Phenomenon of Frustrated Total Internal Reflection in the Near-Field Interference Microwave Sounding
A new approach is proposed in solving the problems of active near-field microwave probing of materials, objects and media. According to this approach, the probing near field is formed as a result of overlapping of the evanescent fields generating under the conditions of a frustrated total internal r...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Belichenko, V. P. [verfasserIn] |
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| Format: |
Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2020 |
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| Schlagwörter: |
frustrated total internal reflection |
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| Anmerkung: |
© Springer Science+Business Media, LLC, part of Springer Nature 2020 |
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| Übergeordnetes Werk: |
Enthalten in: Russian physics journal - Springer US, 1992, 63(2020), 2 vom: Juni, Seite 231-237 |
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| Übergeordnetes Werk: |
volume:63 ; year:2020 ; number:2 ; month:06 ; pages:231-237 |
| Links: |
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| DOI / URN: |
10.1007/s11182-020-02025-3 |
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OLC2033098184 |
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| 520 | |a A new approach is proposed in solving the problems of active near-field microwave probing of materials, objects and media. According to this approach, the probing near field is formed as a result of overlapping of the evanescent fields generating under the conditions of a frustrated total internal reflection in the gap between the major faces of two right-angle dielectric prisms. An object under study placed into this gap exerts a noticeable influence on the reflected radiation characteristics. On this basis, one can not only perform the object quality diagnostics, but also obtain the data on its material parameters. A schematic design of a nearfield interference microwave microscope is described, which implements the proposed approach. The results of test measurements under the conditions of diagnostics of metalized strips with breaks are presented. | ||
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10.1007/s11182-020-02025-3 doi (DE-627)OLC2033098184 (DE-He213)s11182-020-02025-3-p DE-627 ger DE-627 rakwb eng 530 370 VZ Belichenko, V. P. verfasserin aut Phenomenon of Frustrated Total Internal Reflection in the Near-Field Interference Microwave Sounding 2020 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC, part of Springer Nature 2020 A new approach is proposed in solving the problems of active near-field microwave probing of materials, objects and media. According to this approach, the probing near field is formed as a result of overlapping of the evanescent fields generating under the conditions of a frustrated total internal reflection in the gap between the major faces of two right-angle dielectric prisms. An object under study placed into this gap exerts a noticeable influence on the reflected radiation characteristics. On this basis, one can not only perform the object quality diagnostics, but also obtain the data on its material parameters. A schematic design of a nearfield interference microwave microscope is described, which implements the proposed approach. The results of test measurements under the conditions of diagnostics of metalized strips with breaks are presented. near field frustrated total internal reflection near-field interference microwave microscope diagnostics Zapasnoy, A. S. aut Miron’chev, A. S. aut Klokov, A. V. aut Matvievskiy, E. V. aut Enthalten in Russian physics journal Springer US, 1992 63(2020), 2 vom: Juni, Seite 231-237 (DE-627)131169718 (DE-600)1138228-4 (DE-576)033029253 1064-8887 nnns volume:63 year:2020 number:2 month:06 pages:231-237 https://doi.org/10.1007/s11182-020-02025-3 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY AR 63 2020 2 06 231-237 |
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10.1007/s11182-020-02025-3 doi (DE-627)OLC2033098184 (DE-He213)s11182-020-02025-3-p DE-627 ger DE-627 rakwb eng 530 370 VZ Belichenko, V. P. verfasserin aut Phenomenon of Frustrated Total Internal Reflection in the Near-Field Interference Microwave Sounding 2020 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC, part of Springer Nature 2020 A new approach is proposed in solving the problems of active near-field microwave probing of materials, objects and media. According to this approach, the probing near field is formed as a result of overlapping of the evanescent fields generating under the conditions of a frustrated total internal reflection in the gap between the major faces of two right-angle dielectric prisms. An object under study placed into this gap exerts a noticeable influence on the reflected radiation characteristics. On this basis, one can not only perform the object quality diagnostics, but also obtain the data on its material parameters. A schematic design of a nearfield interference microwave microscope is described, which implements the proposed approach. The results of test measurements under the conditions of diagnostics of metalized strips with breaks are presented. near field frustrated total internal reflection near-field interference microwave microscope diagnostics Zapasnoy, A. S. aut Miron’chev, A. S. aut Klokov, A. V. aut Matvievskiy, E. V. aut Enthalten in Russian physics journal Springer US, 1992 63(2020), 2 vom: Juni, Seite 231-237 (DE-627)131169718 (DE-600)1138228-4 (DE-576)033029253 1064-8887 nnns volume:63 year:2020 number:2 month:06 pages:231-237 https://doi.org/10.1007/s11182-020-02025-3 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY AR 63 2020 2 06 231-237 |
