Close-to-Functional Broadside Tests With a Safety Margin
Scan-based tests that maintain close-to-functional operation conditions are important for avoiding overtesting of delay faults while achieving the fault coverage required for avoiding test escapes. For a measurable proximity to functional operation conditions, partially functional broadside tests ha...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Pomeranz, Irith [verfasserIn] |
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| Format: |
Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2017 |
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| Schlagwörter: |
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| Übergeordnetes Werk: |
Enthalten in: IEEE transactions on computer-aided design of integrated circuits and systems - New York, NY : Institute of Electrical and Electronics Engineers, 1982, 36(2017), 12, Seite 2139-2143 |
|---|---|
| Übergeordnetes Werk: |
volume:36 ; year:2017 ; number:12 ; pages:2139-2143 |
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| DOI / URN: |
10.1109/TCAD.2017.2669862 |
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| 520 | |a Scan-based tests that maintain close-to-functional operation conditions are important for avoiding overtesting of delay faults while achieving the fault coverage required for avoiding test escapes. For a measurable proximity to functional operation conditions, partially functional broadside tests have a known Hamming distance between their scan-in states and reachable states. Another parameter that is important for the discussion of overtesting is the switching activity. This paper suggests a combined metric, where a reduced switching activity is taken as a safety margin that allows a higher Hamming distance between the scan-in state and a reachable state. The metric is defined such that a value of 100% or lower is preferred. To demonstrate that the metric is flexible enough to allow tests to be generated, the paper describes a test generation procedure that uses the metric. | ||
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10.1109/TCAD.2017.2669862 doi PQ20171228 (DE-627)OLC1999247302 (DE-599)GBVOLC1999247302 (PRQ)c1078-2a31167b5623b72ab3cd70737b05fc2ec81d11cf9e0f4e3520b6df1bb20845420 (KEY)0113814620170000036001202139closetofunctionalbroadsidetestswithasafetymargin DE-627 ger DE-627 rakwb eng 620 DE-600 Pomeranz, Irith verfasserin aut Close-to-Functional Broadside Tests With a Safety Margin 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Scan-based tests that maintain close-to-functional operation conditions are important for avoiding overtesting of delay faults while achieving the fault coverage required for avoiding test escapes. For a measurable proximity to functional operation conditions, partially functional broadside tests have a known Hamming distance between their scan-in states and reachable states. Another parameter that is important for the discussion of overtesting is the switching activity. This paper suggests a combined metric, where a reduced switching activity is taken as a safety margin that allows a higher Hamming distance between the scan-in state and a reachable state. The metric is defined such that a value of 100% or lower is preferred. To demonstrate that the metric is flexible enough to allow tests to be generated, the paper describes a test generation procedure that uses the metric. Hamming distance Switches test generation Safety Circuit faults switching activity Close-to-functional broadside tests functional broadside tests Power dissipation Delays Enthalten in IEEE transactions on computer-aided design of integrated circuits and systems New York, NY : Institute of Electrical and Electronics Engineers, 1982 36(2017), 12, Seite 2139-2143 (DE-627)13041705X (DE-600)627344-0 (DE-576)015919471 0278-0070 nnns volume:36 year:2017 number:12 pages:2139-2143 http://dx.doi.org/10.1109/TCAD.2017.2669862 Volltext http://ieeexplore.ieee.org/document/7857721 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-MAT GBV_ILN_70 GBV_ILN_2002 GBV_ILN_2004 GBV_ILN_4313 AR 36 2017 12 2139-2143 |
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10.1109/TCAD.2017.2669862 doi PQ20171228 (DE-627)OLC1999247302 (DE-599)GBVOLC1999247302 (PRQ)c1078-2a31167b5623b72ab3cd70737b05fc2ec81d11cf9e0f4e3520b6df1bb20845420 (KEY)0113814620170000036001202139closetofunctionalbroadsidetestswithasafetymargin DE-627 ger DE-627 rakwb eng 620 DE-600 Pomeranz, Irith verfasserin aut Close-to-Functional Broadside Tests With a Safety Margin 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Scan-based tests that maintain close-to-functional operation conditions are important for avoiding overtesting of delay faults while achieving the fault coverage required for avoiding test escapes. For a measurable proximity to functional operation conditions, partially functional broadside tests have a known Hamming distance between their scan-in states and reachable states. Another parameter that is important for the discussion of overtesting is the switching activity. This paper suggests a combined metric, where a reduced switching activity is taken as a safety margin that allows a higher Hamming distance between the scan-in state and