Microstructural and magnetic properties of self-biased strontium hexaferrite thick films by two-step sintering
Abstract $ SrFe_{12} $$ O_{19} $ hexaferrite thick films were prepared by tape casting method followed by a two-step sintering process. X-Ray diffractometer, field emission scanning electron microscope and vibrating sample magnetometer were used to investigate the microstructure and magnetic propert...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Kiani, Esmail [verfasserIn] |
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| Format: |
Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2012 |
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| Schlagwörter: |
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| Anmerkung: |
© Springer Science+Business Media New York 2012 |
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| Übergeordnetes Werk: |
Enthalten in: Journal of materials science / Materials in electronics - Springer US, 1990, 24(2012), 5 vom: 11. Nov., Seite 1617-1623 |
|---|---|
| Übergeordnetes Werk: |
volume:24 ; year:2012 ; number:5 ; day:11 ; month:11 ; pages:1617-1623 |
| Links: |
|---|
| DOI / URN: |
10.1007/s10854-012-0985-1 |
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| Katalog-ID: |
OLC2026268185 |
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| 520 | |a Abstract $ SrFe_{12} $$ O_{19} $ hexaferrite thick films were prepared by tape casting method followed by a two-step sintering process. X-Ray diffractometer, field emission scanning electron microscope and vibrating sample magnetometer were used to investigate the microstructure and magnetic properties of samples. Results show that high density films with nanocrystalline grains, high crystallographic c-axis orientation of crystals perpendicular to the film plane with high squareness (Mr/Ms = 0.93) and moderate coercivity (Hc = 3,750 Oe) can be obtained with two-step sintering. Grains growth is controllable by this sintering method. The average grain size of the films strongly depends on final stage of sintering and quality of starting powders and ranging between 0.5 and 10 μm. The thick films with starting powders from coprecipitation method are denser with smaller grain size rather than those with starting powders from solid state reactions. This work reveals the feasibility of fabrication of thick hexaferrite films with a simple and effective method for next generation of self-biased planar microwave devices. | ||
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10.1007/s10854-012-0985-1 doi (DE-627)OLC2026268185 (DE-He213)s10854-012-0985-1-p DE-627 ger DE-627 rakwb eng 600 670 620 VZ Kiani, Esmail verfasserin aut Microstructural and magnetic properties of self-biased strontium hexaferrite thick films by two-step sintering 2012 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media New York 2012 Abstract $ SrFe_{12} $$ O_{19} $ hexaferrite thick films were prepared by tape casting method followed by a two-step sintering process. X-Ray diffractometer, field emission scanning electron microscope and vibrating sample magnetometer were used to investigate the microstructure and magnetic properties of samples. Results show that high density films with nanocrystalline grains, high crystallographic c-axis orientation of crystals perpendicular to the film plane with high squareness (Mr/Ms = 0.93) and moderate coercivity (Hc = 3,750 Oe) can be obtained with two-step sintering. Grains growth is controllable by this sintering method. The average grain size of the films strongly depends on final stage of sintering and quality of starting powders and ranging between 0.5 and 10 μm. The thick films with starting powders from coprecipitation method are denser with smaller grain size rather than those with starting powders from solid state reactions. This work reveals the feasibility of fabrication of thick hexaferrite films with a simple and effective method for next generation of self-biased planar microwave devices. Thick Film SrFe12O19 Barium Hexaferrite Strontium Hexaferrite Intrinsic Coercivity Yousefi, Mohammad H. aut Rozatian, Amir S. H. aut Enthalten in Journal of materials science / Materials in electronics Springer US, 1990 24(2012), 5 vom: 11. Nov., Seite 1617-1623 (DE-627)130863289 (DE-600)1030929-9 (DE-576)023106719 0957-4522 nnns volume:24 year:2012 number:5 day:11 month:11 pages:1617-1623 https://doi.org/10.1007/s10854-012-0985-1 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_30 GBV_ILN_32 GBV_ILN_40 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2015 GBV_ILN_4046 GBV_ILN_4305 GBV_ILN_4323 AR 24 2012 5 11 11 1617-1623 |
