Study of the polarization profile in film ferroelectrics by the thermal square wave method
Abstract The possibility of using the thermal square wave method at single frequency for the analysis of the polarization distribution over the depth of a thin-film ferroelectric has been considered. The temperature distribution in a ferroelectric film-substrate system has been calculated. The metho...
Ausführliche Beschreibung
Gespeichert in:
| Autor*in: |
Malyshkina, O. V. [verfasserIn] |
|---|
| Format: |
Artikel |
|---|---|
| Sprache: |
Englisch |
| Erschienen: |
2010 |
|---|
| Schlagwörter: |
|---|
| Anmerkung: |
© Pleiades Publishing, Ltd. 2010 |
|---|
| Übergeordnetes Werk: |
Enthalten in: Physics of the solid state - SP MAIK Nauka/Interperiodica, 1993, 52(2010), 4 vom: Apr., Seite 756-761 |
|---|---|
| Übergeordnetes Werk: |
volume:52 ; year:2010 ; number:4 ; month:04 ; pages:756-761 |
| Links: |
|---|
| DOI / URN: |
10.1134/S1063783410040141 |
|---|
| Katalog-ID: |
OLC2040720634 |
|---|
| LEADER | 01000caa a22002652 4500 | ||
|---|---|---|---|
| 001 | OLC2040720634 | ||
| 003 | DE-627 | ||
| 005 | 20230504111155.0 | ||
| 007 | tu | ||
| 008 | 200820s2010 xx ||||| 00| ||eng c | ||
| 024 | 7 | |a 10.1134/S1063783410040141 |2 doi | |
| 035 | |a (DE-627)OLC2040720634 | ||
| 035 | |a (DE-He213)S1063783410040141-p | ||
| 040 | |a DE-627 |b ger |c DE-627 |e rakwb | ||
| 041 | |a eng | ||
| 082 | 0 | 4 | |a 530 |q VZ |
| 100 | 1 | |a Malyshkina, O. V. |e verfasserin |4 aut | |
| 245 | 1 | 0 | |a Study of the polarization profile in film ferroelectrics by the thermal square wave method |
| 264 | 1 | |c 2010 | |
| 336 | |a Text |b txt |2 rdacontent | ||
| 337 | |a ohne Hilfsmittel zu benutzen |b n |2 rdamedia | ||
| 338 | |a Band |b nc |2 rdacarrier | ||
| 500 | |a © Pleiades Publishing, Ltd. 2010 | ||
| 520 | |a Abstract The possibility of using the thermal square wave method at single frequency for the analysis of the polarization distribution over the depth of a thin-film ferroelectric has been considered. The temperature distribution in a ferroelectric film-substrate system has been calculated. The method has been tested using tin thiohypodiphosphate films on aluminum substrates. | ||
| 650 | 4 | |a Heat Flux | |
| 650 | 4 | |a Thermal Wave | |
| 650 | 4 | |a Wave Method | |
| 650 | 4 | |a Polarization Distribution | |
| 650 | 4 | |a Temperature Wave | |
| 773 | 0 | 8 | |i Enthalten in |t Physics of the solid state |d SP MAIK Nauka/Interperiodica, 1993 |g 52(2010), 4 vom: Apr., Seite 756-761 |w (DE-627)16567332X |w (DE-600)1159011-7 |w (DE-576)038490706 |x 1063-7834 |7 nnns |
| 773 | 1 | 8 | |g volume:52 |g year:2010 |g number:4 |g month:04 |g pages:756-761 |
| 856 | 4 | 1 | |u https://doi.org/10.1134/S1063783410040141 |z lizenzpflichtig |3 Volltext |
| 912 | |a GBV_USEFLAG_A | ||
| 912 | |a SYSFLAG_A | ||
| 912 | |a GBV_OLC | ||
| 912 | |a SSG-OLC-PHY | ||
| 912 | |a GBV_ILN_40 | ||
| 912 | |a GBV_ILN_70 | ||
| 912 | |a GBV_ILN_4700 | ||
| 951 | |a AR | ||
| 952 | |d 52 |j 2010 |e 4 |c 04 |h 756-761 | ||
| author_variant |
o v m ov ovm |
|---|---|
| matchkey_str |
article:10637834:2010----::tdoteoaiainrfliflfrolcrcbteh |
| hierarchy_sort_str |
2010 |
| publishDate |
2010 |
| allfields |
10.1134/S1063783410040141 doi (DE-627)OLC2040720634 (DE-He213)S1063783410040141-p DE-627 ger DE-627 rakwb eng 530 VZ Malyshkina, O. V. verfasserin aut Study of the polarization profile in film ferroelectrics by the thermal square wave method 2010 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Ltd. 2010 Abstract The possibility of using the thermal square wave method at single frequency for the analysis of the polarization distribution over the depth of a thin-film ferroelectric has been considered. The temperature distribution in a ferroelectric film-substrate system has been calculated. The method has been tested using tin thiohypodiphosphate films on aluminum substrates. Heat Flux Thermal Wave Wave Method Polarization Distribution Temperature Wave Enthalten in Physics of the solid state SP MAIK Nauka/Interperiodica, 1993 52(2010), 4 vom: Apr., Seite 756-761 (DE-627)16567332X (DE-600)1159011-7 (DE-576)038490706 1063-7834 nnns volume:52 year:2010 number:4 month:04 pages:756-761 https://doi.org/10.1134/S1063783410040141 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_40 GBV_ILN_70 GBV_ILN_4700 AR 52 2010 4 04 756-761 |
