A statistical threshold meter of shaper-discriminators of scintillation detectors
Abstract A statistical threshold meter of shaper-discriminators, used in detectors of the Baksan Underground Scintillation Telescope, is described. The device is based on an ATmega103 microprocessor. The principle of operation and block diagram of the device are given. The application of the device...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Yanin, A. F. [verfasserIn] |
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| Format: |
Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2015 |
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| Schlagwörter: |
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| Anmerkung: |
© Pleiades Publishing, Inc. 2015 |
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| Übergeordnetes Werk: |
Enthalten in: Instruments and experimental techniques - Pleiades Publishing, 1959, 58(2015), 2 vom: März, Seite 229-233 |
|---|---|
| Übergeordnetes Werk: |
volume:58 ; year:2015 ; number:2 ; month:03 ; pages:229-233 |
| Links: |
|---|
| DOI / URN: |
10.1134/S0020441215010315 |
|---|
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OLC2034155939 |
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| 520 | |a Abstract A statistical threshold meter of shaper-discriminators, used in detectors of the Baksan Underground Scintillation Telescope, is described. The device is based on an ATmega103 microprocessor. The principle of operation and block diagram of the device are given. The application of the device reduced the adjustment time of the shaper-discriminators by a factor of dozens, and, in addition, due to the use of statistical methods in the program code of the microprocessor, the threshold adjustment accuracy went up by a factor of 2.5 as compared to the previous adjustment method. The device allows one to diagnose faults in electronics of the anode and 12th dynode circuits and to distinguish photoelectron multiplier tubes with high noise levels. | ||
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10.1134/S0020441215010315 doi (DE-627)OLC2034155939 (DE-He213)S0020441215010315-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Yanin, A. F. verfasserin aut A statistical threshold meter of shaper-discriminators of scintillation detectors 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Inc. 2015 Abstract A statistical threshold meter of shaper-discriminators, used in detectors of the Baksan Underground Scintillation Telescope, is described. The device is based on an ATmega103 microprocessor. The principle of operation and block diagram of the device are given. The application of the device reduced the adjustment time of the shaper-discriminators by a factor of dozens, and, in addition, due to the use of statistical methods in the program code of the microprocessor, the threshold adjustment accuracy went up by a factor of 2.5 as compared to the previous adjustment method. The device allows one to diagnose faults in electronics of the anode and 12th dynode circuits and to distinguish photoelectron multiplier tubes with high noise levels. Statistical Threshold Reference Voltage Scintillation Detector Elbrus Anode Pulse Dzaparova, I. M. aut Boliev, M. M. aut Novoseltseva, R. V. aut Enthalten in Instruments and experimental techniques Pleiades Publishing, 1959 58(2015), 2 vom: März, Seite 229-233 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:58 year:2015 number:2 month:03 pages:229-233 https://doi.org/10.1134/S0020441215010315 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 AR 58 2015 2 03 229-233 |
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10.1134/S0020441215010315 doi (DE-627)OLC2034155939 (DE-He213)S0020441215010315-p DE-627 ger DE-627 rakwb eng 620 VZ 11 ssgn Yanin, A. F. verfasserin aut A statistical threshold meter of shaper-discriminators of scintillation detectors 2015 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Inc. 2015 Abstract A statistical threshold meter of shaper-discriminators, used in detectors of the Baksan Underground Scintillation Telescope, is described. The device is based on an ATmega103 microprocessor. The principle of operation and block diagram of the device are given. The application of the device reduced the adjustment time of the shaper-discriminators by a factor of dozens, and, in addition, due to the use of statistical methods in the program code of the microprocessor, the threshold adjustment accuracy went up by a factor of 2.5 as compared to the previous adjustment method. The device allows one to diagnose faults in electronics of the anode and 12th dynode circuits and to distinguish photoelectron multiplier tubes with high noise levels. Statistical Threshold Reference Voltage Scintillation Detector Elbrus Anode Pulse Dzaparova, I. M. aut Boliev, M. M. aut Novoseltseva, R. V. aut Enthalten in Instruments and experimental techniques Pleiades Publishing, 1959 58(2015), 2 vom: März, Seite 229-233 (DE-627)129603007 (DE-600)241643-8 (DE-576)015096815 0020-4412 nnns volume:58 year:2015 number:2 month:03 pages:229-233 https://doi.org/10.1134/S0020441215010315 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-PHY GBV_ILN_70 AR 58 2015 2 03 229-233 |
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Abstract A statistical threshold meter of shaper-discriminators, used in detectors of the Baksan Underground Scintillation Telescope, is described. The device is based on an ATmega103 microprocessor. The principle of operation and block diagram of the device are given. The application of the device reduced the adjustment time of the shaper-discriminators by a factor of dozens, and, in addition, due to the use of statistical methods in the program code of the microprocessor, the threshold adjustment accuracy went up by a factor of 2.5 as compared to the previous adjustment method. The device allows one to diagnose faults in electronics of the anode and 12th dynode circuits and to distinguish photoelectron multiplier tubes with high noise levels. © Pleiades Publishing, Inc. 2015 |
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Abstract A statistical threshold meter of shaper-discriminators, used in detectors of the Baksan Underground Scintillation Telescope, is described. The device is based on an ATmega103 microprocessor. The principle of operation and block diagram of the device are given. The application of the device reduced the adjustment time of the shaper-discriminators by a factor of dozens, and, in addition, due to the use of statistical methods in the program code of the microprocessor, the threshold adjustment accuracy went up by a factor of 2.5 as compared to the previous adjustment method. The device allows one to diagnose faults in electronics of the anode and 12th dynode circuits and to distinguish photoelectron multiplier tubes with high noise levels. © Pleiades Publishing, Inc. 2015 |
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Abstract A statistical threshold meter of shaper-discriminators, used in detectors of the Baksan Underground Scintillation Telescope, is described. The device is based on an ATmega103 microprocessor. The principle of operation and block diagram of the device are given. The application of the device reduced the adjustment time of the shaper-discriminators by a factor of dozens, and, in addition, due to the use of statistical methods in the program code of the microprocessor, the threshold adjustment accuracy went up by a factor of 2.5 as compared to the previous adjustment method. The device allows one to diagnose faults in electronics of the anode and 12th dynode circuits and to distinguish photoelectron multiplier tubes with high noise levels. © Pleiades Publishing, Inc. 2015 |
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<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC2034155939</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230503094345.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">200819s2015 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1134/S0020441215010315</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC2034155939</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-He213)S0020441215010315-p</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">620</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">11</subfield><subfield code="2">ssgn</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Yanin, A. F.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">A statistical threshold meter of shaper-discriminators of scintillation detectors</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2015</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© Pleiades Publishing, Inc. 2015</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract A statistical threshold meter of shaper-discriminators, used in detectors of the Baksan Underground Scintillation Telescope, is described. The device is based on an ATmega103 microprocessor. The principle of operation and block diagram of the device are given. The application of the device reduced the adjustment time of the shaper-discriminators by a factor of dozens, and, in addition, due to the use of statistical methods in the program code of the microprocessor, the threshold adjustment accuracy went up by a factor of 2.5 as compared to the previous adjustment method. The device allows one to diagnose faults in electronics of the anode and 12th dynode circuits and to distinguish photoelectron multiplier tubes with high noise levels.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Statistical Threshold</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Reference Voltage</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Scintillation Detector</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Elbrus</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Anode Pulse</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Dzaparova, I. M.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Boliev, M. 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