input vectors. At the same time, application of primary input vectors as part of a scan-based test requires hardware support. An earlier work considered the case where a primary input vector is held constant during a test. The approach described in this article matches the hardware for applying primary input vectors to the functional constraints that the design creates. This increases the transition fault coverage that can be achieved by functional broadside tests. This article also considers the effect on the transition fault coverage achievable using close-to-functional broadside tests. |
| abstract_unstemmed |
Functional broadside tests avoid overtesting of delay faults by creating functional operation conditions during the clock cycles where delay faults are detected. When a circuit is embedded in a larger design, a functional broadside test needs to take into consideration the functional constraints that the design creates for its primary input vectors. At the same time, application of primary input vectors as part of a scan-based test requires hardware support. An earlier work considered the case where a primary input vector is held constant during a test. The approach described in this article matches the hardware for applying primary input vectors to the functional constraints that the design creates. This increases the transition fault coverage that can be achieved by functional broadside tests. This article also considers the effect on the transition fault coverage achievable using close-to-functional broadside tests. |
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Design-for-Testability for Functional Broadside Tests under Primary Input Constraints |
| url |
http://dx.doi.org/10.1145/2831231 http://dl.acm.org/citation.cfm?id=2831231 |
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false |
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214067289 |
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| doi_str |
10.1145/2831231 |
| up_date |
2024-07-04T04:03:35.649Z |
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1803619732711014400 |
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