A Technique for the Mass Testing of Single-Sided Microstrip Detectors

Abstract In 1986–2000, the Skobel'tsyn Institute of Nuclear Physics of Moscow State University took part in the development of a tracker for the D0 experiment (FERMILAB, USA) on the basis of microstrip silicon detectors. Using the mass testing of detectors for this experiment as an example, we...
Ausführliche Beschreibung

Gespeichert in:

Autor*in:	Ermolov, P. F. [verfasserIn] Voronin, A. G. Zverev, E. G. Karmanov, D. E. Kuznetsov, E. N. Leflat, A. K. Merkin, M. M. Shabalina, E. K.

Format:	Artikel
Sprache:	Englisch

Erschienen:	2002

Schlagwörter:	Silicon Russia Physical Chemistry Mass Test Silicon Detector

Anmerkung:	© MAIK “Nauka/Interperiodica” 2002

Übergeordnetes Werk:	Enthalten in: Instruments and experimental techniques - Kluwer Academic Publishers-Plenum Publishers, 1959, 45(2002), 2 vom: März, Seite 194-206
Übergeordnetes Werk:	volume:45 ; year:2002 ; number:2 ; month:03 ; pages:194-206

Links:	Volltext

DOI / URN:	10.1023/A:1015308400067

Katalog-ID:	OLC2034137965

Internformat


LEADER	01000caa a22002652 4500
001	OLC2034137965
003	DE-627
005	20230519012127.0
007	tu
008	200819s2002 xx \|\|\|\|\| 00\| \|\|eng c
024	7		\|a 10.1023/A:1015308400067 \|2 doi
035			\|a (DE-627)OLC2034137965
035			\|a (DE-He213)A:1015308400067-p
040			\|a DE-627 \|b ger \|c DE-627 \|e rakwb
041			\|a eng
082	0	4	\|a 620 \|q VZ
084			\|a 11 \|2 ssgn
100	1		\|a Ermolov, P. F. \|e verfasserin \|4 aut
245	1	0	\|a A Technique for the Mass Testing of Single-Sided Microstrip Detectors
264		1	\|c 2002
336			\|a Text \|b txt \|2 rdacontent
337			\|a ohne Hilfsmittel zu benutzen \|b n \|2 rdamedia
338			\|a Band \|b nc \|2 rdacarrier
500			\|a © MAIK “Nauka/Interperiodica” 2002
520			\|a Abstract In 1986–2000, the Skobel'tsyn Institute of Nuclear Physics of Moscow State University took part in the development of a tracker for the D0 experiment (FERMILAB, USA) on the basis of microstrip silicon detectors. Using the mass testing of detectors for this experiment as an example, we describe a technique for testing single-sided microstrip detectors. The experimental results are presented for the detectors produced in Russia during 1998–2000.
650		4	\|a Silicon
650		4	\|a Russia
650		4	\|a Physical Chemistry
650		4	\|a Mass Test
650		4	\|a Silicon Detector
700	1		\|a Voronin, A. G. \|4 aut
700	1		\|a Zverev, E. G. \|4 aut
700	1		\|a Karmanov, D. E. \|4 aut
700	1		\|a Kuznetsov, E. N. \|4 aut
700	1		\|a Leflat, A. K. \|4 aut
700	1		\|a Merkin, M. M. \|4 aut
700	1		\|a Shabalina, E. K. \|4 aut
773	0	8	\|i Enthalten in \|t Instruments and experimental techniques \|d Kluwer Academic Publishers-Plenum Publishers, 1959 \|g 45(2002), 2 vom: März, Seite 194-206 \|w (DE-627)129603007 \|w (DE-600)241643-8 \|w (DE-576)015096815 \|x 0020-4412 \|7 nnns
773	1	8	\|g volume:45 \|g year:2002 \|g number:2 \|g month:03 \|g pages:194-206
856	4	1	\|u https://doi.org/10.1023/A:1015308400067 \|z lizenzpflichtig \|3 Volltext
912			\|a GBV_USEFLAG_A
912			\|a SYSFLAG_A
912			\|a GBV_OLC
912			\|a SSG-OLC-TEC
912			\|a SSG-OLC-PHY
912			\|a SSG-OLC-PHA
912			\|a SSG-OLC-DE-84
912			\|a GBV_ILN_40
912			\|a GBV_ILN_70
912			\|a GBV_ILN_2014
912			\|a GBV_ILN_2015
951			\|a AR
952			\|d 45 \|j 2002 \|e 2 \|c 03 \|h 194-206

