Surface modification and enhanced multiferroic behavior of $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ films with different thickness over Pt(111)/Ti/$ SiO_{2} $/Si substrate
Abstract Polycrystalline $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ thin films have been fabricated via a chemical deposition technique at various thicknesses (60-, 130-, 190-, 240 nm). The effect of Cr substitution on $ BiFeO_{3} $ structures have been briefly discussed by performing X-ray diffraction a...
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| Autor*in: |
William, R. V. [verfasserIn] |
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| Format: |
Artikel |
|---|---|
| Sprache: |
Englisch |
| Erschienen: |
2017 |
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| Anmerkung: |
© Springer Science+Business Media, LLC, part of Springer Nature 2017 |
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| Übergeordnetes Werk: |
Enthalten in: Journal of materials science / Materials in electronics - Springer US, 1990, 29(2017), 6 vom: 07. Dez., Seite 4457-4465 |
|---|---|
| Übergeordnetes Werk: |
volume:29 ; year:2017 ; number:6 ; day:07 ; month:12 ; pages:4457-4465 |
| Links: |
|---|
| DOI / URN: |
10.1007/s10854-017-8393-1 |
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OLC2026342172 |
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| 520 | |a Abstract Polycrystalline $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ thin films have been fabricated via a chemical deposition technique at various thicknesses (60-, 130-, 190-, 240 nm). The effect of Cr substitution on $ BiFeO_{3} $ structures have been briefly discussed by performing X-ray diffraction and SAED pattern. The nature of the films surface at different thicknesses were briefly discussed using scanning electron microscope and transmission electron microscope. Roughness and other amplitude parameters of the film at different thickness are studied through atomic force microscopy. The result indicates that, when changing the thickness of the film, the average bond length gets changed causing difference in electrical and magnetic properties. Electrical and dielectric study reveals thickness dependent property and is deeply understood from space charge, oxygen vacancies and super-exchange interaction. Film at 60 nm shows higher magnetization with 8.5042 emu/$ cm^{3} $ and with a retentivity of 3.852 emu/$ cm^{3} $ than the thick film. Further, the spin-cooling behavior and magnetization below room temperature from 2 to 300 K were analyzed briefly for spintronics applications. | ||
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10.1007/s10854-017-8393-1 doi (DE-627)OLC2026342172 (DE-He213)s10854-017-8393-1-p DE-627 ger DE-627 rakwb eng 600 670 620 VZ William, R. V. verfasserin (orcid)0000-0002-2835-8894 aut Surface modification and enhanced multiferroic behavior of $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ films with different thickness over Pt(111)/Ti/$ SiO_{2} $/Si substrate 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC, part of Springer Nature 2017 Abstract Polycrystalline $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ thin films have been fabricated via a chemical deposition technique at various thicknesses (60-, 130-, 190-, 240 nm). The effect of Cr substitution on $ BiFeO_{3} $ structures have been briefly discussed by performing X-ray diffraction and SAED pattern. The nature of the films surface at different thicknesses were briefly discussed using scanning electron microscope and transmission electron microscope. Roughness and other amplitude parameters of the film at different thickness are studied through atomic force microscopy. The result indicates that, when changing the thickness of the film, the average bond length gets changed causing difference in electrical and magnetic properties. Electrical and dielectric study reveals thickness dependent property and is deeply understood from space charge, oxygen vacancies and super-exchange interaction. Film at 60 nm shows higher magnetization with 8.5042 emu/$ cm^{3} $ and with a retentivity of 3.852 emu/$ cm^{3} $ than the thick film. Further, the spin-cooling behavior and magnetization below room temperature from 2 to 300 K were analyzed briefly for spintronics applications. Sivaprakash, P. aut Marikani, A. aut Raghavendra Reddy, V. aut Arumugam, S. aut Enthalten in Journal of materials science / Materials in electronics Springer US, 1990 29(2017), 6 vom: 07. Dez., Seite 4457-4465 (DE-627)130863289 (DE-600)1030929-9 (DE-576)023106719 0957-4522 nnns volume:29 year:2017 number:6 day:07 month:12 pages:4457-4465 https://doi.org/10.1007/s10854-017-8393-1 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_30 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2015 GBV_ILN_4046 GBV_ILN_4323 AR 29 2017 6 07 12 4457-4465 |
