Enhanced spatial resolution in vector potential photoelectron microscopy

The spatial resolution of the vector potential photoelectron microscope is determined by the maximum size of the cyclotron orbits of the imaged electrons at the surface of a sample. It is straightforward to calculate the spatial resolution for any imaged electron energy given the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. Vector potential photoelectron microscopy (VPPEM) is a new method being developed for the chemical analysis of the surface and near surface of advanced materials at the mesoscopic scale (10–100 nm). The microscope is a full field imaging technique used with a monochromatic synchrotron x‐ray light source illuminating a sample to produce photoelectrons. The monochromatic x‐ray energy is scanned over a region that includes the binding energies of atomic core electrons of the sample. As the x‐ray energy is scanned, an increase in absorption of the x‐rays at the core electron‐binding energy edge causes an increase in the photoelectron yield. The exact position of the core edge energy gives detailed information about the chemical state of the atoms in the sample. When the x‐ray energy is scanned, a stack of images from each step in the x‐ray scan is collected. This image stack is processed to give a picture of the chemical distribution of the sample. The sample sits in a strong magnetic field. The spatial resolution of the VPPEM is determined by the size of the cyclotron orbits of the photoelectrons at the surface of the sample. A strong magnetic field and low‐energy electrons (1.0 eV) give the highest spatial resolution. These low‐energy electrons are energy analyzed by the VPPEM and imaged. It is straightforward to calculate the spatial resolution for any imaged electron energy for the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution of the chemical‐specific images is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. This opens the possibility that the chemical state and the related surface potential can be simultaneously imaged at high spatial resolution. Ausführliche Beschreibung

Gespeichert in:

Autor*in:	BROWNING, R [verfasserIn]

Format:	Artikel
Sprache:	Englisch

Erschienen:	2017

Rechteinformationen:	Nutzungsrecht: 2017 The Authors Journal of Microscopy © 2017 Royal Microscopical Society

Schlagwörter:	Materials microanalysis VPPEM photoelectron microscopy Electron energy Calcium Thermodynamics Light (illumination) Photoelectrons Spatial resolution Image enhancement Orbits Mathematical analysis Magnetic fields Binding energy Energy Aluminum Microscopy X rays Cyclotrons Low energy Calcium base alloys Calcium aluminate Chemical analysis Nuclear electric power generation Spatial discrimination Field strength

Übergeordnetes Werk:	Enthalten in: Journal of microscopy - Oxford : Wiley-Blackwell, 1969, 267(2017), 2, Seite 176-192
Übergeordnetes Werk:	volume:267 ; year:2017 ; number:2 ; pages:176-192