Indexfelder

author_variant	p f e pf pfe a g v ag agv e g z eg egz d e k de dek e n k en enk a k l ak akl m m m mm mmm e k s ek eks
matchkey_str	article:00204412:2002----::tcnqeoteasetnosnlsddi
hierarchy_sort_str	2002
publishDate	2002
allfields	10.1023/A:1015308400067 doi (DE-627)OLC2034137965 (DE-He213)A:1015308400067-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Ermolov, P. F. verfasserin aut A Technique for the Mass Testing of Single-Sided Microstrip Detectors 2002 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © MAIK “Nauka/Interperiodica” 2002 Abstract In 1986–2000, the Skobel'tsyn Institute of Nuclear Physics of Moscow State University took part in the development of a tracker for the D0 experiment (FERMILAB, USA) on the basis of microstrip silicon detectors. Using the mass testing of detectors for this experiment as an example, we describe a technique for testing single-sided microstrip detectors. The experimental results are presented for the detectors produced in Russia during 1998–2000. Silicon Russia Physical Chemistry Mass Test Silicon Detector Voronin, A. G. aut Zverev, E. G. aut Karmanov, D. E. aut Kuznetsov, E. N. aut Leflat, A. K. aut Merkin, M. M. aut Shabalina, E. K. aut Enthalten in Instruments and experimental techniques Kluwer Academic Publishers-Plenum Publishers, 1959 45(2002), 2 vom: März, Seite 194-206 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:45 year:2002 number:2 month:03 pages:194-206 https://doi.org/10.1023/A:1015308400067 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_40 GBV_ILN_70 GBV_ILN_2014 GBV_ILN_2015 AR 45 2002 2 03 194-206
spelling	10.1023/A:1015308400067 doi (DE-627)OLC2034137965 (DE-He213)A:1015308400067-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Ermolov, P. F. verfasserin aut A Technique for the Mass Testing of Single-Sided Microstrip Detectors 2002 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © MAIK “Nauka/Interperiodica” 2002 Abstract In 1986–2000, the Skobel'tsyn Institute of Nuclear Physics of Moscow State University took part in the development of a tracker for the D0 experiment (FERMILAB, USA) on the basis of microstrip silicon detectors. Using the mass testing of detectors for this experiment as an example, we describe a technique for testing single-sided microstrip detectors. The experimental results are presented for the detectors produced in Russia during 1998–2000. Silicon Russia Physical Chemistry Mass Test Silicon Detector Voronin, A. G. aut Zverev, E. G. aut Karmanov, D. E. aut Kuznetsov, E. N. aut Leflat, A. K. aut Merkin, M. M. aut Shabalina, E. K. aut Enthalten in Instruments and experimental techniques Kluwer Academic Publishers-Plenum Publishers, 1959 45(2002), 2 vom: März, Seite 194-206 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:45 year:2002 number:2 month:03 pages:194-206 https://doi.org/10.1023/A:1015308400067 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_40 GBV_ILN_70 GBV_ILN_2014 GBV_ILN_2015 AR 45 2002 2 03 194-206
allfields_unstemmed	10.1023/A:1015308400067 doi (DE-627)OLC2034137965 (DE-He213)A:1015308400067-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Ermolov, P. F. verfasserin aut A Technique for the Mass Testing of Single-Sided Microstrip Detectors 2002 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © MAIK “Nauka/Interperiodica” 2002 Abstract In 1986–2000, the Skobel'tsyn Institute of Nuclear Physics of Moscow State University took part in the development of a tracker for the D0 experiment (FERMILAB, USA) on the basis of microstrip silicon detectors. Using the mass testing of detectors for this experiment as an example, we describe a technique for testing single-sided microstrip detectors. The experimental results are presented for the detectors produced in Russia during 1998–2000. Silicon Russia Physical Chemistry Mass Test Silicon Detector Voronin, A. G. aut Zverev, E. G. aut Karmanov, D. E. aut Kuznetsov, E. N. aut Leflat, A. K. aut Merkin, M. M. aut Shabalina, E. K. aut Enthalten in Instruments and experimental techniques Kluwer Academic Publishers-Plenum Publishers, 1959 45(2002), 2 vom: März, Seite 194-206 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:45 year:2002 number:2 month:03 pages:194-206 https://doi.org/10.1023/A:1015308400067 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_40 GBV_ILN_70 GBV_ILN_2014 GBV_ILN_2015 AR 45 2002 2 03 194-206