| spelling |
10.1134/S1063783410040141 doi (DE-627)OLC2040720634 (DE-He213)S1063783410040141-p DE-627 ger DE-627 rakwb eng 530 VZ Malyshkina, O. V. verfasserin aut Study of the polarization profile in film ferroelectrics by the thermal square wave method 2010 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Ltd. 2010 Abstract The possibility of using the thermal square wave method at single frequency for the analysis of the polarization distribution over the depth of a thin-film ferroelectric has been considered. The temperature distribution in a ferroelectric film-substrate system has been calculated. The method has been tested using tin thiohypodiphosphate films on aluminum substrates. Heat Flux Thermal Wave Wave Method Polarization Distribution Temperature Wave Enthalten in Physics of the solid state SP MAIK Nauka/Interperiodica, 1993 52(2010), 4 vom: Apr., Seite 756-761 (DE-627)16567332X (DE-600)1159011-7 (DE-576)038490706 1063-7834 nnns volume:52 year:2010 number:4 month:04 pages:756-761 https://doi.org/10.1134/S1063783410040141 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_40 GBV_ILN_70 GBV_ILN_4700 AR 52 2010 4 04 756-761 |
| allfields_unstemmed |
10.1134/S1063783410040141 doi (DE-627)OLC2040720634 (DE-He213)S1063783410040141-p DE-627 ger DE-627 rakwb eng 530 VZ Malyshkina, O. V. verfasserin aut Study of the polarization profile in film ferroelectrics by the thermal square wave method 2010 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Ltd. 2010 Abstract The possibility of using the thermal square wave method at single frequency for the analysis of the polarization distribution over the depth of a thin-film ferroelectric has been considered. The temperature distribution in a ferroelectric film-substrate system has been calculated. The method has been tested using tin thiohypodiphosphate films on aluminum substrates. Heat Flux Thermal Wave Wave Method Polarization Distribution Temperature Wave Enthalten in Physics of the solid state SP MAIK Nauka/Interperiodica, 1993 52(2010), 4 vom: Apr., Seite 756-761 (DE-627)16567332X (DE-600)1159011-7 (DE-576)038490706 1063-7834 nnns volume:52 year:2010 number:4 month:04 pages:756-761 https://doi.org/10.1134/S1063783410040141 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_40 GBV_ILN_70 GBV_ILN_4700 AR 52 2010 4 04 756-761 |
| allfieldsGer |
10.1134/S1063783410040141 doi (DE-627)OLC2040720634 (DE-He213)S1063783410040141-p DE-627 ger DE-627 rakwb eng 530 VZ Malyshkina, O. V. verfasserin aut Study of the polarization profile in film ferroelectrics by the thermal square wave method 2010 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Ltd. 2010 Abstract The possibility of using the thermal square wave method at single frequency for the analysis of the polarization distribution over the depth of a thin-film ferroelectric has been considered. The temperature distribution in a ferroelectric film-substrate system has been calculated. The method has been tested using tin thiohypodiphosphate films on aluminum substrates. Heat Flux Thermal Wave Wave Method Polarization Distribution Temperature Wave Enthalten in Physics of the solid state SP MAIK Nauka/Interperiodica, 1993 52(2010), 4 vom: Apr., Seite 756-761 (DE-627)16567332X (DE-600)1159011-7 (DE-576)038490706 1063-7834 nnns volume:52 year:2010 number:4 month:04 pages:756-761 https://doi.org/10.1134/S1063783410040141 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_40 GBV_ILN_70 GBV_ILN_4700 AR 52 2010 4 04 756-761 |
| allfieldsSound |