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10.1007/s10854-017-8393-1 doi (DE-627)OLC2026342172 (DE-He213)s10854-017-8393-1-p DE-627 ger DE-627 rakwb eng 600 670 620 VZ William, R. V. verfasserin (orcid)0000-0002-2835-8894 aut Surface modification and enhanced multiferroic behavior of $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ films with different thickness over Pt(111)/Ti/$ SiO_{2} $/Si substrate 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC, part of Springer Nature 2017 Abstract Polycrystalline $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ thin films have been fabricated via a chemical deposition technique at various thicknesses (60-, 130-, 190-, 240 nm). The effect of Cr substitution on $ BiFeO_{3} $ structures have been briefly discussed by performing X-ray diffraction and SAED pattern. The nature of the films surface at different thicknesses were briefly discussed using scanning electron microscope and transmission electron microscope. Roughness and other amplitude parameters of the film at different thickness are studied through atomic force microscopy. The result indicates that, when changing the thickness of the film, the average bond length gets changed causing difference in electrical and magnetic properties. Electrical and dielectric study reveals thickness dependent property and is deeply understood from space charge, oxygen vacancies and super-exchange interaction. Film at 60 nm shows higher magnetization with 8.5042 emu/$ cm^{3} $ and with a retentivity of 3.852 emu/$ cm^{3} $ than the thick film. Further, the spin-cooling behavior and magnetization below room temperature from 2 to 300 K were analyzed briefly for spintronics applications. Sivaprakash, P. aut Marikani, A. aut Raghavendra Reddy, V. aut Arumugam, S. aut Enthalten in Journal of materials science / Materials in electronics Springer US, 1990 29(2017), 6 vom: 07. Dez., Seite 4457-4465 (DE-627)130863289 (DE-600)1030929-9 (DE-576)023106719 0957-4522 nnns volume:29 year:2017 number:6 day:07 month:12 pages:4457-4465 https://doi.org/10.1007/s10854-017-8393-1 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_30 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2015 GBV_ILN_4046 GBV_ILN_4323 AR 29 2017 6 07 12 4457-4465 |
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10.1007/s10854-017-8393-1 doi (DE-627)OLC2026342172 (DE-He213)s10854-017-8393-1-p DE-627 ger DE-627 rakwb eng 600 670 620 VZ William, R. V. verfasserin (orcid)0000-0002-2835-8894 aut Surface modification and enhanced multiferroic behavior of $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ films with different thickness over Pt(111)/Ti/$ SiO_{2} $/Si substrate 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC, part of Springer Nature 2017 Abstract Polycrystalline $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ thin films have been fabricated via a chemical deposition technique at various thicknesses (60-, 130-, 190-, 240 nm). The effect of Cr substitution on $ BiFeO_{3} $ structures have been briefly discussed by performing X-ray diffraction and SAED pattern. The nature of the films surface at different thicknesses were briefly discussed using scanning electron microscope and transmission electron microscope. Roughness and other amplitude parameters of the film at different thickness are studied through atomic force microscopy. The result indicates that, when changing the thickness of the film, the average bond length gets changed causing difference in electrical and magnetic properties. Electrical and dielectric study reveals thickness dependent property and is deeply understood from space charge, oxygen vacancies and super-exchange interaction. Film at 60 nm shows higher magnetization with 8.5042 emu/$ cm^{3} $ and with a retentivity of 3.852 emu/$ cm^{3} $ than the thick film. Further, the spin-cooling behavior and magnetization below room temperature from 2 to 300 K were analyzed briefly for spintronics applications. Sivaprakash, P. aut Marikani, A. aut Raghavendra Reddy, V. aut Arumugam, S. aut Enthalten in Journal of materials science / Materials in electronics Springer US, 1990 29(2017), 6 vom: 07. Dez., Seite 4457-4465 (DE-627)130863289 (DE-600)1030929-9 (DE-576)023106719 0957-4522 nnns volume:29 year:2017 number:6 day:07 month:12 pages:4457-4465 https://doi.org/10.1007/s10854-017-8393-1 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_30 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2015 GBV_ILN_4046 GBV_ILN_4323 AR 29 2017 6 07 12 4457-4465 |
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10.1007/s10854-017-8393-1 doi (DE-627)OLC2026342172 (DE-He213)s10854-017-8393-1-p DE-627 ger DE-627 rakwb eng 600 670 620 VZ William, R. V. verfasserin (orcid)0000-0002-2835-8894 aut Surface modification and enhanced multiferroic behavior of $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ films with different thickness over Pt(111)/Ti/$ SiO_{2} $/Si substrate 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC, part of Springer Nature 2017 Abstract Polycrystalline $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ thin films have been fabricated via a chemical deposition technique at various thicknesses (60-, 130-, 190-, 240 nm). The effect of Cr substitution on $ BiFeO_{3} $ structures have been briefly discussed by performing X-ray diffraction and SAED pattern. The nature of the