A W-Geometry Ortho-TOF MS with High Resolution and Up to 100% Duty Cycle for MS/MS
Orthogonal injection time-of-flight (orthoTOF) mass spectrometry (MS) is the most prevalent form of TOFMS, owing to its greater control over incoming ion energy, the ability to correct for aberrations in incoming ion velocity and position, and its ability to provide an entire mass spectrum within a...
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| Autor*in: |
Chernushevich, Igor V [verfasserIn] |
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| Format: |
Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2017 |
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| Rechteinformationen: |
Nutzungsrecht: © American Society for Mass Spectrometry 2017 |
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| Schlagwörter: |
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| Übergeordnetes Werk: |
Enthalten in: Journal of the American Society for Mass Spectrometry - New York, NY : Springer, 1990, 28(2017), 10, Seite 2143-2150 |
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| Übergeordnetes Werk: |
volume:28 ; year:2017 ; number:10 ; pages:2143-2150 |
| Links: |
|---|
| DOI / URN: |
10.1007/s13361-017-1742-8 |
|---|
| Katalog-ID: |
OLC1998102661 |
|---|
| LEADER | 01000caa a2200265 4500 | ||
|---|---|---|---|
| 001 | OLC1998102661 | ||
| 003 | DE-627 | ||
| 005 | 20230715080559.0 | ||
| 007 | tu | ||
| 008 | 171125s2017 xx ||||| 00| ||eng c | ||
| 024 | 7 | |a 10.1007/s13361-017-1742-8 |2 doi | |
| 028 | 5 | 2 | |a PQ20171228 |
| 035 | |a (DE-627)OLC1998102661 | ||
| 035 | |a (DE-599)GBVOLC1998102661 | ||
| 035 | |a (PRQ)p1315-ae1ef5e0260325253698d4bc3bc99a68572edb98f7b4077313182b06fd99d83a0 | ||
| 035 | |a (KEY)0186032120170000028001002143wgeometryorthotofmswithhighresolutionandupto100dut | ||
| 040 | |a DE-627 |b ger |c DE-627 |e rakwb | ||
| 041 | |a eng | ||
| 082 | 0 | 4 | |a 530 |q ZDB |
| 100 | 1 | |a Chernushevich, Igor V |e verfasserin |4 aut | |
| 245 | 1 | 2 | |a A W-Geometry Ortho-TOF MS with High Resolution and Up to 100% Duty Cycle for MS/MS |
| 264 | 1 | |c 2017 | |
| 336 | |a Text |b txt |2 rdacontent | ||
| 337 | |a ohne Hilfsmittel zu benutzen |b n |2 rdamedia | ||
| 338 | |a Band |b nc |2 rdacarrier | ||
| 520 | |a Orthogonal injection time-of-flight (orthoTOF) mass spectrometry (MS) is the most prevalent form of TOFMS, owing to its greater control over incoming ion energy, the ability to correct for aberrations in incoming ion velocity and position, and its ability to provide an entire mass spectrum within a single scan. However, the duty cycle of orthoTOFMS is low compared with scanning analyzers, which can have 100% duty cycle when measuring a single type of ion. Typical duty cycles for orthoTOFMS range from 1% to 30%, depending on instrument geometry. Generally, as instrument resolution increases, duty cycle decreases. Additionally, the greatest duty cycle is achieved for the highest m/z ion recorded in the spectrum, and decreases for all other ions as a function of m/z. In a prior publication [Loboda, A.V.; Chernushevich, I.V. J. Am. Soc. Mass Spectrom. 20, 1342–1348 (20)], a novel trapping/release method for restoring the duty cycle of a V-geometry orthoTOFMS to near 100% (referred to as “Zeno pulsing”) was presented. Here, we apply that method to a W-TOF geometry analyzer with analog detection. Across a m/z range of 100–2000, sensitivity gains of ~5–20 are observed, for total ion currents approaching ~107 ions·s−1. Zeno pulsing, or similar strategies for restoring duty cycle, will continue to be important as instrument resolution in orthoTOFMS is increased through the use of ion mirrors. Graphical Abstract ᅟ | ||
| 540 | |a Nutzungsrecht: © American Society for Mass Spectrometry 2017 | ||
| 650 | 4 | |a Chemistry | |
| 650 | 4 | |a Organic Chemistry | |
| 650 | 4 | |a Duty cycle | |
| 650 | 4 | |a Zeno | |
| 650 | 4 | |a Ion trapping | |
| 650 | 4 | |a Quadrupole | |
| 650 | 4 | |a Time-of-flight mass spectrometry | |
| 650 | 4 | |a orthoTOF | |
| 650 | 4 | |a Analytical Chemistry | |
| 650 | 4 | |a Proteomics | |
| 650 | 4 | |a Collision cell | |
| 650 | 4 | |a Mass resolution | |
| 650 | 4 | |a Bioinformatics | |
| 650 | 4 | |a Biotechnology | |
| 650 | 4 | |a High resolution | |
| 650 | 4 | |a Ion currents | |
| 650 | 4 | |a Mass spectrometry | |
| 650 | 4 | |a Ion velocity | |
| 650 | 4 | |a Analyzers | |
| 650 | 4 | |a Aberration | |
| 650 | 4 | |a Geometry | |
| 650 | 4 | |a Laser printers | |
| 650 | 4 | |a Hardware reviews | |
| 700 | 1 | |a Merenbloom, Samuel I |4 oth | |
| 700 | 1 | |a Liu, Suya |4 oth | |
| 700 | 1 | |a Bloomfield, Nic |4 oth | |
| 773 | 0 | 8 | |i Enthalten in |t Journal of the American Society for Mass Spectrometry |d New York, NY : Springer, 1990 |g 28(2017), 10, Seite 2143-2150 |w (DE-627)130977357 |w (DE-600)1073671-2 |w (DE-576)277732093 |x 1044-0305 |7 nnns |
| 773 | 1 | 8 | |g volume:28 |g year:2017 |g number:10 |g pages:2143-2150 |
| 856 | 4 | 1 | |u http://dx.doi.org/10.1007/s13361-017-1742-8 |3 Volltext |
| 856 | 4 | 2 | |u https://search.proquest.com/docview/1937607845 |
| 912 | |a GBV_USEFLAG_A | ||
| 912 | |a SYSFLAG_A | ||
| 912 | |a GBV_OLC | ||
| 912 | |a SSG-OLC-PHY | ||
