A four-segment photodiode cantilever-bending sensor for an atomic-force microscope
Abstract An electronic circuit for processing signals from a multisegment photodiode (PD) cantilever-bending sensor for an atomic-force microscope (AFM) of “classical” design is described. The electronics includes two analog channels for selecting the difference between the photocurrents of two halv...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Kazantsev, D. V. [verfasserIn] |
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| Format: |
Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2014 |
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| Schlagwörter: |
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| Anmerkung: |
© Pleiades Publishing, Inc. 2014 |
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| Übergeordnetes Werk: |
Enthalten in: Instruments and experimental techniques - Pleiades Publishing, 1959, 57(2014), 5 vom: Sept., Seite 631-639 |
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| Übergeordnetes Werk: |
volume:57 ; year:2014 ; number:5 ; month:09 ; pages:631-639 |
| Links: |
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| DOI / URN: |
10.1134/S0020441214040046 |
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OLC2034155068 |
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| 520 | |a Abstract An electronic circuit for processing signals from a multisegment photodiode (PD) cantilever-bending sensor for an atomic-force microscope (AFM) of “classical” design is described. The electronics includes two analog channels for selecting the difference between the photocurrents of two halves of the receiving area, each channel being normalized to the signal of the total illumination of the PD. The use of modern electronic components allowed the extension of the operating frequency band of the conventional-circuit response from ordinary 200–300 kHz to 2–3 MHz, thus suppressing phase distortions in the band from 0 to 1 MHz. Owing to this, for cantilever-vibration frequencies of up to 200 kHz, the voltage at the circuit output can be accepted with a high accuracy as the signal of the instantaneous position of the cantilever tip with respect to the sample surface. It was shown that the output noise level of the proposed electronics is quite low for the reliable observation of the Brownian motion of the cantilever. | ||
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| 650 | 4 | |a Power Supply Stabilizer | |
| 700 | 1 | |a Kazantzeva, E. A. |4 aut | |
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10.1134/S0020441214040046 doi (DE-627)OLC2034155068 (DE-He213)S0020441214040046-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Kazantsev, D. V. verfasserin aut A four-segment photodiode cantilever-bending sensor for an atomic-force microscope 2014 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Inc. 2014 Abstract An electronic circuit for processing signals from a multisegment photodiode (PD) cantilever-bending sensor for an atomic-force microscope (AFM) of “classical” design is described. The electronics includes two analog channels for selecting the difference between the photocurrents of two halves of the receiving area, each channel being normalized to the signal of the total illumination of the PD. The use of modern electronic components allowed the extension of the operating frequency band of the conventional-circuit response from ordinary 200–300 kHz to 2–3 MHz, thus suppressing phase distortions in the band from 0 to 1 MHz. Owing to this, for cantilever-vibration frequencies of up to 200 kHz, the voltage at the circuit output can be accepted with a high accuracy as the signal of the instantaneous position of the cantilever tip with respect to the sample surface. It was shown that the output noise level of the proposed electronics is quite low for the reliable observation of the Brownian motion of the cantilever. Atomic Force Microscope Atomic Force Microscope Cantilever Cantilever Deflection Operating Frequency Band Power Supply Stabilizer Kazantzeva, E. A. aut Enthalten in Instruments and experimental techniques Pleiades Publishing, 1959 57(2014), 5 vom: Sept., Seite 631-639 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:57 year:2014 number:5 month:09 pages:631-639 https://doi.org/10.1134/S0020441214040046 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 AR 57 2014 5 09 631-639 |
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10.1134/S0020441214040046 doi (DE-627)OLC2034155068 (DE-He213)S0020441214040046-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Kazantsev, D. V. verfasserin aut A four-segment photodiode cantilever-bending sensor for an atomic-force microscope 2014 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Inc. 2014 Abstract An electronic circuit for processing signals from a multisegment photodiode (PD) cantilever-bending sensor for an atomic-force microscope (AFM) of “classical” design is described. The electronics includes two analog channels for selecting the difference between the photocurrents of two halves of the receiving area, each channel being normalized to the signal of the total illumination of the PD. The use of modern electronic components allowed