Periodic Scan-In States to Reduce the Input Test Data Volume for Partially Functional Broadside Tests
This article describes a procedure for test data compression targeting functional and partially functional broadside tests. The scan-in state of such a test is either a reachable state or has a known Hamming distance from a reachable state. Reachable states are fully specified, while the popular LFS...
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Gespeichert in:
| Autor*in: |
Pomeranz, Irith [verfasserIn] |
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| Format: |
Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2016 |
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| Schlagwörter: |
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| Übergeordnetes Werk: |
Enthalten in: ACM transactions on design automation of electronic systems - New York, NY : ACM Press, 1996, 22(2016), 1, Seite 1-22 |
|---|---|
| Übergeordnetes Werk: |
volume:22 ; year:2016 ; number:1 ; pages:1-22 |
| Links: |
|---|
| DOI / URN: |
10.1145/2911983 |
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| 520 | |a This article describes a procedure for test data compression targeting functional and partially functional broadside tests. The scan-in state of such a test is either a reachable state or has a known Hamming distance from a reachable state. Reachable states are fully specified, while the popular LFSR -based test data compression methods require the use of incompletely specified test cubes. The test data compression approach considered in this article is based on the use of periodic scan-in states. Such states require the storage of a period that can be significantly shorter than a scan-in state, thus providing test data compression. The procedure computes a set of periods that is sufficient for detecting all the detectable target faults. Considering the scan-in states that the periods produce, the procedure ranks the periods based on the distances of the scan-in states from reachable states, and the lengths of the periods. Functional and partially functional broadside tests are generated preferring shorter periods with smaller Hamming distances. The results are compared with those of an LFSR -based approach. | ||
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10.1145/2911983 doi PQ20170206 (DE-627)OLC197846584X (DE-599)GBVOLC197846584X (PRQ)a759-852594045eac4cf63dc17cfbd0f1fca700299587929727d1ebe034f5ae8de6020 (KEY)0304613320160000022000100001periodicscaninstatestoreducetheinputtestdatavolume DE-627 ger DE-627 rakwb eng 540 620 DE-600 54.00 bkl Pomeranz, Irith verfasserin aut Periodic Scan-In States to Reduce the Input Test Data Volume for Partially Functional Broadside Tests 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier This article describes a procedure for test data compression targeting functional and partially functional broadside tests. The scan-in state of such a test is either a reachable state or has a known Hamming distance from a reachable state. Reachable states are fully specified, while the popular LFSR -based test data compression methods require the use of incompletely specified test cubes. The test data compression approach considered in this article is based on the use of periodic scan-in states. Such states require the storage of a period that can be significantly shorter than a scan-in state, thus providing test data compression. The procedure computes a set of periods that is sufficient for detecting all the detectable target faults. Considering the scan-in states that the periods produce, the procedure ranks the periods based on the distances of the scan-in states from reachable states, and the lengths of the periods. Functional and partially functional broadside tests are generated preferring shorter periods with smaller Hamming distances. The results are compared with those of an LFSR -based approach. transition faults Functional broadside tests scan circuits test data compression Enthalten in ACM transactions on design automation of electronic systems New York, NY : ACM Press, 1996 22(2016), 1, Seite 1-22 (DE-627)214067289 (DE-600)1325337-2 (DE-576)053039084 1084-4309 nnns volume:22 year:2016 number:1 pages:1-22 http://dx.doi.org/10.1145/2911983 Volltext http://dl.acm.org/citation.cfm?id=2911983 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-MAT SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_70 GBV_ILN_2021 GBV_ILN_2190 GBV_ILN_4125 54.00 AVZ AR 22 2016 1 1-22 |
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10.1145/2911983 doi PQ20170206 (DE-627)OLC197846584X (DE-599)GBVOLC197846584X (PRQ)a759-852594045eac4cf63dc17cfbd0f1fca700299587929727d1ebe034f5ae8de6020 (KEY)0304613320160000022000100001periodicscaninstatestoreducetheinputtestdatavolume DE-627 ger DE-627 rakwb eng 540 620 DE-600 54.00 bkl Pomeranz, Irith verfasserin aut Periodic Scan-In States to Reduce the Input Test Data Volume for Partially Functional Broadside Tests 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier This article describes a procedure for test data compression targeting functional and partially functional broadside tests. The scan-in state of such a test is either a reachable state or has a known Hamming distance from a reachable state. Reachable states are fully specified, while the popular LFSR -based test data compression methods require the use of incompletely specified test cubes. The test data compression approach considered in this article is based on the use of periodic scan-in states. Such states require the storage of a period that can be significantly shorter than a scan-in state, thus providing test data compression. The procedure computes a set of periods that is sufficient for detecting all the detectable target faults. Considering the scan-in states that the periods produce, the procedure ranks the periods based on the distances of the scan-in states from reachable states, and the lengths of the periods. Functional and partially functional broadside tests are generated preferring shorter periods with smaller Hamming distances. The results are compared with those of an LFSR -based approach. transition faults Functional broadside tests scan circuits test data compression Enthalten in ACM transactions on design automation of electronic systems New York, NY : ACM Press, 1996 22(2016), 1, Seite 1-22 (DE-627)214067289 (DE-600)1325337-2 (DE-576)053039084 1084-4309 nnns volume:22 year:2016 number:1 pages:1-22 http://dx.doi.org/10.1145/2911983 Volltext http://dl.acm.org/citation.cfm?id=2911983 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-MAT SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_70 GBV_ILN_2021 GBV_ILN_2190 GBV_ILN_4125 54.00 AVZ AR 22 2016 1 1-22 |