10.1134/S1063783410040141 doi (DE-627)OLC2040720634 (DE-He213)S1063783410040141-p DE-627 ger DE-627 rakwb eng 530 VZ Malyshkina, O. V. verfasserin aut Study of the polarization profile in film ferroelectrics by the thermal square wave method 2010 Text txt rdacontent ohne Hilfsmittel zu benutzen n rdamedia Band nc rdacarrier © Pleiades Publishing, Ltd. 2010 Abstract The possibility of using the thermal square wave method at single frequency for the analysis of the polarization distribution over the depth of a thin-film ferroelectric has been considered. The temperature distribution in a ferroelectric film-substrate system has been calculated. The method has been tested using tin thiohypodiphosphate films on aluminum substrates. Heat Flux Thermal Wave Wave Method Polarization Distribution Temperature Wave Enthalten in Physics of the solid state SP MAIK Nauka/Interperiodica, 1993 52(2010), 4 vom: Apr., Seite 756-761 (DE-627)16567332X (DE-600)1159011-7 (DE-576)038490706 1063-7834 nnns volume:52 year:2010 number:4 month:04 pages:756-761 https://doi.org/10.1134/S1063783410040141 lizenzpflichtig Volltext GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_40 GBV_ILN_70 GBV_ILN_4700 AR 52 2010 4 04 756-761 |
| language |
English |
| source |
Enthalten in Physics of the solid state 52(2010), 4 vom: Apr., Seite 756-761 volume:52 year:2010 number:4 month:04 pages:756-761 |
| sourceStr |
Enthalten in Physics of the solid state 52(2010), 4 vom: Apr., Seite 756-761 volume:52 year:2010 number:4 month:04 pages:756-761 |
| format_phy_str_mv |
Article |
| institution |
findex.gbv.de |
| topic_facet |
Heat Flux Thermal Wave Wave Method Polarization Distribution Temperature Wave |
| dewey-raw |
530 |
| isfreeaccess_bool |
false |
| container_title |
Physics of the solid state |
| authorswithroles_txt_mv |
Malyshkina, O. V. @@aut@@ |
| publishDateDaySort_date |
2010-04-01T00:00:00Z |
| hierarchy_top_id |
16567332X |
| dewey-sort |
3530 |
| id |
OLC2040720634 |
| language_de |
englisch |
| fullrecord |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC2040720634</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230504111155.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">200820s2010 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1134/S1063783410040141</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC2040720634</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-He213)S1063783410040141-p</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">530</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Malyshkina, O. V.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Study of the polarization profile in film ferroelectrics by the thermal square wave method</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2010</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© Pleiades Publishing, Ltd. 2010</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract The possibility of using the thermal square wave method at single frequency for the analysis of the polarization distribution over the depth of a thin-film ferroelectric has been considered. The temperature distribution in a ferroelectric film-substrate system has been calculated. The method has been tested using tin thiohypodiphosphate films on aluminum substrates.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Heat Flux</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Thermal Wave</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Wave Method</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Polarization Distribution</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Temperature Wave</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Physics of the solid state</subfield><subfield code="d">SP MAIK Nauka/Interperiodica, 1993</subfield><subfield code="g">52(2010), 4 vom: Apr., Seite 756-761</subfield><subfield code="w">(DE-627)16567332X</subfield><subfield code="w">(DE-600)1159011-7</subfield><subfield code="w">(DE-576)038490706</subfield><subfield code="x">1063-7834</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:52</subfield><subfield code="g">year:2010</subfield><subfield code="g">number:4</subfield><subfield code="g">month:04</subfield><subfield code="g">pages:756-761</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">https://doi.org/10.1134/S1063783410040141</subfield><subfield code="z">lizenzpflichtig</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4700</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">52</subfield><subfield code="j">2010</subfield><subfield code="e">4</subfield><subfield code="c">04</subfield><subfield code="h">756-761</subfield></datafield></record></collection>
