Application of astigmatic method and snell’s law on the thickness and refractive index measurement of a transparent plate
Abstract In this study, a thickness and refractive index measuring system for the transparent plate has been proposed. The measuring system is composed of an astigmatic measurement module and a light spot measurement module using a DVD optical pickup, a laser diode and a quadrant photodiode detector...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Liu, Chien-Hung [verfasserIn] |
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| Format: |
Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2013 |
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| Schlagwörter: |
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| Anmerkung: |
© Springer-Verlag Berlin Heidelberg 2013 |
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| Übergeordnetes Werk: |
Enthalten in: Microsystem technologies - Springer Berlin Heidelberg, 1994, 19(2013), 11 vom: 08. Juni, Seite 1761-1766 |
|---|---|
| Übergeordnetes Werk: |
volume:19 ; year:2013 ; number:11 ; day:08 ; month:06 ; pages:1761-1766 |
| Links: |
|---|
| DOI / URN: |
10.1007/s00542-013-1831-y |
|---|
| Katalog-ID: |
OLC2034935780 |
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| 520 | |a Abstract In this study, a thickness and refractive index measuring system for the transparent plate has been proposed. The measuring system is composed of an astigmatic measurement module and a light spot measurement module using a DVD optical pickup, a laser diode and a quadrant photodiode detector. Both of the thickness and refractive index of a transparent plate are converted into the focusing error of DVD pickup based on astigmatic method and the light spot displacements based on snell’s law in our proposed system. The thickness and the refractive index are simultaneously calculated by means of two nonlinear formulas. The accuracy of the proposed system is 99 % verified by a height Gauge and the refractive index by the TF-166. | ||
| 650 | 4 | |a Refractive Index | |
| 650 | 4 | |a Refraction Index | |
| 650 | 4 | |a Refractive Index Measurement | |
| 650 | 4 | |a Transparent Plate | |
| 650 | 4 | |a Optical Pickup | |
| 700 | 1 | |a Liu, Chin-Chia |4 aut | |
| 700 | 1 | |a Huang, Wei-Chuan |4 aut | |
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10.1007/s00542-013-1831-y doi (DE-627)OLC2034935780 (DE-He213)s00542-013-1831-y-p DE-627 ger DE-627 rakwb eng 620 VZ 510 VZ Liu, Chien-Hung verfasserin aut Application of astigmatic method and snell’s law on the thickness and refractive index measurement of a transparent plate 2013 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer-Verlag Berlin Heidelberg 2013 Abstract In this study, a thickness and refractive index measuring system for the transparent plate has been proposed. The measuring system is composed of an astigmatic measurement module and a light spot measurement module using a DVD optical pickup, a laser diode and a quadrant photodiode detector. Both of the thickness and refractive index of a transparent plate are converted into the focusing error of DVD pickup based on astigmatic method and the light spot displacements based on snell’s law in our proposed system. The thickness and the refractive index are simultaneously calculated by means of two nonlinear formulas. The accuracy of the proposed system is 99 % verified by a height Gauge and the refractive index by the TF-166. Refractive Index Refraction Index Refractive Index Measurement Transparent Plate Optical Pickup Liu, Chin-Chia aut Huang, Wei-Chuan aut Enthalten in Microsystem technologies Springer Berlin Heidelberg, 1994 19(2013), 11 vom: 08. Juni, Seite 1761-1766 (DE-627)182644278 (DE-600)1223008-X (DE-576)045302146 0946-7076 nnns volume:19 year:2013 number:11 day:08 month:06 pages:1761-1766 https://doi.org/10.1007/s00542-013-1831-y lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT SSG-OPC-MAT GBV_ILN_70 GBV_ILN_267 GBV_ILN_2018 GBV_ILN_2048 GBV_ILN_4277 AR 19 2013 11 08 06 1761-1766 |
