Low-Loss Microcoaxial Rat-Race Hybrid for Si-Based Microwave Integrated Circuits

This letter presents a microcoaxial rat-race hybrid for Si-based Ku-Band microwave applications. The device fabrication is conducted using a low-thermal-budget multilayer Cu Damescene process, which is fully compatible with CMOS back-end-of-line (BEOL) technology. The reported on-chip rat-race hybri...
Ausführliche Beschreibung

Gespeichert in:
Autor*in:

Tian, Yang [verfasserIn]

Wang, Hong

Liu, Zhihong

Meng, Qianqian

Lee, Kokyan

Format:

Artikel

Sprache:

Englisch

Erschienen:

2016

Schlagwörter:

Microwave circuits

Silicon

Propagation losses

Microwave integrated circuits

transmission loss

CMOS integrated circuits

phase response

Isolation

rat-race hybrid

S-parameters

Resists

System-on-chip

return loss

Übergeordnetes Werk:

Enthalten in: IEEE microwave and wireless components letters - New York, NY : Inst., 1991, 26(2016), 3, Seite 162-164

Übergeordnetes Werk:

volume:26 ; year:2016 ; number:3 ; pages:162-164

Links:

Volltext
Link aufrufen

DOI / URN:

10.1109/LMWC.2016.2524657

Katalog-ID:

OLC1974265420

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