Effect of traps localization in ZnO thin films by photoluminescence spectroscopy

Gespeichert in:

Autor*in:	Onofre, Y.J [verfasserIn] de Castro, S de Godoy, M.P.F

Format:	Artikel
Sprache:	Englisch

Erschienen:	2017

Übergeordnetes Werk:	Enthalten in: Materials letters - New York, NY [u.a.] : Elsevier, 1982, 188(2017), Seite 37-40
Übergeordnetes Werk:	volume:188 ; year:2017 ; pages:37-40

Links:	Volltext

DOI / URN:	10.1016/j.matlet.2016.10.081

Katalog-ID:	OLC1990919472

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