| 912 | |a SSG-OLC-CHE | ||
| 912 | |a SSG-OLC-PHA | ||
| 912 | |a SSG-OLC-DE-84 | ||
| 912 | |a GBV_ILN_70 | ||
| 912 | |a GBV_ILN_4012 | ||
| 951 | |a AR | ||
| 952 | |d 28 |j 2017 |e 10 |h 2143-2150 | ||
| author_variant |
i v c iv ivc |
|---|---|
| matchkey_str |
article:10440305:2017----::wemtyrhtfsihiheouinnut10 |
| hierarchy_sort_str |
2017 |
| publishDate |
2017 |
| allfields |
10.1007/s13361-017-1742-8 doi PQ20171228 (DE-627)OLC1998102661 (DE-599)GBVOLC1998102661 (PRQ)p1315-ae1ef5e0260325253698d4bc3bc99a68572edb98f7b4077313182b06fd99d83a0 (KEY)0186032120170000028001002143wgeometryorthotofmswithhighresolutionandupto100dut DE-627 ger DE-627 rakwb eng 530 ZDB Chernushevich, Igor V verfasserin aut A W-Geometry Ortho-TOF MS with High Resolution and Up to 100% Duty Cycle for MS/MS 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Orthogonal injection time-of-flight (orthoTOF) mass spectrometry (MS) is the most prevalent form of TOFMS, owing to its greater control over incoming ion energy, the ability to correct for aberrations in incoming ion velocity and position, and its ability to provide an entire mass spectrum within a single scan. However, the duty cycle of orthoTOFMS is low compared with scanning analyzers, which can have 100% duty cycle when measuring a single type of ion. Typical duty cycles for orthoTOFMS range from 1% to 30%, depending on instrument geometry. Generally, as instrument resolution increases, duty cycle decreases. Additionally, the greatest duty cycle is achieved for the highest m/z ion recorded in the spectrum, and decreases for all other ions as a function of m/z. In a prior publication [Loboda, A.V.; Chernushevich, I.V. J. Am. Soc. Mass Spectrom. 20, 1342–1348 (20)], a novel trapping/release method for restoring the duty cycle of a V-geometry orthoTOFMS to near 100% (referred to as “Zeno pulsing”) was presented. Here, we apply that method to a W-TOF geometry analyzer with analog detection. Across a m/z range of 100–2000, sensitivity gains of ~5–20 are observed, for total ion currents approaching ~107 ions·s−1. Zeno pulsing, or similar strategies for restoring duty cycle, will continue to be important as instrument resolution in orthoTOFMS is increased through the use of ion mirrors. Graphical Abstract ᅟ Nutzungsrecht: © American Society for Mass Spectrometry 2017 Chemistry Organic Chemistry Duty cycle Zeno Ion trapping Quadrupole Time-of-flight mass spectrometry orthoTOF Analytical Chemistry Proteomics Collision cell Mass resolution Bioinformatics Biotechnology High resolution Ion currents Mass spectrometry Ion velocity Analyzers Aberration Geometry Laser printers Hardware reviews Merenbloom, Samuel I oth Liu, Suya oth Bloomfield, Nic oth Enthalten in Journal of the American Society for Mass Spectrometry New York, NY : Springer, 1990 28(2017), 10, Seite 2143-2150 (DE-627)130977357 (DE-600)1073671-2 (DE-576)277732093 1044-0305 nnns volume:28 year:2017 number:10 pages:2143-2150 http://dx.doi.org/10.1007/s13361-017-1742-8 Volltext https://search.proquest.com/docview/1937607845 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_70 GBV_ILN_4012 AR 28 2017 10 2143-2150 |
| spelling |
10.1007/s13361-017-1742-8 doi PQ20171228 (DE-627)OLC1998102661 (DE-599)GBVOLC1998102661 (PRQ)p1315-ae1ef5e0260325253698d4bc3bc99a68572edb98f7b4077313182b06fd99d83a0 (KEY)0186032120170000028001002143wgeometryorthotofmswithhighresolutionandupto100dut DE-627 ger DE-627 rakwb eng 530 ZDB Chernushevich, Igor V verfasserin aut A W-Geometry Ortho-TOF MS with High Resolution and Up to 100% Duty Cycle for MS/MS 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Orthogonal injection time-of-flight (orthoTOF) mass spectrometry (MS) is the most prevalent form of TOFMS, owing to its greater control over incoming ion energy, the ability to correct for aberrations in incoming ion velocity and position, and its ability to provide an entire mass spectrum within a single scan. However, the duty cycle of orthoTOFMS is low compared with scanning analyzers, which can have 100% duty cycle when measuring a single type of ion. Typical duty cycles for orthoTOFMS range from 1% to 30%, depending on instrument geometry. Generally, as instrument resolution increases, duty cycle decreases. Additionally, the greatest duty cycle is achieved for the highest m/z ion recorded in the spectrum, and decreases for all other ions as a function of m/z. In a prior publication [Loboda, A.V.; Chernushevich, I.V. J. Am. Soc. Mass Spectrom. 20, 1342–1348 (20)], a novel trapping/release method for restoring the duty cycle of a V-geometry orthoTOFMS to near 100% (referred to as “Zeno pulsing”) was presented. Here, we apply that method to a W-TOF geometry analyzer with analog detection. Across a m/z range of 100–2000, sensitivity gains of ~5–20 are observed, for total ion currents approaching ~107 ions·s−1. Zeno pulsing, or similar strategies for restoring duty cycle, will continue to be important as instrument resolution in orthoTOFMS is increased through the use of ion mirrors. Graphical Abstract ᅟ Nutzungsrecht: © American Society for Mass Spectrometry 2017 Chemistry Organic Chemistry Duty cycle Zeno Ion trapping Quadrupole Time-of-flight mass spectrometry orthoTOF Analytical Chemistry Proteomics Collision cell Mass resolution Bioinformatics Biotechnology High resolution Ion currents Mass spectrometry Ion velocity Analyzers Aberration Geometry Laser printers Hardware reviews Merenbloom, Samuel I oth Liu, Suya oth Bloomfield, Nic oth Enthalten in Journal of the American Society for Mass Spectrometry New York, NY : Springer, 1990 28(2017), 10, Seite 2143-2150 (DE-627)130977357 (DE-600)1073671-2 (DE-576)277732093 1044-0305 nnns volume:28 year:2017 number:10 pages:2143-2150 http://dx.doi.org/10.1007/s13361-017-1742-8 Volltext https://search.proquest.com/docview/1937607845 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_70 GBV_ILN_4012 AR 28 2017 10 2143-2150 |