the extension of the operating frequency band of the conventional-circuit response from ordinary 200–300 kHz to 2–3 MHz, thus suppressing phase distortions in the band from 0 to 1 MHz. Owing to this, for cantilever-vibration frequencies of up to 200 kHz, the voltage at the circuit output can be accepted with a high accuracy as the signal of the instantaneous position of the cantilever tip with respect to the sample surface. It was shown that the output noise level of the proposed electronics is quite low for the reliable observation of the Brownian motion of the cantilever. Atomic Force Microscope Atomic Force Microscope Cantilever Cantilever Deflection Operating Frequency Band Power Supply Stabilizer Kazantzeva, E. A. aut Enthalten in Instruments and experimental techniques Pleiades Publishing, 1959 57(2014), 5 vom: Sept., Seite 631-639 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:57 year:2014 number:5 month:09 pages:631-639 https://doi.org/10.1134/S0020441214040046 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 AR 57 2014 5 09 631-639 |
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10.1134/S0020441214040046 doi (DE-627)OLC2034155068 (DE-He213)S0020441214040046-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Kazantsev, D. V. verfasserin aut A four-segment photodiode cantilever-bending sensor for an atomic-force microscope 2014 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Inc. 2014 Abstract An electronic circuit for processing signals from a multisegment photodiode (PD) cantilever-bending sensor for an atomic-force microscope (AFM) of “classical” design is described. The electronics includes two analog channels for selecting the difference between the photocurrents of two halves of the receiving area, each channel being normalized to the signal of the total illumination of the PD. The use of modern electronic components allowed the extension of the operating frequency band of the conventional-circuit response from ordinary 200–300 kHz to 2–3 MHz, thus suppressing phase distortions in the band from 0 to 1 MHz. Owing to this, for cantilever-vibration frequencies of up to 200 kHz, the voltage at the circuit output can be accepted with a high accuracy as the signal of the instantaneous position of the cantilever tip with respect to the sample surface. It was shown that the output noise level of the proposed electronics is quite low for the reliable observation of the Brownian motion of the cantilever. Atomic Force Microscope Atomic Force Microscope Cantilever Cantilever Deflection Operating Frequency Band Power Supply Stabilizer Kazantzeva, E. A. aut Enthalten in Instruments and experimental techniques Pleiades Publishing, 1959 57(2014), 5 vom: Sept., Seite 631-639 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:57 year:2014 number:5 month:09 pages:631-639 https://doi.org/10.1134/S0020441214040046 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 AR 57 2014 5 09 631-639 |
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10.1134/S0020441214040046 doi (DE-627)OLC2034155068 (DE-He213)S0020441214040046-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Kazantsev, D. V. verfasserin aut A four-segment photodiode cantilever-bending sensor for an atomic-force microscope 2014 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Inc. 2014 Abstract An electronic circuit for processing signals from a multisegment photodiode (PD) cantilever-bending sensor for an atomic-force microscope (AFM) of “classical” design is described. The electronics includes two analog channels for selecting the difference between the photocurrents of two halves of the receiving area, each channel being normalized to the signal of the total illumination of the PD. The use of modern electronic components allowed the extension of the operating frequency band of the conventional-circuit response from ordinary 200–300 kHz to 2–3 MHz, thus suppressing phase distortions in the band from 0 to 1 MHz. Owing to this, for cantilever-vibration frequencies of up to 200 kHz, the voltage at the circuit output can be accepted with a high accuracy as the signal of the instantaneous position of the cantilever tip with respect to the sample surface. It was shown that the output noise level of the proposed electronics is quite low for the reliable observation of the Brownian motion of the cantilever. Atomic Force Microscope Atomic Force Microscope Cantilever Cantilever Deflection Operating Frequency Band Power Supply Stabilizer Kazantzeva, E. A. aut Enthalten in Instruments and experimental techniques Pleiades Publishing, 1959 57(2014), 5 vom: Sept., Seite 631-639 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:57 year:2014 number:5 month:09 pages:631-639 https://doi.org/10.1134/S0020441214040046 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 AR 57 2014 5 09 631-639 |
