A Technique for Testing the Si Tracker Modules for the D0 Collider Experiment (FNAL) and Comparative Analysis of the Test Results
Abstract The Skobel'tsyn Institute of Nuclear Physics (SINP) of Moscow State University participates in the development of a silicon tracker for the D0 experiment (FNAL, USA). The SINP specialists were engaged in assembling and testing of the end-disc detectors for the tracker. A technique for...
Ausführliche Beschreibung
Autor*in: |
Ermolov, P. F. [verfasserIn] |
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Format: |
Artikel |
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Sprache: |
Englisch |
Erschienen: |
2002 |
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Schlagwörter: |
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Anmerkung: |
© MAIK “Nauka/Interperiodica” 2002 |
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Übergeordnetes Werk: |
Enthalten in: Instruments and experimental techniques - Kluwer Academic Publishers-Plenum Publishers, 1959, 45(2002), 2 vom: März, Seite 183-193 |
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Übergeordnetes Werk: |
volume:45 ; year:2002 ; number:2 ; month:03 ; pages:183-193 |
Links: |
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DOI / URN: |
10.1023/A:1015356315997 |
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Katalog-ID: |
OLC2034137973 |
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LEADER | 01000caa a22002652 4500 | ||
---|---|---|---|
001 | OLC2034137973 | ||
003 | DE-627 | ||
005 | 20230519012127.0 | ||
007 | tu | ||
008 | 200819s2002 xx ||||| 00| ||eng c | ||
024 | 7 | |a 10.1023/A:1015356315997 |2 doi | |
035 | |a (DE-627)OLC2034137973 | ||
035 | |a (DE-He213)A:1015356315997-p | ||
040 | |a DE-627 |b ger |c DE-627 |e rakwb | ||
041 | |a eng | ||
082 | 0 | 4 | |a 620 |q VZ |
084 | |a 11 |2 ssgn | ||
100 | 1 | |a Ermolov, P. F. |e verfasserin |4 aut | |
245 | 1 | 0 | |a A Technique for Testing the Si Tracker Modules for the D0 Collider Experiment (FNAL) and Comparative Analysis of the Test Results |
264 | 1 | |c 2002 | |
336 | |a Text |b txt |2 rdacontent | ||
337 | |a ohne Hilfsmittel zu benutzen |b n |2 rdamedia | ||
338 | |a Band |b nc |2 rdacarrier | ||
500 | |a © MAIK “Nauka/Interperiodica” 2002 | ||
520 | |a Abstract The Skobel'tsyn Institute of Nuclear Physics (SINP) of Moscow State University participates in the development of a silicon tracker for the D0 experiment (FNAL, USA). The SINP specialists were engaged in assembling and testing of the end-disc detectors for the tracker. A technique for testing the disc modules is described, and the test results are presented. They are compared to the disc-detector parameters and measured before the assembling. This comparison can be used to create test procedures and the detector-selection criteria in the development of large-sized tracking systems on the basis of single-sided microstrip detectors. | ||
650 | 4 | |a Silicon | |
650 | 4 | |a Physical Chemistry | |
650 | 4 | |a Comparative Analysis | |
650 | 4 | |a Test Procedure | |
650 | 4 | |a Tracking System | |
700 | 1 | |a Zverev, E. G. |4 aut | |
700 | 1 | |a Karmanov, D. E. |4 aut | |
700 | 1 | |a Leflat, A. K. |4 aut | |
700 | 1 | |a Merkin, M. M. |4 aut | |
700 | 1 | |a Shabalina, E. K. |4 aut | |
773 | 0 | 8 | |i Enthalten in |t Instruments and experimental techniques |d Kluwer Academic Publishers-Plenum Publishers, 1959 |g 45(2002), 2 vom: März, Seite 183-193 |w (DE-627)129603007 |w (DE-600)241643-8 |w (DE-576)015096815 |x 0020-4412 |7 nnns |
773 | 1 | 8 | |g volume:45 |g year:2002 |g number:2 |g month:03 |g pages:183-193 |
856 | 4 | 1 | |u https://doi.org/10.1023/A:1015356315997 |z lizenzpflichtig |3 Volltext |
912 | |a GBV_USEFLAG_A | ||
912 | |a SYSFLAG_A | ||
912 | |a GBV_OLC | ||
912 | |a SSG-OLC-TEC | ||
912 | |a SSG-OLC-PHY | ||
912 | |a SSG-OLC-PHA | ||
912 | |a SSG-OLC-DE-84 | ||
912 | |a GBV_ILN_40 | ||
912 | |a GBV_ILN_70 | ||
912 | |a GBV_ILN_2014 | ||
912 | |a GBV_ILN_2015 | ||
951 | |a AR | ||
952 | |d 45 |j 2002 |e 2 |c 03 |h 183-193 |
author_variant |
p f e pf pfe e g z eg egz d e k de dek a k l ak akl m m m mm mmm e k s ek eks |
---|---|
matchkey_str |
article:00204412:2002----::tcnqeotsighstakrouefrhdclieeprmnfaadopr |
hierarchy_sort_str |
2002 |
publishDate |
2002 |
allfields |
