Preface to special topic: Defects in semiconductors

Gespeichert in:

Autor*in:	Tuomisto, Filip [verfasserIn] Makkonen, Ilja

Format:	Artikel
Sprache:	Englisch

Erschienen:	2016

Schlagwörter:	Optics Physics Semiconductors Research

Übergeordnetes Werk:	Enthalten in: Journal of applied physics - Melville, NY : AIP, 1937, 119(2016), 20
Übergeordnetes Werk:	volume:119 ; year:2016 ; number:20

Katalog-ID:	OLC1977745806

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