| allfields_unstemmed |
10.1007/s13361-017-1742-8 doi PQ20171228 (DE-627)OLC1998102661 (DE-599)GBVOLC1998102661 (PRQ)p1315-ae1ef5e0260325253698d4bc3bc99a68572edb98f7b4077313182b06fd99d83a0 (KEY)0186032120170000028001002143wgeometryorthotofmswithhighresolutionandupto100dut DE-627 ger DE-627 rakwb eng 530 ZDB Chernushevich, Igor V verfasserin aut A W-Geometry Ortho-TOF MS with High Resolution and Up to 100% Duty Cycle for MS/MS 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Orthogonal injection time-of-flight (orthoTOF) mass spectrometry (MS) is the most prevalent form of TOFMS, owing to its greater control over incoming ion energy, the ability to correct for aberrations in incoming ion velocity and position, and its ability to provide an entire mass spectrum within a single scan. However, the duty cycle of orthoTOFMS is low compared with scanning analyzers, which can have 100% duty cycle when measuring a single type of ion. Typical duty cycles for orthoTOFMS range from 1% to 30%, depending on instrument geometry. Generally, as instrument resolution increases, duty cycle decreases. Additionally, the greatest duty cycle is achieved for the highest m/z ion recorded in the spectrum, and decreases for all other ions as a function of m/z. In a prior publication [Loboda, A.V.; Chernushevich, I.V. J. Am. Soc. Mass Spectrom. 20, 1342–1348 (20)], a novel trapping/release method for restoring the duty cycle of a V-geometry orthoTOFMS to near 100% (referred to as “Zeno pulsing”) was presented. Here, we apply that method to a W-TOF geometry analyzer with analog detection. Across a m/z range of 100–2000, sensitivity gains of ~5–20 are observed, for total ion currents approaching ~107 ions·s−1. Zeno pulsing, or similar strategies for restoring duty cycle, will continue to be important as instrument resolution in orthoTOFMS is increased through the use of ion mirrors. Graphical Abstract ᅟ Nutzungsrecht: © American Society for Mass Spectrometry 2017 Chemistry Organic Chemistry Duty cycle Zeno Ion trapping Quadrupole Time-of-flight mass spectrometry orthoTOF Analytical Chemistry Proteomics Collision cell Mass resolution Bioinformatics Biotechnology High resolution Ion currents Mass spectrometry Ion velocity Analyzers Aberration Geometry Laser printers Hardware reviews Merenbloom, Samuel I oth Liu, Suya oth Bloomfield, Nic oth Enthalten in Journal of the American Society for Mass Spectrometry New York, NY : Springer, 1990 28(2017), 10, Seite 2143-2150 (DE-627)130977357 (DE-600)1073671-2 (DE-576)277732093 1044-0305 nnns volume:28 year:2017 number:10 pages:2143-2150 http://dx.doi.org/10.1007/s13361-017-1742-8 Volltext https://search.proquest.com/docview/1937607845 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_70 GBV_ILN_4012 AR 28 2017 10 2143-2150 |
| allfieldsGer |
10.1007/s13361-017-1742-8 doi PQ20171228 (DE-627)OLC1998102661 (DE-599)GBVOLC1998102661 (PRQ)p1315-ae1ef5e0260325253698d4bc3bc99a68572edb98f7b4077313182b06fd99d83a0 (KEY)0186032120170000028001002143wgeometryorthotofmswithhighresolutionandupto100dut DE-627 ger DE-627 rakwb eng 530 ZDB Chernushevich, Igor V verfasserin aut A W-Geometry Ortho-TOF MS with High Resolution and Up to 100% Duty Cycle for MS/MS 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Orthogonal injection time-of-flight (orthoTOF) mass spectrometry (MS) is the most prevalent form of TOFMS, owing to its greater control over incoming ion energy, the ability to correct for aberrations in incoming ion velocity and position, and its ability to provide an entire mass spectrum within a single scan. However, the duty cycle of orthoTOFMS is low compared with scanning analyzers, which can have 100% duty cycle when measuring a single type of ion. Typical duty cycles for orthoTOFMS range from 1% to 30%, depending on instrument geometry. Generally, as instrument resolution increases, duty cycle decreases. Additionally, the greatest duty cycle is achieved for the highest m/z ion recorded in the spectrum, and decreases for all other ions as a function of m/z. In a prior publication [Loboda, A.V.; Chernushevich, I.V. J. Am. Soc. Mass Spectrom. 