allfieldsGer	10.1023/A:1015308400067 doi (DE-627)OLC2034137965 (DE-He213)A:1015308400067-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Ermolov, P. F. verfasserin aut A Technique for the Mass Testing of Single-Sided Microstrip Detectors 2002 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © MAIK “Nauka/Interperiodica” 2002 Abstract In 1986–2000, the Skobel'tsyn Institute of Nuclear Physics of Moscow State University took part in the development of a tracker for the D0 experiment (FERMILAB, USA) on the basis of microstrip silicon detectors. Using the mass testing of detectors for this experiment as an example, we describe a technique for testing single-sided microstrip detectors. The experimental results are presented for the detectors produced in Russia during 1998–2000. Silicon Russia Physical Chemistry Mass Test Silicon Detector Voronin, A. G. aut Zverev, E. G. aut Karmanov, D. E. aut Kuznetsov, E. N. aut Leflat, A. K. aut Merkin, M. M. aut Shabalina, E. K. aut Enthalten in Instruments and experimental techniques Kluwer Academic Publishers-Plenum Publishers, 1959 45(2002), 2 vom: März, Seite 194-206 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:45 year:2002 number:2 month:03 pages:194-206 https://doi.org/10.1023/A:1015308400067 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_40 GBV_ILN_70 GBV_ILN_2014 GBV_ILN_2015 AR 45 2002 2 03 194-206
allfieldsSound	10.1023/A:1015308400067 doi (DE-627)OLC2034137965 (DE-He213)A:1015308400067-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Ermolov, P. F. verfasserin aut A Technique for the Mass Testing of Single-Sided Microstrip Detectors 2002 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © MAIK “Nauka/Interperiodica” 2002 Abstract In 1986–2000, the Skobel'tsyn Institute of Nuclear Physics of Moscow State University took part in the development of a tracker for the D0 experiment (FERMILAB, USA) on the basis of microstrip silicon detectors. Using the mass testing of detectors for this experiment as an example, we describe a technique for testing single-sided microstrip detectors. The experimental results are presented for the detectors produced in Russia during 1998–2000. Silicon Russia Physical Chemistry Mass Test Silicon Detector Voronin, A. G. aut Zverev, E. G. aut Karmanov, D. E. aut Kuznetsov, E. N. aut Leflat, A. K. aut Merkin, M. M. aut Shabalina, E. K. aut Enthalten in Instruments and experimental techniques Kluwer Academic Publishers-Plenum Publishers, 1959 45(2002), 2 vom: März, Seite 194-206 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:45 year:2002 number:2 month:03 pages:194-206 https://doi.org/10.1023/A:1015308400067 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_40 GBV_ILN_70 GBV_ILN_2014 GBV_ILN_2015 AR 45 2002 2 03 194-206
language	English
source	Enthalten in Instruments and experimental techniques 45(2002), 2 vom: März, Seite 194-206 volume:45 year:2002 number:2 month:03 pages:194-206
sourceStr	Enthalten in Instruments and experimental techniques 45(2002), 2 vom: März, Seite 194-206 volume:45 year:2002 number:2 month:03 pages:194-206
format_phy_str_mv	Article
institution	findex.gbv.de
topic_facet	Silicon Russia Physical Chemistry Mass Test Silicon Detector
dewey-raw	620
isfreeaccess_bool	false
container_title	Instruments and experimental techniques
authorswithroles_txt_mv	Ermolov, P. F. @@aut@@ Voronin, A. G. @@aut@@ Zverev, E. G. @@aut@@ Karmanov, D. E. @@aut@@ Kuznetsov, E. N. @@aut@@ Leflat, A. K. @@aut@@ Merkin, M. M. @@aut@@ Shabalina, E. K. @@aut@@
publishDateDaySort_date	2002-03-01T00:00:00Z
hierarchy_top_id	129603007
dewey-sort	3620
id	OLC2034137965
language_de	englisch
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC2034137965</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230519012127.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">200819s2002 xx \|\|\|\|\| 00\| \|\|eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1023/A:1015308400067</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC2034137965</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-He213)A:1015308400067-p</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">11</subfield><subfield code="2">ssgn</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Ermolov, P. F.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">A Technique for the Mass Testing of Single-Sided Microstrip Detectors</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2002</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© MAIK “Nauka/Interperiodica” 2002</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract In 1986–2000, the Skobel'tsyn Institute of Nuclear Physics of Moscow State University took part in the development of a tracker for the D0 experiment (FERMILAB, USA) on the basis of microstrip silicon detectors. Using the mass testing of detectors for this experiment as an example, we describe a technique for testing single-sided microstrip detectors. The experimental results are presented for the detectors produced in Russia during 1998–2000.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Silicon</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Russia</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physical Chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mass Test</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Silicon Detector</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Voronin, A. G.