Design of reversible circuits with high testability

Gespeichert in:

Autor*in:	Gaur, H.M [verfasserIn] Singh, A.K

Format:	Artikel
Sprache:	Englisch

Erschienen:	2016

Übergeordnetes Werk:	Enthalten in: Electronics letters - Stevenage : IET, 1965, 52(2016), 13, Seite 1102-1104
Übergeordnetes Werk:	volume:52 ; year:2016 ; number:13 ; pages:1102-1104

Links:	Volltext

DOI / URN:	10.1049/el.2016.0161

Katalog-ID:	OLC1976856744

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