Energy Resolution of STJ X-Ray Detectors with Killed Electrode. Simple Model
Abstract Superconducting tunnel junctions X-ray detectors Ti/Nb/Al,$ AlO_{x} $/Al/Nb(2)/NbN with killed Ti/Nb electrode was studied as a function of bias voltage, energy of the absorbed quantum, and thickness of the Nb(2) layer. The data was compared with a simple diffusion model including the losse...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Andrianov, V. A. [verfasserIn] |
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| Format: |
Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
2012 |
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| Schlagwörter: |
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| Anmerkung: |
© Springer Science+Business Media, LLC 2012 |
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| Übergeordnetes Werk: |
Enthalten in: Journal of low temperature physics - Springer US, 1969, 167(2012), 3-4 vom: 26. Jan., Seite 404-409 |
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| Übergeordnetes Werk: |
volume:167 ; year:2012 ; number:3-4 ; day:26 ; month:01 ; pages:404-409 |
| Links: |
|---|
| DOI / URN: |
10.1007/s10909-012-0525-7 |
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| Katalog-ID: |
OLC2036816290 |
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| 520 | |a Abstract Superconducting tunnel junctions X-ray detectors Ti/Nb/Al,$ AlO_{x} $/Al/Nb(2)/NbN with killed Ti/Nb electrode was studied as a function of bias voltage, energy of the absorbed quantum, and thickness of the Nb(2) layer. The data was compared with a simple diffusion model including the losses of excess quasiparticles due to self-recombination. It was shown that increasing of the electrode thickness reduces the self-recombination contribution and improves the linearity of the detector response. | ||
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10.1007/s10909-012-0525-7 doi (DE-627)OLC2036816290 (DE-He213)s10909-012-0525-7-p DE-627 ger DE-627 rakwb eng 530 VZ Andrianov, V. A. verfasserin aut Energy Resolution of STJ X-Ray Detectors with Killed Electrode. Simple Model 2012 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC 2012 Abstract Superconducting tunnel junctions X-ray detectors Ti/Nb/Al,$ AlO_{x} $/Al/Nb(2)/NbN with killed Ti/Nb electrode was studied as a function of bias voltage, energy of the absorbed quantum, and thickness of the Nb(2) layer. The data was compared with a simple diffusion model including the losses of excess quasiparticles due to self-recombination. It was shown that increasing of the electrode thickness reduces the self-recombination contribution and improves the linearity of the detector response. Detectors Superconducting tunnel junctions X-rays Quasiparticles Recombination Phonons Energy resolution Filippenko, L. V. aut Enthalten in Journal of low temperature physics Springer US, 1969 167(2012), 3-4 vom: 26. Jan., Seite 404-409 (DE-627)129546267 (DE-600)218311-0 (DE-576)014996642 0022-2291 nnns volume:167 year:2012 number:3-4 day:26 month:01 pages:404-409 https://doi.org/10.1007/s10909-012-0525-7 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_22 GBV_ILN_40 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2005 GBV_ILN_2185 GBV_ILN_4036 GBV_ILN_4126 GBV_ILN_4323 AR 167 2012 3-4 26 01 404-409 |
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10.1007/s10909-012-0525-7 doi (DE-627)OLC2036816290 (DE-He213)s10909-012-0525-7-p DE-627 ger DE-627 rakwb eng 530 VZ Andrianov, V. A. verfasserin aut Energy Resolution of STJ X-Ray Detectors with Killed Electrode. Simple Model 2012 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC 2012 Abstract Superconducting tunnel junctions X-ray detectors Ti/Nb/Al,$ AlO_{x} $/Al/Nb(2)/NbN with killed Ti/Nb electrode was studied as a function of bias voltage, energy of the absorbed quantum, and thickness of the Nb(2) layer. The data was compared with a simple diffusion model including the losses of excess quasiparticles due to self-recombination. It was shown that increasing of the electrode thickness reduces the self-recombination contribution