Back-focal plane Mueller matrix microscopy: Mueller conoscopy and Mueller diffractrometry

Gespeichert in:

Autor*in:	Arteaga, Oriol [verfasserIn] Nichols, Shane M Antó, Joan

Format:	Artikel
Sprache:	Englisch

Erschienen:	2017

Rechteinformationen:	Nutzungsrecht: © Elsevier B.V.

Schlagwörter:	Polarimetry Diffraction Instrumentation Microscopy

Übergeordnetes Werk:	Enthalten in: Applied surface science - Amsterdam [u.a.] : Elsevier, 1985, 421(2017), Seite 702-706
Übergeordnetes Werk:	volume:421 ; year:2017 ; pages:702-706

Links:	Volltext Link aufrufen

DOI / URN:	10.1016/j.apsusc.2016.10.129

Katalog-ID:	OLC1998986187

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title	Back-focal plane Mueller matrix microscopy: Mueller conoscopy and Mueller diffractrometry
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Back-focal plane Mueller matrix microscopy: Mueller conoscopy and Mueller diffractrometry

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