Kinetic modeling of near-interface defect segregation during thermal annealing of oxygen-conducting solid electrolytes

Gespeichert in:

Autor*in:	Tong, Xiaorui [verfasserIn] Mebane, David S

Format:	Artikel
Sprache:	Englisch

Erschienen:	2016

Übergeordnetes Werk:	Enthalten in: Solid state ionics - Amsterdam : North-Holland Publ. Co., 1980, (2016)
Übergeordnetes Werk:	year:2016

Links:	Volltext

DOI / URN:	10.1016/j.ssi.2016.08.008

Katalog-ID:	OLC1982334533

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