10.1023/A:1015356315997 doi (DE-627)OLC2034137973 (DE-He213)A:1015356315997-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Ermolov, P. F. verfasserin aut A Technique for Testing the Si Tracker Modules for the D0 Collider Experiment (FNAL) and Comparative Analysis of the Test Results 2002 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © MAIK “Nauka/Interperiodica” 2002 Abstract The Skobel'tsyn Institute of Nuclear Physics (SINP) of Moscow State University participates in the development of a silicon tracker for the D0 experiment (FNAL, USA). The SINP specialists were engaged in assembling and testing of the end-disc detectors for the tracker. A technique for testing the disc modules is described, and the test results are presented. They are compared to the disc-detector parameters and measured before the assembling. This comparison can be used to create test procedures and the detector-selection criteria in the development of large-sized tracking systems on the basis of single-sided microstrip detectors. Silicon Physical Chemistry Comparative Analysis Test Procedure Tracking System Zverev, E. G. aut Karmanov, D. E. aut Leflat, A. K. aut Merkin, M. M. aut Shabalina, E. K. aut Enthalten in Instruments and experimental techniques Kluwer Academic Publishers-Plenum Publishers, 1959 45(2002), 2 vom: März, Seite 183-193 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:45 year:2002 number:2 month:03 pages:183-193 https://doi.org/10.1023/A:1015356315997 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_40 GBV_ILN_70 GBV_ILN_2014 GBV_ILN_2015 AR 45 2002 2 03 183-193 |
spelling |
10.1023/A:1015356315997 doi (DE-627)OLC2034137973 (DE-He213)A:1015356315997-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Ermolov, P. F. verfasserin aut A Technique for Testing the Si Tracker Modules for the D0 Collider Experiment (FNAL) and Comparative Analysis of the Test Results 2002 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © MAIK “Nauka/Interperiodica” 2002 Abstract The Skobel'tsyn Institute of Nuclear Physics (SINP) of Moscow State University participates in the development of a silicon tracker for the D0 experiment (FNAL, USA). The SINP specialists were engaged in assembling and testing of the end-disc detectors for the tracker. A technique for testing the disc modules is described, and the test results are presented. They are compared to the disc-detector parameters and measured before the assembling. This comparison can be used to create test procedures and the detector-selection criteria in the development of large-sized tracking systems on the basis of single-sided microstrip detectors. Silicon Physical Chemistry Comparative Analysis Test Procedure Tracking System Zverev, E. G. aut Karmanov, D. E. aut Leflat, A. K. aut Merkin, M. M. aut Shabalina, E. K. aut Enthalten in Instruments and experimental techniques Kluwer Academic Publishers-Plenum Publishers, 1959 45(2002), 2 vom: März, Seite 183-193 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:45 year:2002 number:2 month:03 pages:183-193 https://doi.org/10.1023/A:1015356315997 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_40 GBV_ILN_70 GBV_ILN_2014 GBV_ILN_2015 AR 45 2002 2 03 183-193 |
allfields_unstemmed |
10.1023/A:1015356315997 doi (DE-627)OLC2034137973 (DE-He213)A:1015356315997-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Ermolov, P. F. verfasserin aut A Technique for Testing the Si Tracker Modules for the D0 Collider Experiment (FNAL) and Comparative Analysis of the Test Results 2002 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © MAIK “Nauka/Interperiodica” 2002 Abstract The Skobel'tsyn Institute of Nuclear Physics (SINP) of Moscow State University participates in the development of a silicon tracker for the D0 experiment (FNAL, USA). The SINP specialists were engaged in assembling and testing of the end-disc detectors for the tracker. A technique for testing the disc modules is described, and the test results are presented. They are compared to the disc-detector parameters and measured before the assembling. This comparison can be used to create test procedures and the detector-selection criteria in the development of large-sized tracking systems on the basis of single-sided microstrip detectors. Silicon Physical Chemistry Comparative Analysis Test Procedure Tracking System Zverev, E. G. aut Karmanov, D. E. aut Leflat, A. K. aut Merkin, M. M. aut Shabalina, E. K. aut Enthalten in Instruments and experimental techniques Kluwer Academic Publishers-Plenum Publishers, 1959 45(2002), 2 vom: März, Seite 183-193 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:45 year:2002 number:2 month:03 pages:183-193 https://doi.org/10.1023/A:1015356315997 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_40 GBV_ILN_70 GBV_ILN_2014 GBV_ILN_2015 AR 45 2002 2 03 183-193 |