a reachable state. The metric is defined such that a value of 100% or lower is preferred. To demonstrate that the metric is flexible enough to allow tests to be generated, the paper describes a test generation procedure that uses the metric. Hamming distance Switches test generation Safety Circuit faults switching activity Close-to-functional broadside tests functional broadside tests Power dissipation Delays Enthalten in IEEE transactions on computer-aided design of integrated circuits and systems New York, NY : Institute of Electrical and Electronics Engineers, 1982 36(2017), 12, Seite 2139-2143 (DE-627)13041705X (DE-600)627344-0 (DE-576)015919471 0278-0070 nnns volume:36 year:2017 number:12 pages:2139-2143 http://dx.doi.org/10.1109/TCAD.2017.2669862 Volltext http://ieeexplore.ieee.org/document/7857721 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-MAT GBV_ILN_70 GBV_ILN_2002 GBV_ILN_2004 GBV_ILN_4313 AR 36 2017 12 2139-2143 |
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10.1109/TCAD.2017.2669862 doi PQ20171228 (DE-627)OLC1999247302 (DE-599)GBVOLC1999247302 (PRQ)c1078-2a31167b5623b72ab3cd70737b05fc2ec81d11cf9e0f4e3520b6df1bb20845420 (KEY)0113814620170000036001202139closetofunctionalbroadsidetestswithasafetymargin DE-627 ger DE-627 rakwb eng 620 DE-600 Pomeranz, Irith verfasserin aut Close-to-Functional Broadside Tests With a Safety Margin 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Scan-based tests that maintain close-to-functional operation conditions are important for avoiding overtesting of delay faults while achieving the fault coverage required for avoiding test escapes. For a measurable proximity to functional operation conditions, partially functional broadside tests have a known Hamming distance between their scan-in states and reachable states. Another parameter that is important for the discussion of overtesting is the switching activity. This paper suggests a combined metric, where a reduced switching activity is taken as a safety margin that allows a higher Hamming distance between the scan-in state and a reachable state. The metric is defined such that a value of 100% or lower is preferred. To demonstrate that the metric is flexible enough to allow tests to be generated, the paper describes a test generation procedure that uses the metric. Hamming distance Switches test generation Safety Circuit faults switching activity Close-to-functional broadside tests functional broadside tests Power dissipation Delays Enthalten in IEEE transactions on computer-aided design of integrated circuits and systems New York, NY : Institute of Electrical and Electronics Engineers, 1982 36(2017), 12, Seite 2139-2143 (DE-627)13041705X (DE-600)627344-0 (DE-576)015919471 0278-0070 nnns volume:36 year:2017 number:12 pages:2139-2143 http://dx.doi.org/10.1109/TCAD.2017.2669862 Volltext http://ieeexplore.ieee.org/document/7857721 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-MAT GBV_ILN_70 GBV_ILN_2002 GBV_ILN_2004 GBV_ILN_4313 AR 36 2017 12 2139-2143 |
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10.1109/TCAD.2017.2669862 doi PQ20171228 (DE-627)OLC1999247302 (DE-599)GBVOLC1999247302 (PRQ)c1078-2a31167b5623b72ab3cd70737b05fc2ec81d11cf9e0f4e3520b6df1bb20845420 (KEY)0113814620170000036001202139closetofunctionalbroadsidetestswithasafetymargin DE-627 ger DE-627 rakwb eng 620 DE-600 Pomeranz, Irith verfasserin aut Close-to-Functional Broadside Tests With a Safety Margin 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Scan-based tests that maintain close-to-functional operation conditions are important for avoiding overtesting of delay faults while achieving the fault coverage required for avoiding test escapes. For a measurable proximity to functional operation conditions, partially functional broadside tests have a known Hamming distance between their scan-in states and reachable states. Another parameter that is important for the discussion of overtesting is the switching activity. This paper suggests a combined metric, where a reduced switching activity is taken as a safety margin that allows a higher Hamming distance between the scan-in state and a reachable state. The metric is defined such that a value of 100% or lower is preferred. To demonstrate that the metric is flexible enough to allow tests to be generated, the paper describes a test generation procedure that uses the metric. Hamming distance Switches test generation Safety Circuit faults switching activity Close-to-functional broadside tests functional broadside tests Power dissipation Delays Enthalten in IEEE transactions on computer-aided design of integrated circuits and systems New York, NY : Institute of Electrical and Electronics Engineers, 1982 36(2017), 12, Seite 2139-2143 (DE-627)13041705X (DE-600)627344-0 (DE-576)015919471 0278-0070 nnns volume:36 year:2017 number:12 pages:2139-2143 http://dx.doi.org/10.1109/TCAD.2017.2669862 Volltext http://ieeexplore.ieee.org/document/7857721 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-MAT GBV_ILN_70 GBV_ILN_2002 GBV_ILN_2004 GBV_ILN_4313 AR 36 2017 12 2139-2143 |
