Improved optical and electrical performances of GaN-based light emitting diodes with nano truncated cone SiO2 passivation layer

GaN-based light emitting diodes (LEDs) with nano truncated cone SiO2 passivation layer via laser interference lithography and inductively coupled plasma dry etching technology were fabricated. The sidewall profile of the nano truncated cones was optimized by adjusting the etching process to obtain h...
Ausführliche Beschreibung

Gespeichert in:
Autor*in:

Zuo, Peng [verfasserIn]

Zhao, Bin

Yan, Shen

Yue, Gen

Yang, Haojun

Li, Yangfeng

Wu, Haiyan

Jiang, Yang

Jia, Haiqiang

Zhou, Junming

Chen, Hong

Format:

Artikel

Sprache:

Englisch

Erschienen:

2016

Rechteinformationen:

Nutzungsrecht: © Springer Science+Business Media New York 2016

Schlagwörter:

Light emitting diodes (LEDs)

Physics

Computer Communication Networks

Optics, Optoelectronics, Plasmonics and Optical Devices

Nano truncated cones

Surface texture

Electrical Engineering

Light extraction efficiency

Reverse leakage current

Characterization and Evaluation of Materials

Übergeordnetes Werk:

Enthalten in: Optical and quantum electronics - Dordrecht : Kluwer, 1975, 48(2016), 5, Seite 1-7

Übergeordnetes Werk:

volume:48 ; year:2016 ; number:5 ; pages:1-7

Links:

Volltext

DOI / URN:

10.1007/s11082-016-0551-9

Katalog-ID:

OLC1974621596

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