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10.1134/S0020441214040046 doi (DE-627)OLC2034155068 (DE-He213)S0020441214040046-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Kazantsev, D. V. verfasserin aut A four-segment photodiode cantilever-bending sensor for an atomic-force microscope 2014 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Inc. 2014 Abstract An electronic circuit for processing signals from a multisegment photodiode (PD) cantilever-bending sensor for an atomic-force microscope (AFM) of “classical” design is described. The electronics includes two analog channels for selecting the difference between the photocurrents of two halves of the receiving area, each channel being normalized to the signal of the total illumination of the PD. The use of modern electronic components allowed the extension of the operating frequency band of the conventional-circuit response from ordinary 200–300 kHz to 2–3 MHz, thus suppressing phase distortions in the band from 0 to 1 MHz. Owing to this, for cantilever-vibration frequencies of up to 200 kHz, the voltage at the circuit output can be accepted with a high accuracy as the signal of the instantaneous position of the cantilever tip with respect to the sample surface. It was shown that the output noise level of the proposed electronics is quite low for the reliable observation of the Brownian motion of the cantilever. Atomic Force Microscope Atomic Force Microscope Cantilever Cantilever Deflection Operating Frequency Band Power Supply Stabilizer Kazantzeva, E. A. aut Enthalten in Instruments and experimental techniques Pleiades Publishing, 1959 57(2014), 5 vom: Sept., Seite 631-639 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:57 year:2014 number:5 month:09 pages:631-639 https://doi.org/10.1134/S0020441214040046 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 AR 57 2014 5 09 631-639 |
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A four-segment photodiode cantilever-bending sensor for an atomic-force microscope |
| abstract |
Abstract An electronic circuit for processing signals from a multisegment photodiode (PD) cantilever-bending sensor for an atomic-force microscope (AFM) of “classical” design is described. The electronics includes two analog channels for selecting the difference between the photocurrents of two halves of the receiving area, each channel being normalized to the signal of the total illumination of the PD. The use of modern electronic components allowed the extension of the operating frequency band of the conventional-circuit response from ordinary 200–300 kHz to 2–3 MHz, thus suppressing phase distortions in the band from 0 to 1 MHz. Owing to this, for cantilever-vibration frequencies of up to 200 kHz, the voltage at the circuit output can be accepted with a high accuracy as the signal of the instantaneous position of the cantilever tip with respect to the sample surface. It was shown that the output noise level of the proposed electronics is quite low for the reliable observation of the Brownian motion of the cantilever. © Pleiades Publishing, Inc. 2014 |
| abstractGer |
Abstract An electronic circuit for processing signals from a multisegment photodiode (PD) cantilever-bending sensor for an atomic-force microscope (AFM) of “classical” design is described. The electronics includes two analog channels for selecting the difference between the photocurrents of two halves of the receiving area, each channel being normalized to the signal of the total illumination of the PD. The use of modern electronic components allowed the extension of the operating frequency band of the conventional-circuit response from ordinary 200–300 kHz to 2–3 MHz, thus suppressing phase distortions in the band from 0 to 1 MHz. Owing to this, for cantilever-vibration frequencies of up to 200 kHz, the voltage at the circuit output can be accepted with a high accuracy as the signal of the instantaneous position of the cantilever tip with respect to the sample surface. It was shown that the output noise level of the proposed electronics is quite low for the reliable observation of the Brownian motion of the cantilever. © Pleiades Publishing, Inc. 2014 |
| abstract_unstemmed |
Abstract An electronic circuit for processing signals from a multisegment photodiode (PD) cantilever-bending sensor for an atomic-force microscope (AFM) of “classical” design is described. The electronics includes two analog channels for selecting the difference between the photocurrents of two halves of the receiving area, each channel being normalized to the signal of the total illumination of the PD. The use of modern electronic components allowed the extension of the operating frequency band of the conventional-circuit response from ordinary 200–300 kHz to 2–3 MHz, thus suppressing phase distortions in the band from 0 to 1 MHz. Owing to this, for cantilever-vibration frequencies of up to 200 kHz, the voltage at the circuit output can be accepted with a high accuracy as the signal of the instantaneous position of the cantilever tip with respect to the sample surface. It was shown that the output noise level of the proposed electronics is quite low for the reliable observation of the Brownian motion of the cantilever. © Pleiades Publishing, Inc. 2014 |
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A four-segment photodiode cantilever-bending sensor for an atomic-force microscope |
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Kazantzeva, E. A. |
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10.1134/S0020441214040046 |
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