Links:	Volltext Link aufrufen Link aufrufen

DOI / URN:	10.1111/jmi.12558

Katalog-ID:	OLC1995849987

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520			\|a The spatial resolution of the vector potential photoelectron microscope is determined by the maximum size of the cyclotron orbits of the imaged electrons at the surface of a sample. It is straightforward to calculate the spatial resolution for any imaged electron energy given the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. Vector potential photoelectron microscopy (VPPEM) is a new method being developed for the chemical analysis of the surface and near surface of advanced materials at the mesoscopic scale (10–100 nm). The microscope is a full field imaging technique used with a monochromatic synchrotron x‐ray light source illuminating a sample to produce photoelectrons. The monochromatic x‐ray energy is scanned over a region that includes the binding energies of atomic core electrons of the sample. As the x‐ray energy is scanned, an increase in absorption of the x‐rays at the core electron‐binding energy edge causes an increase in the photoelectron yield. The exact position of the core edge energy gives detailed information about the chemical state of the atoms in the sample. When the x‐ray energy is scanned, a stack of images from each step in the x‐ray scan is collected. This image stack is processed to give a picture of the chemical distribution of the sample. The sample sits in a strong magnetic field. The spatial resolution of the VPPEM is determined by the size of the cyclotron orbits of the photoelectrons at the surface of the sample. A strong magnetic field and low‐energy electrons (1.0 eV) give the highest spatial resolution. These low‐energy electrons are energy analyzed by the VPPEM and imaged. It is straightforward to calculate the spatial resolution for any imaged electron energy for the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution of the chemical‐specific images is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. This opens the possibility that the chemical state and the related surface potential can be simultaneously imaged at high spatial resolution.
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650		4	\|a Materials microanalysis
650		4	\|a VPPEM
650		4	\|a photoelectron microscopy
650		4	\|a Electron energy
650		4	\|a Calcium
650		4	\|a Thermodynamics
650		4	\|a Light (illumination)
650		4	\|a Photoelectrons
650		4	\|a Spatial resolution
650		4	\|a Image enhancement
650		4	\|a Orbits
650		4	\|a Mathematical analysis
650		4	\|a Magnetic fields
650		4	\|a Binding energy
650		4	\|a Energy
650		4	\|a Aluminum
650		4	\|a Microscopy
650		4	\|a X rays
650		4	\|a Cyclotrons
650		4	\|a Low energy
650		4	\|a Calcium base alloys
650		4	\|a Calcium aluminate
650		4	\|a Chemical analysis
650		4	\|a Nuclear electric power generation
650		4	\|a Spatial discrimination
650		4	\|a Field strength
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allfields	10.1111/jmi.12558 doi PQ20171228 (DE-627)OLC1995849987 (DE-599)GBVOLC1995849987 (PRQ)p1338-9e92d04aa828a9b2ea977b52b99c20a6eae7792f1b289598ba67d041d0f300170 (KEY)0031376920170000267000200176enhancedspatialresolutioninvectorpotentialphotoele DE-627 ger DE-627 rakwb eng 570 DE-600 BIODIV fid BROWNING, R verfasserin aut Enhanced spatial resolution in vector potential photoelectron microscopy 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The spatial resolution of the vector potential photoelectron microscope is determined by the maximum size of the cyclotron orbits of the imaged electrons at the surface of a sample. It is straightforward to calculate the spatial resolution for any imaged electron energy given the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. Vector potential photoelectron microscopy (VPPEM) is a new method being developed for the chemical analysis of the surface and near surface of advanced materials at the mesoscopic scale (10–100 nm). The microscope is a full field imaging technique used with a monochromatic synchrotron x‐ray light source illuminating a sample to produce photoelectrons. The monochromatic x‐ray energy is scanned over a region that includes the binding energies of atomic core electrons of the sample. As the x‐ray energy is scanned, an increase in absorption of the x‐rays at the core electron‐binding energy edge causes an increase in the photoelectron yield. The exact position of the core edge energy gives detailed information about the chemical state of the atoms in the sample. When the x‐ray energy is scanned, a stack of images from each step in the x‐ray scan is collected. This image stack is processed to give a picture of the chemical distribution of the sample. The sample sits in a strong magnetic field. The spatial resolution of the VPPEM is determined by the size of the cyclotron orbits of the photoelectrons at the surface of the sample. A strong magnetic field and low‐energy electrons (1.0 eV) give the highest spatial resolution. These low‐energy electrons are energy analyzed by the VPPEM and imaged. It is straightforward to calculate the spatial resolution for any imaged electron energy for the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution of the chemical‐specific images is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. This opens the possibility that the chemical state and the related surface potential can be simultaneously imaged at high spatial resolution. Nutzungsrecht: 2017 The Authors Journal of Microscopy © 2017 Royal Microscopical Society Materials microanalysis VPPEM photoelectron microscopy Electron energy Calcium Thermodynamics Light (illumination) Photoelectrons Spatial resolution Image enhancement Orbits Mathematical analysis Magnetic fields Binding energy Energy Aluminum Microscopy X rays Cyclotrons Low energy Calcium base alloys Calcium aluminate Chemical analysis Nuclear electric power generation Spatial discrimination Field strength Enthalten in Journal of microscopy Oxford : Wiley-Blackwell, 1969 267(2017), 2, Seite 176-192 (DE-627)129550426 (DE-600)219263-9 (DE-576)015003884 0022-2720 nnns volume:267 year:2017 number:2 pages:176-192 http://dx.doi.org/10.1111/jmi.12558 Volltext http://onlinelibrary.wiley.com/doi/10.1111/jmi.12558/abstract https://search.proquest.com/docview/1919652861 GBV_USEFLAG_A SYSFLAG_A GBV_OLC FID-BIODIV SSG-OLC-PHY SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_22 GBV_ILN_70 GBV_ILN_150 GBV_ILN_2219 GBV_ILN_4012 AR 267 2017 2 176-192
spelling	10.1111/jmi.12558 doi PQ20171228 (DE-627)OLC1995849987 (DE-599)GBVOLC1995849987 (PRQ)p1338-9e92d04aa828a9b2ea977b52b99c20a6eae7792f1b289598ba67d041d0f300170 (KEY)0031376920170000267000200176enhancedspatialresolutioninvectorpotentialphotoele DE-627 ger DE-627 rakwb eng 570 DE-600 BIODIV fid BROWNING, R verfasserin aut Enhanced spatial resolution in vector potential photoelectron microscopy 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The spatial resolution of the vector potential photoelectron microscope is determined by the maximum size of the cyclotron orbits of the imaged electrons at the surface of a sample. It is straightforward to calculate the spatial resolution for any imaged electron energy given the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. Vector potential photoelectron microscopy (VPPEM) is a new method being developed for the chemical analysis of the surface and near surface of advanced materials at the mesoscopic scale (10–100 nm). The microscope is a full field imaging technique used with a monochromatic synchrotron x‐ray light source illuminating a sample to produce photoelectrons. The monochromatic x‐ray energy is scanned over a region that includes the binding energies of atomic core electrons of the sample. As the x‐ray energy is scanned, an increase in absorption of the x‐rays at the core electron‐binding energy edge causes an increase in the photoelectron yield. The exact position of the core edge energy gives detailed information about the chemical state of the atoms in the sample. When the x‐ray energy is scanned, a stack of images from each step in the x‐ray scan is collected. This image stack is processed to give a picture of the chemical distribution of the sample. The sample sits in a strong magnetic field. The spatial resolution of the VPPEM is determined by the size of the cyclotron orbits of the photoelectrons at the surface of the sample. A strong magnetic field and low‐energy electrons (1.0 eV) give the highest spatial resolution. These low‐energy electrons are energy analyzed by the VPPEM and imaged. It is straightforward to calculate the spatial resolution for any imaged electron energy for the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution of the chemical‐specific images is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. This opens the possibility that the chemical state and the related surface potential can be simultaneously imaged at high spatial resolution. Nutzungsrecht: 2017 The Authors Journal of Microscopy © 2017 Royal Microscopical Society Materials microanalysis VPPEM photoelectron microscopy Electron energy Calcium Thermodynamics Light (illumination) Photoelectrons Spatial resolution Image enhancement Orbits Mathematical analysis Magnetic fields Binding energy Energy Aluminum Microscopy X rays Cyclotrons Low energy Calcium base alloys Calcium aluminate Chemical analysis Nuclear electric power generation Spatial discrimination Field strength Enthalten in Journal of microscopy Oxford : Wiley-Blackwell, 1969 267(2017), 2, Seite 176-192 (DE-627)129550426 (DE-600)219263-9 (DE-576)015003884 0022-2720 nnns volume:267 year:2017 number:2 pages:176-192 http://dx.doi.org/10.1111/jmi.12558 Volltext http://onlinelibrary.wiley.com/doi/10.1111/jmi.12558/abstract https://search.proquest.com/docview/1919652861 GBV_USEFLAG_A SYSFLAG_A GBV_OLC FID-BIODIV SSG-OLC-PHY SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_22 GBV_ILN_70 GBV_ILN_150 GBV_ILN_2219 GBV_ILN_4012 AR 267 2017 2 176-192