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10.1109/TCAD.2017.2669862 doi PQ20171228 (DE-627)OLC1999247302 (DE-599)GBVOLC1999247302 (PRQ)c1078-2a31167b5623b72ab3cd70737b05fc2ec81d11cf9e0f4e3520b6df1bb20845420 (KEY)0113814620170000036001202139closetofunctionalbroadsidetestswithasafetymargin DE-627 ger DE-627 rakwb eng 620 DE-600 Pomeranz, Irith verfasserin aut Close-to-Functional Broadside Tests With a Safety Margin 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier Scan-based tests that maintain close-to-functional operation conditions are important for avoiding overtesting of delay faults while achieving the fault coverage required for avoiding test escapes. For a measurable proximity to functional operation conditions, partially functional broadside tests have a known Hamming distance between their scan-in states and reachable states. Another parameter that is important for the discussion of overtesting is the switching activity. This paper suggests a combined metric, where a reduced switching activity is taken as a safety margin that allows a higher Hamming distance between the scan-in state and a reachable state. The metric is defined such that a value of 100% or lower is preferred. To demonstrate that the metric is flexible enough to allow tests to be generated, the paper describes a test generation procedure that uses the metric. Hamming distance Switches test generation Safety Circuit faults switching activity Close-to-functional broadside tests functional broadside tests Power dissipation Delays Enthalten in IEEE transactions on computer-aided design of integrated circuits and systems New York, NY : Institute of Electrical and Electronics Engineers, 1982 36(2017), 12, Seite 2139-2143 (DE-627)13041705X (DE-600)627344-0 (DE-576)015919471 0278-0070 nnns volume:36 year:2017 number:12 pages:2139-2143 http://dx.doi.org/10.1109/TCAD.2017.2669862 Volltext http://ieeexplore.ieee.org/document/7857721 GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-MAT GBV_ILN_70 GBV_ILN_2002 GBV_ILN_2004 GBV_ILN_4313 AR 36 2017 12 2139-2143 |
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Close-to-Functional Broadside Tests With a Safety Margin |
| abstract |
Scan-based tests that maintain close-to-functional operation conditions are important for avoiding overtesting of delay faults while achieving the fault coverage required for avoiding test escapes. For a measurable proximity to functional operation conditions, partially functional broadside tests have a known Hamming distance between their scan-in states and reachable states. Another parameter that is important for the discussion of overtesting is the switching activity. This paper suggests a combined metric, where a reduced switching activity is taken as a safety margin that allows a higher Hamming distance between the scan-in state and a reachable state. The metric is defined such that a value of 100% or lower is preferred. To demonstrate that the metric is flexible enough to allow tests to be generated, the paper describes a test generation procedure that uses the metric. |
| abstractGer |
Scan-based tests that maintain close-to-functional operation conditions are important for avoiding overtesting of delay faults while achieving the fault coverage required for avoiding test escapes. For a measurable proximity to functional operation conditions, partially functional broadside tests have a known Hamming distance between their scan-in states and reachable states. Another parameter that is important for the discussion of overtesting is the switching activity. This paper suggests a combined metric, where a reduced switching activity is taken as a safety margin that allows a higher Hamming distance between the scan-in state and a reachable state. The metric is defined such that a value of 100% or lower is preferred. To demonstrate that the metric is flexible enough to allow tests to be generated, the paper describes a test generation procedure that uses the metric. |
| abstract_unstemmed |
Scan-based tests that maintain close-to-functional operation conditions are important for avoiding overtesting of delay faults while achieving the fault coverage required for avoiding test escapes. For a measurable proximity to functional operation conditions, partially functional broadside tests have a known Hamming distance between their scan-in states and reachable states. Another parameter that is important for the discussion of overtesting is the switching activity. This paper suggests a combined metric, where a reduced switching activity is taken as a safety margin that allows a higher Hamming distance between the scan-in state and a reachable state. The metric is defined such that a value of 100% or lower is preferred. To demonstrate that the metric is flexible enough to allow tests to be generated, the paper describes a test generation procedure that uses the metric. |
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| container_issue |
12 |
| title_short |
Close-to-Functional Broadside Tests With a Safety Margin |
| url |
http://dx.doi.org/10.1109/TCAD.2017.2669862 http://ieeexplore.ieee.org/document/7857721 |
| remote_bool |
false |
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| doi_str |
10.1109/TCAD.2017.2669862 |
| up_date |
2024-07-03T13:27:55.354Z |
| _version_ |
1803564640217595904 |
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7.399476 |