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10.1007/s10854-012-0985-1 doi (DE-627)OLC2026268185 (DE-He213)s10854-012-0985-1-p DE-627 ger DE-627 rakwb eng 600 670 620 VZ Kiani, Esmail verfasserin aut Microstructural and magnetic properties of self-biased strontium hexaferrite thick films by two-step sintering 2012 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media New York 2012 Abstract $ SrFe_{12} $$ O_{19} $ hexaferrite thick films were prepared by tape casting method followed by a two-step sintering process. X-Ray diffractometer, field emission scanning electron microscope and vibrating sample magnetometer were used to investigate the microstructure and magnetic properties of samples. Results show that high density films with nanocrystalline grains, high crystallographic c-axis orientation of crystals perpendicular to the film plane with high squareness (Mr/Ms = 0.93) and moderate coercivity (Hc = 3,750 Oe) can be obtained with two-step sintering. Grains growth is controllable by this sintering method. The average grain size of the films strongly depends on final stage of sintering and quality of starting powders and ranging between 0.5 and 10 μm. The thick films with starting powders from coprecipitation method are denser with smaller grain size rather than those with starting powders from solid state reactions. This work reveals the feasibility of fabrication of thick hexaferrite films with a simple and effective method for next generation of self-biased planar microwave devices. Thick Film SrFe12O19 Barium Hexaferrite Strontium Hexaferrite Intrinsic Coercivity Yousefi, Mohammad H. aut Rozatian, Amir S. H. aut Enthalten in Journal of materials science / Materials in electronics Springer US, 1990 24(2012), 5 vom: 11. Nov., Seite 1617-1623 (DE-627)130863289 (DE-600)1030929-9 (DE-576)023106719 0957-4522 nnns volume:24 year:2012 number:5 day:11 month:11 pages:1617-1623 https://doi.org/10.1007/s10854-012-0985-1 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_30 GBV_ILN_32 GBV_ILN_40 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2015 GBV_ILN_4046 GBV_ILN_4305 GBV_ILN_4323 AR 24 2012 5 11 11 1617-1623 |
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10.1007/s10854-012-0985-1 doi (DE-627)OLC2026268185 (DE-He213)s10854-012-0985-1-p DE-627 ger DE-627 rakwb eng 600 670 620 VZ Kiani, Esmail verfasserin aut Microstructural and magnetic properties of self-biased strontium hexaferrite thick films by two-step sintering 2012 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media New York 2012 Abstract $ SrFe_{12} $$ O_{19} $ hexaferrite thick films were prepared by tape casting method followed by a two-step sintering process. X-Ray diffractometer, field emission scanning electron microscope and vibrating sample magnetometer were used to investigate the microstructure and magnetic properties of samples. Results show that high density films with nanocrystalline grains, high crystallographic c-axis orientation of crystals perpendicular to the film plane with high squareness (Mr/Ms = 0.93) and moderate coercivity (Hc = 3,750 Oe) can be obtained with two-step sintering. Grains growth is controllable by this sintering method. The average grain size of the films strongly depends on final stage of sintering and quality of starting powders and ranging between 0.5 and 10 μm. The thick films with starting powders from coprecipitation method are denser with smaller grain size rather than those with starting powders from solid state reactions. This work reveals the feasibility of fabrication of thick hexaferrite films with a simple and effective method for next generation of self-biased planar microwave devices. Thick Film SrFe12O19 Barium Hexaferrite Strontium Hexaferrite Intrinsic Coercivity Yousefi, Mohammad H. aut Rozatian, Amir S. H. aut Enthalten in Journal of materials science / Materials in electronics Springer US, 1990 24(2012), 5 vom: 11. Nov., Seite 1617-1623 (DE-627)130863289 (DE-600)1030929-9 (DE-576)023106719 0957-4522 nnns volume:24 year:2012 number:5 day:11 month:11 pages:1617-1623 https://doi.org/10.1007/s10854-012-0985-1 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_30 GBV_ILN_32 GBV_ILN_40 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2015 GBV_ILN_4046 GBV_ILN_4305 GBV_ILN_4323 AR 24 2012 5 11 11 1617-1623 |