and improves the linearity of the detector response. Detectors Superconducting tunnel junctions X-rays Quasiparticles Recombination Phonons Energy resolution Filippenko, L. V. aut Enthalten in Journal of low temperature physics Springer US, 1969 167(2012), 3-4 vom: 26. Jan., Seite 404-409 (DE-627)129546267 (DE-600)218311-0 (DE-576)014996642 0022-2291 nnns volume:167 year:2012 number:3-4 day:26 month:01 pages:404-409 https://doi.org/10.1007/s10909-012-0525-7 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_22 GBV_ILN_40 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2005 GBV_ILN_2185 GBV_ILN_4036 GBV_ILN_4126 GBV_ILN_4323 AR 167 2012 3-4 26 01 404-409 |
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10.1007/s10909-012-0525-7 doi (DE-627)OLC2036816290 (DE-He213)s10909-012-0525-7-p DE-627 ger DE-627 rakwb eng 530 VZ Andrianov, V. A. verfasserin aut Energy Resolution of STJ X-Ray Detectors with Killed Electrode. Simple Model 2012 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Springer Science+Business Media, LLC 2012 Abstract Superconducting tunnel junctions X-ray detectors Ti/Nb/Al,$ AlO_{x} $/Al/Nb(2)/NbN with killed Ti/Nb electrode was studied as a function of bias voltage, energy of the absorbed quantum, and thickness of the Nb(2) layer. The data was compared with a simple diffusion model including the losses of excess quasiparticles due to self-recombination. It was shown that increasing of the electrode thickness reduces the self-recombination contribution and improves the linearity of the detector response. Detectors Superconducting tunnel junctions X-rays Quasiparticles Recombination Phonons Energy resolution Filippenko, L. V. aut Enthalten in Journal of low temperature physics Springer US, 1969 167(2012), 3-4 vom: 26. Jan., Seite 404-409 (DE-627)129546267 (DE-600)218311-0 (DE-576)014996642 0022-2291 nnns volume:167 year:2012 number:3-4 day:26 month:01 pages:404-409 https://doi.org/10.1007/s10909-012-0525-7 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_22 GBV_ILN_40 GBV_ILN_70 GBV_ILN_170 GBV_ILN_2005 GBV_ILN_2185 GBV_ILN_4036 GBV_ILN_4126 GBV_ILN_4323 AR 167 2012 3-4 26 01 404-409 |
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Abstract Superconducting tunnel junctions X-ray detectors Ti/Nb/Al,$ AlO_{x} $/Al/Nb(2)/NbN with killed Ti/Nb electrode was studied as a function of bias voltage, energy of the absorbed quantum, and thickness of the Nb(2) layer. The data was compared with a simple diffusion model including the losses of excess quasiparticles due to self-recombination. It was shown that increasing of the electrode thickness reduces the self-recombination contribution and improves the linearity of the detector response. © Springer Science+Business Media, LLC 2012 |
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Abstract Superconducting tunnel junctions X-ray detectors Ti/Nb/Al,$ AlO_{x} $/Al/Nb(2)/NbN with killed Ti/Nb electrode was studied as a function of bias voltage, energy of the absorbed quantum, and thickness of the Nb(2) layer. The data was compared with a simple diffusion model including the losses of excess quasiparticles due to self-recombination. It was shown that increasing of the electrode thickness reduces the self-recombination contribution and improves the linearity of the detector response. © Springer Science+Business Media, LLC 2012 |
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Abstract Superconducting tunnel junctions X-ray detectors Ti/Nb/Al,$ AlO_{x} $/Al/Nb(2)/NbN with killed Ti/Nb electrode was studied as a function of bias voltage, energy of the absorbed quantum, and thickness of the Nb(2) layer. The data was compared with a simple diffusion model including the losses of excess quasiparticles due to self-recombination. It was shown that increasing of the electrode thickness reduces the self-recombination contribution and improves the linearity of the detector response. © Springer Science+Business Media, LLC 2012 |
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2024-07-04T04:15:17.582Z |
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