20, 1342–1348 (20)], a novel trapping/release method for restoring the duty cycle of a V-geometry orthoTOFMS to near 100% (referred to as “Zeno pulsing”) was presented. Here, we apply that method to a W-TOF geometry analyzer with analog detection. Across a m/z range of 100–2000, sensitivity gains of ~5–20 are observed, for total ion currents approaching ~107 ions·s−1. Zeno pulsing, or similar strategies for restoring duty cycle, will continue to be important as instrument resolution in orthoTOFMS is increased through the use of ion mirrors. Graphical Abstract ᅟ Nutzungsrecht: © American Society for Mass Spectrometry 2017 Chemistry Organic Chemistry Duty cycle Zeno Ion trapping Quadrupole Time-of-flight mass spectrometry orthoTOF Analytical Chemistry Proteomics Collision cell Mass resolution Bioinformatics Biotechnology High resolution Ion currents Mass spectrometry Ion velocity Analyzers Aberration Geometry Laser printers Hardware reviews Merenbloom, Samuel I oth Liu, Suya oth Bloomfield, Nic oth Enthalten in Journal of the American Society for Mass Spectrometry New York, NY : Springer, 1990 28(2017), 10, Seite 2143-2150 (DE-627)130977357 (DE-600)1073671-2 (DE-576)277732093 1044-0305 nnns volume:28 year:2017 number:10 pages:2143-2150 http://dx.doi.org/10.1007/s13361-017-1742-8 Volltext https://search.proquest.com/docview/1937607845 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_70 GBV_ILN_4012 AR 28 2017 10 2143-2150 |
| allfieldsSound |
10.1007/s13361-017-1742-8 doi PQ20171228 (DE-627)OLC1998102661 (DE-599)GBVOLC1998102661 (PRQ)p1315-ae1ef5e0260325253698d4bc3bc99a68572edb98f7b4077313182b06fd99d83a0 (KEY)0186032120170000028001002143wgeometryorthotofmswithhighresolutionandupto100dut DE-627 ger DE-627 rakwb eng 530 ZDB Chernushevich, Igor V verfasserin aut A W-Geometry Ortho-TOF MS with High Resolution and Up to 100% Duty Cycle for MS/MS 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Orthogonal injection time-of-flight (orthoTOF) mass spectrometry (MS) is the most prevalent form of TOFMS, owing to its greater control over incoming ion energy, the ability to correct for aberrations in incoming ion velocity and position, and its ability to provide an entire mass spectrum within a single scan. However, the duty cycle of orthoTOFMS is low compared with scanning analyzers, which can have 100% duty cycle when measuring a single type of ion. Typical duty cycles for orthoTOFMS range from 1% to 30%, depending on instrument geometry. Generally, as instrument resolution increases, duty cycle decreases. Additionally, the greatest duty cycle is achieved for the highest m/z ion recorded in the spectrum, and decreases for all other ions as a function of m/z. In a prior publication [Loboda, A.V.; Chernushevich, I.V. J. Am. Soc. Mass Spectrom. 20, 1342–1348 (20)], a novel trapping/release method for restoring the duty cycle of a V-geometry orthoTOFMS to near 100% (referred to as “Zeno pulsing”) was presented. Here, we apply that method to a W-TOF geometry analyzer with analog detection. Across a m/z range of 100–2000, sensitivity gains of ~5–20 are observed, for total ion currents approaching ~107 ions·s−1. Zeno pulsing, or similar strategies for restoring duty cycle, will continue to be important as instrument resolution in orthoTOFMS is increased through the use of ion mirrors. Graphical Abstract ᅟ Nutzungsrecht: © American Society for Mass Spectrometry 2017 Chemistry Organic Chemistry Duty cycle Zeno Ion trapping Quadrupole Time-of-flight mass spectrometry orthoTOF Analytical Chemistry Proteomics Collision cell Mass resolution Bioinformatics Biotechnology High resolution Ion currents Mass spectrometry Ion velocity Analyzers Aberration Geometry Laser printers Hardware reviews Merenbloom, Samuel I oth Liu, Suya oth Bloomfield, Nic oth Enthalten in Journal of the American Society for Mass Spectrometry New York, NY : Springer, 1990 28(2017), 10, Seite 2143-2150 (DE-627)130977357 (DE-600)1073671-2 (DE-576)277732093 1044-0305 nnns volume:28 year:2017 number:10 pages:2143-2150 http://dx.doi.org/10.1007/s13361-017-1742-8 Volltext https://search.proquest.com/docview/1937607845 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_70 GBV_ILN_4012 AR 28 2017 10 2143-2150 |
| language |
English |
| source |
Enthalten in Journal of the American Society for Mass Spectrometry 28(2017), 10, Seite 2143-2150 volume:28 year:2017 number:10 pages:2143-2150 |
| sourceStr |
Enthalten in Journal of the American Society for Mass Spectrometry 28(2017), 10, Seite 2143-2150 volume:28 year:2017 number:10 pages:2143-2150 |
| format_phy_str_mv |
Article |
| institution |
findex.gbv.de |
| topic_facet |
Chemistry Organic Chemistry Duty cycle Zeno Ion trapping Quadrupole Time-of-flight mass spectrometry orthoTOF Analytical Chemistry Proteomics Collision cell Mass resolution Bioinformatics Biotechnology High resolution Ion currents Mass spectrometry Ion velocity Analyzers Aberration Geometry Laser printers Hardware reviews |
| dewey-raw |
530 |
| isfreeaccess_bool |
false |
| container_title |
Journal of the American Society for Mass Spectrometry |
| authorswithroles_txt_mv |
Chernushevich, Igor V @@aut@@ Merenbloom, Samuel I @@oth@@ Liu, Suya @@oth@@ Bloomfield, Nic @@oth@@ |
| publishDateDaySort_date |
2017-01-01T00:00:00Z |
| hierarchy_top_id |
130977357 |
| dewey-sort |
3530 |
| id |
OLC1998102661 |
| language_de |
englisch |
| fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a2200265 4500</leader><controlfield tag="001">OLC1998102661</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230715080559.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">171125s2017 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/s13361-017-1742-8</subfield><subfield code="2">doi</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">PQ20171228</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1998102661</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1998102661</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(PRQ)p1315-ae1ef5e0260325253698d4bc3bc99a68572edb98f7b4077313182b06fd99d83a0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(KEY)0186032120170000028001002143wgeometryorthotofmswithhighresolutionandupto100dut</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">530</subfield><subfield code="q">ZDB</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Chernushevich, Igor V</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="2"><subfield code="a">A W-Geometry Ortho-TOF MS with High Resolution and Up to 100% Duty Cycle for MS/MS</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2017</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Orthogonal injection time-of-flight (orthoTOF) mass spectrometry (MS) is the most prevalent form of TOFMS, owing to its greater control over incoming ion energy, the ability to correct for aberrations in incoming ion velocity and position, and its ability to provide an entire mass spectrum within a single scan. However, the duty cycle of orthoTOFMS is low compared with scanning analyzers, which can have 100% duty cycle when measuring a single type of ion. Typical duty cycles for orthoTOFMS range from 1% to 30%, depending on instrument geometry. Generally, as instrument resolution increases, duty cycle decreases. Additionally, the greatest duty cycle is achieved for the highest m/z ion recorded in the spectrum, and decreases for all other ions as a function of m/z. In a prior publication [Loboda, A.V.; Chernushevich, I.V. J. Am. Soc. Mass Spectrom. 20, 1342–1348 (20)], a novel trapping/release method for restoring the duty cycle of a V-geometry orthoTOFMS to near 100% (referred to as “Zeno pulsing”) was presented. Here, we apply that method to a W-TOF geometry analyzer with analog detection. Across a m/z range of 100–2000, sensitivity gains of ~5–20 are observed, for total ion currents approaching ~107 ions·s−1. Zeno pulsing, or similar strategies for restoring duty cycle, will continue to be important as instrument resolution in orthoTOFMS is increased through the use of ion mirrors. Graphical Abstract ᅟ</subfield></datafield><datafield tag="540" ind1=" " ind2=" "><subfield code="a">Nutzungsrecht: © American Society for Mass Spectrometry 2017</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Organic Chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Duty cycle</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Zeno</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ion trapping</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Quadrupole</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Time-of-flight mass spectrometry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">orthoTOF</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Analytical Chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Proteomics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Collision cell</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mass resolution</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Bioinformatics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Biotechnology</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">High resolution</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ion currents</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mass spectrometry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ion velocity</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Analyzers</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Aberration</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Geometry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Laser printers</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Hardware reviews</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Merenbloom, Samuel I</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Liu, Suya</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Bloomfield, Nic</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Journal of the American Society for Mass Spectrometry</subfield><subfield code="d">New York, NY : Springer, 1990</subfield><subfield code="g">28(2017), 10, Seite 2143-2150</subfield><subfield code="w">(DE-627)130977357</subfield><subfield code="w">(DE-600)1073671-2</subfield><subfield code="w">(DE-576)277732093</subfield><subfield code="x">1044-0305</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:28</subfield><subfield code="g">year:2017</subfield><subfield code="g">number:10</subfield><subfield code="g">pages:2143-2150</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">http://dx.doi.org/10.1007/s13361-017-1742-8</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">https://search.proquest.com/docview/1937607845</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-CHE</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHA</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-DE-84</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4012</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">28</subfield><subfield code="j">2017</subfield><subfield code="e">10</subfield><subfield code="h">2143-2150</subfield></datafield></record></collection>