allfieldsGer |
10.1023/A:1015356315997 doi (DE-627)OLC2034137973 (DE-He213)A:1015356315997-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Ermolov, P. F. verfasserin aut A Technique for Testing the Si Tracker Modules for the D0 Collider Experiment (FNAL) and Comparative Analysis of the Test Results 2002 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © MAIK “Nauka/Interperiodica” 2002 Abstract The Skobel'tsyn Institute of Nuclear Physics (SINP) of Moscow State University participates in the development of a silicon tracker for the D0 experiment (FNAL, USA). The SINP specialists were engaged in assembling and testing of the end-disc detectors for the tracker. A technique for testing the disc modules is described, and the test results are presented. They are compared to the disc-detector parameters and measured before the assembling. This comparison can be used to create test procedures and the detector-selection criteria in the development of large-sized tracking systems on the basis of single-sided microstrip detectors. Silicon Physical Chemistry Comparative Analysis Test Procedure Tracking System Zverev, E. G. aut Karmanov, D. E. aut Leflat, A. K. aut Merkin, M. M. aut Shabalina, E. K. aut Enthalten in Instruments and experimental techniques Kluwer Academic Publishers-Plenum Publishers, 1959 45(2002), 2 vom: März, Seite 183-193 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:45 year:2002 number:2 month:03 pages:183-193 https://doi.org/10.1023/A:1015356315997 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_40 GBV_ILN_70 GBV_ILN_2014 GBV_ILN_2015 AR 45 2002 2 03 183-193 |
allfieldsSound |
10.1023/A:1015356315997 doi (DE-627)OLC2034137973 (DE-He213)A:1015356315997-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Ermolov, P. F. verfasserin aut A Technique for Testing the Si Tracker Modules for the D0 Collider Experiment (FNAL) and Comparative Analysis of the Test Results 2002 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © MAIK “Nauka/Interperiodica” 2002 Abstract The Skobel'tsyn Institute of Nuclear Physics (SINP) of Moscow State University participates in the development of a silicon tracker for the D0 experiment (FNAL, USA). The SINP specialists were engaged in assembling and testing of the end-disc detectors for the tracker. A technique for testing the disc modules is described, and the test results are presented. They are compared to the disc-detector parameters and measured before the assembling. This comparison can be used to create test procedures and the detector-selection criteria in the development of large-sized tracking systems on the basis of single-sided microstrip detectors. Silicon Physical Chemistry Comparative Analysis Test Procedure Tracking System Zverev, E. G. aut Karmanov, D. E. aut Leflat, A. K. aut Merkin, M. M. aut Shabalina, E. K. aut Enthalten in Instruments and experimental techniques Kluwer Academic Publishers-Plenum Publishers, 1959 45(2002), 2 vom: März, Seite 183-193 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:45 year:2002 number:2 month:03 pages:183-193 https://doi.org/10.1023/A:1015356315997 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_40 GBV_ILN_70 GBV_ILN_2014 GBV_ILN_2015 AR 45 2002 2 03 183-193 |
language |
English |
source |
Enthalten in Instruments and experimental techniques 45(2002), 2 vom: März, Seite 183-193 volume:45 year:2002 number:2 month:03 pages:183-193 |
sourceStr |
Enthalten in Instruments and experimental techniques 45(2002), 2 vom: März, Seite 183-193 volume:45 year:2002 number:2 month:03 pages:183-193 |
format_phy_str_mv |
Article |
institution |
findex.gbv.de |
topic_facet |
Silicon Physical Chemistry Comparative Analysis Test Procedure Tracking System |
dewey-raw |
620 |
isfreeaccess_bool |
false |
container_title |
Instruments and experimental techniques |
authorswithroles_txt_mv |
Ermolov, P. F. @@aut@@ Zverev, E. G. @@aut@@ Karmanov, D. E. @@aut@@ Leflat, A. K. @@aut@@ Merkin, M. M. @@aut@@ Shabalina, E. K. @@aut@@ |
