Influence of pulsed laser radiation on the real structure of CdTe single crystals
Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Shul’pina, I. L. [verfasserIn] |
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| Format: |
Artikel |
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| Sprache: |
Englisch |
| Erschienen: |
1998 |
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| Schlagwörter: |
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| Anmerkung: |
© American Institute of Physics 1998 |
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| Übergeordnetes Werk: |
Enthalten in: Physics of the solid state - Nauka/Interperiodica, 1993, 40(1998), 1 vom: Jan., Seite 59-62 |
|---|---|
| Übergeordnetes Werk: |
volume:40 ; year:1998 ; number:1 ; month:01 ; pages:59-62 |
| Links: |
|---|
| DOI / URN: |
10.1134/1.1130233 |
|---|
| Katalog-ID: |
OLC2040671552 |
|---|
| LEADER | 01000caa a22002652 4500 | ||
|---|---|---|---|
| 001 | OLC2040671552 | ||
| 003 | DE-627 | ||
| 005 | 20230504110802.0 | ||
| 007 | tu | ||
| 008 | 200820s1998 xx ||||| 00| ||eng c | ||
| 024 | 7 | |a 10.1134/1.1130233 |2 doi | |
| 035 | |a (DE-627)OLC2040671552 | ||
| 035 | |a (DE-He213)1.1130233-p | ||
| 040 | |a DE-627 |b ger |c DE-627 |e rakwb | ||
| 041 | |a eng | ||
| 082 | 0 | 4 | |a 530 |q VZ |
| 100 | 1 | |a Shul’pina, I. L. |e verfasserin |4 aut | |
| 245 | 1 | 0 | |a Influence of pulsed laser radiation on the real structure of CdTe single crystals |
| 264 | 1 | |c 1998 | |
| 336 | |a Text |b txt |2 rdacontent | ||
| 337 | |a ohne Hilfsmittel zu benutzen |b n |2 rdamedia | ||
| 338 | |a Band |b nc |2 rdacarrier | ||
| 500 | |a © American Institute of Physics 1998 | ||
| 520 | |a Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. | ||
| 650 | 4 | |a Radiation | |
| 650 | 4 | |a Spectroscopy | |
| 650 | 4 | |a State Physics | |
| 650 | 4 | |a Surface Layer | |
| 650 | 4 | |a Pulse Laser | |
| 700 | 1 | |a Zelenina, N. K. |4 aut | |
| 700 | 1 | |a Matveev, O. A. |4 aut | |
| 773 | 0 | 8 | |i Enthalten in |t Physics of the solid state |d Nauka/Interperiodica, 1993 |g 40(1998), 1 vom: Jan., Seite 59-62 |w (DE-627)16567332X |w (DE-600)1159011-7 |w (DE-576)038490706 |x 1063-7834 |7 nnns |
| 773 | 1 | 8 | |g volume:40 |g year:1998 |g number:1 |g month:01 |g pages:59-62 |
| 856 | 4 | 1 | |u https://doi.org/10.1134/1.1130233 |z lizenzpflichtig |3 Volltext |
| 912 | |a GBV_USEFLAG_A | ||
| 912 | |a SYSFLAG_A | ||
| 912 | |a GBV_OLC | ||
| 912 | |a SSG-OLC-PHY | ||
| 912 | |a GBV_ILN_20 | ||
| 912 | |a GBV_ILN_22 | ||
| 912 | |a GBV_ILN_40 | ||
| 912 | |a GBV_ILN_70 | ||
| 912 | |a GBV_ILN_130 | ||
| 912 | |a GBV_ILN_2014 | ||
| 912 | |a GBV_ILN_2015 | ||
| 912 | |a GBV_ILN_2095 | ||
| 912 | |a GBV_ILN_4027 | ||
| 912 | |a GBV_ILN_4116 | ||
| 912 | |a GBV_ILN_4306 | ||
| 912 | |a GBV_ILN_4313 | ||
| 912 | |a GBV_ILN_4315 | ||
| 912 | |a GBV_ILN_4323 | ||
| 912 | |a GBV_ILN_4700 | ||
| 951 | |a AR | ||
| 952 | |d 40 |j 1998 |e 1 |c 01 |h 59-62 | ||
| author_variant |
i l s il ils n k z nk nkz o a m oa oam |
|---|---|
| matchkey_str |
article:10637834:1998----::nlecoplelsraitooteeltutro |
| hierarchy_sort_str |
1998 |
| publishDate |
1998 |
| allfields |
10.1134/1.1130233 doi (DE-627)OLC2040671552 (DE-He213)1.1130233-p DE-627 ger DE-627 rakwb eng 530 VZ Shul’pina, I. L. verfasserin aut Influence of pulsed laser radiation on the real structure of CdTe single crystals 1998 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © American Institute of Physics 1998 Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. Radiation Spectroscopy State Physics Surface Layer Pulse Laser Zelenina, N. K. aut Matveev, O. A. aut Enthalten in Physics of the solid state Nauka/Interperiodica, 1993 40(1998), 1 vom: Jan., Seite 59-62 (DE-627)16567332X (DE-600)1159011-7 (DE-576)038490706 1063-7834 nnns volume:40 year:1998 number:1 month:01 pages:59-62 https://doi.org/10.1134/1.1130233 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_22 GBV_ILN_40 GBV_ILN_70 GBV_ILN_130 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2095 GBV_ILN_4027 GBV_ILN_4116 GBV_ILN_4306 GBV_ILN_4313 GBV_ILN_4315 GBV_ILN_4323 GBV_ILN_4700 AR 40 1998 1 01 59-62 |
| spelling |
10.1134/1.1130233 doi (DE-627)OLC2040671552 (DE-He213)1.1130233-p DE-627 ger DE-627 rakwb eng 530 VZ Shul’pina, I. L. verfasserin aut Influence of pulsed laser radiation on the real structure of CdTe single crystals 1998 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © American Institute of Physics 1998 Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. Radiation Spectroscopy State Physics Surface Layer Pulse Laser Zelenina, N. K. aut Matveev, O. A. aut Enthalten in Physics of the solid state Nauka/Interperiodica, 1993 40(1998), 1 vom: Jan., Seite 59-62 (DE-627)16567332X (DE-600)1159011-7 (DE-576)038490706 1063-7834 nnns volume:40 year:1998 number:1 month:01 pages:59-62 https://doi.org/10.1134/1.1130233 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_22 GBV_ILN_40 GBV_ILN_70 GBV_ILN_130 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2095 GBV_ILN_4027 GBV_ILN_4116 GBV_ILN_4306 GBV_ILN_4313 GBV_ILN_4315 GBV_ILN_4323 GBV_ILN_4700 AR 40 1998 1 01 59-62 |