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10.1145/2911983 doi PQ20170206 (DE-627)OLC197846584X (DE-599)GBVOLC197846584X (PRQ)a759-852594045eac4cf63dc17cfbd0f1fca700299587929727d1ebe034f5ae8de6020 (KEY)0304613320160000022000100001periodicscaninstatestoreducetheinputtestdatavolume DE-627 ger DE-627 rakwb eng 540 620 DE-600 54.00 bkl Pomeranz, Irith verfasserin aut Periodic Scan-In States to Reduce the Input Test Data Volume for Partially Functional Broadside Tests 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier This article describes a procedure for test data compression targeting functional and partially functional broadside tests. The scan-in state of such a test is either a reachable state or has a known Hamming distance from a reachable state. Reachable states are fully specified, while the popular LFSR -based test data compression methods require the use of incompletely specified test cubes. The test data compression approach considered in this article is based on the use of periodic scan-in states. Such states require the storage of a period that can be significantly shorter than a scan-in state, thus providing test data compression. The procedure computes a set of periods that is sufficient for detecting all the detectable target faults. Considering the scan-in states that the periods produce, the procedure ranks the periods based on the distances of the scan-in states from reachable states, and the lengths of the periods. Functional and partially functional broadside tests are generated preferring shorter periods with smaller Hamming distances. The results are compared with those of an LFSR -based approach. transition faults Functional broadside tests scan circuits test data compression Enthalten in ACM transactions on design automation of electronic systems New York, NY : ACM Press, 1996 22(2016), 1, Seite 1-22 (DE-627)214067289 (DE-600)1325337-2 (DE-576)053039084 1084-4309 nnns volume:22 year:2016 number:1 pages:1-22 http://dx.doi.org/10.1145/2911983 Volltext http://dl.acm.org/citation.cfm?id=2911983 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-MAT SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_70 GBV_ILN_2021 GBV_ILN_2190 GBV_ILN_4125 54.00 AVZ AR 22 2016 1 1-22 |
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10.1145/2911983 doi PQ20170206 (DE-627)OLC197846584X (DE-599)GBVOLC197846584X (PRQ)a759-852594045eac4cf63dc17cfbd0f1fca700299587929727d1ebe034f5ae8de6020 (KEY)0304613320160000022000100001periodicscaninstatestoreducetheinputtestdatavolume DE-627 ger DE-627 rakwb eng 540 620 DE-600 54.00 bkl Pomeranz, Irith verfasserin aut Periodic Scan-In States to Reduce the Input Test Data Volume for Partially Functional Broadside Tests 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier This article describes a procedure for test data compression targeting functional and partially functional broadside tests. The scan-in state of such a test is either a reachable state or has a known Hamming distance from a reachable state. Reachable states are fully specified, while the popular LFSR -based test data compression methods require the use of incompletely specified test cubes. The test data compression approach considered in this article is based on the use of periodic scan-in states. Such states require the storage of a period that can be significantly shorter than a scan-in state, thus providing test data compression. The procedure computes a set of periods that is sufficient for detecting all the detectable target faults. Considering the scan-in states that the periods produce, the procedure ranks the periods based on the distances of the scan-in states from reachable states, and the lengths of the periods. Functional and partially functional broadside tests are generated preferring shorter periods with smaller Hamming distances. The results are compared with those of an LFSR -based approach. transition faults Functional broadside tests scan circuits test data compression Enthalten in ACM transactions on design automation of electronic systems New York, NY : ACM Press, 1996 22(2016), 1, Seite 1-22 (DE-627)214067289 (DE-600)1325337-2 (DE-576)053039084 1084-4309 nnns volume:22 year:2016 number:1 pages:1-22 http://dx.doi.org/10.1145/2911983 Volltext http://dl.acm.org/citation.cfm?id=2911983 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-MAT SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_70 GBV_ILN_2021 GBV_ILN_2190 GBV_ILN_4125 54.00 AVZ AR 22 2016 1 1-22 |