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10.1007/s10854-012-0985-1 doi (DE-627)OLC2026268185 (DE-He213)s10854-012-0985-1-p DE-627 ger DE-627 rakwb eng 600 670 620 VZ Kiani, Esmail verfasserin aut Microstructural and magnetic properties of self-biased strontium hexaferrite thick films by two-step sintering 2012 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media New York 2012 Abstract $ SrFe_{12} $$ O_{19} $ hexaferrite thick films were prepared by tape casting method followed by a two-step sintering process. X-Ray diffractometer, field emission scanning electron microscope and vibrating sample magnetometer were used to investigate the microstructure and magnetic properties of samples. Results show that high density films with nanocrystalline grains, high crystallographic c-axis orientation of crystals perpendicular to the film plane with high squareness (Mr/Ms = 0.93) and moderate coercivity (Hc = 3,750 Oe) can be obtained with two-step sintering. Grains growth is controllable by this sintering method. The average grain size of the films strongly depends on final stage of sintering and quality of starting powders and ranging between 0.5 and 10 μm. The thick films with starting powders from coprecipitation method are denser with smaller grain size rather than those with starting powders from solid state reactions. This work reveals the feasibility of fabrication of thick hexaferrite films with a simple and effective method for next generation of self-biased planar microwave devices. Thick Film SrFe12O19 Barium Hexaferrite Strontium Hexaferrite Intrinsic Coercivity Yousefi, Mohammad H. aut Rozatian, Amir S. H. aut Enthalten in Journal of materials science / Materials in electronics Springer US, 1990 24(2012), 5 vom: 11. Nov., Seite 1617-1623 (DE-627)130863289 (DE-600)1030929-9 (DE-576)023106719 0957-4522 nnns volume:24 year:2012 number:5 day:11 month:11 pages:1617-1623 https://doi.org/10.1007/s10854-012-0985-1 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_30 GBV_ILN_32 GBV_ILN_40 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2015 GBV_ILN_4046 GBV_ILN_4305 GBV_ILN_4323 AR 24 2012 5 11 11 1617-1623 |
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10.1007/s10854-012-0985-1 doi (DE-627)OLC2026268185 (DE-He213)s10854-012-0985-1-p DE-627 ger DE-627 rakwb eng 600 670 620 VZ Kiani, Esmail verfasserin aut Microstructural and magnetic properties of self-biased strontium hexaferrite thick films by two-step sintering 2012 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media New York 2012 Abstract $ SrFe_{12} $$ O_{19} $ hexaferrite thick films were prepared by tape casting method followed by a two-step sintering process. X-Ray diffractometer, field emission scanning electron microscope and vibrating sample magnetometer were used to investigate the microstructure and magnetic properties of samples. Results show that high density films with nanocrystalline grains, high crystallographic c-axis orientation of crystals perpendicular to the film plane with high squareness (Mr/Ms = 0.93) and moderate coercivity (Hc = 3,750 Oe) can be obtained with two-step sintering. Grains growth is controllable by this sintering method. The average grain size of the films strongly depends on final stage of sintering and quality of starting powders and ranging between 0.5 and 10 μm. The thick films with starting powders from coprecipitation method are denser with smaller grain size rather than those with starting powders from solid state reactions. This work reveals the feasibility of fabrication of thick hexaferrite films with a simple and effective method for next generation of self-biased planar microwave devices. Thick Film SrFe12O19 Barium Hexaferrite Strontium Hexaferrite Intrinsic Coercivity Yousefi, Mohammad H. aut Rozatian, Amir S. H. aut Enthalten in Journal of materials science / Materials in electronics Springer US, 1990 24(2012), 5 vom: 11. Nov., Seite 1617-1623 (DE-627)130863289 (DE-600)1030929-9 (DE-576)023106719 0957-4522 nnns volume:24 year:2012 number:5 day:11 month:11 pages:1617-1623 https://doi.org/10.1007/s10854-012-0985-1 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_30 GBV_ILN_32 GBV_ILN_40 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2005 GBV_ILN_2015 GBV_ILN_4046 GBV_ILN_4305 GBV_ILN_4323 AR 24 2012 5 11 11 1617-1623 |
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600 670 620 VZ Microstructural and magnetic properties of self-biased strontium hexaferrite thick films by two-step sintering Thick Film SrFe12O19 Barium Hexaferrite Strontium Hexaferrite Intrinsic Coercivity |
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Microstructural and magnetic properties of self-biased strontium hexaferrite thick films by two-step sintering |
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Microstructural and magnetic properties of self-biased strontium hexaferrite thick films by two-step sintering |