allfields_unstemmed	10.1111/jmi.12558 doi PQ20171228 (DE-627)OLC1995849987 (DE-599)GBVOLC1995849987 (PRQ)p1338-9e92d04aa828a9b2ea977b52b99c20a6eae7792f1b289598ba67d041d0f300170 (KEY)0031376920170000267000200176enhancedspatialresolutioninvectorpotentialphotoele DE-627 ger DE-627 rakwb eng 570 DE-600 BIODIV fid BROWNING, R verfasserin aut Enhanced spatial resolution in vector potential photoelectron microscopy 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The spatial resolution of the vector potential photoelectron microscope is determined by the maximum size of the cyclotron orbits of the imaged electrons at the surface of a sample. It is straightforward to calculate the spatial resolution for any imaged electron energy given the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. Vector potential photoelectron microscopy (VPPEM) is a new method being developed for the chemical analysis of the surface and near surface of advanced materials at the mesoscopic scale (10–100 nm). The microscope is a full field imaging technique used with a monochromatic synchrotron x‐ray light source illuminating a sample to produce photoelectrons. The monochromatic x‐ray energy is scanned over a region that includes the binding energies of atomic core electrons of the sample. As the x‐ray energy is scanned, an increase in absorption of the x‐rays at the core electron‐binding energy edge causes an increase in the photoelectron yield. The exact position of the core edge energy gives detailed information about the chemical state of the atoms in the sample. When the x‐ray energy is scanned, a stack of images from each step in the x‐ray scan is collected. This image stack is processed to give a picture of the chemical distribution of the sample. The sample sits in a strong magnetic field. The spatial resolution of the VPPEM is determined by the size of the cyclotron orbits of the photoelectrons at the surface of the sample. A strong magnetic field and low‐energy electrons (1.0 eV) give the highest spatial resolution. These low‐energy electrons are energy analyzed by the VPPEM and imaged. It is straightforward to calculate the spatial resolution for any imaged electron energy for the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution of the chemical‐specific images is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. This opens the possibility that the chemical state and the related surface potential can be simultaneously imaged at high spatial resolution. Nutzungsrecht: 2017 The Authors Journal of Microscopy © 2017 Royal Microscopical Society Materials microanalysis VPPEM photoelectron microscopy Electron energy Calcium Thermodynamics Light (illumination) Photoelectrons Spatial resolution Image enhancement Orbits Mathematical analysis Magnetic fields Binding energy Energy Aluminum Microscopy X rays Cyclotrons Low energy Calcium base alloys Calcium aluminate Chemical analysis Nuclear electric power generation Spatial discrimination Field strength Enthalten in Journal of microscopy Oxford : Wiley-Blackwell, 1969 267(2017), 2, Seite 176-192 (DE-627)129550426 (DE-600)219263-9 (DE-576)015003884 0022-2720 nnns volume:267 year:2017 number:2 pages:176-192 http://dx.doi.org/10.1111/jmi.12558 Volltext http://onlinelibrary.wiley.com/doi/10.1111/jmi.12558/abstract https://search.proquest.com/docview/1919652861 GBV_USEFLAG_A SYSFLAG_A GBV_OLC FID-BIODIV SSG-OLC-PHY SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_22 GBV_ILN_70 GBV_ILN_150 GBV_ILN_2219 GBV_ILN_4012 AR 267 2017 2 176-192
allfieldsGer	10.1111/jmi.12558 doi PQ20171228 (DE-627)OLC1995849987 (DE-599)GBVOLC1995849987 (PRQ)p1338-9e92d04aa828a9b2ea977b52b99c20a6eae7792f1b289598ba67d041d0f300170 (KEY)0031376920170000267000200176enhancedspatialresolutioninvectorpotentialphotoele DE-627 ger DE-627 rakwb eng 570 DE-600 BIODIV fid BROWNING, R verfasserin aut Enhanced spatial resolution in vector potential photoelectron microscopy 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The spatial resolution of the vector potential photoelectron microscope is determined by the maximum size of the cyclotron orbits of the imaged electrons at the surface of a sample. It is straightforward to calculate the spatial resolution for any imaged electron energy given the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. Vector potential photoelectron microscopy (VPPEM) is a new method being developed for the chemical analysis of the surface and near surface of advanced materials at the mesoscopic scale (10–100 nm). The microscope is a full field imaging technique used with a monochromatic synchrotron x‐ray light source illuminating a sample to produce photoelectrons. The monochromatic x‐ray energy is scanned over a region that includes the binding energies of atomic core electrons of the sample. As the x‐ray energy is scanned, an increase in absorption of the x‐rays at the core electron‐binding energy edge causes an increase in the photoelectron yield. The exact position of the core edge energy gives detailed information about the chemical state of the atoms in the sample. When the x‐ray energy is scanned, a stack of images from each step in the x‐ray scan is collected. This image stack is processed to give a picture of the chemical distribution of the sample. The sample sits in a strong magnetic field. The spatial resolution of the VPPEM is determined by the size of the cyclotron orbits of the photoelectrons at the surface of the sample. A strong magnetic field and low‐energy electrons (1.0 eV) give the highest spatial resolution. These low‐energy electrons are energy analyzed by the VPPEM and