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zverev, E. G.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Karmanov, D. E.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kuznetsov, E. N.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Leflat, A. K.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Merkin, M. M.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Shabalina, E. K.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Instruments and experimental techniques</subfield><subfield code="d">Kluwer Academic Publishers-Plenum Publishers, 1959</subfield><subfield code="g">45(2002), 2 vom: März, Seite 194-206</subfield><subfield code="w">(DE-627)129603007</subfield><subfield code="w">(DE-600)241643-8</subfield><subfield code="w">(DE-576)015096815</subfield><subfield code="x">0020-4412</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:45</subfield><subfield code="g">year:2002</subfield><subfield code="g">number:2</subfield><subfield code="g">month:03</subfield><subfield code="g">pages:194-206</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">https://doi.org/10.1023/A:1015308400067</subfield><subfield code="z">lizenzpflichtig</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHA</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-DE-84</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2014</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2015</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">45</subfield><subfield code="j">2002</subfield><subfield code="e">2</subfield><subfield code="c">03</subfield><subfield code="h">194-206</subfield></datafield></record></collection>
author	Ermolov, P. F.
spellingShingle	Ermolov, P. F. ddc 620 ssgn 11 misc Silicon misc Russia misc Physical Chemistry misc Mass Test misc Silicon Detector A Technique for the Mass Testing of Single-Sided Microstrip Detectors
authorStr	Ermolov, P. F.
ppnlink_with_tag_str_mv	@@773@@(DE-627)129603007
format	Article
dewey-ones	620 - Engineering & allied operations
delete_txt_mv	keep
author_role	aut aut aut aut aut aut aut aut
collection	OLC
remote_str	false
illustrated	Not Illustrated
issn	0020-4412
topic_title	620 VZ 11 ssgn A Technique for the Mass Testing of Single-Sided Microstrip Detectors Silicon Russia Physical Chemistry Mass Test Silicon Detector
topic	ddc 620 ssgn 11 misc Silicon misc Russia misc Physical Chemistry misc Mass Test misc Silicon Detector
topic_unstemmed	ddc 620 ssgn 11 misc Silicon misc Russia misc Physical Chemistry misc Mass Test misc Silicon Detector
topic_browse	ddc 620 ssgn 11 misc Silicon misc Russia misc Physical Chemistry misc Mass Test misc Silicon Detector
format_facet	Aufsätze Gedruckte Aufsätze
format_main_str_mv	Text Zeitschrift/Artikel
carriertype_str_mv	nc
hierarchy_parent_title	Instruments and experimental techniques
hierarchy_parent_id	129603007
dewey-tens	620 - Engineering
hierarchy_top_title	Instruments and experimental techniques
isfreeaccess_txt	false
familylinks_str_mv	(DE-627)129603007 (DE-600)241643-8 (DE-576)015096815
title	A Technique for the Mass Testing of Single-Sided Microstrip Detectors
ctrlnum	(DE-627)OLC2034137965 (DE-He213)A:1015308400067-p
title_full	A Technique for the Mass Testing of Single-Sided Microstrip Detectors
author_sort	Ermolov, P. F.
journal	Instruments and experimental techniques
journalStr	Instruments and experimental techniques
lang_code	eng
isOA_bool	false
dewey-hundreds	600 - Technology
recordtype	marc
publishDateSort	2002
contenttype_str_mv	txt
container_start_page	194
author_browse	Ermolov, P. F. Voronin, A. G. Zverev, E. G. Karmanov, D. E. Kuznetsov, E. N. Leflat, A. K. Merkin, M. M. Shabalina, E. K.
container_volume	45
class	620 VZ 11 ssgn
format_se	Aufsätze
author-letter	Ermolov, P. F.
doi_str_mv	10.1023/A:1015308400067
dewey-full	620
title_sort	a technique for the mass testing of single-sided microstrip detectors
title_auth	A Technique for the Mass Testing of Single-Sided Microstrip Detectors
abstract	Abstract In 1986–2000, the Skobel'tsyn Institute of Nuclear Physics of Moscow State University took part in the development of a tracker for the D0 experiment (FERMILAB, USA) on the basis of microstrip silicon detectors. Using the mass testing of detectors for this experiment as an example, we describe a technique for testing single-sided microstrip detectors. The experimental results are presented for the detectors produced in Russia during 1998–2000. © MAIK “Nauka/Interperiodica” 2002
abstractGer	Abstract In 1986–2000, the Skobel'tsyn Institute of Nuclear Physics of Moscow State University took part in the development of a tracker for the D0 experiment (FERMILAB, USA) on the basis of microstrip silicon detectors. Using the mass testing of detectors for this experiment as an example, we describe a technique for testing single-sided microstrip detectors. The experimental results are presented for the detectors produced in Russia during 1998–2000. © MAIK “Nauka/Interperiodica” 2002