|
| author |
Chernushevich, Igor V |
| spellingShingle |
Chernushevich, Igor V ddc 530 misc Chemistry misc Organic Chemistry misc Duty cycle misc Zeno misc Ion trapping misc Quadrupole misc Time-of-flight mass spectrometry misc orthoTOF misc Analytical Chemistry misc Proteomics misc Collision cell misc Mass resolution misc Bioinformatics misc Biotechnology misc High resolution misc Ion currents misc Mass spectrometry misc Ion velocity misc Analyzers misc Aberration misc Geometry misc Laser printers misc Hardware reviews A W-Geometry Ortho-TOF MS with High Resolution and Up to 100% Duty Cycle for MS/MS |
| authorStr |
Chernushevich, Igor V |
| ppnlink_with_tag_str_mv |
@@773@@(DE-627)130977357 |
| format |
Article |
| dewey-ones |
530 - Physics |
| delete_txt_mv |
keep |
| author_role |
aut |
| collection |
OLC |
| remote_str |
false |
| illustrated |
Not Illustrated |
| issn |
1044-0305 |
| topic_title |
530 ZDB A W-Geometry Ortho-TOF MS with High Resolution and Up to 100% Duty Cycle for MS/MS Chemistry Organic Chemistry Duty cycle Zeno Ion trapping Quadrupole Time-of-flight mass spectrometry orthoTOF Analytical Chemistry Proteomics Collision cell Mass resolution Bioinformatics Biotechnology High resolution Ion currents Mass spectrometry Ion velocity Analyzers Aberration Geometry Laser printers Hardware reviews |
| topic |
ddc 530 misc Chemistry misc Organic Chemistry misc Duty cycle misc Zeno misc Ion trapping misc Quadrupole misc Time-of-flight mass spectrometry misc orthoTOF misc Analytical Chemistry misc Proteomics misc Collision cell misc Mass resolution misc Bioinformatics misc Biotechnology misc High resolution misc Ion currents misc Mass spectrometry misc Ion velocity misc Analyzers misc Aberration misc Geometry misc Laser printers misc Hardware reviews |
| topic_unstemmed |
ddc 530 misc Chemistry misc Organic Chemistry misc Duty cycle misc Zeno misc Ion trapping misc Quadrupole misc Time-of-flight mass spectrometry misc orthoTOF misc Analytical Chemistry misc Proteomics misc Collision cell misc Mass resolution misc Bioinformatics misc Biotechnology misc High resolution misc Ion currents misc Mass spectrometry misc Ion velocity misc Analyzers misc Aberration misc Geometry misc Laser printers misc Hardware reviews |
| topic_browse |
ddc 530 misc Chemistry misc Organic Chemistry misc Duty cycle misc Zeno misc Ion trapping misc Quadrupole misc Time-of-flight mass spectrometry misc orthoTOF misc Analytical Chemistry misc Proteomics misc Collision cell misc Mass resolution misc Bioinformatics misc Biotechnology misc High resolution misc Ion currents misc Mass spectrometry misc Ion velocity misc Analyzers misc Aberration misc Geometry misc Laser printers misc Hardware reviews |
| format_facet |
Aufsätze Gedruckte Aufsätze |
| format_main_str_mv |
Text Zeitschrift/Artikel |
| carriertype_str_mv |
nc |
| author2_variant |
s i m si sim s l sl n b nb |
| hierarchy_parent_title |
Journal of the American Society for Mass Spectrometry |
| hierarchy_parent_id |
130977357 |
| dewey-tens |
530 - Physics |
| hierarchy_top_title |
Journal of the American Society for Mass Spectrometry |
| isfreeaccess_txt |
false |
| familylinks_str_mv |
(DE-627)130977357 (DE-600)1073671-2 (DE-576)277732093 |
| title |
A W-Geometry Ortho-TOF MS with High Resolution and Up to 100% Duty Cycle for MS/MS |
| ctrlnum |
(DE-627)OLC1998102661 (DE-599)GBVOLC1998102661 (PRQ)p1315-ae1ef5e0260325253698d4bc3bc99a68572edb98f7b4077313182b06fd99d83a0 (KEY)0186032120170000028001002143wgeometryorthotofmswithhighresolutionandupto100dut |
| title_full |
A W-Geometry Ortho-TOF MS with High Resolution and Up to 100% Duty Cycle for MS/MS |
| author_sort |
Chernushevich, Igor V |
| journal |
Journal of the American Society for Mass Spectrometry |
| journalStr |
Journal of the American Society for Mass Spectrometry |
| lang_code |
eng |
| isOA_bool |
false |
| dewey-hundreds |
500 - Science |
| recordtype |
marc |
| publishDateSort |
2017 |
| contenttype_str_mv |
txt |
| container_start_page |
2143 |
| author_browse |
Chernushevich, Igor V |
| container_volume |
28 |
| class |
530 ZDB |
| format_se |
Aufsätze |
| author-letter |
Chernushevich, Igor V |
| doi_str_mv |
10.1007/s13361-017-1742-8 |
| dewey-full |
530 |
| title_sort |
w-geometry ortho-tof ms with high resolution and up to 100% duty cycle for ms/ms |
| title_auth |
A W-Geometry Ortho-TOF MS with High Resolution and Up to 100% Duty Cycle for MS/MS |
| abstract |
