Modeling and analysis of sub-surface leakage current in nano-MOSFET under cutoff regime

Gespeichert in:

Autor*in:	Swami, Yashu [verfasserIn] Rai, Sanjeev

Format:	Artikel
Sprache:	Englisch

Erschienen:	2017

Übergeordnetes Werk:	Enthalten in: Superlattices and microstructures - Oxford [u.a.] : Elsevier Science, Academic Press, 1985, 102(2017), Seite 259-272
Übergeordnetes Werk:	volume:102 ; year:2017 ; pages:259-272

Links:	Volltext

DOI / URN:	10.1016/j.spmi.2016.12.044

Katalog-ID:	OLC1991032013

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