|
| author |
Malyshkina, O. V. |
| spellingShingle |
Malyshkina, O. V. ddc 530 misc Heat Flux misc Thermal Wave misc Wave Method misc Polarization Distribution misc Temperature Wave Study of the polarization profile in film ferroelectrics by the thermal square wave method |
| authorStr |
Malyshkina, O. V. |
| ppnlink_with_tag_str_mv |
@@773@@(DE-627)16567332X |
| format |
Article |
| dewey-ones |
530 - Physics |
| delete_txt_mv |
keep |
| author_role |
aut |
| collection |
OLC |
| remote_str |
false |
| illustrated |
Not Illustrated |
| issn |
1063-7834 |
| topic_title |
530 VZ Study of the polarization profile in film ferroelectrics by the thermal square wave method Heat Flux Thermal Wave Wave Method Polarization Distribution Temperature Wave |
| topic |
ddc 530 misc Heat Flux misc Thermal Wave misc Wave Method misc Polarization Distribution misc Temperature Wave |
| topic_unstemmed |
ddc 530 misc Heat Flux misc Thermal Wave misc Wave Method misc Polarization Distribution misc Temperature Wave |
| topic_browse |
ddc 530 misc Heat Flux misc Thermal Wave misc Wave Method misc Polarization Distribution misc Temperature Wave |
| format_facet |
Aufsätze Gedruckte Aufsätze |
| format_main_str_mv |
Text Zeitschrift/Artikel |
| carriertype_str_mv |
nc |
| hierarchy_parent_title |
Physics of the solid state |
| hierarchy_parent_id |
16567332X |
| dewey-tens |
530 - Physics |
| hierarchy_top_title |
Physics of the solid state |
| isfreeaccess_txt |
false |
| familylinks_str_mv |
(DE-627)16567332X (DE-600)1159011-7 (DE-576)038490706 |
| title |
Study of the polarization profile in film ferroelectrics by the thermal square wave method |
| ctrlnum |
(DE-627)OLC2040720634 (DE-He213)S1063783410040141-p |
| title_full |
Study of the polarization profile in film ferroelectrics by the thermal square wave method |
| author_sort |
Malyshkina, O. V. |
| journal |
Physics of the solid state |
| journalStr |
Physics of the solid state |
| lang_code |
eng |
| isOA_bool |
false |
| dewey-hundreds |
500 - Science |
| recordtype |
marc |
| publishDateSort |
2010 |
| contenttype_str_mv |
txt |
| container_start_page |
756 |
| author_browse |
Malyshkina, O. V. |
| container_volume |
52 |
| class |
530 VZ |
| format_se |
Aufsätze |
| author-letter |
Malyshkina, O. V. |
| doi_str_mv |
10.1134/S1063783410040141 |
| dewey-full |
530 |
| title_sort |
study of the polarization profile in film ferroelectrics by the thermal square wave method |
| title_auth |
Study of the polarization profile in film ferroelectrics by the thermal square wave method |
| abstract |
Abstract The possibility of using the thermal square wave method at single frequency for the analysis of the polarization distribution over the depth of a thin-film ferroelectric has been considered. The temperature distribution in a ferroelectric film-substrate system has been calculated. The method has been tested using tin thiohypodiphosphate films on aluminum substrates. © Pleiades Publishing, Ltd. 2010 |
| abstractGer |
Abstract The possibility of using the thermal square wave method at single frequency for the analysis of the polarization distribution over the depth of a thin-film ferroelectric has been considered. The temperature distribution in a ferroelectric film-substrate system has been calculated. The method has been tested using tin thiohypodiphosphate films on aluminum substrates. © Pleiades Publishing, Ltd. 2010 |
| abstract_unstemmed |
Abstract The possibility of using the thermal square wave method at single frequency for the analysis of the polarization distribution over the depth of a thin-film ferroelectric has been considered. The temperature distribution in a ferroelectric film-substrate system has been calculated. The method has been tested using tin thiohypodiphosphate films on aluminum substrates. © Pleiades Publishing, Ltd. 2010 |
| collection_details |
GBV_USEFLAG_A SYSFLAG_A GBV_OLC SSG-OLC-PHY GBV_ILN_40 GBV_ILN_70 GBV_ILN_4700 |
| container_issue |
4 |
| title_short |
Study of the polarization profile in film ferroelectrics by the thermal square wave method |
| url |
https://doi.org/10.1134/S1063783410040141 |
| remote_bool |
false |
| ppnlink |