abstract_unstemmed	Abstract In 1986–2000, the Skobel'tsyn Institute of Nuclear Physics of Moscow State University took part in the development of a tracker for the D0 experiment (FERMILAB, USA) on the basis of microstrip silicon detectors. Using the mass testing of detectors for this experiment as an example, we describe a technique for testing single-sided microstrip detectors. The experimental results are presented for the detectors produced in Russia during 1998–2000. © MAIK “Nauka/Interperiodica” 2002
collection_details	GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_40 GBV_ILN_70 GBV_ILN_2014 GBV_ILN_2015
container_issue	2
title_short	A Technique for the Mass Testing of Single-Sided Microstrip Detectors
url	https://doi.org/10.1023/A:1015308400067
remote_bool	false
author2	Voronin, A. G. Zverev, E. G. Karmanov, D. E. Kuznetsov, E. N. Leflat, A. K. Merkin, M. M. Shabalina, E. K.
author2Str	Voronin, A. G. Zverev, E. G. Karmanov, D. E. Kuznetsov, E. N. Leflat, A. K. Merkin, M. M. Shabalina, E. K.
ppnlink	129603007
mediatype_str_mv	n
isOA_txt	false
hochschulschrift_bool	false
doi_str	10.1023/A:1015308400067
up_date	2024-07-03T19:46:06.276Z
_version_	1803588433375920128
fullrecord_marcxml	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC2034137965</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230519012127.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">200819s2002 xx \|\|\|\|\| 00\| \|\|eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1023/A:1015308400067</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC2034137965</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-He213)A:1015308400067-p</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">11</subfield><subfield code="2">ssgn</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Ermolov, P. F.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">A Technique for the Mass Testing of Single-Sided Microstrip Detectors</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2002</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© MAIK “Nauka/Interperiodica” 2002</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract In 1986–2000, the Skobel'tsyn Institute of Nuclear Physics of Moscow State University took part in the development of a tracker for the D0 experiment (FERMILAB, USA) on the basis of microstrip silicon detectors. Using the mass testing of detectors for this experiment as an example, we describe a technique for testing single-sided microstrip detectors. The experimental results are presented for the detectors produced in Russia during 1998–2000.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Silicon</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Russia</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physical Chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Mass Test</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Silicon Detector</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Voronin, A. G.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zverev, E. G.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Karmanov, D. E.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kuznetsov, E. N.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Leflat, A. K.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Merkin, M. M.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Shabalina, E. K.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Instruments and experimental techniques</subfield><subfield code="d">Kluwer Academic Publishers-Plenum Publishers, 1959</subfield><subfield code="g">45(2002), 2 vom: März, Seite 194-206</subfield><subfield code="w">(DE-627)129603007</subfield><subfield code="w">(DE-600)241643-8</subfield><subfield code="w">(DE-576)015096815</subfield><subfield code="x">0020-4412</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:45</subfield><subfield code="g">year:2002</subfield><subfield code="g">number:2</subfield><subfield code="g">month:03</subfield><subfield code="g">pages:194-206</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">https://doi.org/10.1023/A:1015308400067</subfield><subfield code="z">lizenzpflichtig</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHA</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-DE-84</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2014</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2015</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">45</subfield><subfield code="j">2002</subfield><subfield code="e">2</subfield><subfield code="c">03</subfield><subfield code="h">194-206</subfield></datafield></record></collection>
score	7.4015665

Nicht das Richtige dabei?

Schreiben Sie uns!

A Technique for the Mass Testing of Single-Sided Microstrip Detectors

Nicht das Richtige dabei?

Zugang & Verfügbarkeit

Vorhandene Bände

Nicht das Richtige dabei?