Orthogonal injection time-of-flight (orthoTOF) mass spectrometry (MS) is the most prevalent form of TOFMS, owing to its greater control over incoming ion energy, the ability to correct for aberrations in incoming ion velocity and position, and its ability to provide an entire mass spectrum within a single scan. However, the duty cycle of orthoTOFMS is low compared with scanning analyzers, which can have 100% duty cycle when measuring a single type of ion. Typical duty cycles for orthoTOFMS range from 1% to 30%, depending on instrument geometry. Generally, as instrument resolution increases, duty cycle decreases. Additionally, the greatest duty cycle is achieved for the highest m/z ion recorded in the spectrum, and decreases for all other ions as a function of m/z. In a prior publication [Loboda, A.V.; Chernushevich, I.V. J. Am. Soc. Mass Spectrom. 20, 1342–1348 (20)], a novel trapping/release method for restoring the duty cycle of a V-geometry orthoTOFMS to near 100% (referred to as “Zeno pulsing”) was presented. Here, we apply that method to a W-TOF geometry analyzer with analog detection. Across a m/z range of 100–2000, sensitivity gains of ~5–20 are observed, for total ion currents approaching ~107 ions·s−1. Zeno pulsing, or similar strategies for restoring duty cycle, will continue to be important as instrument resolution in orthoTOFMS is increased through the use of ion mirrors. Graphical Abstract ᅟ |
| abstractGer |
Orthogonal injection time-of-flight (orthoTOF) mass spectrometry (MS) is the most prevalent form of TOFMS, owing to its greater control over incoming ion energy, the ability to correct for aberrations in incoming ion velocity and position, and its ability to provide an entire mass spectrum within a single scan. However, the duty cycle of orthoTOFMS is low compared with scanning analyzers, which can have 100% duty cycle when measuring a single type of ion. Typical duty cycles for orthoTOFMS range from 1% to 30%, depending on instrument geometry. Generally, as instrument resolution increases, duty cycle decreases. Additionally, the greatest duty cycle is achieved for the highest m/z ion recorded in the spectrum, and decreases for all other ions as a function of m/z. In a prior publication [Loboda, A.V.; Chernushevich, I.V. J. Am. Soc. Mass Spectrom. 20, 1342–1348 (20)], a novel trapping/release method for restoring the duty cycle of a V-geometry orthoTOFMS to near 100% (referred to as “Zeno pulsing”) was presented. Here, we apply that method to a W-TOF geometry analyzer with analog detection. Across a m/z range of 100–2000, sensitivity gains of ~5–20 are observed, for total ion currents approaching ~107 ions·s−1. Zeno pulsing, or similar strategies for restoring duty cycle, will continue to be important as instrument resolution in orthoTOFMS is increased through the use of ion mirrors. Graphical Abstract ᅟ |
| abstract_unstemmed |
Orthogonal injection time-of-flight (orthoTOF) mass spectrometry (MS) is the most prevalent form of TOFMS, owing to its greater control over incoming ion energy, the ability to correct for aberrations in incoming ion velocity and position, and its ability to provide an entire mass spectrum within a single scan. However, the duty cycle of orthoTOFMS is low compared with scanning analyzers, which can have 100% duty cycle when measuring a single type of ion. Typical duty cycles for orthoTOFMS range from 1% to 30%, depending on instrument geometry. Generally, as instrument resolution increases, duty cycle decreases. Additionally, the greatest duty cycle is achieved for the highest m/z ion recorded in the spectrum, and decreases for all other ions as a function of m/z. In a prior publication [Loboda, A.V.; Chernushevich, I.V. J. Am. Soc. Mass Spectrom. 20, 1342–1348 (20)], a novel trapping/release method for restoring the duty cycle of a V-geometry orthoTOFMS to near 100% (referred to as “Zeno pulsing”) was presented. Here, we apply that method to a W-TOF geometry analyzer with analog detection. Across a m/z range of 100–2000, sensitivity gains of ~5–20 are observed, for total ion currents approaching ~107 ions·s−1. Zeno pulsing, or similar strategies for restoring duty cycle, will continue to be important as instrument resolution in orthoTOFMS is increased through the use of ion mirrors. Graphical Abstract ᅟ |
| collection_details |
GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY SSG-OLC-CHE SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_70 GBV_ILN_4012 |
| container_issue |
10 |
| title_short |
A W-Geometry Ortho-TOF MS with High Resolution and Up to 100% Duty Cycle for MS/MS |
| url |
http://dx.doi.org/10.1007/s13361-017-1742-8 https://search.proquest.com/docview/1937607845 |
| remote_bool |
false |
| author2 |
Merenbloom, Samuel I Liu, Suya Bloomfield, Nic |
| author2Str |
Merenbloom, Samuel I Liu, Suya Bloomfield, Nic |
| ppnlink |
130977357 |
| mediatype_str_mv |
n |
| isOA_txt |
false |
| hochschulschrift_bool |
false |
| author2_role |
oth oth oth |
| doi_str |
10.1007/s13361-017-1742-8 |
| up_date |
2024-07-04T04:19:21.393Z |
| _version_ |
1803620724396523520 |