16567332X |
| mediatype_str_mv |
n |
| isOA_txt |
false |
| hochschulschrift_bool |
false |
| doi_str |
10.1134/S1063783410040141 |
| up_date |
2024-07-04T02:59:24.054Z |
| _version_ |
1803615694020935680 |
| fullrecord_marcxml |
<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01000caa a22002652 4500</leader><controlfield tag="001">OLC2040720634</controlfield><controlfield tag="003">DE-627</controlfield><controlfield tag="005">20230504111155.0</controlfield><controlfield tag="007">tu</controlfield><controlfield tag="008">200820s2010 xx ||||| 00| ||eng c</controlfield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1134/S1063783410040141</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-627)OLC2040720634</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-He213)S1063783410040141-p</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-627</subfield><subfield code="b">ger</subfield><subfield code="c">DE-627</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2="4"><subfield code="a">530</subfield><subfield code="q">VZ</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Malyshkina, O. V.</subfield><subfield code="e">verfasserin</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Study of the polarization profile in film ferroelectrics by the thermal square wave method</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="c">2010</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="a">Text</subfield><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="a">ohne Hilfsmittel zu benutzen</subfield><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="a">Band</subfield><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">© Pleiades Publishing, Ltd. 2010</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Abstract The possibility of using the thermal square wave method at single frequency for the analysis of the polarization distribution over the depth of a thin-film ferroelectric has been considered. The temperature distribution in a ferroelectric film-substrate system has been calculated. The method has been tested using tin thiohypodiphosphate films on aluminum substrates.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Heat Flux</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Thermal Wave</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Wave Method</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Polarization Distribution</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Temperature Wave</subfield></datafield><datafield tag="773" ind1="0" ind2="8"><subfield code="i">Enthalten in</subfield><subfield code="t">Physics of the solid state</subfield><subfield code="d">SP MAIK Nauka/Interperiodica, 1993</subfield><subfield code="g">52(2010), 4 vom: Apr., Seite 756-761</subfield><subfield code="w">(DE-627)16567332X</subfield><subfield code="w">(DE-600)1159011-7</subfield><subfield code="w">(DE-576)038490706</subfield><subfield code="x">1063-7834</subfield><subfield code="7">nnns</subfield></datafield><datafield tag="773" ind1="1" ind2="8"><subfield code="g">volume:52</subfield><subfield code="g">year:2010</subfield><subfield code="g">number:4</subfield><subfield code="g">month:04</subfield><subfield code="g">pages:756-761</subfield></datafield><datafield tag="856" ind1="4" ind2="1"><subfield code="u">https://doi.org/10.1134/S1063783410040141</subfield><subfield code="z">lizenzpflichtig</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_USEFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SYSFLAG_A</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_OLC</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">SSG-OLC-PHY</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_40</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_70</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">GBV_ILN_4700</subfield></datafield><datafield tag="951" ind1=" " ind2=" "><subfield code="a">AR</subfield></datafield><datafield tag="952" ind1=" " ind2=" "><subfield code="d">52</subfield><subfield code="j">2010</subfield><subfield code="e">4</subfield><subfield code="c">04</subfield><subfield code="h">756-761</subfield></datafield></record></collection>
|
| score |
7.401613 |