Advanced thermal simulation of SiGe:C HBTs including back-end-of-line
Autor*in: |
d'Alessandro, Vincenzo [verfasserIn] |
---|
Format: |
Artikel |
---|---|
Sprache: |
Englisch |
Erschienen: |
2016 |
---|
Übergeordnetes Werk: |
Enthalten in: Microelectronics reliability - Amsterdam [u.a.] : Elsevier, 1964, (2016) |
---|---|
Übergeordnetes Werk: |
year:2016 |
Links: |
---|
DOI / URN: |
10.1016/j.microrel.2016.06.005 |
---|
Katalog-ID: |
OLC1977236200 |
---|
LEADER | 01000caa a2200265 4500 | ||
---|---|---|---|
001 | OLC1977236200 | ||
003 | DE-627 | ||
005 | 20220221041356.0 | ||
007 | tu | ||
008 | 160719s2016 xx ||||| 00| ||eng c | ||
024 | 7 | |a 10.1016/j.microrel.2016.06.005 |2 doi | |
028 | 5 | 2 | |a PQ20160719 |
035 | |a (DE-627)OLC1977236200 | ||
035 | |a (DE-599)GBVOLC1977236200 | ||
035 | |a (PRQ)crossref_primary_10_1016_j_microrel_2016_06_0050 | ||
035 | |a (KEY)0027825420160000000000000000advancedthermalsimulationofsigechbtsincludingbacke | ||
040 | |a DE-627 |b ger |c DE-627 |e rakwb | ||
041 | |a eng | ||
082 | 0 | 4 | |a 620 |q DNB |
084 | |a 53.55 |2 bkl | ||
084 | |a 53.52 |2 bkl | ||
084 | |a 50.16 |2 bkl | ||
100 | 1 | |a d'Alessandro, Vincenzo |e verfasserin |4 aut | |
245 | 1 | 0 | |a Advanced thermal simulation of SiGe:C HBTs including back-end-of-line |
264 | 1 | |c 2016 | |
336 | |a Text |b txt |2 rdacontent | ||
337 | |a ohne Hilfsmittel zu benutzen |b n |2 rdamedia | ||
338 | |a Band |b nc |2 rdacarrier | ||
700 | 1 | |a Magnani, Alessandro |4 oth | |
700 | 1 | |a Codecasa, Lorenzo |4 oth | |
700 | 1 | |a Rinaldi, Niccolò |4 oth | |
700 | 1 | |a Aufinger, Klaus |4 oth | |
773 | 0 | 8 | |i Enthalten in |t Microelectronics reliability |d Amsterdam [u.a.] : Elsevier, 1964 |g (2016) |w (DE-627)129596949 |w (DE-600)240853-3 |w (DE-576)015090116 |x 0026-2714 |7 nnns |
773 | 1 | 8 | |g year:2016 |
856 | 4 | 1 | |u http://dx.doi.org/10.1016/j.microrel.2016.06.005 |3 Volltext |
912 | |a GBV_USEFLAG_A | ||
912 | |a SYSFLAG_A | ||
912 | |a GBV_OLC | ||
912 | |a SSG-OLC-TEC | ||
912 | |a GBV_ILN_70 | ||
936 | b | k | |a 53.55 |q AVZ |
936 | b | k | |a 53.52 |q AVZ |
936 | b | k | |a 50.16 |q AVZ |
951 | |a AR | ||
952 | |j 2016 |
author_variant |
v d vd |
---|---|
matchkey_str |
article:00262714:2016----::dacdhrasmltoosgcbsnld |
hierarchy_sort_str |
2016 |
bklnumber |
53.55 53.52 50.16 |
publishDate |
2016 |
allfields |
10.1016/j.microrel.2016.06.005 doi PQ20160719 (DE-627)OLC1977236200 (DE-599)GBVOLC1977236200 (PRQ)crossref_primary_10_1016_j_microrel_2016_06_0050 (KEY)0027825420160000000000000000advancedthermalsimulationofsigechbtsincludingbacke DE-627 ger DE-627 rakwb eng 620 DNB 53.55 bkl 53.52 bkl 50.16 bkl d'Alessandro, Vincenzo verfasserin aut Advanced thermal simulation of SiGe:C HBTs including back-end-of-line 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Magnani, Alessandro oth Codecasa, Lorenzo oth Rinaldi, Niccolò oth Aufinger, Klaus oth Enthalten in Microelectronics reliability Amsterdam [u.a.] : Elsevier, 1964 (2016) (DE-627)129596949 (DE-600)240853-3 (DE-576)015090116 0026-2714 nnns year:2016 http://dx.doi.org/10.1016/j.microrel.2016.06.005 Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_70 53.55 AVZ 53.52 AVZ 50.16 AVZ AR 2016 |
spelling |
10.1016/j.microrel.2016.06.005 doi PQ20160719 (DE-627)OLC1977236200 (DE-599)GBVOLC1977236200 (PRQ)crossref_primary_10_1016_j_microrel_2016_06_0050 (KEY)0027825420160000000000000000advancedthermalsimulationofsigechbtsincludingbacke DE-627 ger DE-627 rakwb eng 620 DNB 53.55 bkl 53.52 bkl 50.16 bkl d'Alessandro, Vincenzo verfasserin aut Advanced thermal simulation of SiGe:C HBTs including back-end-of-line 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Magnani, Alessandro oth Codecasa, Lorenzo oth Rinaldi, Niccolò oth Aufinger, Klaus oth Enthalten in Microelectronics reliability Amsterdam [u.a.] : Elsevier, 1964 (2016) (DE-627)129596949 (DE-600)240853-3 (DE-576)015090116 0026-2714 nnns year:2016 http://dx.doi.org/10.1016/j.microrel.2016.06.005 Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_70 53.55 AVZ 53.52 AVZ 50.16 AVZ AR 2016 |
