Influence of pulsed laser radiation on the real structure of CdTe single crystals
Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample...
Ausführliche Beschreibung
Autor*in: |
Shul’pina, I. L. [verfasserIn] |
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Format: |
Artikel |
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Sprache: |
Englisch |
Erschienen: |
1998 |
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Schlagwörter: |
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Anmerkung: |
© American Institute of Physics 1998 |
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Übergeordnetes Werk: |
Enthalten in: Physics of the solid state - Nauka/Interperiodica, 1993, 40(1998), 1 vom: Jan., Seite 59-62 |
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Übergeordnetes Werk: |
volume:40 ; year:1998 ; number:1 ; month:01 ; pages:59-62 |
Links: |
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DOI / URN: |
10.1134/1.1130233 |
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Katalog-ID: |
OLC2040671552 |
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520 | |a Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. | ||
650 | 4 | |a Radiation | |
650 | 4 | |a Spectroscopy | |
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650 | 4 | |a Pulse Laser | |
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700 | 1 | |a Matveev, O. A. |4 aut | |
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10.1134/1.1130233 doi (DE-627)OLC2040671552 (DE-He213)1.1130233-p DE-627 ger DE-627 rakwb eng 530 VZ Shul’pina, I. L. verfasserin aut Influence of pulsed laser radiation on the real structure of CdTe single crystals 1998 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © American Institute of Physics 1998 Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. Radiation Spectroscopy State Physics Surface Layer Pulse Laser Zelenina, N. K. aut Matveev, O. A. aut Enthalten in Physics of the solid state Nauka/Interperiodica, 1993 40(1998), 1 vom: Jan., Seite 59-62 (DE-627)16567332X (DE-600)1159011-7 (DE-576)038490706 1063-7834 nnns volume:40 year:1998 number:1 month:01 pages:59-62 https://doi.org/10.1134/1.1130233 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_22 GBV_ILN_40 GBV_ILN_70 GBV_ILN_130 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2095 GBV_ILN_4027 GBV_ILN_4116 GBV_ILN_4306 GBV_ILN_4313 GBV_ILN_4315 GBV_ILN_4323 GBV_ILN_4700 AR 40 1998 1 01 59-62 |
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10.1134/1.1130233 doi (DE-627)OLC2040671552 (DE-He213)1.1130233-p DE-627 ger DE-627 rakwb eng 530 VZ Shul’pina, I. L. verfasserin aut Influence of pulsed laser radiation on the real structure of CdTe single crystals 1998 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © American Institute of Physics 1998 Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. Radiation Spectroscopy State Physics Surface Layer Pulse Laser Zelenina, N. K. aut Matveev, O. A. aut Enthalten in Physics of the solid state Nauka/Interperiodica, 1993 40(1998), 1 vom: Jan., Seite 59-62 (DE-627)16567332X (DE-600)1159011-7 (DE-576)038490706 1063-7834 nnns volume:40 year:1998 number:1 month:01 pages:59-62 https://doi.org/10.1134/1.1130233 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_22 GBV_ILN_40 GBV_ILN_70 GBV_ILN_130 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2095 GBV_ILN_4027 GBV_ILN_4116 GBV_ILN_4306 GBV_ILN_4313 GBV_ILN_4315 GBV_ILN_4323 GBV_ILN_4700 AR 40 1998 1 01 59-62 |
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10.1134/1.1130233 doi (DE-627)OLC2040671552 (DE-He213)1.1130233-p DE-627 ger DE-627 rakwb eng 530 VZ Shul’pina, I. L. verfasserin aut Influence of pulsed laser radiation on the real structure of CdTe single crystals 1998 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © American Institute of Physics 1998 Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. Radiation Spectroscopy State Physics Surface Layer Pulse Laser Zelenina, N. K. aut Matveev, O. A. aut Enthalten in Physics of the solid state Nauka/Interperiodica, 1993 40(1998), 1 vom: Jan., Seite 59-62 (DE-627)16567332X (DE-600)1159011-7 (DE-576)038490706 1063-7834 nnns volume:40 year:1998 number:1 month:01 pages:59-62 https://doi.org/10.1134/1.1130233 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_22 GBV_ILN_40 GBV_ILN_70 GBV_ILN_130 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2095 GBV_ILN_4027 GBV_ILN_4116 GBV_ILN_4306 GBV_ILN_4313 GBV_ILN_4315 GBV_ILN_4323 GBV_ILN_4700 AR 40 1998 1 01 59-62 |
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10.1134/1.1130233 doi (DE-627)OLC2040671552 (DE-He213)1.1130233-p DE-627 ger DE-627 rakwb eng 530 VZ Shul’pina, I. L. verfasserin aut Influence of pulsed laser radiation on the real structure of CdTe single crystals 1998 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © American Institute of Physics 1998 Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. Radiation Spectroscopy State Physics Surface Layer Pulse Laser Zelenina, N. K. aut Matveev, O. A. aut Enthalten in Physics of the solid state Nauka/Interperiodica, 1993 40(1998), 1 vom: Jan., Seite 59-62 (DE-627)16567332X (DE-600)1159011-7 (DE-576)038490706 1063-7834 nnns volume:40 year:1998 number:1 month:01 pages:59-62 https://doi.org/10.1134/1.1130233 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_22 GBV_ILN_40 GBV_ILN_70 GBV_ILN_130 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2095 GBV_ILN_4027 GBV_ILN_4116 GBV_ILN_4306 GBV_ILN_4313 GBV_ILN_4315 GBV_ILN_4323 GBV_ILN_4700 AR 40 1998 1 01 59-62 |
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10.1134/1.1130233 doi (DE-627)OLC2040671552 (DE-He213)1.1130233-p DE-627 ger DE-627 rakwb eng 530 VZ Shul’pina, I. L. verfasserin aut Influence of pulsed laser radiation on the real structure of CdTe single crystals 1998 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © American Institute of Physics 1998 Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. Radiation Spectroscopy State Physics Surface Layer Pulse Laser Zelenina, N. K. aut Matveev, O. A. aut Enthalten in Physics of the solid state Nauka/Interperiodica, 1993 40(1998), 1 vom: Jan., Seite 59-62 (DE-627)16567332X (DE-600)1159011-7 (DE-576)038490706 1063-7834 nnns volume:40 year:1998 number:1 month:01 pages:59-62 https://doi.org/10.1134/1.1130233 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_22 GBV_ILN_40 GBV_ILN_70 GBV_ILN_130 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2095 GBV_ILN_4027 GBV_ILN_4116 GBV_ILN_4306 GBV_ILN_4313 GBV_ILN_4315 GBV_ILN_4323 GBV_ILN_4700 AR 40 1998 1 01 59-62 |
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Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. © American Institute of Physics 1998 |
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Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. © American Institute of Physics 1998 |
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Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. © American Institute of Physics 1998 |
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L.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Influence of pulsed laser radiation on the real structure of CdTe single crystals</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">1998</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© American Institute of Physics 1998</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. 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