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10.1007/s11182-020-02025-3 doi (DE-627)OLC2033098184 (DE-He213)s11182-020-02025-3-p DE-627 ger DE-627 rakwb eng 530 370 VZ Belichenko, V. P. verfasserin aut Phenomenon of Frustrated Total Internal Reflection in the Near-Field Interference Microwave Sounding 2020 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC, part of Springer Nature 2020 A new approach is proposed in solving the problems of active near-field microwave probing of materials, objects and media. According to this approach, the probing near field is formed as a result of overlapping of the evanescent fields generating under the conditions of a frustrated total internal reflection in the gap between the major faces of two right-angle dielectric prisms. An object under study placed into this gap exerts a noticeable influence on the reflected radiation characteristics. On this basis, one can not only perform the object quality diagnostics, but also obtain the data on its material parameters. A schematic design of a nearfield interference microwave microscope is described, which implements the proposed approach. The results of test measurements under the conditions of diagnostics of metalized strips with breaks are presented. near field frustrated total internal reflection near-field interference microwave microscope diagnostics Zapasnoy, A. S. aut Miron’chev, A. S. aut Klokov, A. V. aut Matvievskiy, E. V. aut Enthalten in Russian physics journal Springer US, 1992 63(2020), 2 vom: Juni, Seite 231-237 (DE-627)131169718 (DE-600)1138228-4 (DE-576)033029253 1064-8887 nnns volume:63 year:2020 number:2 month:06 pages:231-237 https://doi.org/10.1007/s11182-020-02025-3 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY AR 63 2020 2 06 231-237 |
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10.1007/s11182-020-02025-3 doi (DE-627)OLC2033098184 (DE-He213)s11182-020-02025-3-p DE-627 ger DE-627 rakwb eng 530 370 VZ Belichenko, V. P. verfasserin aut Phenomenon of Frustrated Total Internal Reflection in the Near-Field Interference Microwave Sounding 2020 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC, part of Springer Nature 2020 A new approach is proposed in solving the problems of active near-field microwave probing of materials, objects and media. According to this approach, the probing near field is formed as a result of overlapping of the evanescent fields generating under the conditions of a frustrated total internal reflection in the gap between the major faces of two right-angle dielectric prisms. An object under study placed into this gap exerts a noticeable influence on the reflected radiation characteristics. On this basis, one can not only perform the object quality diagnostics, but also obtain the data on its material parameters. A schematic design of a nearfield interference microwave microscope is described, which implements the proposed approach. The results of test measurements under the conditions of diagnostics of metalized strips with breaks are presented. near field frustrated total internal reflection near-field interference microwave microscope diagnostics Zapasnoy, A. S. aut Miron’chev, A. S. aut Klokov, A. V. aut Matvievskiy, E. V. aut Enthalten in Russian physics journal Springer US, 1992 63(2020), 2 vom: Juni, Seite 231-237 (DE-627)131169718 (DE-600)1138228-4 (DE-576)033029253 1064-8887 nnns volume:63 year:2020 number:2 month:06 pages:231-237 https://doi.org/10.1007/s11182-020-02025-3 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY AR 63 2020 2 06 231-237 |
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10.1007/s11182-020-02025-3 doi (DE-627)OLC2033098184 (DE-He213)s11182-020-02025-3-p DE-627 ger DE-627 rakwb eng 530 370 VZ Belichenko, V. P. verfasserin aut Phenomenon of Frustrated Total Internal Reflection in the Near-Field Interference Microwave Sounding 2020 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC, part of Springer Nature 2020 A new approach is proposed in solving the problems of active near-field microwave probing of materials, objects and media. According to this approach, the probing near field is formed as a result of overlapping of the evanescent fields generating under the conditions of a frustrated total internal reflection in the gap between the major faces of two right-angle dielectric prisms. An object under study placed into this