Dew point and relative humidity measurement using a quartz resonant sensor
Abstract A new dew point measurement device for humidity measurement in high temperature environment using a quartz crystal sensor was proposed. Combined with Peltier module and quartz crystal, active condensation occurs in the quartz surface to change the mass on the surface of quartz crystal, and...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Nie, Jing [verfasserIn] |
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| Format: |
Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2013 |
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| Schlagwörter: |
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| Anmerkung: |
© Springer-Verlag Berlin Heidelberg 2013 |
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| Übergeordnetes Werk: |
Enthalten in: Microsystem technologies - Springer Berlin Heidelberg, 1994, 20(2013), 7 vom: 22. Sept., Seite 1311-1315 |
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| Übergeordnetes Werk: |
volume:20 ; year:2013 ; number:7 ; day:22 ; month:09 ; pages:1311-1315 |
| Links: |
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| DOI / URN: |
10.1007/s00542-013-1914-9 |
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| Katalog-ID: |
OLC2034937457 |
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| 520 | |a Abstract A new dew point measurement device for humidity measurement in high temperature environment using a quartz crystal sensor was proposed. Combined with Peltier module and quartz crystal, active condensation occurs in the quartz surface to change the mass on the surface of quartz crystal, and use the shift of its resonant frequency identify the time of condensation. This quartz sensor does not require any absorbent material, and it is directly stuck on the Peltier element. The sensor system can also be achieved relative humidity measurement based on dew point and ambient-temperature measuring. It can operate in the range of dew point temperature from 50 to −30 °C, and in the range of relative humidity from 1 to 90 % RH. The measured dew points values and relative humidity values showed very good agreement with reference values and were within ±0.3 °C, 1 % RH, respectively over the whole temperature range. | ||
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10.1007/s00542-013-1914-9 doi (DE-627)OLC2034937457 (DE-He213)s00542-013-1914-9-p DE-627 ger DE-627 rakwb eng 620 VZ 510 VZ Nie, Jing verfasserin aut Dew point and relative humidity measurement using a quartz resonant sensor 2013 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer-Verlag Berlin Heidelberg 2013 Abstract A new dew point measurement device for humidity measurement in high temperature environment using a quartz crystal sensor was proposed. Combined with Peltier module and quartz crystal, active condensation occurs in the quartz surface to change the mass on the surface of quartz crystal, and use the shift of its resonant frequency identify the time of condensation. This quartz sensor does not require any absorbent material, and it is directly stuck on the Peltier element. The sensor system can also be achieved relative humidity measurement based on dew point and ambient-temperature measuring. It can operate in the range of dew point temperature from 50 to −30 °C, and in the range of relative humidity from 1 to 90 % RH. The measured dew points values and relative humidity values showed very good agreement with reference values and were within ±0.3 °C, 1 % RH, respectively over the whole temperature range. Resonant Frequency Quartz Crystal Quartz Crystal Microbalance High Temperature Environment Quartz Resonator Meng, Xiaofeng aut Enthalten in Microsystem technologies Springer Berlin Heidelberg, 1994 20(2013), 7 vom: 22. Sept., Seite 1311-1315 (DE-627)182644278 (DE-600)1223008-X (DE-576)045302146 0946-7076 nnns volume:20 year:2013 number:7 day:22 month:09 pages:1311-1315 https://doi.org/10.1007/s00542-013-1914-9 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT SSG-OPC-MAT GBV_ILN_70 GBV_ILN_267 GBV_ILN_2018 GBV_ILN_2048 GBV_ILN_4277 AR 20 2013 7 22 09 1311-1315 |
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10.1007/s00542-013-1914-9 doi (DE-627)OLC2034937457 (DE-He213)s00542-013-1914-9-p DE-627 ger DE-627 rakwb eng 620 VZ 510 VZ Nie, Jing verfasserin aut Dew point and relative humidity measurement using a quartz resonant sensor 2013 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer-Verlag Berlin Heidelberg 2013 Abstract A new dew point measurement device for humidity measurement in high temperature environment using a quartz crystal sensor was proposed. Combined with Peltier module and quartz crystal, active condensation occurs in the quartz surface to change the mass on the surface of quartz crystal, and use the shift of its resonant frequency identify the time of condensation. This quartz sensor does not require any absorbent material, and it is directly stuck on the Peltier element. The