Issues in measuring the degree of technological specialisation with patent data
Summary This paper analyses several issues that arise when measuring technological specialisation with patent data. Three starting choices are required regarding the data source, the statistical measure and the sectoral aggregation level. We show that the measure is highly sensitive to the data sour...
Ausführliche Beschreibung
Autor*in: |
van Zeebroeck, Nicolas [verfasserIn] |
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Format: |
Artikel |
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Sprache: |
Englisch |
Erschienen: |
2006 |
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Schlagwörter: |
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Anmerkung: |
© Springer-Verlag/Akadémiai Kiadó 2006 |
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Übergeordnetes Werk: |
Enthalten in: Scientometrics - Springer Netherlands, 1978, 66(2006), 3 vom: März, Seite 481-492 |
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Übergeordnetes Werk: |
volume:66 ; year:2006 ; number:3 ; month:03 ; pages:481-492 |
Links: |
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DOI / URN: |
10.1007/s11192-006-0035-y |
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Katalog-ID: |
OLC2033187292 |
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10.1007/s11192-006-0035-y doi (DE-627)OLC2033187292 (DE-He213)s11192-006-0035-y-p DE-627 ger DE-627 rakwb eng 050 370 VZ 11 ssgn van Zeebroeck, Nicolas verfasserin aut Issues in measuring the degree of technological specialisation with patent data 2006 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer-Verlag/Akadémiai Kiadó 2006 Summary This paper analyses several issues that arise when measuring technological specialisation with patent data. Three starting choices are required regarding the data source, the statistical measure and the sectoral aggregation level. We show that the measure is highly sensitive to the data source and to the level of sectoral aggregation. The statistical analysis further suggests that the most stable and reliable measures of technological specialization are obtained with patents applied at the EPO, with Gini or C20 as statistical measure and the 4-digits aggregation level of the IPC classification system. Concentration Index Aggregation Level European Patent Office Patent Data International Patent Classification van Pottelsberghe de la Potterie, Bruno aut Han, Wook aut Enthalten in Scientometrics Springer Netherlands, 1978 66(2006), 3 vom: März, Seite 481-492 (DE-627)13005352X (DE-600)435652-4 (DE-576)015591697 0138-9130 nnns volume:66 year:2006 number:3 month:03 pages:481-492 https://doi.org/10.1007/s11192-006-0035-y lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-BUB SSG-OLC-HSW SSG-OPC-BBI GBV_ILN_11 GBV_ILN_22 GBV_ILN_40 GBV_ILN_754 GBV_ILN_2010 GBV_ILN_4012 GBV_ILN_4193 GBV_ILN_4318 AR 66 2006 3 03 481-492 |
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10.1007/s11192-006-0035-y doi (DE-627)OLC2033187292 (DE-He213)s11192-006-0035-y-p DE-627 ger DE-627 rakwb eng 050 370 VZ 11 ssgn van Zeebroeck, Nicolas verfasserin aut Issues in measuring the degree of technological specialisation with patent data 2006 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer-Verlag/Akadémiai Kiadó 2006 Summary This paper analyses several issues that arise when measuring technological specialisation with patent data. Three starting choices are required regarding the data source, the statistical measure and the sectoral aggregation level. We show that the measure is highly sensitive to the data source and to the level of sectoral aggregation. The statistical analysis further suggests that the most stable and reliable measures of technological specialization are obtained with patents applied at the EPO, with Gini or C20 as statistical measure and the 4-digits aggregation level of the IPC classification system. Concentration Index Aggregation Level European Patent Office Patent Data International Patent Classification van Pottelsberghe de la Potterie, Bruno aut Han, Wook aut Enthalten in Scientometrics Springer Netherlands, 1978 66(2006), 3 vom: März, Seite 481-492 (DE-627)13005352X (DE-600)435652-4 (DE-576)015591697 0138-9130 nnns volume:66 year:2006 number:3 month:03 pages:481-492 https://doi.org/10.1007/s11192-006-0035-y lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-BUB SSG-OLC-HSW SSG-OPC-BBI GBV_ILN_11 GBV_ILN_22 GBV_ILN_40 GBV_ILN_754 GBV_ILN_2010 GBV_ILN_4012 GBV_ILN_4193 GBV_ILN_4318 AR 66 2006 3 03 481-492 |
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10.1007/s11192-006-0035-y doi (DE-627)OLC2033187292 (DE-He213)s11192-006-0035-y-p DE-627 ger DE-627 rakwb eng 050 370 VZ 11 ssgn van Zeebroeck, Nicolas verfasserin aut Issues in measuring the degree of technological specialisation with patent data 2006 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer-Verlag/Akadémiai Kiadó 2006 Summary This paper analyses several issues that arise when measuring technological specialisation with patent data. Three starting choices are required regarding the data source, the statistical measure and the sectoral aggregation level. We show that the measure is highly sensitive to the data source and to the level of sectoral aggregation. The statistical analysis further suggests that the most stable and reliable measures of technological specialization are obtained with patents applied at the EPO, with Gini or C20 as statistical measure and the 4-digits aggregation level of the IPC classification system. Concentration Index Aggregation Level European Patent Office Patent Data International Patent Classification van Pottelsberghe de la Potterie, Bruno aut Han, Wook aut Enthalten in Scientometrics Springer Netherlands, 1978 66(2006), 3 vom: März, Seite 481-492 (DE-627)13005352X (DE-600)435652-4 (DE-576)015591697 0138-9130 nnns volume:66 year:2006 number:3 month:03 pages:481-492 https://doi.org/10.1007/s11192-006-0035-y lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-BUB SSG-OLC-HSW SSG-OPC-BBI GBV_ILN_11 GBV_ILN_22 GBV_ILN_40 GBV_ILN_754 GBV_ILN_2010 GBV_ILN_4012 GBV_ILN_4193 GBV_ILN_4318 AR 66 2006 3 03 481-492 |