| allfields_unstemmed |
10.1134/1.1130233 doi (DE-627)OLC2040671552 (DE-He213)1.1130233-p DE-627 ger DE-627 rakwb eng 530 VZ Shul’pina, I. L. verfasserin aut Influence of pulsed laser radiation on the real structure of CdTe single crystals 1998 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © American Institute of Physics 1998 Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. Radiation Spectroscopy State Physics Surface Layer Pulse Laser Zelenina, N. K. aut Matveev, O. A. aut Enthalten in Physics of the solid state Nauka/Interperiodica, 1993 40(1998), 1 vom: Jan., Seite 59-62 (DE-627)16567332X (DE-600)1159011-7 (DE-576)038490706 1063-7834 nnns volume:40 year:1998 number:1 month:01 pages:59-62 https://doi.org/10.1134/1.1130233 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_22 GBV_ILN_40 GBV_ILN_70 GBV_ILN_130 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2095 GBV_ILN_4027 GBV_ILN_4116 GBV_ILN_4306 GBV_ILN_4313 GBV_ILN_4315 GBV_ILN_4323 GBV_ILN_4700 AR 40 1998 1 01 59-62 |
| allfieldsGer |
10.1134/1.1130233 doi (DE-627)OLC2040671552 (DE-He213)1.1130233-p DE-627 ger DE-627 rakwb eng 530 VZ Shul’pina, I. L. verfasserin aut Influence of pulsed laser radiation on the real structure of CdTe single crystals 1998 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © American Institute of Physics 1998 Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. Radiation Spectroscopy State Physics Surface Layer Pulse Laser Zelenina, N. K. aut Matveev, O. A. aut Enthalten in Physics of the solid state Nauka/Interperiodica, 1993 40(1998), 1 vom: Jan., Seite 59-62 (DE-627)16567332X (DE-600)1159011-7 (DE-576)038490706 1063-7834 nnns volume:40 year:1998 number:1 month:01 pages:59-62 https://doi.org/10.1134/1.1130233 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_22 GBV_ILN_40 GBV_ILN_70 GBV_ILN_130 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2095 GBV_ILN_4027 GBV_ILN_4116 GBV_ILN_4306 GBV_ILN_4313 GBV_ILN_4315 GBV_ILN_4323 GBV_ILN_4700 AR 40 1998 1 01 59-62 |
| allfieldsSound |
10.1134/1.1130233 doi (DE-627)OLC2040671552 (DE-He213)1.1130233-p DE-627 ger DE-627 rakwb eng 530 VZ Shul’pina, I. L. verfasserin aut Influence of pulsed laser radiation on the real structure of CdTe single crystals 1998 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © American Institute of Physics 1998 Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. Radiation Spectroscopy State Physics Surface Layer Pulse Laser Zelenina, N. K. aut Matveev, O. A. aut Enthalten in Physics of the solid state Nauka/Interperiodica, 1993 40(1998), 1 vom: Jan., Seite 59-62 (DE-627)16567332X (DE-600)1159011-7 (DE-576)038490706 1063-7834 nnns volume:40 year:1998 number:1 month:01 pages:59-62 https://doi.org/10.1134/1.1130233 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_22 GBV_ILN_40 GBV_ILN_70 GBV_ILN_130 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2095 GBV_ILN_4027 GBV_ILN_4116 GBV_ILN_4306 GBV_ILN_4313 GBV_ILN_4315 GBV_ILN_4323 GBV_ILN_4700 AR 40 1998 1 01 59-62 |
| language |
English |
| source |
Enthalten in Physics of the solid state 40(1998), 1 vom: Jan., Seite 59-62 volume:40 year:1998 number:1 month:01 pages:59-62 |
| sourceStr |
Enthalten in Physics of the solid state 40(1998), 1 vom: Jan., Seite 59-62 volume:40 year:1998 number:1 month:01 pages:59-62 |
| format_phy_str_mv |
Article |
| institution |
findex.gbv.de |
| topic_facet |
Radiation Spectroscopy State Physics Surface Layer Pulse Laser |
| dewey-raw |
530 |
| isfreeaccess_bool |
false |
| container_title |
Physics of the solid state |
| authorswithroles_txt_mv |
Shul’pina, I. L. @@aut@@ Zelenina, N. K. @@aut@@ Matveev, O. A. @@aut@@ |
| publishDateDaySort_date |
1998-01-01T00:00:00Z |
| hierarchy_top_id |
16567332X |
| dewey-sort |
3530 |
| id |
OLC2040671552 |
| language_de |
englisch |
| fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC2040671552</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230504110802.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">200820s1998 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1134/1.1130233</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC2040671552</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-He213)1.1130233-p</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">530</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Shul’pina, I. L.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Influence of pulsed laser radiation on the real structure of CdTe single crystals</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">1998</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© American Institute of Physics 1998</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Radiation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectroscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">State Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surface Layer</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Pulse Laser</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zelenina, N. K.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Matveev, O. A.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Physics of the solid state</subfield><subfield code="d">Nauka/Interperiodica, 1993</subfield><subfield code="g">40(1998), 1 vom: Jan., Seite 59-62</subfield><subfield code="w">(DE-627)16567332X</subfield><subfield code="w">(DE-600)1159011-7</subfield><subfield code="w">(DE-576)038490706</subfield><subfield code="x">1063-7834</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:40</subfield><subfield code="g">year:1998</subfield><subfield code="g">number:1</subfield><subfield code="g">month:01</subfield><subfield code="g">pages:59-62</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">https://doi.org/10.1134/1.1130233</subfield><subfield code="z">lizenzpflichtig</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_20</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_130</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2014</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2015</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2095</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4027</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4116</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4306</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4313</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4315</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4323</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4700</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">40</subfield><subfield code="j">1998</subfield><subfield code="e">1</subfield><subfield code="c">01</subfield><subfield code="h">59-62</subfield></datafield></record></collection>
|
| author |
Shul’pina, I. L. |
| spellingShingle |
Shul’pina, I. L. ddc 530 misc Radiation misc Spectroscopy misc State Physics misc Surface Layer misc Pulse Laser Influence of pulsed laser radiation on the real structure of CdTe single crystals |
| authorStr |
Shul’pina, I. L. |
| ppnlink_with_tag_str_mv |
@@773@@(DE-627)16567332X |
| format |
Article |
| dewey-ones |
530 - Physics |
| delete_txt_mv |
keep |
| author_role |
aut aut aut |
| collection |
OLC |
| remote_str |
false |
| illustrated |
Not Illustrated |
| issn |
1063-7834 |
| topic_title |
530 VZ Influence of pulsed laser radiation on the real structure of CdTe single crystals Radiation Spectroscopy State Physics Surface Layer Pulse Laser |
| topic |
ddc 530 misc Radiation misc Spectroscopy misc State Physics misc Surface Layer misc Pulse Laser |
| topic_unstemmed |
ddc 530 misc Radiation misc Spectroscopy misc State Physics misc Surface Layer misc Pulse Laser |
| topic_browse |
ddc 530 misc Radiation misc Spectroscopy misc State Physics misc Surface Layer misc Pulse Laser |
| format_facet |
Aufsätze Gedruckte Aufsätze |
| format_main_str_mv |
Text Zeitschrift/Artikel |
| carriertype_str_mv |
nc |
| hierarchy_parent_title |
Physics of the solid state |
| hierarchy_parent_id |
16567332X |
| dewey-tens |
530 - Physics |
| hierarchy_top_title |
Physics of the solid state |
| isfreeaccess_txt |
false |
| familylinks_str_mv |
(DE-627)16567332X (DE-600)1159011-7 (DE-576)038490706 |
| title |
Influence of pulsed laser radiation on the real structure of CdTe single crystals |
| ctrlnum |
(DE-627)OLC2040671552 (DE-He213)1.1130233-p |
| title_full |
Influence of pulsed laser radiation on the real structure of CdTe single crystals |
| author_sort |
Shul’pina, I. L. |
| journal |
Physics of the solid state |
| journalStr |
Physics of the solid state |
| lang_code |
eng |
| isOA_bool |
false |
| dewey-hundreds |
500 - Science |
| recordtype |
marc |
| publishDateSort |
1998 |
| contenttype_str_mv |
txt |
| container_start_page |
59 |
| author_browse |
Shul’pina, I. L. Zelenina, N. K. Matveev, O. A. |
| container_volume |
40 |
| class |
530 VZ |
| format_se |
Aufsätze |
| author-letter |
Shul’pina, I. L. |
| doi_str_mv |
10.1134/1.1130233 |
| dewey-full |
530 |
| title_sort |
influence of pulsed laser radiation on the real structure of cdte single crystals |
| title_auth |