sensor system can also be achieved relative humidity measurement based on dew point and ambient-temperature measuring. It can operate in the range of dew point temperature from 50 to −30 °C, and in the range of relative humidity from 1 to 90 % RH. The measured dew points values and relative humidity values showed very good agreement with reference values and were within ±0.3 °C, 1 % RH, respectively over the whole temperature range. Resonant Frequency Quartz Crystal Quartz Crystal Microbalance High Temperature Environment Quartz Resonator Meng, Xiaofeng aut Enthalten in Microsystem technologies Springer Berlin Heidelberg, 1994 20(2013), 7 vom: 22. Sept., Seite 1311-1315 (DE-627)182644278 (DE-600)1223008-X (DE-576)045302146 0946-7076 nnns volume:20 year:2013 number:7 day:22 month:09 pages:1311-1315 https://doi.org/10.1007/s00542-013-1914-9 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT SSG-OPC-MAT GBV_ILN_70 GBV_ILN_267 GBV_ILN_2018 GBV_ILN_2048 GBV_ILN_4277 AR 20 2013 7 22 09 1311-1315 |
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10.1007/s00542-013-1914-9 doi (DE-627)OLC2034937457 (DE-He213)s00542-013-1914-9-p DE-627 ger DE-627 rakwb eng 620 VZ 510 VZ Nie, Jing verfasserin aut Dew point and relative humidity measurement using a quartz resonant sensor 2013 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer-Verlag Berlin Heidelberg 2013 Abstract A new dew point measurement device for humidity measurement in high temperature environment using a quartz crystal sensor was proposed. Combined with Peltier module and quartz crystal, active condensation occurs in the quartz surface to change the mass on the surface of quartz crystal, and use the shift of its resonant frequency identify the time of condensation. This quartz sensor does not require any absorbent material, and it is directly stuck on the Peltier element. The sensor system can also be achieved relative humidity measurement based on dew point and ambient-temperature measuring. It can operate in the range of dew point temperature from 50 to −30 °C, and in the range of relative humidity from 1 to 90 % RH. The measured dew points values and relative humidity values showed very good agreement with reference values and were within ±0.3 °C, 1 % RH, respectively over the whole temperature range. Resonant Frequency Quartz Crystal Quartz Crystal Microbalance High Temperature Environment Quartz Resonator Meng, Xiaofeng aut Enthalten in Microsystem technologies Springer Berlin Heidelberg, 1994 20(2013), 7 vom: 22. Sept., Seite 1311-1315 (DE-627)182644278 (DE-600)1223008-X (DE-576)045302146 0946-7076 nnns volume:20 year:2013 number:7 day:22 month:09 pages:1311-1315 https://doi.org/10.1007/s00542-013-1914-9 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT SSG-OPC-MAT GBV_ILN_70 GBV_ILN_267 GBV_ILN_2018 GBV_ILN_2048 GBV_ILN_4277 AR 20 2013 7 22 09 1311-1315 |
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10.1007/s00542-013-1914-9 doi (DE-627)OLC2034937457 (DE-He213)s00542-013-1914-9-p DE-627 ger DE-627 rakwb eng 620 VZ 510 VZ Nie, Jing verfasserin aut Dew point and relative humidity measurement using a quartz resonant sensor 2013 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer-Verlag Berlin Heidelberg 2013 Abstract A new dew point measurement device for humidity measurement in high temperature environment using a quartz crystal sensor was proposed. Combined with Peltier module and quartz crystal, active condensation occurs in the quartz surface to change the mass on the surface of quartz crystal, and use the shift of its resonant frequency identify the time of condensation. This quartz sensor does not require any absorbent material, and it is directly stuck on the Peltier element. The sensor system can also be achieved relative humidity measurement based on dew point and ambient-temperature measuring. It can operate in the range of dew point temperature from 50 to −30 °C, and in the range of relative humidity from 1 to 90 % RH. The measured dew points values and relative humidity values showed very good agreement with reference values and were within ±0.3 °C, 1 % RH, respectively over the whole temperature range. Resonant Frequency Quartz Crystal Quartz Crystal Microbalance High Temperature Environment Quartz Resonator Meng, Xiaofeng aut Enthalten in Microsystem technologies Springer Berlin Heidelberg, 1994 20(2013), 7 vom: 22. Sept., Seite 1311-1315 (DE-627)182644278 (DE-600)1223008-X (DE-576)045302146 0946-7076 nnns volume:20 year:2013 number:7 day:22 month:09 pages:1311-1315 https://doi.org/10.1007/s00542-013-1914-9 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT SSG-OPC-MAT GBV_ILN_70 GBV_ILN_267 GBV_ILN_2018 GBV_ILN_2048 GBV_ILN_4277 AR 20 2013 7 22 09 1311-1315 |