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Kiani, Esmail |
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Journal of materials science / Materials in electronics |
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2012 |
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Kiani, Esmail Yousefi, Mohammad H. Rozatian, Amir S. H. |
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10.1007/s10854-012-0985-1 |
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600 670 620 |
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microstructural and magnetic properties of self-biased strontium hexaferrite thick films by two-step sintering |
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Microstructural and magnetic properties of self-biased strontium hexaferrite thick films by two-step sintering |
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Abstract $ SrFe_{12} $$ O_{19} $ hexaferrite thick films were prepared by tape casting method followed by a two-step sintering process. X-Ray diffractometer, field emission scanning electron microscope and vibrating sample magnetometer were used to investigate the microstructure and magnetic properties of samples. Results show that high density films with nanocrystalline grains, high crystallographic c-axis orientation of crystals perpendicular to the film plane with high squareness (Mr/Ms = 0.93) and moderate coercivity (Hc = 3,750 Oe) can be obtained with two-step sintering. Grains growth is controllable by this sintering method. The average grain size of the films strongly depends on final stage of sintering and quality of starting powders and ranging between 0.5 and 10 μm. The thick films with starting powders from coprecipitation method are denser with smaller grain size rather than those with starting powders from solid state reactions. This work reveals the feasibility of fabrication of thick hexaferrite films with a simple and effective method for next generation of self-biased planar microwave devices. © Springer Science+Business Media New York 2012 |
| abstractGer |
Abstract $ SrFe_{12} $$ O_{19} $ hexaferrite thick films were prepared by tape casting method followed by a two-step sintering process. X-Ray diffractometer, field emission scanning electron microscope and vibrating sample magnetometer were used to investigate the microstructure and magnetic properties of samples. Results show that high density films with nanocrystalline grains, high crystallographic c-axis orientation of crystals perpendicular to the film plane with high squareness (Mr/Ms = 0.93) and moderate coercivity (Hc = 3,750 Oe) can be obtained with two-step sintering. Grains growth is controllable by this sintering method. The average grain size of the films strongly depends on final stage of sintering and quality of starting powders and ranging between 0.5 and 10 μm. The thick films with starting powders from coprecipitation method are denser with smaller grain size rather than those with starting powders from solid state reactions. This work reveals the feasibility of fabrication of thick hexaferrite films with a simple and effective method for next generation of self-biased planar microwave devices. © Springer Science+Business Media New York 2012 |
| abstract_unstemmed |
Abstract $ SrFe_{12} $$ O_{19} $ hexaferrite thick films were prepared by tape casting method followed by a two-step sintering process. X-Ray diffractometer, field emission scanning electron microscope and vibrating sample magnetometer were used to investigate the microstructure and magnetic properties of samples. Results show that high density films with nanocrystalline grains, high crystallographic c-axis orientation of crystals perpendicular to the film plane with high squareness (Mr/Ms = 0.93) and moderate coercivity (Hc = 3,750 Oe) can be obtained with two-step sintering. Grains growth is controllable by this sintering method. The average grain size of the films strongly depends on final stage of sintering and quality of starting powders and ranging between 0.5 and 10 μm. The thick films with starting powders from coprecipitation method are denser with smaller grain size rather than those with starting powders from solid state reactions. This work reveals the feasibility of fabrication of thick hexaferrite films with a simple and effective method for next generation of self-biased planar microwave devices. © Springer Science+Business Media New York 2012 |
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Microstructural and magnetic properties of self-biased strontium hexaferrite thick films by two-step sintering |
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