publishDateDaySort_date |
2002-03-01T00:00:00Z |
hierarchy_top_id |
129603007 |
dewey-sort |
3620 |
id |
OLC2034137973 |
language_de |
englisch |
fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC2034137973</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230519012127.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">200819s2002 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1023/A:1015356315997</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC2034137973</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-He213)A:1015356315997-p</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">11</subfield><subfield code="2">ssgn</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Ermolov, P. F.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">A Technique for Testing the Si Tracker Modules for the D0 Collider Experiment (FNAL) and Comparative Analysis of the Test Results</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2002</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© MAIK “Nauka/Interperiodica” 2002</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract The Skobel'tsyn Institute of Nuclear Physics (SINP) of Moscow State University participates in the development of a silicon tracker for the D0 experiment (FNAL, USA). The SINP specialists were engaged in assembling and testing of the end-disc detectors for the tracker. A technique for testing the disc modules is described, and the test results are presented. They are compared to the disc-detector parameters and measured before the assembling. This comparison can be used to create test procedures and the detector-selection criteria in the development of large-sized tracking systems on the basis of single-sided microstrip detectors.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Silicon</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physical Chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Comparative Analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Test Procedure</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Tracking System</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zverev, E. G.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Karmanov, D. E.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Leflat, A. K.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Merkin, M. M.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Shabalina, E. K.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Instruments and experimental techniques</subfield><subfield code="d">Kluwer Academic Publishers-Plenum Publishers, 1959</subfield><subfield code="g">45(2002), 2 vom: März, Seite 183-193</subfield><subfield code="w">(DE-627)129603007</subfield><subfield code="w">(DE-600)241643-8</subfield><subfield code="w">(DE-576)015096815</subfield><subfield code="x">0020-4412</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:45</subfield><subfield code="g">year:2002</subfield><subfield code="g">number:2</subfield><subfield code="g">month:03</subfield><subfield code="g">pages:183-193</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">https://doi.org/10.1023/A:1015356315997</subfield><subfield code="z">lizenzpflichtig</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHA</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-DE-84</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2014</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2015</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">45</subfield><subfield code="j">2002</subfield><subfield code="e">2</subfield><subfield code="c">03</subfield><subfield code="h">183-193</subfield></datafield></record></collection>
|
author |
Ermolov, P. F. |
spellingShingle |
Ermolov, P. F. ddc 620 ssgn 11 misc Silicon misc Physical Chemistry misc Comparative Analysis misc Test Procedure misc Tracking System A Technique for Testing the Si Tracker Modules for the D0 Collider Experiment (FNAL) and Comparative Analysis of the Test Results |
authorStr |
Ermolov, P. F. |
ppnlink_with_tag_str_mv |
@@773@@(DE-627)129603007 |
format |
Article |
dewey-ones |
620 - Engineering & allied operations |
delete_txt_mv |
keep |
author_role |
aut aut aut aut aut aut |
collection |
OLC |
remote_str |
false |
illustrated |
Not Illustrated |
issn |
0020-4412 |
topic_title |