allfields_unstemmed |
10.1016/j.microrel.2016.06.005 doi PQ20160719 (DE-627)OLC1977236200 (DE-599)GBVOLC1977236200 (PRQ)crossref_primary_10_1016_j_microrel_2016_06_0050 (KEY)0027825420160000000000000000advancedthermalsimulationofsigechbtsincludingbacke DE-627 ger DE-627 rakwb eng 620 DNB 53.55 bkl 53.52 bkl 50.16 bkl d'Alessandro, Vincenzo verfasserin aut Advanced thermal simulation of SiGe:C HBTs including back-end-of-line 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Magnani, Alessandro oth Codecasa, Lorenzo oth Rinaldi, Niccolò oth Aufinger, Klaus oth Enthalten in Microelectronics reliability Amsterdam [u.a.] : Elsevier, 1964 (2016) (DE-627)129596949 (DE-600)240853-3 (DE-576)015090116 0026-2714 nnns year:2016 http://dx.doi.org/10.1016/j.microrel.2016.06.005 Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_70 53.55 AVZ 53.52 AVZ 50.16 AVZ AR 2016 |
allfieldsGer |
10.1016/j.microrel.2016.06.005 doi PQ20160719 (DE-627)OLC1977236200 (DE-599)GBVOLC1977236200 (PRQ)crossref_primary_10_1016_j_microrel_2016_06_0050 (KEY)0027825420160000000000000000advancedthermalsimulationofsigechbtsincludingbacke DE-627 ger DE-627 rakwb eng 620 DNB 53.55 bkl 53.52 bkl 50.16 bkl d'Alessandro, Vincenzo verfasserin aut Advanced thermal simulation of SiGe:C HBTs including back-end-of-line 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Magnani, Alessandro oth Codecasa, Lorenzo oth Rinaldi, Niccolò oth Aufinger, Klaus oth Enthalten in Microelectronics reliability Amsterdam [u.a.] : Elsevier, 1964 (2016) (DE-627)129596949 (DE-600)240853-3 (DE-576)015090116 0026-2714 nnns year:2016 http://dx.doi.org/10.1016/j.microrel.2016.06.005 Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_70 53.55 AVZ 53.52 AVZ 50.16 AVZ AR 2016 |
allfieldsSound |
10.1016/j.microrel.2016.06.005 doi PQ20160719 (DE-627)OLC1977236200 (DE-599)GBVOLC1977236200 (PRQ)crossref_primary_10_1016_j_microrel_2016_06_0050 (KEY)0027825420160000000000000000advancedthermalsimulationofsigechbtsincludingbacke DE-627 ger DE-627 rakwb eng 620 DNB 53.55 bkl 53.52 bkl 50.16 bkl d'Alessandro, Vincenzo verfasserin aut Advanced thermal simulation of SiGe:C HBTs including back-end-of-line 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Magnani, Alessandro oth Codecasa, Lorenzo oth Rinaldi, Niccolò oth Aufinger, Klaus oth Enthalten in Microelectronics reliability Amsterdam [u.a.] : Elsevier, 1964 (2016) (DE-627)129596949 (DE-600)240853-3 (DE-576)015090116 0026-2714 nnns year:2016 http://dx.doi.org/10.1016/j.microrel.2016.06.005 Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_70 53.55 AVZ 53.52 AVZ 50.16 AVZ AR 2016 |
language |
English |
source |
Enthalten in Microelectronics reliability (2016) year:2016 |
sourceStr |
Enthalten in Microelectronics reliability (2016) year:2016 |
format_phy_str_mv |
Article |
institution |
findex.gbv.de |
dewey-raw |
620 |
isfreeaccess_bool |
false |
container_title |
Microelectronics reliability |
authorswithroles_txt_mv |
d'Alessandro, Vincenzo @@aut@@ Magnani, Alessandro @@oth@@ Codecasa, Lorenzo @@oth@@ Rinaldi, Niccolò @@oth@@ Aufinger, Klaus @@oth@@ |
publishDateDaySort_date |
2016-01-01T00:00:00Z |
hierarchy_top_id |
129596949 |
dewey-sort |
3620 |
id |
OLC1977236200 |
language_de |
englisch |
fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a2200265 4500</leader><controlfield tag="001">OLC1977236200</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20220221041356.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">160719s2016 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1016/j.microrel.2016.06.005</subfield><subfield code="2">doi</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">PQ20160719</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1977236200</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1977236200</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(PRQ)crossref_primary_10_1016_j_microrel_2016_06_0050</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(KEY)0027825420160000000000000000advancedthermalsimulationofsigechbtsincludingbacke</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620</subfield><subfield code="q">DNB</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">53.55</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">53.52</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">50.16</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">d'Alessandro, Vincenzo</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Advanced thermal simulation of SiGe:C HBTs including back-end-of-line</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2016</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Magnani, Alessandro</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Codecasa, Lorenzo</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Rinaldi, Niccolò</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Aufinger, Klaus</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Microelectronics reliability</subfield><subfield code="d">Amsterdam [u.a.] : Elsevier, 1964</subfield><subfield code="g">(2016)</subfield><subfield code="w">(DE-627)129596949</subfield><subfield code="w">(DE-600)240853-3</subfield><subfield code="w">(DE-576)015090116</subfield><subfield code="x">0026-2714</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">year:2016</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">http://dx.doi.org/10.1016/j.microrel.2016.06.005</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">53.55</subfield><subfield code="q">AVZ</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">53.52</subfield><subfield code="q">AVZ</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">50.16</subfield><subfield code="q">AVZ</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="j">2016</subfield></datafield></record></collection>
|
author |
d'Alessandro, Vincenzo |
spellingShingle |
d'Alessandro, Vincenzo ddc 620 bkl 53.55 bkl 53.52 bkl 50.16 Advanced thermal simulation of SiGe:C HBTs including back-end-of-line |
authorStr |
d'Alessandro, Vincenzo |
ppnlink_with_tag_str_mv |
@@773@@(DE-627)129596949 |
format |
Article |
dewey-ones |
620 - Engineering & allied operations |
delete_txt_mv |
keep |
author_role |
aut |
collection |
OLC |
remote_str |
false |
illustrated |
Not Illustrated |
issn |
0026-2714 |
topic_title |
620 DNB 53.55 bkl 53.52 bkl 50.16 bkl Advanced thermal simulation of SiGe:C HBTs including back-end-of-line |
topic |
ddc 620 bkl 53.55 bkl 53.52 bkl 50.16 |
topic_unstemmed |
ddc 620 bkl 53.55 bkl 53.52 bkl 50.16 |
topic_browse |
ddc 620 bkl 53.55 bkl 53.52 bkl 50.16 |
format_facet |
Aufsätze Gedruckte Aufsätze |
format_main_str_mv |
Text Zeitschrift/Artikel |
carriertype_str_mv |
nc |
author2_variant |
a m am l c lc n r nr k a ka |
hierarchy_parent_title |
Microelectronics reliability |
hierarchy_parent_id |
129596949 |
dewey-tens |
620 - Engineering |
hierarchy_top_title |
Microelectronics reliability |
isfreeaccess_txt |
false |
familylinks_str_mv |
(DE-627)129596949 (DE-600)240853-3 (DE-576)015090116 |
title |
Advanced thermal simulation of SiGe:C HBTs including back-end-of-line |
ctrlnum |
(DE-627)OLC1977236200 (DE-599)GBVOLC1977236200 (PRQ)crossref_primary_10_1016_j_microrel_2016_06_0050 (KEY)0027825420160000000000000000advancedthermalsimulationofsigechbtsincludingbacke |
title_full |
Advanced thermal simulation of SiGe:C HBTs including back-end-of-line |
author_sort |
d'Alessandro, Vincenzo |
journal |
Microelectronics reliability |
journalStr |
Microelectronics reliability |