gap exerts a noticeable influence on the reflected radiation characteristics. On this basis, one can not only perform the object quality diagnostics, but also obtain the data on its material parameters. A schematic design of a nearfield interference microwave microscope is described, which implements the proposed approach. The results of test measurements under the conditions of diagnostics of metalized strips with breaks are presented. near field frustrated total internal reflection near-field interference microwave microscope diagnostics Zapasnoy, A. S. aut Miron’chev, A. S. aut Klokov, A. V. aut Matvievskiy, E. V. aut Enthalten in Russian physics journal Springer US, 1992 63(2020), 2 vom: Juni, Seite 231-237 (DE-627)131169718 (DE-600)1138228-4 (DE-576)033029253 1064-8887 nnns volume:63 year:2020 number:2 month:06 pages:231-237 https://doi.org/10.1007/s11182-020-02025-3 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY AR 63 2020 2 06 231-237 |
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A new approach is proposed in solving the problems of active near-field microwave probing of materials, objects and media. According to this approach, the probing near field is formed as a result of overlapping of the evanescent fields generating under the conditions of a frustrated total internal reflection in the gap between the major faces of two right-angle dielectric prisms. An object under study placed into this gap exerts a noticeable influence on the reflected radiation characteristics. On this basis, one can not only perform the object quality diagnostics, but also obtain the data on its material parameters. A schematic design of a nearfield interference microwave microscope is described, which implements the proposed approach. The results of test measurements under the conditions of diagnostics of metalized strips with breaks are presented. © Springer Science+Business Media, LLC, part of Springer Nature 2020 |
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A new approach is proposed in solving the problems of active near-field microwave probing of materials, objects and media. According to this approach, the probing near field is formed as a result of overlapping of the evanescent fields generating under the conditions of a frustrated total internal reflection in the gap between the major faces of two right-angle dielectric prisms. An object under study placed into this gap exerts a noticeable influence on the reflected radiation characteristics. On this basis, one can not only perform the object quality diagnostics, but also obtain the data on its material parameters. A schematic design of a nearfield interference microwave microscope is described, which implements the proposed approach. The results of test measurements under the conditions of diagnostics of metalized strips with breaks are presented. © Springer Science+Business Media, LLC, part of Springer Nature 2020 |
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A new approach is proposed in solving the problems of active near-field microwave probing of materials, objects and media. According to this approach, the probing near field is formed as a result of overlapping of the evanescent fields generating under the conditions of a frustrated total internal reflection in the gap between the major faces of two right-angle dielectric prisms. An object under study placed into this gap exerts a noticeable influence on the reflected radiation characteristics. On this basis, one can not only perform the object quality diagnostics, but also obtain the data on its material parameters. A schematic design of a nearfield interference microwave microscope is described, which implements the proposed approach. The results of test measurements under the conditions of diagnostics of metalized strips with breaks are presented. © Springer Science+Business Media, LLC, part of Springer Nature 2020 |
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<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC2033098184</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230504154608.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">200819s2020 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/s11182-020-02025-3</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC2033098184</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-He213)s11182-020-02025-3-p</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">530</subfield><subfield code="a">370</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Belichenko, V. P.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Phenomenon of Frustrated Total Internal Reflection in the Near-Field Interference Microwave Sounding</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2020</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© Springer Science+Business Media, LLC, part of Springer Nature 2020</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">A new approach is proposed in solving the problems of active near-field microwave probing of materials, objects and media. 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