imaged. It is straightforward to calculate the spatial resolution for any imaged electron energy for the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution of the chemical‐specific images is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. This opens the possibility that the chemical state and the related surface potential can be simultaneously imaged at high spatial resolution. Nutzungsrecht: 2017 The Authors Journal of Microscopy © 2017 Royal Microscopical Society Materials microanalysis VPPEM photoelectron microscopy Electron energy Calcium Thermodynamics Light (illumination) Photoelectrons Spatial resolution Image enhancement Orbits Mathematical analysis Magnetic fields Binding energy Energy Aluminum Microscopy X rays Cyclotrons Low energy Calcium base alloys Calcium aluminate Chemical analysis Nuclear electric power generation Spatial discrimination Field strength Enthalten in Journal of microscopy Oxford : Wiley-Blackwell, 1969 267(2017), 2, Seite 176-192 (DE-627)129550426 (DE-600)219263-9 (DE-576)015003884 0022-2720 nnns volume:267 year:2017 number:2 pages:176-192 http://dx.doi.org/10.1111/jmi.12558 Volltext http://onlinelibrary.wiley.com/doi/10.1111/jmi.12558/abstract https://search.proquest.com/docview/1919652861 GBV_USEFLAG_A SYSFLAG_A GBV_OLC FID-BIODIV SSG-OLC-PHY SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_22 GBV_ILN_70 GBV_ILN_150 GBV_ILN_2219 GBV_ILN_4012 AR 267 2017 2 176-192
allfieldsSound	10.1111/jmi.12558 doi PQ20171228 (DE-627)OLC1995849987 (DE-599)GBVOLC1995849987 (PRQ)p1338-9e92d04aa828a9b2ea977b52b99c20a6eae7792f1b289598ba67d041d0f300170 (KEY)0031376920170000267000200176enhancedspatialresolutioninvectorpotentialphotoele DE-627 ger DE-627 rakwb eng 570 DE-600 BIODIV fid BROWNING, R verfasserin aut Enhanced spatial resolution in vector potential photoelectron microscopy 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier The spatial resolution of the vector potential photoelectron microscope is determined by the maximum size of the cyclotron orbits of the imaged electrons at the surface of a sample. It is straightforward to calculate the spatial resolution for any imaged electron energy given the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. Vector potential photoelectron microscopy (VPPEM) is a new method being developed for the chemical analysis of the surface and near surface of advanced materials at the mesoscopic scale (10–100 nm). The microscope is a full field imaging technique used with a monochromatic synchrotron x‐ray light source illuminating a sample to produce photoelectrons. The monochromatic x‐ray energy is scanned over a region that includes the binding energies of atomic core electrons of the sample. As the x‐ray energy is scanned, an increase in absorption of the x‐rays at the core electron‐binding energy edge causes an increase in the photoelectron yield. The exact position of the core edge energy gives detailed information about the chemical state of the atoms in the sample. When the x‐ray energy is scanned, a stack of images from each step in the x‐ray scan is collected. This image stack is processed to give a picture of the chemical distribution of the sample. The sample sits in a strong magnetic field. The spatial resolution of the VPPEM is determined by the size of the cyclotron orbits of the photoelectrons at the surface of the sample. A strong magnetic field and low‐energy electrons (1.0 eV) give the highest spatial resolution. These low‐energy electrons are energy analyzed by the VPPEM and imaged. It is straightforward to calculate the spatial resolution for any imaged electron energy for the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution of the chemical‐specific images is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. This opens the possibility that the chemical state and the related surface potential can be simultaneously imaged at high spatial resolution. Nutzungsrecht: 2017 The Authors Journal of Microscopy © 2017 Royal Microscopical Society Materials microanalysis VPPEM photoelectron microscopy Electron energy Calcium Thermodynamics Light (illumination) Photoelectrons Spatial resolution Image enhancement Orbits Mathematical analysis Magnetic fields Binding energy Energy Aluminum Microscopy X rays Cyclotrons Low energy Calcium base alloys Calcium aluminate Chemical analysis Nuclear electric power generation Spatial discrimination Field strength Enthalten in Journal of microscopy Oxford : Wiley-Blackwell, 1969 267(2017), 2, Seite 176-192 (DE-627)129550426 (DE-600)219263-9 (DE-576)015003884 0022-2720 nnns volume:267 year:2017 number:2 pages:176-192 http://dx.doi.org/10.1111/jmi.12558 Volltext http://onlinelibrary.wiley.com/doi/10.1111/jmi.12558/abstract https://search.proquest.com/docview/1919652861 GBV_USEFLAG_A SYSFLAG_A GBV_OLC FID-BIODIV SSG-OLC-PHY SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_22 GBV_ILN_70 GBV_ILN_150 GBV_ILN_2219 GBV_ILN_4012 AR 267 2017 2 176-192
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author	BROWNING, R