films surface at different thicknesses were briefly discussed using scanning electron microscope and transmission electron microscope. Roughness and other amplitude parameters of the film at different thickness are studied through atomic force microscopy. The result indicates that, when changing the thickness of the film, the average bond length gets changed causing difference in electrical and magnetic properties. Electrical and dielectric study reveals thickness dependent property and is deeply understood from space charge, oxygen vacancies and super-exchange interaction. Film at 60 nm shows higher magnetization with 8.5042 emu/$ cm^{3} $ and with a retentivity of 3.852 emu/$ cm^{3} $ than the thick film. Further, the spin-cooling behavior and magnetization below room temperature from 2 to 300 K were analyzed briefly for spintronics applications. Sivaprakash, P. aut Marikani, A. aut Raghavendra Reddy, V. aut Arumugam, S. aut Enthalten in Journal of materials science / Materials in electronics Springer US, 1990 29(2017), 6 vom: 07. Dez., Seite 4457-4465 (DE-627)130863289 (DE-600)1030929-9 (DE-576)023106719 0957-4522 nnns volume:29 year:2017 number:6 day:07 month:12 pages:4457-4465 https://doi.org/10.1007/s10854-017-8393-1 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_30 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2015 GBV_ILN_4046 GBV_ILN_4323 AR 29 2017 6 07 12 4457-4465 |
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10.1007/s10854-017-8393-1 doi (DE-627)OLC2026342172 (DE-He213)s10854-017-8393-1-p DE-627 ger DE-627 rakwb eng 600 670 620 VZ William, R. V. verfasserin (orcid)0000-0002-2835-8894 aut Surface modification and enhanced multiferroic behavior of $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ films with different thickness over Pt(111)/Ti/$ SiO_{2} $/Si substrate 2017 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC, part of Springer Nature 2017 Abstract Polycrystalline $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ thin films have been fabricated via a chemical deposition technique at various thicknesses (60-, 130-, 190-, 240 nm). The effect of Cr substitution on $ BiFeO_{3} $ structures have been briefly discussed by performing X-ray diffraction and SAED pattern. The nature of the films surface at different thicknesses were briefly discussed using scanning electron microscope and transmission electron microscope. Roughness and other amplitude parameters of the film at different thickness are studied through atomic force microscopy. The result indicates that, when changing the thickness of the film, the average bond length gets changed causing difference in electrical and magnetic properties. Electrical and dielectric study reveals thickness dependent property and is deeply understood from space charge, oxygen vacancies and super-exchange interaction. Film at 60 nm shows higher magnetization with 8.5042 emu/$ cm^{3} $ and with a retentivity of 3.852 emu/$ cm^{3} $ than the thick film. Further, the spin-cooling behavior and magnetization below room temperature from 2 to 300 K were analyzed briefly for spintronics applications. Sivaprakash, P. aut Marikani, A. aut Raghavendra Reddy, V. aut Arumugam, S. aut Enthalten in Journal of materials science / Materials in electronics Springer US, 1990 29(2017), 6 vom: 07. Dez., Seite 4457-4465 (DE-627)130863289 (DE-600)1030929-9 (DE-576)023106719 0957-4522 nnns volume:29 year:2017 number:6 day:07 month:12 pages:4457-4465 https://doi.org/10.1007/s10854-017-8393-1 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_30 GBV_ILN_70 GBV_ILN_2004 GBV_ILN_2015 GBV_ILN_4046 GBV_ILN_4323 AR 29 2017 6 07 12 4457-4465 |
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Surface modification and enhanced multiferroic behavior of $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ films with different thickness over Pt(111)/Ti/$ SiO_{2} $/Si substrate |
| ctrlnum |
(DE-627)OLC2026342172 (DE-He213)s10854-017-8393-1-p |
| title_full |
Surface modification and enhanced multiferroic behavior of $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ films with different thickness over Pt(111)/Ti/$ SiO_{2} $/Si substrate |
| author_sort |
William, R. V. |
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Journal of materials science / Materials in electronics |
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Journal of materials science / Materials in electronics |
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eng |
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600 - Technology |
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marc |
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2017 |
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4457 |
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William, R. V. Sivaprakash, P. Marikani, A. Raghavendra Reddy, V. Arumugam, S. |
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29 |
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600 670 620 VZ |
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William, R. V. |
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10.1007/s10854-017-8393-1 |