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10.1145/2911983 doi PQ20170206 (DE-627)OLC197846584X (DE-599)GBVOLC197846584X (PRQ)a759-852594045eac4cf63dc17cfbd0f1fca700299587929727d1ebe034f5ae8de6020 (KEY)0304613320160000022000100001periodicscaninstatestoreducetheinputtestdatavolume DE-627 ger DE-627 rakwb eng 540 620 DE-600 54.00 bkl Pomeranz, Irith verfasserin aut Periodic Scan-In States to Reduce the Input Test Data Volume for Partially Functional Broadside Tests 2016 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier This article describes a procedure for test data compression targeting functional and partially functional broadside tests. The scan-in state of such a test is either a reachable state or has a known Hamming distance from a reachable state. Reachable states are fully specified, while the popular LFSR -based test data compression methods require the use of incompletely specified test cubes. The test data compression approach considered in this article is based on the use of periodic scan-in states. Such states require the storage of a period that can be significantly shorter than a scan-in state, thus providing test data compression. The procedure computes a set of periods that is sufficient for detecting all the detectable target faults. Considering the scan-in states that the periods produce, the procedure ranks the periods based on the distances of the scan-in states from reachable states, and the lengths of the periods. Functional and partially functional broadside tests are generated preferring shorter periods with smaller Hamming distances. The results are compared with those of an LFSR -based approach. transition faults Functional broadside tests scan circuits test data compression Enthalten in ACM transactions on design automation of electronic systems New York, NY : ACM Press, 1996 22(2016), 1, Seite 1-22 (DE-627)214067289 (DE-600)1325337-2 (DE-576)053039084 1084-4309 nnns volume:22 year:2016 number:1 pages:1-22 http://dx.doi.org/10.1145/2911983 Volltext http://dl.acm.org/citation.cfm?id=2911983 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-MAT SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_70 GBV_ILN_2021 GBV_ILN_2190 GBV_ILN_4125 54.00 AVZ AR 22 2016 1 1-22 |
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periodic scan-in states to reduce the input test data volume for partially functional broadside tests |
| title_auth |
Periodic Scan-In States to Reduce the Input Test Data Volume for Partially Functional Broadside Tests |
| abstract |
This article describes a procedure for test data compression targeting functional and partially functional broadside tests. The scan-in state of such a test is either a reachable state or has a known Hamming distance from a reachable state. Reachable states are fully specified, while the popular LFSR -based test data compression methods require the use of incompletely specified test cubes. The test data compression approach considered in this article is based on the use of periodic scan-in states. Such states require the storage of a period that can be significantly shorter than a scan-in state, thus providing test data compression. The procedure computes a set of periods that is sufficient for detecting all the detectable target faults. Considering the scan-in states that the periods produce, the procedure ranks the periods based on the distances of the scan-in states from reachable states, and the lengths of the periods. Functional and partially functional broadside tests are generated preferring shorter periods with smaller Hamming distances. The results are compared with those of an LFSR -based approach. |
| abstractGer |
This article describes a procedure for test data compression targeting functional and partially functional broadside tests. The scan-in state of such a test is either a reachable state or has a known Hamming distance from a reachable state. Reachable states are fully specified, while the popular LFSR -based test data compression methods require the use of incompletely specified test cubes. The test data compression approach considered in this article is based on the use of periodic scan-in states. Such states require the storage of a period that can be significantly shorter than a scan-in state, thus providing test data compression. The procedure computes a set of periods that is sufficient for detecting all the detectable target faults. Considering the scan-in states that the periods produce, the procedure ranks the periods based on the distances of the scan-in states from reachable states, and the lengths of the periods. Functional and partially functional broadside tests are generated preferring shorter periods with smaller Hamming distances. The results are compared with those of an LFSR -based approach. |
| abstract_unstemmed |
This article describes a procedure for test data compression targeting functional and partially functional broadside tests. The scan-in state of such a test is either a reachable state or has a known Hamming distance from a reachable state. Reachable states are fully specified, while the popular LFSR -based test data compression methods require the use of incompletely specified test cubes. The test data compression approach considered in this article is based on the use of periodic scan-in states. Such states require the storage of a period that can be significantly shorter than a scan-in state, thus providing test data compression. The procedure computes a set of periods that is sufficient for detecting all the detectable target faults. Considering the scan-in states that the periods produce, the procedure ranks the periods based on the distances of the scan-in states from reachable states, and the lengths of the periods. Functional and partially functional broadside tests are generated preferring shorter periods with smaller Hamming distances. The results are compared with those of an LFSR -based approach. |
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| title_short |
Periodic Scan-In States to Reduce the Input Test Data Volume for Partially Functional Broadside Tests |
| url |
http://dx.doi.org/10.1145/2911983 http://dl.acm.org/citation.cfm?id=2911983 |
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| up_date |
2024-07-03T21:47:20.876Z |
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