| fullrecord_marcxml |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a2200265 4500</leader><controlfield tag="001">OLC1998102661</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230715080559.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">171125s2017 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/s13361-017-1742-8</subfield><subfield code="2">doi</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">PQ20171228</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC1998102661</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)GBVOLC1998102661</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(PRQ)p1315-ae1ef5e0260325253698d4bc3bc99a68572edb98f7b4077313182b06fd99d83a0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(KEY)0186032120170000028001002143wgeometryorthotofmswithhighresolutionandupto100dut</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">530</subfield><subfield code="q">ZDB</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Chernushevich, Igor V</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="2"><subfield code="a">A W-Geometry Ortho-TOF MS with High Resolution and Up to 100% Duty Cycle for MS/MS</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2017</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Orthogonal injection time-of-flight (orthoTOF) mass spectrometry (MS) is the most prevalent form of TOFMS, owing to its greater control over incoming ion energy, the ability to correct for aberrations in incoming ion velocity and position, and its ability to provide an entire mass spectrum within a single scan. However, the duty cycle of orthoTOFMS is low compared with scanning analyzers, which can have 100% duty cycle when measuring a single type of ion. Typical duty cycles for orthoTOFMS range from 1% to 30%, depending on instrument geometry. Generally, as instrument resolution increases, duty cycle decreases. Additionally, the greatest duty cycle is achieved for the highest m/z ion recorded in the spectrum, and decreases for all other ions as a function of m/z. In a prior publication [Loboda, A.V.; Chernushevich, I.V. J. Am. Soc. Mass Spectrom. 20, 1342–1348 (20)], a novel trapping/release method for restoring the duty cycle of a V-geometry orthoTOFMS to near 100% (referred to as “Zeno pulsing”) was presented. Here, we apply that method to a W-TOF geometry analyzer with analog detection. Across a m/z range of 100–2000, sensitivity gains of ~5–20 are observed, for total ion currents approaching ~107 ions·s−1. Zeno pulsing, or similar strategies for restoring duty cycle, will continue to be important as instrument resolution in orthoTOFMS is increased through the use of ion mirrors. Graphical Abstract ᅟ</subfield></datafield><datafield tag="540" ind1=" " ind2=" "><subfield code="a">Nutzungsrecht: © American Society for Mass Spectrometry 2017</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Organic Chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Duty cycle</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Zeno</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ion trapping</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Quadrupole</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Time-of-flight mass spectrometry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">orthoTOF</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Analytical Chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Proteomics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Collision cell</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mass resolution</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Bioinformatics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Biotechnology</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">High resolution</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ion currents</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mass spectrometry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ion velocity</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Analyzers</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Aberration</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Geometry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Laser printers</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Hardware reviews</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Merenbloom, Samuel I</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Liu, Suya</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Bloomfield, Nic</subfield><subfield code="4">oth</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Journal of the American Society for Mass Spectrometry</subfield><subfield code="d">New York, NY : Springer, 1990</subfield><subfield code="g">28(2017), 10, Seite 2143-2150</subfield><subfield code="w">(DE-627)130977357</subfield><subfield code="w">(DE-600)1073671-2</subfield><subfield code="w">(DE-576)277732093</subfield><subfield code="x">1044-0305</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:28</subfield><subfield code="g">year:2017</subfield><subfield code="g">number:10</subfield><subfield code="g">pages:2143-2150</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">http://dx.doi.org/10.1007/s13361-017-1742-8</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="u">https://search.proquest.com/docview/1937607845</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-CHE</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHA</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-DE-84</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4012</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">28</subfield><subfield code="j">2017</subfield><subfield code="e">10</subfield><subfield code="h">2143-2150</subfield></datafield></record></collection>
|
| score |
7.400609 |