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Summary This paper analyses several issues that arise when measuring technological specialisation with patent data. Three starting choices are required regarding the data source, the statistical measure and the sectoral aggregation level. We show that the measure is highly sensitive to the data source and to the level of sectoral aggregation. The statistical analysis further suggests that the most stable and reliable measures of technological specialization are obtained with patents applied at the EPO, with Gini or C20 as statistical measure and the 4-digits aggregation level of the IPC classification system. © Springer-Verlag/Akadémiai Kiadó 2006 |
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Summary This paper analyses several issues that arise when measuring technological specialisation with patent data. Three starting choices are required regarding the data source, the statistical measure and the sectoral aggregation level. We show that the measure is highly sensitive to the data source and to the level of sectoral aggregation. The statistical analysis further suggests that the most stable and reliable measures of technological specialization are obtained with patents applied at the EPO, with Gini or C20 as statistical measure and the 4-digits aggregation level of the IPC classification system. © Springer-Verlag/Akadémiai Kiadó 2006 |
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Summary This paper analyses several issues that arise when measuring technological specialisation with patent data. Three starting choices are required regarding the data source, the statistical measure and the sectoral aggregation level. We show that the measure is highly sensitive to the data source and to the level of sectoral aggregation. The statistical analysis further suggests that the most stable and reliable measures of technological specialization are obtained with patents applied at the EPO, with Gini or C20 as statistical measure and the 4-digits aggregation level of the IPC classification system. © Springer-Verlag/Akadémiai Kiadó 2006 |
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<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC2033187292</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230504041619.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">200819s2006 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/s11192-006-0035-y</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC2033187292</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-He213)s11192-006-0035-y-p</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">050</subfield><subfield code="a">370</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">11</subfield><subfield code="2">ssgn</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">van Zeebroeck, Nicolas</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Issues in measuring the degree of technological specialisation with patent data</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2006</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© Springer-Verlag/Akadémiai Kiadó 2006</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Summary This paper analyses several issues that arise when measuring technological specialisation with patent data. Three starting choices are required regarding the data source, the statistical measure and the sectoral aggregation level. We show that the measure is highly sensitive to the data source and to the level of sectoral aggregation. The statistical analysis further suggests that the most stable and reliable measures of technological specialization are obtained with patents applied at the EPO, with Gini or C20 as statistical measure and the 4-digits aggregation level of the IPC classification system.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Concentration Index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Aggregation Level</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">European Patent Office</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Patent Data</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">International Patent Classification</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">van Pottelsberghe de la Potterie, Bruno</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Han, Wook</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Scientometrics</subfield><subfield code="d">Springer Netherlands, 1978</subfield><subfield code="g">66(2006), 3 vom: März, Seite 481-492</subfield><subfield code="w">(DE-627)13005352X</subfield><subfield code="w">(DE-600)435652-4</subfield><subfield code="w">(DE-576)015591697</subfield><subfield code="x">0138-9130</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:66</subfield><subfield code="g">year:2006</subfield><subfield code="g">number:3</subfield><subfield code="g">month:03</subfield><subfield code="g">pages:481-492</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">https://doi.org/10.1007/s11192-006-0035-y</subfield><subfield code="z">lizenzpflichtig</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-BUB</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-HSW</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OPC-BBI</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_11</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_754</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2010</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4012</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4193</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4318</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">66</subfield><subfield code="j">2006</subfield><subfield code="e">3</subfield><subfield code="c">03</subfield><subfield code="h">481-492</subfield></datafield></record></collection>
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