620 VZ 11 ssgn A Technique for Testing the Si Tracker Modules for the D0 Collider Experiment (FNAL) and Comparative Analysis of the Test Results Silicon Physical Chemistry Comparative Analysis Test Procedure Tracking System |
topic |
ddc 620 ssgn 11 misc Silicon misc Physical Chemistry misc Comparative Analysis misc Test Procedure misc Tracking System |
topic_unstemmed |
ddc 620 ssgn 11 misc Silicon misc Physical Chemistry misc Comparative Analysis misc Test Procedure misc Tracking System |
topic_browse |
ddc 620 ssgn 11 misc Silicon misc Physical Chemistry misc Comparative Analysis misc Test Procedure misc Tracking System |
format_facet |
Aufsätze Gedruckte Aufsätze |
format_main_str_mv |
Text Zeitschrift/Artikel |
carriertype_str_mv |
nc |
hierarchy_parent_title |
Instruments and experimental techniques |
hierarchy_parent_id |
129603007 |
dewey-tens |
620 - Engineering |
hierarchy_top_title |
Instruments and experimental techniques |
isfreeaccess_txt |
false |
familylinks_str_mv |
(DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 |
title |
A Technique for Testing the Si Tracker Modules for the D0 Collider Experiment (FNAL) and Comparative Analysis of the Test Results |
ctrlnum |
(DE-627)OLC2034137973 (DE-He213)A:1015356315997-p |
title_full |
A Technique for Testing the Si Tracker Modules for the D0 Collider Experiment (FNAL) and Comparative Analysis of the Test Results |
author_sort |
Ermolov, P. F. |
journal |
Instruments and experimental techniques |
journalStr |
Instruments and experimental techniques |
lang_code |
eng |
isOA_bool |
false |
dewey-hundreds |
600 - Technology |
recordtype |
marc |
publishDateSort |
2002 |
contenttype_str_mv |
txt |
container_start_page |
183 |
author_browse |
Ermolov, P. F. Zverev, E. G. Karmanov, D. E. Leflat, A. K. Merkin, M. M. Shabalina, E. K. |
container_volume |
45 |
class |
620 VZ 11 ssgn |
format_se |
Aufsätze |
author-letter |
Ermolov, P. F. |
doi_str_mv |
10.1023/A:1015356315997 |
dewey-full |
620 |
title_sort |
a technique for testing the si tracker modules for the d0 collider experiment (fnal) and comparative analysis of the test results |
title_auth |
A Technique for Testing the Si Tracker Modules for the D0 Collider Experiment (FNAL) and Comparative Analysis of the Test Results |
abstract |
Abstract The Skobel'tsyn Institute of Nuclear Physics (SINP) of Moscow State University participates in the development of a silicon tracker for the D0 experiment (FNAL, USA). The SINP specialists were engaged in assembling and testing of the end-disc detectors for the tracker. A technique for testing the disc modules is described, and the test results are presented. They are compared to the disc-detector parameters and measured before the assembling. This comparison can be used to create test procedures and the detector-selection criteria in the development of large-sized tracking systems on the basis of single-sided microstrip detectors. © MAIK “Nauka/Interperiodica” 2002 |
abstractGer |
Abstract The Skobel'tsyn Institute of Nuclear Physics (SINP) of Moscow State University participates in the development of a silicon tracker for the D0 experiment (FNAL, USA). The SINP specialists were engaged in assembling and testing of the end-disc detectors for the tracker. A technique for testing the disc modules is described, and the test results are presented. They are compared to the disc-detector parameters and measured before the assembling. This comparison can be used to create test procedures and the detector-selection criteria in the development of large-sized tracking systems on the basis of single-sided microstrip detectors. © MAIK “Nauka/Interperiodica” 2002 |
abstract_unstemmed |
Abstract The Skobel'tsyn Institute of Nuclear Physics (SINP) of Moscow State University participates in the development of a silicon tracker for the D0 experiment (FNAL, USA). The SINP specialists were engaged in assembling and testing of the end-disc detectors for the tracker. A technique for testing the disc modules is described, and the test results are presented. They are compared to the disc-detector parameters and measured before the assembling. This comparison can be used to create test procedures and the detector-selection criteria in the development of large-sized tracking systems on the basis of single-sided microstrip detectors. © MAIK “Nauka/Interperiodica” 2002 |
collection_details |
GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY SSG-OLC-PHA SSG-OLC-DE-84 GBV_ILN_40 GBV_ILN_70 GBV_ILN_2014 GBV_ILN_2015 |
container_issue |
2 |
title_short |
A Technique for Testing the Si Tracker Modules for the D0 Collider Experiment (FNAL) and Comparative Analysis of the Test Results |
url |
https://doi.org/10.1023/A:1015356315997 |
remote_bool |
false |
author2 |
Zverev, E. G. Karmanov, D. E. Leflat, A. K. Merkin, M. M. Shabalina, E. K. |
author2Str |
Zverev, E. G. Karmanov, D. E. Leflat, A. K. Merkin, M. M. Shabalina, E. K. |
ppnlink |
129603007 |
mediatype_str_mv |
n |
isOA_txt |
false |
hochschulschrift_bool |
false |
doi_str |
10.1023/A:1015356315997 |
up_date |
2024-07-03T19:46:06.429Z |
_version_ |
1803588433537400832 |
fullrecord_marcxml |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC2034137973</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230519012127.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">200819s2002 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1023/A:1015356315997</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC2034137973</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-He213)A:1015356315997-p</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">11</subfield><subfield code="2">ssgn</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Ermolov, P. F.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">A Technique for Testing the Si Tracker Modules for the D0 Collider Experiment (FNAL) and Comparative Analysis of the Test Results</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2002</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© MAIK “Nauka/Interperiodica” 2002</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract The Skobel'tsyn Institute of Nuclear Physics (SINP) of Moscow State University participates in the development of a silicon tracker for the D0 experiment (FNAL, USA). The SINP specialists were engaged in assembling and testing of the end-disc detectors for the tracker. A technique for testing the disc modules is described, and the test results are presented. They are compared to the disc-detector parameters and measured before the assembling. This comparison can be used to create test procedures and the detector-selection criteria in the development of large-sized tracking systems on the basis of single-sided microstrip detectors.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Silicon</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Physical Chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Comparative Analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Test Procedure</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Tracking System</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zverev, E. G.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Karmanov, D. E.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Leflat, A. K.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Merkin, M. M.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Shabalina, E. K.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Instruments and experimental techniques</subfield><subfield code="d">Kluwer Academic Publishers-Plenum Publishers, 1959</subfield><subfield code="g">45(2002), 2 vom: März, Seite 183-193</subfield><subfield code="w">(DE-627)129603007</subfield><subfield code="w">(DE-600)241643-8</subfield><subfield code="w">(DE-576)015096815</subfield><subfield code="x">0020-4412</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:45</subfield><subfield code="g">year:2002</subfield><subfield code="g">number:2</subfield><subfield code="g">month:03</subfield><subfield code="g">pages:183-193</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">https://doi.org/10.1023/A:1015356315997</subfield><subfield code="z">lizenzpflichtig</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-TEC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHA</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-DE-84</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2014</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2015</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">45</subfield><subfield code="j">2002</subfield><subfield code="e">2</subfield><subfield code="c">03</subfield><subfield code="h">183-193</subfield></datafield></record></collection>
|
score |
7.401067 |