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10.1007/s00542-013-1831-y doi (DE-627)OLC2034935780 (DE-He213)s00542-013-1831-y-p DE-627 ger DE-627 rakwb eng 620 VZ 510 VZ Liu, Chien-Hung verfasserin aut Application of astigmatic method and snell’s law on the thickness and refractive index measurement of a transparent plate 2013 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer-Verlag Berlin Heidelberg 2013 Abstract In this study, a thickness and refractive index measuring system for the transparent plate has been proposed. The measuring system is composed of an astigmatic measurement module and a light spot measurement module using a DVD optical pickup, a laser diode and a quadrant photodiode detector. Both of the thickness and refractive index of a transparent plate are converted into the focusing error of DVD pickup based on astigmatic method and the light spot displacements based on snell’s law in our proposed system. The thickness and the refractive index are simultaneously calculated by means of two nonlinear formulas. The accuracy of the proposed system is 99 % verified by a height Gauge and the refractive index by the TF-166. Refractive Index Refraction Index Refractive Index Measurement Transparent Plate Optical Pickup Liu, Chin-Chia aut Huang, Wei-Chuan aut Enthalten in Microsystem technologies Springer Berlin Heidelberg, 1994 19(2013), 11 vom: 08. Juni, Seite 1761-1766 (DE-627)182644278 (DE-600)1223008-X (DE-576)045302146 0946-7076 nnns volume:19 year:2013 number:11 day:08 month:06 pages:1761-1766 https://doi.org/10.1007/s00542-013-1831-y lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT SSG-OPC-MAT GBV_ILN_70 GBV_ILN_267 GBV_ILN_2018 GBV_ILN_2048 GBV_ILN_4277 AR 19 2013 11 08 06 1761-1766 |
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10.1007/s00542-013-1831-y doi (DE-627)OLC2034935780 (DE-He213)s00542-013-1831-y-p DE-627 ger DE-627 rakwb eng 620 VZ 510 VZ Liu, Chien-Hung verfasserin aut Application of astigmatic method and snell’s law on the thickness and refractive index measurement of a transparent plate 2013 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer-Verlag Berlin Heidelberg 2013 Abstract In this study, a thickness and refractive index measuring system for the transparent plate has been proposed. The measuring system is composed of an astigmatic measurement module and a light spot measurement module using a DVD optical pickup, a laser diode and a quadrant photodiode detector. Both of the thickness and refractive index of a transparent plate are converted into the focusing error of DVD pickup based on astigmatic method and the light spot displacements based on snell’s law in our proposed system. The thickness and the refractive index are simultaneously calculated by means of two nonlinear formulas. The accuracy of the proposed system is 99 % verified by a height Gauge and the refractive index by the TF-166. Refractive Index Refraction Index Refractive Index Measurement Transparent Plate Optical Pickup Liu, Chin-Chia aut Huang, Wei-Chuan aut Enthalten in Microsystem technologies Springer Berlin Heidelberg, 1994 19(2013), 11 vom: 08. Juni, Seite 1761-1766 (DE-627)182644278 (DE-600)1223008-X (DE-576)045302146 0946-7076 nnns volume:19 year:2013 number:11 day:08 month:06 pages:1761-1766 https://doi.org/10.1007/s00542-013-1831-y lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT SSG-OPC-MAT GBV_ILN_70 GBV_ILN_267 GBV_ILN_2018 GBV_ILN_2048 GBV_ILN_4277 AR 19 2013 11 08 06 1761-1766 |
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10.1007/s00542-013-1831-y doi (DE-627)OLC2034935780 (DE-He213)s00542-013-1831-y-p DE-627 ger DE-627 rakwb eng 620 VZ 510 VZ Liu, Chien-Hung verfasserin aut Application of astigmatic method and snell’s law on the thickness and refractive index measurement of a transparent plate 2013 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer-Verlag Berlin Heidelberg 2013 Abstract In this study, a thickness and refractive index measuring system for the transparent plate has been proposed. The measuring system is composed of an astigmatic measurement module and a light spot measurement module using a DVD optical pickup, a laser diode and a quadrant photodiode detector. Both of the thickness and refractive index of a transparent plate are converted into the focusing error of DVD pickup based on astigmatic method and the light spot displacements based on snell’s law in our proposed system. The thickness and the refractive index are simultaneously calculated by means of two nonlinear formulas. The accuracy of the proposed system is 99 % verified by a height Gauge and the refractive index by the TF-166. Refractive Index Refraction Index Refractive Index Measurement Transparent Plate Optical Pickup Liu, Chin-Chia aut Huang, Wei-Chuan aut Enthalten in Microsystem technologies Springer Berlin Heidelberg, 1994 19(2013), 11 vom: 08. Juni, Seite 1761-1766 (DE-627)182644278 (DE-600)1223008-X (DE-576)045302146 0946-7076 nnns volume:19 year:2013 number:11 day:08 month:06 pages:1761-1766 https://doi.org/10.1007/s00542-013-1831-y lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT SSG-OPC-MAT GBV_ILN_70 GBV_ILN_267 GBV_ILN_2018 GBV_ILN_2048 GBV_ILN_4277 AR 19 2013 11 08 06 1761-1766 |