Influence of pulsed laser radiation on the real structure of CdTe single crystals |
| abstract |
Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. © American Institute of Physics 1998 |
| abstractGer |
Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. © American Institute of Physics 1998 |
| abstract_unstemmed |
Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure. © American Institute of Physics 1998 |
| collection_details |
GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_20 GBV_ILN_22 GBV_ILN_40 GBV_ILN_70 GBV_ILN_130 GBV_ILN_2014 GBV_ILN_2015 GBV_ILN_2095 GBV_ILN_4027 GBV_ILN_4116 GBV_ILN_4306 GBV_ILN_4313 GBV_ILN_4315 GBV_ILN_4323 GBV_ILN_4700 |
| container_issue |
1 |
| title_short |
Influence of pulsed laser radiation on the real structure of CdTe single crystals |
| url |
https://doi.org/10.1134/1.1130233 |
| remote_bool |
false |
| author2 |
Zelenina, N. K. Matveev, O. A. |
| author2Str |
Zelenina, N. K. Matveev, O. A. |
| ppnlink |
16567332X |
| mediatype_str_mv |
n |
| isOA_txt |
false |
| hochschulschrift_bool |
false |
| doi_str |
10.1134/1.1130233 |
| up_date |
2024-07-04T02:53:11.665Z |
| _version_ |
1803615303554301952 |
| fullrecord_marcxml |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC2040671552</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230504110802.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">200820s1998 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1134/1.1130233</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC2040671552</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-He213)1.1130233-p</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">530</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Shul’pina, I. L.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Influence of pulsed laser radiation on the real structure of CdTe single crystals</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">1998</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© American Institute of Physics 1998</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract Back-reflection x-ray diffraction topography is used the measure the real structure of the surface layer of CdTe single crystals. It is found that the structural changes depend mainly on the laser power, on the presence of a doping impurity, and on the orientation and profile of the sample surface. Three distinct and conspicuous phenomena are discussed: overall improvement of the real structure of the surface layer, the periodic relief of the crystal surface, and twin mosaic structure.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Radiation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Spectroscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">State Physics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surface Layer</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Pulse Laser</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zelenina, N. K.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Matveev, O. A.</subfield><subfield code="4">aut</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Physics of the solid state</subfield><subfield code="d">Nauka/Interperiodica, 1993</subfield><subfield code="g">40(1998), 1 vom: Jan., Seite 59-62</subfield><subfield code="w">(DE-627)16567332X</subfield><subfield code="w">(DE-600)1159011-7</subfield><subfield code="w">(DE-576)038490706</subfield><subfield code="x">1063-7834</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:40</subfield><subfield code="g">year:1998</subfield><subfield code="g">number:1</subfield><subfield code="g">month:01</subfield><subfield code="g">pages:59-62</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">https://doi.org/10.1134/1.1130233</subfield><subfield code="z">lizenzpflichtig</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_20</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_22</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_130</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2014</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2015</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_2095</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4027</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4116</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4306</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4313</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4315</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4323</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4700</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">40</subfield><subfield code="j">1998</subfield><subfield code="e">1</subfield><subfield code="c">01</subfield><subfield code="h">59-62</subfield></datafield></record></collection>
|
| score |
7.399806 |