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(ORCID)0000-0002-2835-8894 |
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(orcid)0000-0002-2835-8894 |
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600 670 620 |
| title_sort |
surface modification and enhanced multiferroic behavior of $ bife_{0.25} $$ cr_{0.75} $$ o_{3} $ films with different thickness over pt(111)/ti/$ sio_{2} $/si substrate |
| title_auth |
Surface modification and enhanced multiferroic behavior of $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ films with different thickness over Pt(111)/Ti/$ SiO_{2} $/Si substrate |
| abstract |
Abstract Polycrystalline $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ thin films have been fabricated via a chemical deposition technique at various thicknesses (60-, 130-, 190-, 240 nm). The effect of Cr substitution on $ BiFeO_{3} $ structures have been briefly discussed by performing X-ray diffraction and SAED pattern. The nature of the films surface at different thicknesses were briefly discussed using scanning electron microscope and transmission electron microscope. Roughness and other amplitude parameters of the film at different thickness are studied through atomic force microscopy. The result indicates that, when changing the thickness of the film, the average bond length gets changed causing difference in electrical and magnetic properties. Electrical and dielectric study reveals thickness dependent property and is deeply understood from space charge, oxygen vacancies and super-exchange interaction. Film at 60 nm shows higher magnetization with 8.5042 emu/$ cm^{3} $ and with a retentivity of 3.852 emu/$ cm^{3} $ than the thick film. Further, the spin-cooling behavior and magnetization below room temperature from 2 to 300 K were analyzed briefly for spintronics applications. © Springer Science+Business Media, LLC, part of Springer Nature 2017 |
| abstractGer |
Abstract Polycrystalline $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ thin films have been fabricated via a chemical deposition technique at various thicknesses (60-, 130-, 190-, 240 nm). The effect of Cr substitution on $ BiFeO_{3} $ structures have been briefly discussed by performing X-ray diffraction and SAED pattern. The nature of the films surface at different thicknesses were briefly discussed using scanning electron microscope and transmission electron microscope. Roughness and other amplitude parameters of the film at different thickness are studied through atomic force microscopy. The result indicates that, when changing the thickness of the film, the average bond length gets changed causing difference in electrical and magnetic properties. Electrical and dielectric study reveals thickness dependent property and is deeply understood from space charge, oxygen vacancies and super-exchange interaction. Film at 60 nm shows higher magnetization with 8.5042 emu/$ cm^{3} $ and with a retentivity of 3.852 emu/$ cm^{3} $ than the thick film. Further, the spin-cooling behavior and magnetization below room temperature from 2 to 300 K were analyzed briefly for spintronics applications. © Springer Science+Business Media, LLC, part of Springer Nature 2017 |
| abstract_unstemmed |
Abstract Polycrystalline $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ thin films have been fabricated via a chemical deposition technique at various thicknesses (60-, 130-, 190-, 240 nm). The effect of Cr substitution on $ BiFeO_{3} $ structures have been briefly discussed by performing X-ray diffraction and SAED pattern. The nature of the films surface at different thicknesses were briefly discussed using scanning electron microscope and transmission electron microscope. Roughness and other amplitude parameters of the film at different thickness are studied through atomic force microscopy. The result indicates that, when changing the thickness of the film, the average bond length gets changed causing difference in electrical and magnetic properties. Electrical and dielectric study reveals thickness dependent property and is deeply understood from space charge, oxygen vacancies and super-exchange interaction. Film at 60 nm shows higher magnetization with 8.5042 emu/$ cm^{3} $ and with a retentivity of 3.852 emu/$ cm^{3} $ than the thick film. Further, the spin-cooling behavior and magnetization below room temperature from 2 to 300 K were analyzed briefly for spintronics applications. © Springer Science+Business Media, LLC, part of Springer Nature 2017 |
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6 |
| title_short |
Surface modification and enhanced multiferroic behavior of $ BiFe_{0.25} $$ Cr_{0.75} $$ O_{3} $ films with different thickness over Pt(111)/Ti/$ SiO_{2} $/Si substrate |
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https://doi.org/10.1007/s10854-017-8393-1 |
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Sivaprakash, P. Marikani, A. Raghavendra Reddy, V. Arumugam, S. |
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| up_date |
2024-07-04T03:44:12.461Z |
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