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10.1007/s00542-013-1831-y doi (DE-627)OLC2034935780 (DE-He213)s00542-013-1831-y-p DE-627 ger DE-627 rakwb eng 620 VZ 510 VZ Liu, Chien-Hung verfasserin aut Application of astigmatic method and snell’s law on the thickness and refractive index measurement of a transparent plate 2013 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer-Verlag Berlin Heidelberg 2013 Abstract In this study, a thickness and refractive index measuring system for the transparent plate has been proposed. The measuring system is composed of an astigmatic measurement module and a light spot measurement module using a DVD optical pickup, a laser diode and a quadrant photodiode detector. Both of the thickness and refractive index of a transparent plate are converted into the focusing error of DVD pickup based on astigmatic method and the light spot displacements based on snell’s law in our proposed system. The thickness and the refractive index are simultaneously calculated by means of two nonlinear formulas. The accuracy of the proposed system is 99 % verified by a height Gauge and the refractive index by the TF-166. Refractive Index Refraction Index Refractive Index Measurement Transparent Plate Optical Pickup Liu, Chin-Chia aut Huang, Wei-Chuan aut Enthalten in Microsystem technologies Springer Berlin Heidelberg, 1994 19(2013), 11 vom: 08. Juni, Seite 1761-1766 (DE-627)182644278 (DE-600)1223008-X (DE-576)045302146 0946-7076 nnns volume:19 year:2013 number:11 day:08 month:06 pages:1761-1766 https://doi.org/10.1007/s00542-013-1831-y lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT SSG-OPC-MAT GBV_ILN_70 GBV_ILN_267 GBV_ILN_2018 GBV_ILN_2048 GBV_ILN_4277 AR 19 2013 11 08 06 1761-1766 |
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Application of astigmatic method and snell’s law on the thickness and refractive index measurement of a transparent plate |
| abstract |
Abstract In this study, a thickness and refractive index measuring system for the transparent plate has been proposed. The measuring system is composed of an astigmatic measurement module and a light spot measurement module using a DVD optical pickup, a laser diode and a quadrant photodiode detector. Both of the thickness and refractive index of a transparent plate are converted into the focusing error of DVD pickup based on astigmatic method and the light spot displacements based on snell’s law in our proposed system. The thickness and the refractive index are simultaneously calculated by means of two nonlinear formulas. The accuracy of the proposed system is 99 % verified by a height Gauge and the refractive index by the TF-166. © Springer-Verlag Berlin Heidelberg 2013 |
| abstractGer |
Abstract In this study, a thickness and refractive index measuring system for the transparent plate has been proposed. The measuring system is composed of an astigmatic measurement module and a light spot measurement module using a DVD optical pickup, a laser diode and a quadrant photodiode detector. Both of the thickness and refractive index of a transparent plate are converted into the focusing error of DVD pickup based on astigmatic method and the light spot displacements based on snell’s law in our proposed system. The thickness and the refractive index are simultaneously calculated by means of two nonlinear formulas. The accuracy of the proposed system is 99 % verified by a height Gauge and the refractive index by the TF-166. © Springer-Verlag Berlin Heidelberg 2013 |
| abstract_unstemmed |
Abstract In this study, a thickness and refractive index measuring system for the transparent plate has been proposed. The measuring system is composed of an astigmatic measurement module and a light spot measurement module using a DVD optical pickup, a laser diode and a quadrant photodiode detector. Both of the thickness and refractive index of a transparent plate are converted into the focusing error of DVD pickup based on astigmatic method and the light spot displacements based on snell’s law in our proposed system. The thickness and the refractive index are simultaneously calculated by means of two nonlinear formulas. The accuracy of the proposed system is 99 % verified by a height Gauge and the refractive index by the TF-166. © Springer-Verlag Berlin Heidelberg 2013 |
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Application of astigmatic method and snell’s law on the thickness and refractive index measurement of a transparent plate |
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Liu, Chin-Chia Huang, Wei-Chuan |
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Liu, Chin-Chia Huang, Wei-Chuan |
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| doi_str |
10.1007/s00542-013-1831-y |
| up_date |
2024-07-03T23:05:26.111Z |
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1803600974171865088 |
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