spellingShingle	BROWNING, R ddc 570 fid BIODIV misc Materials microanalysis misc VPPEM misc photoelectron microscopy misc Electron energy misc Calcium misc Thermodynamics misc Light (illumination) misc Photoelectrons misc Spatial resolution misc Image enhancement misc Orbits misc Mathematical analysis misc Magnetic fields misc Binding energy misc Energy misc Aluminum misc Microscopy misc X rays misc Cyclotrons misc Low energy misc Calcium base alloys misc Calcium aluminate misc Chemical analysis misc Nuclear electric power generation misc Spatial discrimination misc Field strength Enhanced spatial resolution in vector potential photoelectron microscopy
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topic_title	570 DE-600 BIODIV fid Enhanced spatial resolution in vector potential photoelectron microscopy Materials microanalysis VPPEM photoelectron microscopy Electron energy Calcium Thermodynamics Light (illumination) Photoelectrons Spatial resolution Image enhancement Orbits Mathematical analysis Magnetic fields Binding energy Energy Aluminum Microscopy X rays Cyclotrons Low energy Calcium base alloys Calcium aluminate Chemical analysis Nuclear electric power generation Spatial discrimination Field strength
topic	ddc 570 fid BIODIV misc Materials microanalysis misc VPPEM misc photoelectron microscopy misc Electron energy misc Calcium misc Thermodynamics misc Light (illumination) misc Photoelectrons misc Spatial resolution misc Image enhancement misc Orbits misc Mathematical analysis misc Magnetic fields misc Binding energy misc Energy misc Aluminum misc Microscopy misc X rays misc Cyclotrons misc Low energy misc Calcium base alloys misc Calcium aluminate misc Chemical analysis misc Nuclear electric power generation misc Spatial discrimination misc Field strength
topic_unstemmed	ddc 570 fid BIODIV misc Materials microanalysis misc VPPEM misc photoelectron microscopy misc Electron energy misc Calcium misc Thermodynamics misc Light (illumination) misc Photoelectrons misc Spatial resolution misc Image enhancement misc Orbits misc Mathematical analysis misc Magnetic fields misc Binding energy misc Energy misc Aluminum misc Microscopy misc X rays misc Cyclotrons misc Low energy misc Calcium base alloys misc Calcium aluminate misc Chemical analysis misc Nuclear electric power generation misc Spatial discrimination misc Field strength
topic_browse	ddc 570 fid BIODIV misc Materials microanalysis misc VPPEM misc photoelectron microscopy misc Electron energy misc Calcium misc Thermodynamics misc Light (illumination) misc Photoelectrons misc Spatial resolution misc Image enhancement misc Orbits misc Mathematical analysis misc Magnetic fields misc Binding energy misc Energy misc Aluminum misc Microscopy misc X rays misc Cyclotrons misc Low energy misc Calcium base alloys misc Calcium aluminate misc Chemical analysis misc Nuclear electric power generation misc Spatial discrimination misc Field strength
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title	Enhanced spatial resolution in vector potential photoelectron microscopy
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title_full	Enhanced spatial resolution in vector potential photoelectron microscopy
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title_sort	enhanced spatial resolution in vector potential photoelectron microscopy
title_auth	Enhanced spatial resolution in vector potential photoelectron microscopy
abstract	The spatial resolution of the vector potential photoelectron microscope is determined by the maximum size of the cyclotron orbits of the imaged electrons at the surface of a sample. It is straightforward to calculate the spatial resolution for any imaged electron energy given the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. Vector potential photoelectron microscopy (VPPEM) is a new method being developed for the chemical analysis of the surface and near surface of advanced materials at the mesoscopic scale (10–100 nm). The microscope is a full field imaging technique used with a monochromatic synchrotron x‐ray light source illuminating a sample to produce photoelectrons. The monochromatic x‐ray energy is scanned over a region that includes the binding energies of atomic core electrons of the sample. As the x‐ray energy is scanned, an increase in absorption of the x‐rays at the core electron‐binding energy edge causes an increase in the photoelectron yield. The exact position of the core edge energy gives detailed information about the chemical state of the atoms in the sample. When the x‐ray energy is scanned, a stack of images from each step in the x‐ray scan is collected. This image stack is processed to give a picture of the chemical distribution of the sample. The sample sits in a strong magnetic field. The spatial resolution of the VPPEM is determined by the size of the cyclotron orbits of the photoelectrons at the surface of the sample. A strong magnetic field and low‐energy electrons (1.0 eV) give the highest spatial resolution. These low‐energy electrons are energy analyzed by the VPPEM and imaged. It is straightforward to calculate the spatial resolution for any imaged electron energy for the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution of the chemical‐specific images is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. This opens the possibility that the chemical state and the related surface potential can be simultaneously imaged at high spatial resolution.