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10.1007/s00542-013-1914-9 doi (DE-627)OLC2034937457 (DE-He213)s00542-013-1914-9-p DE-627 ger DE-627 rakwb eng 620 VZ 510 VZ Nie, Jing verfasserin aut Dew point and relative humidity measurement using a quartz resonant sensor 2013 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer-Verlag Berlin Heidelberg 2013 Abstract A new dew point measurement device for humidity measurement in high temperature environment using a quartz crystal sensor was proposed. Combined with Peltier module and quartz crystal, active condensation occurs in the quartz surface to change the mass on the surface of quartz crystal, and use the shift of its resonant frequency identify the time of condensation. This quartz sensor does not require any absorbent material, and it is directly stuck on the Peltier element. The sensor system can also be achieved relative humidity measurement based on dew point and ambient-temperature measuring. It can operate in the range of dew point temperature from 50 to −30 °C, and in the range of relative humidity from 1 to 90 % RH. The measured dew points values and relative humidity values showed very good agreement with reference values and were within ±0.3 °C, 1 % RH, respectively over the whole temperature range. Resonant Frequency Quartz Crystal Quartz Crystal Microbalance High Temperature Environment Quartz Resonator Meng, Xiaofeng aut Enthalten in Microsystem technologies Springer Berlin Heidelberg, 1994 20(2013), 7 vom: 22. Sept., Seite 1311-1315 (DE-627)182644278 (DE-600)1223008-X (DE-576)045302146 0946-7076 nnns volume:20 year:2013 number:7 day:22 month:09 pages:1311-1315 https://doi.org/10.1007/s00542-013-1914-9 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-TEC SSG-OLC-MAT SSG-OPC-MAT GBV_ILN_70 GBV_ILN_267 GBV_ILN_2018 GBV_ILN_2048 GBV_ILN_4277 AR 20 2013 7 22 09 1311-1315 |
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Dew point and relative humidity measurement using a quartz resonant sensor |
| abstract |
Abstract A new dew point measurement device for humidity measurement in high temperature environment using a quartz crystal sensor was proposed. Combined with Peltier module and quartz crystal, active condensation occurs in the quartz surface to change the mass on the surface of quartz crystal, and use the shift of its resonant frequency identify the time of condensation. This quartz sensor does not require any absorbent material, and it is directly stuck on the Peltier element. The sensor system can also be achieved relative humidity measurement based on dew point and ambient-temperature measuring. It can operate in the range of dew point temperature from 50 to −30 °C, and in the range of relative humidity from 1 to 90 % RH. The measured dew points values and relative humidity values showed very good agreement with reference values and were within ±0.3 °C, 1 % RH, respectively over the whole temperature range. © Springer-Verlag Berlin Heidelberg 2013 |
| abstractGer |
Abstract A new dew point measurement device for humidity measurement in high temperature environment using a quartz crystal sensor was proposed. Combined with Peltier module and quartz crystal, active condensation occurs in the quartz surface to change the mass on the surface of quartz crystal, and use the shift of its resonant frequency identify the time of condensation. This quartz sensor does not require any absorbent material, and it is directly stuck on the Peltier element. The sensor system can also be achieved relative humidity measurement based on dew point and ambient-temperature measuring. It can operate in the range of dew point temperature from 50 to −30 °C, and in the range of relative humidity from 1 to 90 % RH. The measured dew points values and relative humidity values showed very good agreement with reference values and were within ±0.3 °C, 1 % RH, respectively over the whole temperature range. © Springer-Verlag Berlin Heidelberg 2013 |
| abstract_unstemmed |
Abstract A new dew point measurement device for humidity measurement in high temperature environment using a quartz crystal sensor was proposed. Combined with Peltier module and quartz crystal, active condensation occurs in the quartz surface to change the mass on the surface of quartz crystal, and use the shift of its resonant frequency identify the time of condensation. This quartz sensor does not require any absorbent material, and it is directly stuck on the Peltier element. The sensor system can also be achieved relative humidity measurement based on dew point and ambient-temperature measuring. It can operate in the range of dew point temperature from 50 to −30 °C, and in the range of relative humidity from 1 to 90 % RH. The measured dew points values and relative humidity values showed very good agreement with reference values and were within ±0.3 °C, 1 % RH, respectively over the whole temperature range. © Springer-Verlag Berlin Heidelberg 2013 |
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Dew point and relative humidity measurement using a quartz resonant sensor |
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Meng, Xiaofeng |
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10.1007/s00542-013-1914-9 |
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