Preface to Special Topic: Defects in Semiconductors

Gespeichert in:

Autor*in:	Tuomisto, Filip [verfasserIn] Makkonen, Ilja

Format:	Artikel
Sprache:	Englisch

Erschienen:	2016

Rechteinformationen:	Nutzungsrecht: © Author(s)

Übergeordnetes Werk:	Enthalten in: Journal of applied physics - Melville, NY : AIP, 1937, 119(2016), 18
Übergeordnetes Werk:	volume:119 ; year:2016 ; number:18

Links:	Volltext Link aufrufen

DOI / URN:	10.1063/1.4948578

Katalog-ID:	OLC1975251660

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