lang_code |
eng |
isOA_bool |
false |
dewey-hundreds |
600 - Technology |
recordtype |
marc |
publishDateSort |
2016 |
contenttype_str_mv |
txt |
author_browse |
d'Alessandro, Vincenzo |
class |
620 DNB 53.55 bkl 53.52 bkl 50.16 bkl |
format_se |
Aufsätze |
author-letter |
d'Alessandro, Vincenzo |
doi_str_mv |
10.1016/j.microrel.2016.06.005 |
dewey-full |
620 |
title_sort |
advanced thermal simulation of sige:c hbts including back-end-of-line |
title_auth |
Advanced thermal simulation of SiGe:C HBTs including back-end-of-line |
collection_details |
GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC GBV_ILN_70 |
title_short |
Advanced thermal simulation of SiGe:C HBTs including back-end-of-line |
url |
http://dx.doi.org/10.1016/j.microrel.2016.06.005 |
remote_bool |
false |
author2 |
Magnani, Alessandro Codecasa, Lorenzo Rinaldi, Niccolò Aufinger, Klaus |
author2Str |
Magnani, Alessandro Codecasa, Lorenzo Rinaldi, Niccolò Aufinger, Klaus |
ppnlink |
129596949 |
mediatype_str_mv |
n |
isOA_txt |
false |
hochschulschrift_bool |
false |
author2_role |
oth oth oth oth |
doi_str |
10.1016/j.microrel.2016.06.005 |
up_date |
2024-07-03T17:41:50.705Z |
_version_ |
1803580615643103232 |
fullrecord_marcxml |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a2200265 4500</leader><controlfield tag="001">OLC1977236200</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20220221041356.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">160719s2016 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1016/j.microrel.2016.06.005</subfield><subfield code="2">doi</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">PQ20160719</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1977236200</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1977236200</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(PRQ)crossref_primary_10_1016_j_microrel_2016_06_0050</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(KEY)0027825420160000000000000000advancedthermalsimulationofsigechbtsincludingbacke</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620</subfield><subfield code="q">DNB</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">53.55</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">53.52</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">50.16</subfield><subfield code="2">bkl</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">d'Alessandro, Vincenzo</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Advanced thermal simulation of SiGe:C HBTs including back-end-of-line</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2016</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Magnani, Alessandro</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Codecasa, Lorenzo</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Rinaldi, Niccolò</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Aufinger, Klaus</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Microelectronics reliability</subfield><subfield code="d">Amsterdam [u.a.] : Elsevier, 1964</subfield><subfield code="g">(2016)</subfield><subfield code="w">(DE-627)129596949</subfield><subfield code="w">(DE-600)240853-3</subfield><subfield code="w">(DE-576)015090116</subfield><subfield code="x">0026-2714</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">year:2016</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">http://dx.doi.org/10.1016/j.microrel.2016.06.005</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">53.55</subfield><subfield code="q">AVZ</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">53.52</subfield><subfield code="q">AVZ</subfield></datafield><datafield tag="936" ind1="b" ind2="k"><subfield code="a">50.16</subfield><subfield code="q">AVZ</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="j">2016</subfield></datafield></record></collection>
|
score |
7.400424 |