abstractGer	The spatial resolution of the vector potential photoelectron microscope is determined by the maximum size of the cyclotron orbits of the imaged electrons at the surface of a sample. It is straightforward to calculate the spatial resolution for any imaged electron energy given the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. Vector potential photoelectron microscopy (VPPEM) is a new method being developed for the chemical analysis of the surface and near surface of advanced materials at the mesoscopic scale (10–100 nm). The microscope is a full field imaging technique used with a monochromatic synchrotron x‐ray light source illuminating a sample to produce photoelectrons. The monochromatic x‐ray energy is scanned over a region that includes the binding energies of atomic core electrons of the sample. As the x‐ray energy is scanned, an increase in absorption of the x‐rays at the core electron‐binding energy edge causes an increase in the photoelectron yield. The exact position of the core edge energy gives detailed information about the chemical state of the atoms in the sample. When the x‐ray energy is scanned, a stack of images from each step in the x‐ray scan is collected. This image stack is processed to give a picture of the chemical distribution of the sample. The sample sits in a strong magnetic field. The spatial resolution of the VPPEM is determined by the size of the cyclotron orbits of the photoelectrons at the surface of the sample. A strong magnetic field and low‐energy electrons (1.0 eV) give the highest spatial resolution. These low‐energy electrons are energy analyzed by the VPPEM and imaged. It is straightforward to calculate the spatial resolution for any imaged electron energy for the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution of the chemical‐specific images is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. This opens the possibility that the chemical state and the related surface potential can be simultaneously imaged at high spatial resolution.
abstract_unstemmed	The spatial resolution of the vector potential photoelectron microscope is determined by the maximum size of the cyclotron orbits of the imaged electrons at the surface of a sample. It is straightforward to calculate the spatial resolution for any imaged electron energy given the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. Vector potential photoelectron microscopy (VPPEM) is a new method being developed for the chemical analysis of the surface and near surface of advanced materials at the mesoscopic scale (10–100 nm). The microscope is a full field imaging technique used with a monochromatic synchrotron x‐ray light source illuminating a sample to produce photoelectrons. The monochromatic x‐ray energy is scanned over a region that includes the binding energies of atomic core electrons of the sample. As the x‐ray energy is scanned, an increase in absorption of the x‐rays at the core electron‐binding energy edge causes an increase in the photoelectron yield. The exact position of the core edge energy gives detailed information about the chemical state of the atoms in the sample. When the x‐ray energy is scanned, a stack of images from each step in the x‐ray scan is collected. This image stack is processed to give a picture of the chemical distribution of the sample. The sample sits in a strong magnetic field. The spatial resolution of the VPPEM is determined by the size of the cyclotron orbits of the photoelectrons at the surface of the sample. A strong magnetic field and low‐energy electrons (1.0 eV) give the highest spatial resolution. These low‐energy electrons are energy analyzed by the VPPEM and imaged. It is straightforward to calculate the spatial resolution for any imaged electron energy for the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution of the chemical‐specific images is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. This opens the possibility that the chemical state and the related surface potential can be simultaneously imaged at high spatial resolution.
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title_short	Enhanced spatial resolution in vector potential photoelectron microscopy
url	http://dx.doi.org/10.1111/jmi.12558 http://onlinelibrary.wiley.com/doi/10.1111/jmi.12558/abstract https://search.proquest.com/docview/1919652861
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It is straightforward to calculate the spatial resolution for any imaged electron energy for the magnetic field strength. However, in low‐energy secondary photoelectron images from an aluminium–calcium metal matrix alloy, we find the apparent spatial resolution of the chemical‐specific images is significantly higher than expected. A possible explanation for the enhanced resolution is that the low‐energy cyclotron orbits are distorted when passing from one area of work function to another and the image is dependent on the surface field distribution. 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Enhanced spatial resolution in vector potential photoelectron microscopy

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